University of Massachusetts Medical School, et al.; Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscope, 27468 [2017-12407]

Download as PDF 27468 Federal Register / Vol. 82, No. 114 / Thursday, June 15, 2017 / Notices VI. Partial Rescission of Administrative Review VII. Subsidies Valuation Information VIII. Benchmarks IX. Use of Facts Otherwise Available and Adverse Inferences X. Programs Determined To Be Countervailable XI. Programs Determined Not To Confer Measurable Benefits XII. Programs Determined Not To Be Used During the POR XIII. Analysis of Comments XIV. Conclusion Netherlands. Intended Use: See notice at 81 FR 71702–03, October 18, 2016. Comments: None received. Decision: Approved. No instrument of equivalent scientific value to the foreign instrument, for such purposes as this instrument is intended to be used, is being manufactured in the United States at the time the instrument was ordered. Reasons: Each foreign instrument is an electron microscope and is intended for research or scientific educational uses requiring an electron microscope. We know of no electron microscope, or any other instrument suited to these purposes, which was being manufactured in the United States at the time of order of each instrument. [FR Doc. 2017–12449 Filed 6–14–17; 8:45 am] BILLING CODE 3510–DS–P DEPARTMENT OF COMMERCE International Trade Administration pmangrum on DSK3GDR082PROD with NOTICES University of Massachusetts Medical School, et al.; Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscope This is a decision consolidated pursuant to Section 6(c) of the Educational, Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89–651, as amended by Pub. L. 106– 36; 80 Stat. 897; 15 CFR part 301). Related records can be viewed between 8:30 a.m. and 5:00 p.m. in Room 3720, U.S. Department of Commerce, 14th and Constitution Avenue NW., Washington, DC. Docket Number: 16–002. Applicant: University of Massachusetts Medical School, Worcester, MA 01655. Instrument: Electron Microscope. Manufacturer: FEI Company, the Netherlands. Intended Use: See notice at 81 FR 71702, October 18, 2016. Docket Number: 16–011. Applicant: Van Andel Research Institute, Grand Rapids, MI 49503. Instrument: Electron Microscope. Manufacturer: FEI Company, the Netherlands. Intended Use: See notice at 81 FR 71702–03, October 18, 2016. Docket Number: 16–012. Applicant: Van Andel Research Institute, Grand Rapids, MI 49503. Instrument: Electron Microscope. Manufacturer: FEI Company, the Netherlands. Intended Use: See notice at 81 FR 71702–03, October 18, 2016. Docket Number: 16–013. Applicant: Van Andel Research Institute, Grand Rapids, MI 49503. Instrument: Electron Microscope. Manufacturer: FEI Company, Czech Republic. Intended Use: See notice at 81 FR 71702–03, October 18, 2016. Docket Number: 16–015. Applicant: Yale University, New Haven, CT 06520. Instrument: Electron Microscope. Manufacturer: FEI Company, the VerDate Sep<11>2014 14:10 Jun 14, 2017 Jkt 241001 Dated: June 9, 2017. Gregory W. Campbell, Director, Subsidies Enforcement, Enforcement and Compliance. [FR Doc. 2017–12407 Filed 6–14–17; 8:45 am] BILLING CODE 3510–DS–P DEPARTMENT OF COMMERCE International Trade Administration Purdue University, et al.; Notice of Decision on Application for Duty-Free Entry of Scientific Instruments This is a decision pursuant to Section 6(c) of the Educational, Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89–651, as amended by Pub. L. 106–36; 80 Stat. 897; 15 CFR part 301). Related records can be viewed between 8:30 a.m. and 5:00 p.m. in Room 3720, U.S. Department of Commerce, 14th and Constitution Ave. NW., Washington, DC. Docket Number: 16–004. Applicant: Purdue University, West Lafayette, IN 47907. Instrument: SGR YAG pulsed laser. Manufacturer: Beamtech Optronics, Co., LTD, China. Intended Use: See notice at 81 FR 71702, October 18, 2016. Comments: None received. Decision: Approved. We know of no instruments of equivalent scientific value to the foreign instruments described below, for such purposes as this is intended to be used, that was being manufactured in the United States at the time of order. Reasons: The instrument will be used for pulsed laser annealing and nanostructure integrated laser shock peening, to improve the microstructure of thin film for better electrical and optical properties. Requirements for the experiment include three wave lengths (355nm, 532nm, 1064 nm), pulse energy 2J, flat hat beam, and pulse duration tunable from 10ns to 25ns. PO 00000 Frm 00007 Fmt 4703 Sfmt 4703 Docket Number: 16–008. Applicant: California Institute of Technology, Pasadena, CA 91125. Instrument: Cryogenic Temperature Scanning Tunneling Microscope System. Manufacturer: Unisoku Co., LTD., Japan. Intended Use: See notice at 81 FR 71703, October 18, 2016. Comments: None received. Decision: Approved. We know of no instruments of equivalent scientific value to the foreign instruments described below, for such purposes as this is intended to be used, that was being manufactured in the United States at the time of order. Reasons: The instrument will be used to investigate structural and electrical surface properties with atomic resolution at cryogenic temperatures (¥459 Fahrenheit—0.4 K) and high magnetic fields, at which conditions materials can exhibit unusual quantum properties such as topological superconductivity and fractionalization of charge carriers. Experiments to be conducted with the instrument include mapping of the local electronic density of states of gated nanostructures by measuring current—voltage curves at different points, mapping of the electron spin structure using scanning tips made of magnetic materials, and probing the size of the energy gap in topological insulators and topological superconductors. For this type of research an instrument capable of performing scanning tunneling microscopy (STM) and atomic force microscopy (AFM) at cryogenic temperatures and high magnetic fields is essential. Dated: June 9, 2017. Gregory W. Campbell, Director, Subsidies Enforcement, Enforcement and Compliance. [FR Doc. 2017–12406 Filed 6–14–17; 8:45 am] BILLING CODE 3510–DS–P DEPARTMENT OF COMMERCE National Oceanic and Atmospheric Administration RIN 0648–XF473 Endangered and Threatened Species; Take of Anadromous Fish National Marine Fisheries Service (NMFS), National Oceanic and Atmospheric Administration (NOAA), Commerce. ACTION: Applications for three new scientific research permits, one permit modification, and four permit renewals. AGENCY: Notice is hereby given that NMFS has received eight scientific research permit application requests SUMMARY: E:\FR\FM\15JNN1.SGM 15JNN1

