University of Kentucky, et al.; Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscope, 6831-6832 [2016-02552]

Download as PDF Federal Register / Vol. 81, No. 26 / Tuesday, February 9, 2016 / Notices Dated: February 2, 2016. Julie Lenzer, Director, Office of Innovation and Entrepreneurship. [FR Doc. 2016–02427 Filed 2–8–16; 8:45 am] BILLING CODE 3510–WH–P DEPARTMENT OF COMMERCE International Trade Administration mstockstill on DSK4VPTVN1PROD with NOTICES University of Minnesota, et al.; Notice of Decision on Application for DutyFree Entry of Scientific Instruments This is a decision pursuant to Section 6(c) of the Educational, Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89–651, as amended by Pub. L. 106–36; 80 Stat. 897; 15 CFR part 301). Related records can be viewed between 8:30 a.m. and 5:00 p.m. in Room 3720, U.S. Department of Commerce, 14th and Constitution Ave. NW., Washington, DC. Docket Number: 15–041. Applicant: University of Minnesota, Minneapolis, MN 55455–0149. Instrument: IVVI Measuring System with Modules. Manufacturer: Delft University of Technology, the Netherlands. Intended Use: See notice at 80 FR 65984–85, October 28, 2015. Comments: None received. Decision: Approved. We know of no instruments of equivalent scientific value to the foreign instruments described below, for such purposes as this is intended to be used, that was being manufactured in the United States at the time of order. Reasons: The instrument will be used to uncover novel quantum properties of certain semiconductors or superconductors, such as InAs, GaSb or devices combining these with superconductors such As Al and Nb, using high-sensitivity electronic current and voltage measurements. Unique properties of this instrument include modular integration of pA sensitivity ammeter, required to measure very small electrical currents down to several pA, low-noise transimpedance amplifier, required to transform the electrical currents into voltage signals of a few mV that can be measured with conventional laboratory voltmeters, and low-noise digital-to-analogue converter and signal switchboxes. The entire setup is battery-operated and is programmable via an opticallydecoupled input to minimize electrical noise interference from electrical power lines or other instruments. Docket Number: 15–042. Applicant: Purdue University, West Lafayette, IN 47907. Instrument: SuperK EXTREME EXR–20 20 MHz with SuperK VARIA VerDate Sep<11>2014 19:08 Feb 08, 2016 Jkt 238001 High 50dB with Power Lock. Manufacturer: NKT Photonics, Denmark. Intended Use: See notice at 80 FR 65984–85, October 28, 2015. Comments: None received. Decision: Approved. We know of no instruments of equivalent scientific value to the foreign instruments described below, for such purposes as this is intended to be used, that was being manufactured in the United States at the time of order. Reasons: The instrument will be used to image tissue or tissue like materials with high optical scatter using Optical Diffusion Tomography (ODT), providing useful information for the study of biological and chemical processes. The instrument has a wide turning range, which is important for exciting different fluorophores of interest, providing specificity to chemical processes, a short pulse width which is important for performing time-gated measurements, high laser power which is important for obtaining a high SNR from laser light traveling through centimeters of tissue or related scattering medium, and a 20MHz repetition rate which is important for time-gated measurements given the temporal response time of tissue. Docket Number: 15–045. Applicant: University of Massachusetts Medical School, Worchester, MA 01655. Instrument: Vitrobot. Manufacturer: FEI Electron Optics, B.V., the Netherlands. Intended Use: See notice at 80 FR 65984–85, October 28, 2015. Comments: None received. Decision: Approved. We know of no instruments of equivalent scientific value to the foreign instruments described below, for such purposes as this is intended to be used, that was being manufactured in the United States at the time of order. Reasons: The instrument will be used to understand the three-dimensional structure of purified proteins and complexes at the atomic level, and how this is related to their function, by freezing them, then examining them in the frozen state in an electron microscope. The instrument can precisely control the humidity at any level, and can also control the temperature of the chamber, which is essential to freeze the proteins and complexes under exactly defined conditions, which is a requirement for all of the studies. The specimen remains in the humidity-controlled environment