Princeton University, et al. Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscope, 34928 [2017-15852]

Download as PDF mstockstill on DSK30JT082PROD with NOTICES 34928 Federal Register / Vol. 82, No. 143 / Thursday, July 27, 2017 / Notices meet the stringent performance characteristics for conducting the experiments. The instrument will be able to accurately adjust the M1 Mirror optical surface by applying arbitrary Zernike correction terms to correct for telescope errors in addition to polishing errors and M1 Cell Assembly induced errors. After optics correction, the total allowed M1 Mirror optical surface figure error from all sources other than polishing residuals shall be less than 45 nm RMS after subtraction of tip tilt and focus. Docket Number: 17–007. Applicant: The Association of Universities for Research in Astronomy, Boulder, CO 80303. Instrument: Coating and Cleaning Equipment for the Daniel K. Inouye Solar Telescope. Manufacturer: Advanced Mechanical & Optical Systems, NA, Belgium. Intended Use: See notice at 82 FR 23191–92, May 22, 2017. Comments: None received. Decision: Approved. We know of no instruments of equivalent scientific value to the foreign instruments described below, for such purposes as this is intended to be used, that was being manufactured in the United States at the time of order. Reasons: The instrument will be used to study the highly dynamic magnetic fields and plasmas throughout the solar atmosphere. The M1 Wash Platform shall be capable of capturing washing effluent and directing it into a containment system, which shall include pumping capacity to move the effluent from the containment system into AURA supplied containers, as well as protect effluent from contaminating the bottom surface of the M1 Mirror or any other surface. Docket Number: 17–008. Applicant: UChicago Argonne, Lemont, IL 60439. Instrument: Multiphoton 3D Lithography System. Manufacturer: Nanoscribe, Germany. Intended Use: See notice at 82 FR 23191–92, May 22, 2017. Comments: None received. Decision: Approved. We know of no instruments of equivalent scientific value to the foreign instruments described below, for such purposes as this is intended to be used, that was being manufactured in the United States at the time of order. Reasons: The instrument will be used for rapid fabrication and prototyping of micro and nano sized parts by the means of novel technology, two-photon polymerization of UV-curable photoresists. The key and unique features of the instrument include the highest resolution (150 nanometers) among all commercially available 3D printers and ability to deposit a wide variety of materials template by VerDate Sep<11>2014 19:17 Jul 26, 2017 Jkt 241001 transparent polymers. The high printing resolution enables sub-micron feature sizes and allows a design freedom for very complex parts with internal features otherwise impossible to produce. Dated: July 24, 2017. Gregory W. Campbell, Director, Subsidies Enforcement, Enforcement and Compliance. [FR Doc. 2017–15849 Filed 7–26–17; 8:45 am] Dated: July 24, 2017. Gregory W. Campbell, Director, Subsidies Enforcement, Enforcement and Compliance. [FR Doc. 2017–15852 Filed 7–26–17; 8:45 am] BILLING CODE 3510–DS–P DEPARTMENT OF COMMERCE National Oceanic and Atmospheric Administration BILLING CODE 3510–DS–P DEPARTMENT OF COMMERCE Proposed Information Collection; Comment Request; Alaska Region Permit Family of Forms International Trade Administration AGENCY: Princeton University, et al. Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscope SUMMARY: This is a decision consolidated pursuant to Section 6(c) of the Educational, Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89–651, as amended by Pub. L. 106–36; 80 Stat. 897; 15 CFR part 301). Related records can be viewed between 8:30 a.m. and 5:00 p.m. in Room 3720, U.S. Department of Commerce, 14th and Constitution Avenue NW., Washington, DC. Docket Number: 16–023. Applicant: Princeton University, Princeton, NJ 08540. Instrument: Electron Microscope. Manufacturer: FEI Company, Czech Republic. Intended Use: See notice at 82 FR 16796–97, April 6, 2017. Docket Number: 16–024. Applicant: The Hormel Institute, Austin, MN 55912. Instrument: Electron Microscope. Manufacturer: FEI Company, the Netherlands. Intended Use: See notice at 82 FR 23191, May 22, 2017. Docket Number: 16–025. Applicant: The Hormel Institute, Austin, MN 55912. Instrument: Electron Microscope. Manufacturer: FEI Company, Czech Republic. Intended Use: See notice at 82 FR 23191, May 22, 2017. Comments: None received. Decision: Approved. No instrument of equivalent scientific value to the foreign instrument, for such purposes as this instrument is intended to be used, is being manufactured in the United States at the time the instrument was ordered. Reasons: Each foreign instrument is an electron microscope and is intended for research or scientific educational uses requiring an electron microscope. We know of no electron microscope, or any other instrument suited to these purposes, which was being manufactured in the United States at the time of order of each instrument. PO 00000 Frm 00006 Fmt 4703 Sfmt 4703 National Oceanic and Atmospheric Administration (NOAA), Commerce. ACTION: Notice. The Department of Commerce, as part of its continuing effort to reduce paperwork and respondent burden, invites the general public and other Federal agencies to take this opportunity to comment on proposed and/or continuing information collections, as required by the Paperwork Reduction Act of 1995. DATES: Written comments must be submitted on or before September 25, 2017. ADDRESSES: Direct all written comments to Jennifer Jessup, Departmental Paperwork Clearance Officer, Department of Commerce, Room 6616, 14th and Constitution Avenue NW., Washington, DC 20230 (or via the Internet at pracomments@doc.gov). FOR FURTHER INFORMATION CONTACT: Requests for additional information or copies of the information collection instrument and instructions should be directed to Kurt Iverson, (907) 586–7228 or kurt.iverson@noaa.gov. SUPPLEMENTARY INFORMATION: I. Abstract This request is for extension of a current information collection. For a person to participate in Federal fisheries, the National Marine Fisheries Service (NMFS) requires a Federal Fisheries Permit (FFP), a Federal Processor Permit (FPP), or an Exempted Fishing Permit (EFP). NMFS Alaska Region created a set of commercial fishing permits that operators of vessels and managers of processors must have on board or on site when fishing, receiving, buying, or processing groundfish and non-groundfish species. The permit information provides harvest gear types; descriptions of vessels, shoreside processors, and stationary floating processors; and expected fishery activity levels. These E:\FR\FM\27JYN1.SGM 27JYN1

