Application(s) for Duty-Free Entry of Scientific Instruments, 65984-65985 [2015-27459]
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65984
Federal Register / Vol. 80, No. 208 / Wednesday, October 28, 2015 / Notices
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Educational Partnership Program and
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Scholarship Program, Office of
Education, 1315 East-West Highway,
10th Floor, Silver Spring, MD 20910–
3281.
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Willis, National Marine Fisheries
Service Recruitment, Training, Research
Program at the University of Florida,
P.O. Box 110240, Gainesville, FL 32611.
SUPPLEMENTARY INFORMATION: On
September 17, 2015 (80 FR 55829), the
Department of Commerce published a
notice in the Federal Register, entitled
‘‘Notice of Proposed Amendment to
Privacy Act System of Records:
COMMERCE/NOAA–14, Dr. Nancy
Foster Scholarship Program,’’ requesting
comments on proposed amendments to
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the proposed changes to the system as
final without changes effective October
28, 2015.
Dated: October 22, 2015.
Michael J. Toland,
Department of Commerce, Freedom of
Information and Privacy Act Officer.
[FR Doc. 2015–27426 Filed 10–27–15; 8:45 am]
BILLING CODE 3510–22–P
DEPARTMENT OF COMMERCE
International Trade Administration
mstockstill on DSK4VPTVN1PROD with NOTICES
Application(s) for Duty-Free Entry of
Scientific Instruments
Pursuant to Section 6(c) of the
Educational, Scientific and Cultural
Materials Importation Act of 1966 (Pub.
L. 89–651, as amended by Pub. L. 106–
36; 80 Stat. 897; 15 CFR part 301), we
invite comments on the question of
whether instruments of equivalent
scientific value, for the purposes for
which the instruments shown below are
intended to be used, are being
manufactured in the United States.
Comments must comply with 15 CFR
301.5(a)(3) and (4) of the regulations and
be postmarked on or before November
17, 2015. Address written comments to
Statutory Import Programs Staff, Room
VerDate Sep<11>2014
19:16 Oct 27, 2015
Jkt 238001
3720, U.S. Department of Commerce,
Washington, DC 20230. Applications
may be examined between 8:30 a.m. and
5:00 p.m. at the U.S. Department of
Commerce in Room 3720.
Docket Number: 15–029. Applicant:
University of California, Irvine, 816 F
Engineering Tower, Irvine, CA 92697–
2575. Instrument: Electron Microscope.
Manufacturer: JEOL Ltd., Japan.
Intended Use: The instrument will be
used to determine nanoparticle size,
crystal structure, interface and defect
structure, surface structure,
composition, electronic state, bad-gap,
cell structure, magnetic domain
structure, 3D-structure and phase
transformation of various materials such
as metals, ceramics, semiconductors,
superconductors, polymers and cells.
Justification for Duty-Free Entry: There
are no instruments of the same general
category manufactured in the United
States. Application accepted by
Commissioner of Customs: June 12,
2015.
Docket Number: 15–031. Applicant:
University of California, Irvine, 816 F
Engineering Tower, Irvine, CA 92697–
2575. Instrument: Electron Microscope.
Manufacturer: JEOL Ltd., Japan.
Intended Use: The instrument will be
used to determine nanoparticle size,
crystal structure, interface and defect
structure, surface structure,
composition, electronic state, bad-gap,
cell structure, magnetic domain
structure, 3D-structure and phase
transformation of various materials such
as metals, ceramics, semiconductors,
superconductors, polymers and cells.
Justification for Duty-Free Entry: There
are no instruments of the same general
category manufactured in the United
States. Application accepted by
Commissioner of Customs: June 12,
2015.
Docket Number: 15–035. Applicant:
Drexel University, 3141 Chestnut Street,
Philadelphia, PA 19104. Instrument:
Electron Microscope. Manufacturer:
JEOL Ltd., Japan. Intended Use: The
instrument will be used to understand
the structure of metal alloys, polymers,
ceramics, semiconductors and biological
structures and relate this to the material
performance by obtaining structural and
morphological information about the
materials using electron diffraction,
bright field and dark field imaging.
Justification for Duty-Free Entry: There
are no instruments of the same general
category manufactured in the United
States. Application accepted by
Commissioner of Customs: July 20,
2015.
Docket Number: 15–036. Applicant:
The Trustees of Princeton University,
701 Carnegie Center, Princeton, NJ
PO 00000
Frm 00002
Fmt 4703
Sfmt 4703
08540. Instrument: Electron Microscope.
Manufacturer: FEI Czech Republic s.r.o.,
Czech Republic. Intended Use: The
instrument will be used for a wide range
of applications including
microstructural and chemical analysis
of the first hydration products of
cement, using samples prepared by
supercritical drying, to elucidate the
process of strength development and
identify the effects of additives on the
kinetics and microstructure, and the
structural analysis of non-conducting
nanowires used as gas sensors. Free
Entry: There are no instruments of the
same general category manufactured in
the United States. Application accepted
by Commissioner of Customs: July 20,
2015.
