Application(s) for Duty-Free Entry of Scientific Instruments, 71702-71703 [2016-25173]

Download as PDF 71702 Federal Register / Vol. 81, No. 201 / Tuesday, October 18, 2016 / Notices Final Rule, 78 FR 57790 (September 20, 2013), available at http://www.gpo.gov/ fdsys/pkg/FR-2013-09-20/html/201322853.htm, prior to submitting factual information in this segment. Certification Requirements Any party submitting factual information in an AD or CVD proceeding must certify to the accuracy and completeness of that information.45 Parties are hereby reminded that revised certification requirements are in effect for company/government officials, as well as their representatives. Investigations initiated on the basis of Petitions filed on or after August 16, 2013, and other segments of any AD or CVD proceedings initiated on or after August 16, 2013, should use the formats for the revised certifications provided at the end of the Final Rule.46 The Department intends to reject factual submissions if the submitting party does not comply with applicable revised certification requirements. Notification to Interested Parties Interested parties must submit applications for disclosure under APO in accordance with 19 CFR 351.305. On January 22, 2008, the Department published Antidumping and Countervailing Duty Proceedings: Documents Submission Procedures; APO Procedures, 73 FR 3634 (January 22, 2008). Parties wishing to participate in these investigations should ensure that they meet the requirements of these procedures (e.g., the filing of letters of appearance as discussed in 19 CFR 351.103(d)). This notice is issued and published pursuant to section 777(i) of the Act and 19 CFR 351.203(c). Dated: October 11, 2016. Paul Piquado, Assistant Secretary for Enforcement and Compliance. Lhorne on DSK30JT082PROD with NOTICES section 782(b) of the Act. Certification of Factual Information to Import Administration during Antidumping and Countervailing Duty Proceedings, 78 FR 42678 (July 17, 2013) (Final Rule); see also frequently asked questions regarding the Final Rule, available at http://enforcement.trade.gov/tlei/notices/factual_ info_final_rule_FAQ_07172013.pdf. VerDate Sep<11>2014 13:19 Oct 17, 2016 Jkt 241001 BILLING CODE 3510–DS–P International Trade Administration Scope of the Investigations The merchandise subject to these investigations is steel concrete reinforcing bar imported in either straight length or coil form (rebar) regardless of metallurgy, length, diameter, or grade or lack thereof. Subject merchandise includes deformed steel wire with bar markings (e.g., mill mark, size, or grade) and which has been subjected to an elongation test. 46 See [FR Doc. 2016–25171 Filed 10–17–16; 8:45 a.m.] DEPARTMENT OF COMMERCE Appendix I 45 See The subject merchandise includes rebar that has been further processed in the subject country or a third country, including but not limited to cutting, grinding, galvanizing, painting, coating, or any other processing that would not otherwise remove the merchandise from the scope of the investigations if performed in the country of manufacture of the rebar. Specifically excluded are plain rounds (i.e., nondeformed or smooth rebar). Also excluded from the scope is deformed steel wire meeting ASTM A1064/A1064M with no bar markings (e.g., mill mark, size, or grade) and without being subject to an elongation test. At the time of the filing of the petition, there was an existing countervailing duty order on steel reinforcing bar from the Republic of Turkey. Steel Concrete Reinforcing Bar From the Republic of Turkey, 79 FR 65,926 (Dep’t Commerce Nov. 6, 2014) (2014 Turkey CVD Order). The scope of this countervailing duty investigation with regard to rebar from Turkey covers only rebar produced and/or exported by those companies that are excluded from the 2014 Turkey CVD Order. At the time of the issuance of the 2014 Turkey CVD Order, Habas Sinai ve Tibbi Gazlar Istihsal Endustrisi A.S. was the only excluded Turkish rebar producer or exporter. The subject merchandise is classifiable in the Harmonized Tariff Schedule of the United States (HTSUS) primarily under item numbers 7213.10.0000, 7214.20.0000, and 7228.30.8010. The subject merchandise may also enter under other HTSUS numbers including 7215.90.1000, 7215.90.5000, 7221.00.0017, 7221.00.0018, 7221.00.0030, 7221.00.0045, 7222.11.0001, 7222.11.0057, 7222.11.0059, 7222.30.0001, 7227.20.0080, 7227.90.6030, 7227.90.6035, 7227.90.6040, 7228.20.1000, and 7228.60.6000. HTSUS numbers are provided for convenience and customs purposes; however, the written description of the scope remains dispositive. Application(s) for Duty-Free Entry of Scientific Instruments Pursuant to Section 6(c) of the Educational, Scientific and Cultural Materials Importation Act of 1966 (Pub. L. 89–651, as amended by Pub. L. 106– 36; 80 Stat. 897; 15 CFR part 301), we