until the instant of freezing, which is essential to prevent any evaporation of water from the specimen before freezing. Docket Number: 15–050. Applicant: Rutgers University, Brunswick, NJ 08901. Instrument: Junior PO 00000 Frm 00004 Fmt 4703 Sfmt 4703 6831 Micromanipulator unit with remote control system, shifting table and chamber unit parts. Manufacturer: Luigs & Neumann, Germany. Intended Use: See notice at 80 FR 79307–08, December 21, 2015. Comments: None received. Decision: Approved. We know of no instruments of equivalent scientific value to the foreign instruments described below, for such purposes as this is intended to be used, that was being manufactured in the United States at the time of order. Reasons: The instrument will be used to simultaneously measure the microscopic electric signals generated from neurons, specifically the patchclamp whole cell recordings from neurons, to identify specific alterations in synaptic transmission that leads to neuropsychiatric or neurological disorders. The instrument is a highly flexible, highly precise system, offering the highest mechanical resolution and smoothest movement because of its patented spindle nut system, which guarantees a unique and extraordinary stability for long term recordings. The step motor is decoupled preventing a thermal bridge from the motor to the machine and also prevents vibration during movement. The experiments require high precision equipment to precisely determine the measurement of voltage in the mV range and current in the pA range. Dated: February 2, 2016. Gregory W. Campbell, Director, Subsidies Enforcement Office, Enforcement and Compliance. [FR Doc. 2016–02558 Filed 2–8–16; 8:45 am] BILLING CODE 3510–DS–P DEPARTMENT OF COMMERCE International Trade Administration University of Kentucky, et al.; Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscope This is a decision consolidated pursuant to Section 6(c) of the Educational, Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89–651, as amended by Pub. L. 106– 36; 80 Stat. 897; 15 CFR part 301). Related records can be viewed between 8:30 a.m. and 5:00 p.m. in Room 3720, U.S. Department of Commerce, 14th and Constitution Avenue NW., Washington, DC. Docket Number: 15–001. Applicant: University of Kentucky, Lexington, KY 40506–0046. Instrument: Electron Microscope. Manufacturer: FEI Company, Czech Republic. Intended E:\FR\FM\09FEN1.SGM 09FEN1 mstockstill on DSK4VPTVN1PROD with NOTICES 6832 Federal Register / Vol. 81, No. 26 / Tuesday, February 9, 2016 / Notices Use: See notice at 80 FR 2914–15, January 21, 2015. Docket Number: 15–029. Applicant: University of California, Irvine, Irvine, CA 92697–2575. Instrument: Electron Microscope. Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 80 FR 65984, October 28, 2015. Docket Number: 15–031. Applicant: University of California, Irvine, Irvine, CA 92697–2575. Instrument: Electron Microscope. Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 80 FR 65984, October 28, 2015. Docket Number: 15–035. Applicant: Drexel University, Philadelphia, PA 19104. Instrument: Electron Microscope. Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 80 FR 65984, October 28, 2015. Docket Number: 15–036. Applicant: The Trustees of Princeton University, Princeton, NJ 08540. Instrument: Electron Microscope. Manufacturer: FEI Czech Republic s.r.o., Czech Republic. Intended Use: See notice at 80 FR 65984, October 28, 2015. Docket Number: 15–037. Applicant: The Trustees of Princeton University, Princeton, NJ 08540. Instrument: Electron Microscope. Manufacturer: FEI Electron Optics BV, the Netherlands. Intended Use: See notice at 80 FR 65984, October 28, 2015. Docket Number: 15–038. Applicant: South Dakota State University, Brookings, SD 57007. Instrument: Electron Microscope. Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 80 FR 65984, October 28, 2015. Docket Number: 15–039. Applicant: University of Texas Southwestern Medical Center, Dallas, TX 75390. Instrument: Electron Microscope. Manufacturer: FEI Company, the Netherlands. Intended Use: See notice at 80 FR 65984–85, October 28, 2015. Docket Number: 15–040. Applicant: UT Battelle, Oak Ridge National Laboratory, Oak Ridge TN 37831–6138. Instrument: Electron Microscope. Manufacturer: FEI Company, Czech Republic. Intended Use: See notice at 80 FR 65984–85, October 28, 2015. Docket Number: 15–043. Applicant: New York Structural Biology Center, New York, NY 10027. Instrument: Electron Microscope. Manufacturer: FEI Co., the Netherlands. Intended Use: See notice at 80 FR 65984–85, October 28, 2015. Docket Number: 15–046. Applicant: National Institute for Occupational Safety & Health, Morgantown, WV 26505. Instrument: Electron Microscope. Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 80 FR 65984–85, October 28, 2015. VerDate Sep<11>2014 17:54 Feb 08, 2016 Jkt 238001 Docket Number: 15–048. Applicant: Battelle/Pacific Northwest National Laboratory, Richland, WA 99352. Instrument: Electron Microscope. Manufacturer: FEI Co., Czech Republic. Intended Use: See notice at 80 FR 79307, December 21, 2015. Docket Number: 15–053. Applicant: University of California at San Diego, La Jolla, CA 92093–0651. Instrument: Electron Microscope. Manufacturer: FEI Company, the Netherlands. Intended Use: See notice at 80 FR 79307–08, December 21, 2015. Comments: None received. Decision: Approved. No instrument of equivalent scientific value to the foreign instrument, for such purposes as this instrument is intended to be used, is being manufactured in the United States at the time the instrument was ordered. Reasons: Each foreign instrument is an electron microscope and is intended for research or scientific educational uses requiring an electron microscope. We know of no electron microscope, or any other instrument suited to these purposes, which was being manufactured in the United States at the time of order of each instrument. Dated: February 3, 2016. Gregory W. Campbell, Director, Subsidies Enforcement Office, Enforcement and Compliance. [FR Doc. 2016–02552 Filed 2–8–16; 8:45 am] BILLING CODE 3510–DS–P DEPARTMENT OF COMMERCE International Trade Administration Initiation of Antidumping and Countervailing Duty Administrative Reviews Enforcement and Compliance, International Trade Administration, Department of Commerce. SUMMARY: The Department of Commerce (‘‘the Department’’) has received requests to conduct administrative reviews of various antidumping and countervailing duty orders and findings with December anniversary dates. In accordance with the Department’s regulations, we are initiating those administrative reviews. DATES: Effective date: February 9, 2016. FOR FURTHER INFORMATION CONTACT: Brenda E. Waters, Office of AD/CVD Operations, Customs Liaison Unit, Enforcement and Compliance, International Trade Administration, U.S. Department of Commerce, 14th Street and Constitution Avenue NW, Washington, DC 20230, telephone: (202) 482–4735. AGENCY: PO 00000 Frm 00005 Fmt 4703 Sfmt 4703 SUPPLEMENTARY INFORMATION: Background The Department has received timely requests, in accordance with 19 CFR 351.213(b), for administrative reviews of various antidumping and countervailing duty orders and findings with December anniversary dates. All deadlines for the submission of various types of information, certifications, or comments or actions by the Department discussed below refer to the number of calendar days from the applicable starting time. Notice of No Sales If a producer or exporter named in this notice of initiation had no exports, sales, or entries during the period of review (‘‘POR’’), it must notify the Department within 30 days of publication of this notice in the Federal Register. All submissions must be filed electronically at http://access.trade.gov in accordance with 19 CFR 351.303.1 Such submissions are subject to verification in accordance with section 782(i) of the Tariff Act of 1930, as amended (‘‘the Act’’). Further, in accordance with 19 CFR 351.303(f)(1)(i), a copy must be served on every party on the Department’s service list. Respondent Selection In the event the Department limits the number of respondents for individual examination for administrative reviews initiated pursuant to requests made for the orders identified below, the Department intends to select respondents based on U.S. Customs and Border Protection (‘‘CBP’’) data for U.S. imports during the period of review. We intend to place the CBP data on the record within five days of publication of the initiation notice and to make our decision regarding respondent selection within 30 days of publication of the initiation Federal Register notice. Comments regarding the CBP data and respondent selection should be submitted seven days after the placement of the CBP data on the record of this review. Parties wishing to submit rebuttal comments should submit those comments five days after the deadline for the initial comments. In the event the Department decides it is necessary to limit individual examination of respondents and conduct respondent selection under section 777A(c)(2) of the Act: In general, the Department has found that determinations concerning whether 1 See Antidumping and Countervailing Duty Proceedings: Electronic Filing Procedures; Administrative Protective Order Procedures, 76 FR 39263 (July 6, 2011). E:\FR\FM\09FEN1.SGM 09FEN1

