University of Massachusetts Medical School, et al.; Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscope, 27468 [2017-12407]
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27468
Federal Register / Vol. 82, No. 114 / Thursday, June 15, 2017 / Notices
VI. Partial Rescission of Administrative
Review
VII. Subsidies Valuation Information
VIII. Benchmarks
IX. Use of Facts Otherwise Available and
Adverse Inferences
X. Programs Determined To Be
Countervailable
XI. Programs Determined Not To Confer
Measurable Benefits
XII. Programs Determined Not To Be Used
During the POR
XIII. Analysis of Comments
XIV. Conclusion
Netherlands. Intended Use: See notice at
81 FR 71702–03, October 18, 2016.
Comments: None received. Decision:
Approved. No instrument of equivalent
scientific value to the foreign
instrument, for such purposes as this
instrument is intended to be used, is
being manufactured in the United States
at the time the instrument was ordered.
Reasons: Each foreign instrument is an
electron microscope and is intended for
research or scientific educational uses
requiring an electron microscope. We
know of no electron microscope, or any
other instrument suited to these
purposes, which was being
manufactured in the United States at the
time of order of each instrument.
[FR Doc. 2017–12449 Filed 6–14–17; 8:45 am]
BILLING CODE 3510–DS–P
DEPARTMENT OF COMMERCE
International Trade Administration
pmangrum on DSK3GDR082PROD with NOTICES
University of Massachusetts Medical
School, et al.; Notice of Consolidated
Decision on Applications for Duty-Free
Entry of Electron Microscope
This is a decision consolidated
pursuant to Section 6(c) of the
Educational, Scientific, and Cultural
Materials Importation Act of 1966 (Pub.
L. 89–651, as amended by Pub. L. 106–
36; 80 Stat. 897; 15 CFR part 301).
Related records can be viewed between
8:30 a.m. and 5:00 p.m. in Room 3720,
U.S. Department of Commerce, 14th and
Constitution Avenue NW., Washington,
DC.
Docket Number: 16–002. Applicant:
University of Massachusetts Medical
School, Worcester, MA 01655.
Instrument: Electron Microscope.
Manufacturer: FEI Company, the
Netherlands. Intended Use: See notice at
81 FR 71702, October 18, 2016.
Docket Number: 16–011. Applicant:
Van Andel Research Institute, Grand
Rapids, MI 49503. Instrument: Electron
Microscope. Manufacturer: FEI
Company, the Netherlands. Intended
Use: See notice at 81 FR 71702–03,
October 18, 2016.
Docket Number: 16–012. Applicant:
Van Andel Research Institute, Grand
Rapids, MI 49503. Instrument: Electron
Microscope. Manufacturer: FEI
Company, the Netherlands. Intended
Use: See notice at 81 FR 71702–03,
October 18, 2016.
Docket Number: 16–013. Applicant:
Van Andel Research Institute, Grand
Rapids, MI 49503. Instrument: Electron
Microscope. Manufacturer: FEI
Company, Czech Republic. Intended
Use: See notice at 81 FR 71702–03,
October 18, 2016.
Docket Number: 16–015. Applicant:
Yale University, New Haven, CT 06520.
Instrument: Electron Microscope.
Manufacturer: FEI Company, the
VerDate Sep<11>2014
14:10 Jun 14, 2017
Jkt 241001
Dated: June 9, 2017.
Gregory W. Campbell,
Director, Subsidies Enforcement, Enforcement
and Compliance.
[FR Doc. 2017–12407 Filed 6–14–17; 8:45 am]
BILLING CODE 3510–DS–P
DEPARTMENT OF COMMERCE
International Trade Administration
Purdue University, et al.; Notice of
Decision on Application for Duty-Free
Entry of Scientific Instruments
This is a decision pursuant to Section
6(c) of the Educational, Scientific, and
Cultural Materials Importation Act of
1966 (Pub. L. 89–651, as amended by
Pub. L. 106–36; 80 Stat. 897; 15 CFR
part 301). Related records can be viewed
between 8:30 a.m. and 5:00 p.m. in
Room 3720, U.S. Department of
Commerce, 14th and Constitution Ave.
NW., Washington, DC.
Docket Number: 16–004. Applicant:
Purdue University, West Lafayette, IN
47907. Instrument: SGR YAG pulsed
laser. Manufacturer: Beamtech
Optronics, Co., LTD, China. Intended
Use: See notice at 81 FR 71702, October
18, 2016. Comments: None received.
Decision: Approved. We know of no
instruments of equivalent scientific
value to the foreign instruments
described below, for such purposes as
this is intended to be used, that was
being manufactured in the United States
at the time of order. Reasons: The
instrument will be used for pulsed laser
annealing and nanostructure integrated
laser shock peening, to improve the
microstructure of thin film for better
electrical and optical properties.
Requirements for the experiment
include three wave lengths (355nm,
532nm, 1064 nm), pulse energy 2J, flat
hat beam, and pulse duration tunable
from 10ns to 25ns.