invite comments on the question of whether instruments of equivalent scientific value, for the purposes for which the instruments shown below are intended to be used, are being manufactured in the United States. Comments must comply with 15 CFR 301.5(a)(3) and (4) of the regulations and be postmarked on or before November 7, 2016. Address written comments to PO 00000 Frm 00014 Fmt 4703 Sfmt 4703 Statutory Import Programs Staff, Room 3720, U.S. Department of Commerce, Washington, DC 20230. Applications may be examined between 8:30 a.m. and 5:00 p.m. at the U.S. Department of Commerce in Room 3720. Docket Number: 15–061. Applicant: Yale School of Medicine, 333 Cedar St., New Haven, CT 06510. Instrument: SuperK Extreme EXR–20 white light laser. Manufacturer: NKT Photonics, Denmark. Intended Use: The instrument will be used as an excitation sources for the study of intracellular processes and structures at super resolution. The experiments require a high power pulsed excitation source at a wavelength of 590 nm, and minimal after pulse tail and sub 100 ps pulse width. Justification for Duty-Free Entry: There are no instruments of the same general category manufactured in the United States. Application accepted by Commissioner of Customs: July 18, 2016. Docket Number: 16–002. Applicant: University of Massachusetts Medical School, 55 Lake Avenue North, Worcester, MA 01655. Instrument: Electron Microscope. Manufacturer: FEI Company, the Netherlands. Intended Use: The instrument will be used to understand the three-dimensional structure of purified proteins and protein complexes at the atomic level, and how this is related to their function. Justification for Duty-Free Entry: There are no instruments of the same general category manufactured in the United States. Application accepted by Commissioner of Customs: July 18, 2016. Docket Number: 16–004. Applicant: Purdue University, 315 N. Grant St., West Lafayette, IN 47907. Instrument: SGR YAG pulsed laser. Manufacturer: Beamtech Optronics, Co. LTD, China. Intended Use: The instrument will be used for pulsed laser annealing and nanostructure integrated laser shock peening, to improve the microstructure of thin film for better electrical and optical properties. Requirements for the experiment include three wave lengths (355nm, 532nm, 1064nm), pulse energy 2J, flat hat beam, and pulse duration tunable from 10ns to 25ns. Justification for Duty-Free Entry: There are no instruments of the same general category manufactured in the United States. Application accepted by Commissioner of Customs: July 18, 2016. Docket Number: 16–005. Applicant: Rutgers University, Administrative Services Bldg. I, Rm. 300, Plant Funds, 65 Davidson Road, Piscataway, NJ 08854–8076. Instrument: Electron E:\FR\FM\18OCN1.SGM 18OCN1 Lhorne on DSK30JT082PROD with NOTICES Federal Register / Vol. 81, No. 201 / Tuesday, October 18, 2016 / Notices Microscope. Manufacturer: FEI Company, the Netherlands. Intended Use: The instrument will be used to achieve sub-nanometer resolution structures of protein complexes, characterize interactions between various components of protein complexes and understand biological activities by imaging protein assemblies in cellular or physiologic conditions. Justification for Duty-Free Entry: There are no instruments of the same general category manufactured in the United States. Application accepted by Commissioner of Customs: July 14, 2016. Docket Number: 16–008. Applicant: California Institute of Technology, 1200 E. California Blvd., Pasadena, CA 91125. Instrument: Cryogenic Temperature Scanning Tunneling Microscope System. Manufacturer: Unisoku Co., LTd., Japan. Intended Use: The instrument will be used to investigate structural and electrical surface properties with atomic resolution at cryogenic temperatures (-459 Fahrenheit—0.4 K) and high magnetic fields, at which conditions materials can exhibit unusual quantum properties such as topological superconductivity and fractionalization of charge carriers. Experiments to be conducted with the instrument include mapping of the local electronic density of states of gated nanostructures by measuring current— voltage curves at different points, mapping of the electron spin structure using scanning tips made of magnetic materials, and probing the size of the energy gap in topological insulators and topological superconductors. For this type of research an instrument capable of performing scanning tunneling microscopy (STM) and atomic force microscopy (AFM) at cryogenic temperatures and high magnetic fields is essential. Justification for Duty-Free Entry: There are no instruments of the same general category manufactured in the United States. Application accepted by Commissioner of Customs: July 14, 2016. Docket Number: 16–010. Applicant: University of California, Riverside, 900 University Drive, Riverside, CA 