Docket Number: 15–037. Applicant:
The Trustees of Princeton University,
701 Carnegie Center, Princeton, NJ
08540. Instrument: Electron Microscope.
Manufacturer: FEI Electron Optics BV,
the Netherlands. Intended Use: The
instrument will be used for research
such as the interfacial atomic structure
of ferromagnetic insulator-topological
insulator heterostructures, using FIB
prepared thin cross-sections, to
elucidate the temperature effect on nearstoichiometric materials which might
lead to the development of spintronic
devices based on the large anomalous
Hall Effect, and the development and
fabrication of uniformly dispersed
nanoparticle-doped chalcogenide glass.
Justification for Duty-Free Entry: There
are no instruments of the same general
category manufactured in the United
States. Application accepted by
Commissioner of Customs: July 30,
2015.
Docket Number: 15–038. Applicant:
South Dakota State University, 1400
North Campus Drive, Agricultural and
Biosystems Engineering Box 2120,
South Dakota State University,
Brookings, South Dakota 57007.
Instrument: Electron Microscope.
Manufacturer: JEOL Ltd., Japan.
Intended Use: The instrument will be
used to develop techniques for stronger,
lighter and cheaper next generation
wind turbine blades by characterizing
internal and interface structure of nanofiber enhanced composites, as well as
other research. Justification for DutyFree Entry: There are no instruments of
the same general category manufactured
in the United States. Application
accepted by Commissioner of Customs:
August 3, 2015.
Docket Number: 15–039. Applicant:
University of Texas Southwestern
Medical Center, 5323 Harry Hines Blvd.,
Dallas, TX 75390. Instrument: Electron
Microscope. Manufacturer: FEI
Company, the Netherlands. Intended
E:\FR\FM\28OCN1.SGM
28OCN1
mstockstill on DSK4VPTVN1PROD with NOTICES
Federal Register / Vol. 80, No. 208 / Wednesday, October 28, 2015 / Notices
Use: The instrument will be used to
learn how imaged proteins and
molecules perform their cellular
functions, using cryo-transmission
electron microscopy. Justification for
Duty-Free Entry: There are no
instruments of the same general
category manufactured in the United
States. Application accepted by
Commissioner of Customs: August 10,
2015.
Docket Number: 15–040. Applicant:
UT Battelle, Oak Ridge National
Laboratory, One Bethel Valley Road,
P.O. Box 2008, Oak Ridge, TN 37831–
6138. Instrument: Electron Microscope.
Manufacturer: FEI Company, Czech
Republic. Intended Use: The instrument
will be used to study metals and
ceramics for nuclear power
applications, using transmission
electron microscopy to study the
evolution of defects in the crystalline
structures of the materials before and
after irradiation. Justification for DutyFree Entry: There are no instruments of
the same general category manufactured
in the United States. Application
accepted by Commissioner of Customs:
August 14, 2015.
Docket Number: 15–041. Applicant:
University of Minnesota, 116 Tate Lab
of Physics, Minneapolis, MN 55455–
0149. Instrument: IVVI Measuring
System with Modules. Manufacturer:
Delft University of Technology, the
Netherlands. Intended Use: The
instrument will be used to uncover
novel quantum properties of certain
semiconductors or superconductors,
such as InAs, GaSb or devices
combining these with superconductors
such As Al and Nb, using highsensitivity electronic current and
voltage measurements. Unique
properties of this instrument include
modular integration of pA sensitivity
ammeter, required to measure very
small electrical currents down to several
pA, low-noise transimpedance
amplifier, required to transform the
electrical currents into voltage signals of
a few mV that can be measured with
conventional laboratory voltmeters, and
low-noise digital-to-analogue converter
and signal switchboxes. The entire
setup is battery-operated and is
programmable via an opticallydecoupled input to minimize electrical
noise interference from electrical power
lines or other instruments. Justification
for Duty-Free Entry: There are no
instruments of the same general
category manufactured in the United
States. Application accepted by
Commissioner of Customs: August 18,
2015.
Docket Number: 15–042. Applicant:
Purdue University, 610 Purdue Mall,
VerDate Sep<11>2014
19:16 Oct 27, 2015
Jkt 238001
West Lafayette, IN 47907. Instrument:
SuperK EXTREME EXR–20 20 MHz
with SuperK VARIA High 50dB with
Power Lock. Manufacturer: NKT
Photonics, Denmark. Intended Use: The
instrument will be used to image tissue
or tissue like materials with high optical
scatter using Optical Diffusion
Tomography (ODT), providing useful
information for the study of biological
and chemical processes. The instrument
has a wide turning range, which is
important for exciting different
fluorophores of interest, providing
specificity to chemical processes, a
short pulse width which is important
for performing time-gated
measurements, high laser power which
is important for obtaining a high SNR
from laser light traveling through
centimeters of tissue or related
scattering medium, and a 20MHz
repetition rate which is important for
time-gated measurements given the
temporal response time of tissue.