Agencies

[Federal Register Volume 82, Number 114 (Thursday, June 15, 2017)]
[Notices]
[Page 27468]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 2017-12407]


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DEPARTMENT OF COMMERCE

International Trade Administration


University of Massachusetts Medical School, et al.; Notice of 
Consolidated Decision on Applications for Duty-Free Entry of Electron 
Microscope

    This is a decision consolidated pursuant to Section 6(c) of the 
Educational, Scientific, and Cultural Materials Importation Act of 1966 
(Pub. L. 89-651, as amended by Pub. L. 106-36; 80 Stat. 897; 15 CFR 
part 301). Related records can be viewed between 8:30 a.m. and 5:00 
p.m. in Room 3720, U.S. Department of Commerce, 14th and Constitution 
Avenue NW., Washington, DC.
    Docket Number: 16-002. Applicant: University of Massachusetts 
Medical School, Worcester, MA 01655. Instrument: Electron Microscope. 
Manufacturer: FEI Company, the Netherlands. Intended Use: See notice at 
81 FR 71702, October 18, 2016.
    Docket Number: 16-011. Applicant: Van Andel Research Institute, 
Grand Rapids, MI 49503. Instrument: Electron Microscope. Manufacturer: 
FEI Company, the Netherlands. Intended Use: See notice at 81 FR 71702-
03, October 18, 2016.
    Docket Number: 16-012. Applicant: Van Andel Research Institute, 
Grand Rapids, MI 49503. Instrument: Electron Microscope. Manufacturer: 
FEI Company, the Netherlands. Intended Use: See notice at 81 FR 71702-
03, October 18, 2016.
    Docket Number: 16-013. Applicant: Van Andel Research Institute, 
Grand Rapids, MI 49503. Instrument: Electron Microscope. Manufacturer: 
FEI Company, Czech Republic. Intended Use: See notice at 81 FR 71702-
03, October 18, 2016.
    Docket Number: 16-015. Applicant: Yale University, New Haven, CT 
06520. Instrument: Electron Microscope. Manufacturer: FEI Company, the 
Netherlands. Intended Use: See notice at 81 FR 71702-03, October 18, 
2016.
    Comments: None received. Decision: Approved. No instrument of 
equivalent scientific value to the foreign instrument, for such 
purposes as this instrument is intended to be used, is being 
manufactured in the United States at the time the instrument was 
ordered. Reasons: Each foreign instrument is an electron microscope and 
is intended for research or scientific educational uses requiring an 
electron microscope. We know of no electron microscope, or any other 
instrument suited to these purposes, which was being manufactured in 
the United States at the time of order of each instrument.

    Dated: June 9, 2017.
Gregory W. Campbell,
Director, Subsidies Enforcement, Enforcement and Compliance.
[FR Doc. 2017-12407 Filed 6-14-17; 8:45 am]
 BILLING CODE 3510-DS-P