92521. Instrument: Electron Microscope. Manufacturer: FEI Company, the Netherlands. Intended Use: The instrument will be used teaching and associated research, including materials science, earth science and life science, all of which rely on the characterization of morphology and structure at microscopic down to atomic scale of materials and biological tissues. Justification for Duty-Free Entry: There are no instruments of the same general VerDate Sep<11>2014 13:19 Oct 17, 2016 Jkt 241001 category manufactured in the United States. Application accepted by Commissioner of Customs: July 18, 2016. Docket Number: 16–011. Applicant: Van Andel Research Institute, 333 Botswick Avenue NE., Grand Rapids, MI 49503. Instrument: Electron Microscope. Manufacturer: FEI Company, the Netherlands. Intended Use: The instrument will be used to computationally process images of protein complexes and apply averaging techniques to 3D models of isolated cellular components. Justification for Duty-Free Entry: There are no instruments of the same general category manufactured in the United States. Application accepted by Commissioner of Customs: June 21, 2016. Docket Number: 16–012. Applicant: Van Andel Research Institute, 333 Botswick Avenue NE., Grand Rapids, MI 49503. Instrument: Electron Microscope. Manufacturer: FEI, Co., the Netherlands. Intended Use: The instrument will be used to computationally process images of protein complexes and apply averaging techniques to 3D models of isolated cellular components. Justification for Duty-Free Entry: There are no instruments of the same general category manufactured in the United States. Application accepted by Commissioner of Customs: June 16, 2016. Docket Number: 16–013. Applicant: Van Andel Research Institute, 333 Botswick Avenue NE., Grand Rapids, MI 49503. Instrument: Electron Microscope. Manufacturer: FEI Company, Czech Republic. Intended Use: The instrument will be used to computationally process images of protein complexes and apply averaging techniques to calculate 3D models of isolated cellular components. Justification for Duty-Free Entry: There are no instruments of the same general category manufactured in the United States. Application accepted by Commissioner of Customs: July 15, 2016. Docket Number: 16–014. Applicant: Iowa State University, 3616 Administrative Services Bldg., Stange Road, Ames, Iowa 50011–3616. Instrument: Electron Microscope. Manufacturer: FEI Company, the Netherlands. Intended Use: The instrument will be used to study atom arrangement/motion in defects, interface, precipitate and their effect on property using high-resolution (scanning) electron microscopy, nanospectroscopy, electron diffraction, electron holography and Lorentz microscopy. Justification for Duty-Free PO 00000 Frm 00015 Fmt 4703 Sfmt 4703 71703 Entry: There are no instruments of the same general category manufactured in the United States. Application accepted by Commissioner of Customs: July 14, 2016. Docket Number: 16–015. Applicant: Yale University, 2 Whitney Avenue, Suite 540, P.O. Box 208202, New Haven, CT 06520. Instrument: Electron Microscope. Manufacturer: FEI Company, the Netherlands. Intended Use: The instrument will be used to obtain atomic-resolution maps of macromolecular complexes, to obtain three-dimensional tomograms of cellular contents, and to observe the arrangements of organelles and macromolecular complexes that participate in cellular processes. Justification for Duty-Free Entry: There are no instruments of the same general category manufactured in the United States. Application accepted by Commissioner of Customs: July 18, 2016. Docket Number: 16–016. Applicant: State University of New York at Stony Brook, Research & Development Campus, Development Drive, Bldg. 17, Stony Brook, NY 117964–6000. Instrument: Cryo-Electron Microscope. Manufacturer: FEI Company, the Netherlands. Intended Use: The instrument will be used to image and visualize purified proteins, nucleic acidprotein complexes, and thin sections of biological materials such as cells or tissues by cryo-electron microscopy. Justification for Duty-Free Entry: There are no instruments of the same general category manufactured in the United States. Application accepted by Commissioner of Customs: August 24, 2016. Dated: October 11, 2016. Gregory W. Campbell, Director of Subsidies Enforcement, Enforcement and Compliance. [FR Doc. 2016–25173 Filed 10–17–16; 8:45 am] BILLING CODE 3510–DS–P DEPARTMENT OF COMMERCE International Trade Administration [A–471–807] Certain Uncoated Paper From Portugal: Initiation and Preliminary Results of Antidumping Duty Changed Circumstances Review Enforcement and Compliance, International Trade Administration, Department of Commerce. SUMMARY: The Department of Commerce (the ‘‘Department’’) preliminarily determines that The Navigator AGENCY: E:\FR\FM\18OCN1.SGM 18OCN1