Agencies

[Federal Register Volume 82, Number 143 (Thursday, July 27, 2017)]
[Notices]
[Page 34928]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 2017-15852]


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DEPARTMENT OF COMMERCE

International Trade Administration


Princeton University, et al. Notice of Consolidated Decision on 
Applications for Duty-Free Entry of Electron Microscope

    This is a decision consolidated pursuant to Section 6(c) of the 
Educational, Scientific, and Cultural Materials Importation Act of 1966 
(Pub. L. 89-651, as amended by Pub. L. 106-36; 80 Stat. 897; 15 CFR 
part 301). Related records can be viewed between 8:30 a.m. and 5:00 
p.m. in Room 3720, U.S. Department of Commerce, 14th and Constitution 
Avenue NW., Washington, DC.
    Docket Number: 16-023. Applicant: Princeton University, Princeton, 
NJ 08540. Instrument: Electron Microscope. Manufacturer: FEI Company, 
Czech Republic. Intended Use: See notice at 82 FR 16796-97, April 6, 
2017.
    Docket Number: 16-024. Applicant: The Hormel Institute, Austin, MN 
55912. Instrument: Electron Microscope. Manufacturer: FEI Company, the 
Netherlands. Intended Use: See notice at 82 FR 23191, May 22, 2017.
    Docket Number: 16-025. Applicant: The Hormel Institute, Austin, MN 
55912. Instrument: Electron Microscope. Manufacturer: FEI Company, 
Czech Republic. Intended Use: See notice at 82 FR 23191, May 22, 2017.
    Comments: None received. Decision: Approved. No instrument of 
equivalent scientific value to the foreign instrument, for such 
purposes as this instrument is intended to be used, is being 
manufactured in the United States at the time the instrument was 
ordered. Reasons: Each foreign instrument is an electron microscope and 
is intended for research or scientific educational uses requiring an 
electron microscope. We know of no electron microscope, or any other 
instrument suited to these purposes, which was being manufactured in 
the United States at the time of order of each instrument.

    Dated: July 24, 2017.
Gregory W. Campbell,
Director, Subsidies Enforcement, Enforcement and Compliance.
[FR Doc. 2017-15852 Filed 7-26-17; 8:45 am]
 BILLING CODE 3510-DS-P
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