PO 00000
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Fmt 4703
Sfmt 4703
Docket Number: 16–008. Applicant:
California Institute of Technology,
Pasadena, CA 91125. Instrument:
Cryogenic Temperature Scanning
Tunneling Microscope System.
Manufacturer: Unisoku Co., LTD., Japan.
Intended Use: See notice at 81 FR
71703, October 18, 2016. Comments:
None received. Decision: Approved. We
know of no instruments of equivalent
scientific value to the foreign
instruments described below, for such
purposes as this is intended to be used,
that was being manufactured in the
United States at the time of order.
Reasons: The instrument will be used to
investigate structural and electrical
surface properties with atomic
resolution at cryogenic temperatures
(¥459 Fahrenheit—0.4 K) and high
magnetic fields, at which conditions
materials can exhibit unusual quantum
properties such as topological
superconductivity and fractionalization
of charge carriers. Experiments to be
conducted with the instrument include
mapping of the local electronic density
of states of gated nanostructures by
measuring current—voltage curves at
different points, mapping of the electron
spin structure using scanning tips made
of magnetic materials, and probing the
size of the energy gap in topological
insulators and topological
superconductors. For this type of
research an instrument capable of
performing scanning tunneling
microscopy (STM) and atomic force
microscopy (AFM) at cryogenic
temperatures and high magnetic fields is
essential.
Dated: June 9, 2017.
Gregory W. Campbell,
Director, Subsidies Enforcement, Enforcement
and Compliance.
[FR Doc. 2017–12406 Filed 6–14–17; 8:45 am]
BILLING CODE 3510–DS–P
DEPARTMENT OF COMMERCE
National Oceanic and Atmospheric
Administration
RIN 0648–XF473
Endangered and Threatened Species;
Take of Anadromous Fish
National Marine Fisheries
Service (NMFS), National Oceanic and
Atmospheric Administration (NOAA),
Commerce.
ACTION: Applications for three new
scientific research permits, one permit
modification, and four permit renewals.
AGENCY:
Notice is hereby given that
NMFS has received eight scientific
research permit application requests
SUMMARY:
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]]>Agencies
[Federal Register Volume 82, Number 114 (Thursday, June 15, 2017)]
[Notices]
[Page 27468]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 2017-12407]
-----------------------------------------------------------------------
DEPARTMENT OF COMMERCE
International Trade Administration
University of Massachusetts Medical School, et al.; Notice of
Consolidated Decision on Applications for Duty-Free Entry of Electron
Microscope
This is a decision consolidated pursuant to Section 6(c) of the
Educational, Scientific, and Cultural Materials Importation Act of 1966
(Pub. L. 89-651, as amended by Pub. L. 106-36; 80 Stat. 897; 15 CFR
part 301). Related records can be viewed between 8:30 a.m. and 5:00
p.m. in Room 3720, U.S. Department of Commerce, 14th and Constitution
Avenue NW., Washington, DC.
Docket Number: 16-002. Applicant: University of Massachusetts
Medical School, Worcester, MA 01655. Instrument: Electron Microscope.
Manufacturer: FEI Company, the Netherlands. Intended Use: See notice at
81 FR 71702, October 18, 2016.
Docket Number: 16-011. Applicant: Van Andel Research Institute,
Grand Rapids, MI 49503. Instrument: Electron Microscope. Manufacturer:
FEI Company, the Netherlands. Intended Use: See notice at 81 FR 71702-
03, October 18, 2016.
Docket Number: 16-012. Applicant: Van Andel Research Institute,
Grand Rapids, MI 49503. Instrument: Electron Microscope. Manufacturer:
FEI Company, the Netherlands. Intended Use: See notice at 81 FR 71702-
03, October 18, 2016.
Docket Number: 16-013. Applicant: Van Andel Research Institute,
Grand Rapids, MI 49503. Instrument: Electron Microscope. Manufacturer:
FEI Company, Czech Republic. Intended Use: See notice at 81 FR 71702-
03, October 18, 2016.
Docket Number: 16-015. Applicant: Yale University, New Haven, CT
06520. Instrument: Electron Microscope. Manufacturer: FEI Company, the
Netherlands. Intended Use: See notice at 81 FR 71702-03, October 18,
2016.
Comments: None received. Decision: Approved. No instrument of
equivalent scientific value to the foreign instrument, for such
purposes as this instrument is intended to be used, is being
manufactured in the United States at the time the instrument was
ordered. Reasons: Each foreign instrument is an electron microscope and
is intended for research or scientific educational uses requiring an
electron microscope. We know of no electron microscope, or any other
instrument suited to these purposes, which was being manufactured in
the United States at the time of order of each instrument.
Dated: June 9, 2017.
Gregory W. Campbell,
Director, Subsidies Enforcement, Enforcement and Compliance.
[FR Doc. 2017-12407 Filed 6-14-17; 8:45 am]
BILLING CODE 3510-DS-P