Agencies

[Federal Register Volume 81, Number 201 (Tuesday, October 18, 2016)]
[Notices]
[Pages 71702-71703]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 2016-25173]


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DEPARTMENT OF COMMERCE

International Trade Administration


Application(s) for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended 
by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments 
on the question of whether instruments of equivalent scientific value, 
for the purposes for which the instruments shown below are intended to 
be used, are being manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be postmarked on or before November 7, 2016. Address 
written comments to Statutory Import Programs Staff, Room 3720, U.S. 
Department of Commerce, Washington, DC 20230. Applications may be 
examined between 8:30 a.m. and 5:00 p.m. at the U.S. Department of 
Commerce in Room 3720.

    Docket Number: 15-061. Applicant: Yale School of Medicine, 333 
Cedar St., New Haven, CT 06510. Instrument: SuperK Extreme EXR-20 white 
light laser. Manufacturer: NKT Photonics, Denmark. Intended Use: The 
instrument will be used as an excitation sources for the study of 
intracellular processes and structures at super resolution. The 
experiments require a high power pulsed excitation source at a 
wavelength of 590 nm, and minimal after pulse tail and sub 100 ps pulse 
width. Justification for Duty-Free Entry: There are no instruments of 
the same general category manufactured in the United States. 
Application accepted by Commissioner of Customs: July 18, 2016.

    Docket Number: 16-002. Applicant: University of Massachusetts 
Medical School, 55 Lake Avenue North, Worcester, MA 01655. Instrument: 
Electron Microscope. Manufacturer: FEI Company, the Netherlands. 
Intended Use: The instrument will be used to understand the three-
dimensional structure of purified proteins and protein complexes at the 
atomic level, and how this is related to their function. Justification 
for Duty-Free Entry: There are no instruments of the same general 
category manufactured in the United States. Application accepted by 
Commissioner of Customs: July 18, 2016.

    Docket Number: 16-004. Applicant: Purdue University, 315 N. Grant 
St., West Lafayette, IN 47907. Instrument: SGR YAG pulsed laser. 
Manufacturer: Beamtech Optronics, Co. LTD, China. Intended Use: The 
instrument will be used for pulsed laser annealing and nanostructure 
integrated laser shock peening, to improve the microstructure of thin 
film for better electrical and optical properties. Requirements for the 
experiment include three wave lengths (355nm, 532nm, 1064nm), pulse 
energy 2J, flat hat beam, and pulse duration tunable from 10ns to 25ns. 
Justification for Duty-Free Entry: There are no instruments of the same 
general category manufactured in the United States. Application 
accepted by Commissioner of Customs: July 18, 2016.

    Docket Number: 16-005. Applicant: Rutgers University, 
Administrative Services Bldg. I, Rm. 300, Plant Funds, 65 Davidson 
Road, Piscataway, NJ 08854-8076. Instrument: Electron

[[Page 71703]]

Microscope. Manufacturer: FEI Company, the Netherlands. Intended Use: 
The instrument will be used to achieve sub-nanometer resolution 
structures of protein complexes, characterize interactions between 
various components of protein complexes and understand biological 
activities by imaging protein assemblies in cellular or physiologic 
conditions. Justification for Duty-Free Entry: There are no instruments 
of the same general category manufactured in the United States. 
Application accepted by Commissioner of Customs: July 14, 2016.

    Docket Number: 16-008. Applicant: California Institute of 
Technology, 1200 E. California Blvd., Pasadena, CA 91125. Instrument: 
Cryogenic Temperature Scanning Tunneling Microscope System. 
Manufacturer: Unisoku Co., LTd., Japan. Intended Use: The instrument 
will be used to investigate structural and electrical surface 
properties with atomic resolution at cryogenic temperatures (-459 
Fahrenheit--0.4 K) and high magnetic fields, at which conditions 
materials can exhibit unusual quantum properties such as topological 
superconductivity and fractionalization of charge carriers. Experiments 
to be conducted with the instrument include mapping of the local 
electronic density of states of gated nanostructures by measuring 
current--voltage curves at different points, mapping of the electron 
spin structure using scanning tips made of magnetic materials, and 
probing the size of the energy gap in topological insulators and 
topological superconductors. For this type of research an instrument 
capable of performing scanning tunneling microscopy (STM) and atomic 
force microscopy (AFM) at cryogenic temperatures and high magnetic 
fields is essential. Justification for Duty-Free Entry: There are no 
instruments of the same general category manufactured in the United 
States. Application accepted by Commissioner of Customs: July 14, 2016.