Agencies

[Federal Register Volume 81, Number 26 (Tuesday, February 9, 2016)]
[Notices]
[Pages 6831-6832]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 2016-02552]


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DEPARTMENT OF COMMERCE

International Trade Administration


University of Kentucky, et al.; Notice of Consolidated Decision 
on Applications for Duty-Free Entry of Electron Microscope

    This is a decision consolidated pursuant to Section 6(c) of the 
Educational, Scientific, and Cultural Materials Importation Act of 1966 
(Pub. L. 89-651, as amended by Pub. L. 106-36; 80 Stat. 897; 15 CFR 
part 301). Related records can be viewed between 8:30 a.m. and 5:00 
p.m. in Room 3720, U.S. Department of Commerce, 14th and Constitution 
Avenue NW., Washington, DC.
    Docket Number: 15-001. Applicant: University of Kentucky, 
Lexington, KY 40506-0046. Instrument: Electron Microscope. 
Manufacturer: FEI Company, Czech Republic. Intended

[[Page 6832]]

Use: See notice at 80 FR 2914-15, January 21, 2015.
    Docket Number: 15-029. Applicant: University of California, Irvine, 
Irvine, CA 92697-2575. Instrument: Electron Microscope. Manufacturer: 
JEOL Ltd., Japan. Intended Use: See notice at 80 FR 65984, October 28, 
2015.
    Docket Number: 15-031. Applicant: University of California, Irvine, 
Irvine, CA 92697-2575. Instrument: Electron Microscope. Manufacturer: 
JEOL Ltd., Japan. Intended Use: See notice at 80 FR 65984, October 28, 
2015.
    Docket Number: 15-035. Applicant: Drexel University, Philadelphia, 
PA 19104. Instrument: Electron Microscope. Manufacturer: JEOL Ltd., 
Japan. Intended Use: See notice at 80 FR 65984, October 28, 2015.
    Docket Number: 15-036. Applicant: The Trustees of Princeton 
University, Princeton, NJ 08540. Instrument: Electron Microscope. 
Manufacturer: FEI Czech Republic s.r.o., Czech Republic. Intended Use: 
See notice at 80 FR 65984, October 28, 2015.
    Docket Number: 15-037. Applicant: The Trustees of Princeton 
University, Princeton, NJ 08540. Instrument: Electron Microscope. 
Manufacturer: FEI Electron Optics BV, the Netherlands. Intended Use: 
See notice at 80 FR 65984, October 28, 2015.
    Docket Number: 15-038. Applicant: South Dakota State University, 
Brookings, SD 57007. Instrument: Electron Microscope. Manufacturer: 
JEOL Ltd., Japan. Intended Use: See notice at 80 FR 65984, October 28, 
2015.
    Docket Number: 15-039. Applicant: University of Texas Southwestern 
Medical Center, Dallas, TX 75390. Instrument: Electron Microscope. 
Manufacturer: FEI Company, the Netherlands. Intended Use: See notice at 
80 FR 65984-85, October 28, 2015.
    Docket Number: 15-040. Applicant: UT Battelle, Oak Ridge National 
Laboratory, Oak Ridge TN 37831-6138. Instrument: Electron Microscope. 
Manufacturer: FEI Company, Czech Republic. Intended Use: See notice at 
80 FR 65984-85, October 28, 2015.
    Docket Number: 15-043. Applicant: New York Structural Biology 
Center, New York, NY 10027. Instrument: Electron Microscope. 
Manufacturer: FEI Co., the Netherlands. Intended Use: See notice at 80 
FR 65984-85, October 28, 2015.
    Docket Number: 15-046. Applicant: National Institute for 
Occupational Safety & Health, Morgantown, WV 26505. Instrument: 
Electron Microscope. Manufacturer: JEOL Ltd., Japan. Intended Use: See 
notice at 80 FR 65984-85, October 28, 2015.
    Docket Number: 15-048. Applicant: Battelle/Pacific Northwest 
National Laboratory, Richland, WA 99352. Instrument: Electron 
Microscope. Manufacturer: FEI Co., Czech Republic. Intended Use: See 
notice at 80 FR 79307, December 21, 2015.
    Docket Number: 15-053. Applicant: University of California at San 
Diego, La Jolla, CA 92093-0651. Instrument: Electron Microscope. 
Manufacturer: FEI Company, the Netherlands. Intended Use: See notice at 
80 FR 79307-08, December 21, 2015.
    Comments: None received. Decision: Approved. No instrument of 
equivalent scientific value to the foreign instrument, for such 
purposes as this instrument is intended to be used, is being 
manufactured in the United States at the time the instrument was 
ordered. Reasons: Each foreign instrument is an electron microscope and 
is intended for research or scientific educational uses requiring an 
electron microscope. We know of no electron microscope, or any other 
instrument suited to these purposes, which was being manufactured in 
the United States at the time of order of each instrument.

    Dated: February 3, 2016.
Gregory W. Campbell,
Director, Subsidies Enforcement Office, Enforcement and Compliance.
[FR Doc. 2016-02552 Filed 2-8-16; 8:45 am]
BILLING CODE 3510-DS-P