    Docket Number: 16-010. Applicant: University of California, 
Riverside, 900 University Drive, Riverside, CA 92521. Instrument: 
Electron Microscope. Manufacturer: FEI Company, the Netherlands. 
Intended Use: The instrument will be used teaching and associated 
research, including materials science, earth science and life science, 
all of which rely on the characterization of morphology and structure 
at microscopic down to atomic scale of materials and biological 
tissues. Justification for Duty-Free Entry: There are no instruments of 
the same general category manufactured in the United States. 
Application accepted by Commissioner of Customs: July 18, 2016.

    Docket Number: 16-011. Applicant: Van Andel Research Institute, 333 
Botswick Avenue NE., Grand Rapids, MI 49503. Instrument: Electron 
Microscope. Manufacturer: FEI Company, the Netherlands. Intended Use: 
The instrument will be used to computationally process images of 
protein complexes and apply averaging techniques to 3D models of 
isolated cellular components. Justification for Duty-Free Entry: There 
are no instruments of the same general category manufactured in the 
United States. Application accepted by Commissioner of Customs: June 
21, 2016.

    Docket Number: 16-012. Applicant: Van Andel Research Institute, 333 
Botswick Avenue NE., Grand Rapids, MI 49503. Instrument: Electron 
Microscope. Manufacturer: FEI, Co., the Netherlands. Intended Use: The 
instrument will be used to computationally process images of protein 
complexes and apply averaging techniques to 3D models of isolated 
cellular components. Justification for Duty-Free Entry: There are no 
instruments of the same general category manufactured in the United 
States. Application accepted by Commissioner of Customs: June 16, 2016.

    Docket Number: 16-013. Applicant: Van Andel Research Institute, 333 
Botswick Avenue NE., Grand Rapids, MI 49503. Instrument: Electron 
Microscope. Manufacturer: FEI Company, Czech Republic. Intended Use: 
The instrument will be used to computationally process images of 
protein complexes and apply averaging techniques to calculate 3D models 
of isolated cellular components. Justification for Duty-Free Entry: 
There are no instruments of the same general category manufactured in 
the United States. Application accepted by Commissioner of Customs: 
July 15, 2016.

    Docket Number: 16-014. Applicant: Iowa State University, 3616 
Administrative Services Bldg., Stange Road, Ames, Iowa 50011-3616. 
Instrument: Electron Microscope. Manufacturer: FEI Company, the 
Netherlands. Intended Use: The instrument will be used to study atom 
arrangement/motion in defects, interface, precipitate and their effect 
on property using high-resolution (scanning) electron microscopy, 
nanospectroscopy, electron diffraction, electron holography and Lorentz 
microscopy. Justification for Duty-Free Entry: There are no instruments 
of the same general category manufactured in the United States. 
Application accepted by Commissioner of Customs: July 14, 2016.

    Docket Number: 16-015. Applicant: Yale University, 2 Whitney 
Avenue, Suite 540, P.O. Box 208202, New Haven, CT 06520. Instrument: 
Electron Microscope. Manufacturer: FEI Company, the Netherlands. 
Intended Use: The instrument will be used to obtain atomic-resolution 
maps of macromolecular complexes, to obtain three-dimensional tomograms 
of cellular contents, and to observe the arrangements of organelles and 
macromolecular complexes that participate in cellular processes. 
Justification for Duty-Free Entry: There are no instruments of the same 
general category manufactured in the United States. Application 
accepted by Commissioner of Customs: July 18, 2016.

    Docket Number: 16-016. Applicant: State University of New York at 
Stony Brook, Research & Development Campus, Development Drive, Bldg. 
17, Stony Brook, NY 117964-6000. Instrument: Cryo-Electron Microscope. 
Manufacturer: FEI Company, the Netherlands. Intended Use: The 
instrument will be used to image and visualize purified proteins, 
nucleic acid-protein complexes, and thin sections of biological 
materials such as cells or tissues by cryo-electron microscopy. 
Justification for Duty-Free Entry: There are no instruments of the same 
general category manufactured in the United States. Application 
accepted by Commissioner of Customs: August 24, 2016.


    Dated: October 11, 2016.
Gregory W. Campbell,
Director of Subsidies Enforcement, Enforcement and Compliance.
[FR Doc. 2016-25173 Filed 10-17-16; 8:45 am]
 BILLING CODE 3510-DS-P