Justification for Duty-Free Entry: There
are no instruments of the same general
category manufactured in the United
States. Application accepted by
Commissioner of Customs: September 4,
2015.
Docket Number: 15–043. Applicant:
New York Structural Biology Center, 89
Convent Ave., New York, NY 10027.
Instrument: Electron Microscope.
Manufacturer: FEI Co., the Netherlands.
Intended Use: The instrument will be
used to determine the three-dimensional
structure of biological assemblies to
determine the manner in which they
function and the mechanisms through
which they interact with other cellular
components. Justification for Duty-Free
Entry: There are no instruments of the
same general category manufactured in
the United States. Application accepted
by Commissioner of Customs: August
27, 2015.
Docket Number: 15–045. Applicant:
University of Massachusetts Medical
School, 55 Lake Avenue North,
Worcester, MA 01655. Instrument:
Vitrobot. Manufacturer: FEI Electron
Optics, B.V., the Netherlands. Intended
Use: The instrument will be used to
understand the three-dimensional
structure of purified proteins and
complexes at the atomic level, and how
this is related to their function, by
freezing them, then examining them in
the frozen state in an electron
microscope. The instrument can
precisely control the humidity at any
level, and can also control the
temperature of the chamber, which is
essential to freeze the proteins and
complexes under exactly defined
conditions, which is a requirement for
all of the studies. The specimen remains
PO 00000
Frm 00003
Fmt 4703
Sfmt 4703
65985
in the humidity-controlled environment
until the instant of freezing, which is
essential to prevent any evaporation of
water from the specimen before
freezing. Justification for Duty-Free
Entry: There are no instruments of the
same general category manufactured in
the United States. Application accepted
by Commissioner of Customs:
September 15, 2015.
Docket Number: 15–046. Applicant:
National Institute for Occupational
Safety & Health, 1095 Willowdale Rd.,
Room B104, Morgantown, WV 26505.
Instrument: Electron Microscope.
Manufacturer: JEOL Ltd., Japan.
Intended Use: The instrument will be
used to determine the effects of
exposing animal lung tissues and cells
to particles such as silica and asbestos,
nanoparticles such as carbon nanotubes,
Titanium Dioxide, graphene and
cellulose, in order to make
recommendations to industry as to how
to protect workers from lung disease.
Justification for Duty-Free Entry: There
are no instruments of the same general
category manufactured in the United
States. Application accepted by
Commissioner of Customs: September
28, 2015.
Dated: October 20, 2015.
Gregory W. Campbell,
Director of Subsidies Enforcement,
Enforcement and Compliance.
[FR Doc. 2015–27459 Filed 10–27–15; 8:45 am]
BILLING CODE 3510–DS–P
DEPARTMENT OF COMMERCE
International Trade Administration
[A–475–818]
Certain Pasta From Italy: Notice of
Final Results of Antidumping Duty
Changed Circumstances Review
Enforcement and Compliance,
International Trade Administration,
Department of Commerce.
SUMMARY: On June 23, 2015, the
Department of Commerce (Department)
published the preliminary results of the
changed circumstances review of the
antidumping duty order on certain pasta
from Italy and preliminarily determined
that La Molisana S.p.A. (La Molisana)
was not the successor-in-interest to La
Molisana Industrie Alimentari, S.p.A.
(LMI), a respondent in the investigation
and several administrative reviews.1 We
received comments from interested
AGENCY:
1 See Certain Pasta from Italy: Notice of
Preliminary Results of Antidumping Duty Changed
Circumstances Review, 80 FR 35936 (June 23, 2015)
(Preliminary Results) and accompanying
Preliminary Decision Memorandum.
E:\FR\FM\28OCN1.SGM
28OCN1
Agencies
[Federal Register Volume 80, Number 208 (Wednesday, October 28, 2015)]
[Notices]
[Pages 65984-65985]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 2015-27459]
-----------------------------------------------------------------------
DEPARTMENT OF COMMERCE
International Trade Administration
Application(s) for Duty-Free Entry of Scientific Instruments
Pursuant to Section 6(c) of the Educational, Scientific and
Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended
by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments
on the question of whether instruments of equivalent scientific value,
for the purposes for which the instruments shown below are intended to
be used, are being manufactured in the United States.
Comments must comply with 15 CFR 301.5(a)(3) and (4) of the
regulations and be postmarked on or before November 17, 2015. Address
written comments to Statutory Import Programs Staff, Room 3720, U.S.
Department of Commerce, Washington, DC 20230. Applications may be
examined between 8:30 a.m. and 5:00 p.m. at the U.S. Department of
Commerce in Room 3720.
Docket Number: 15-029. Applicant: University of California, Irvine,
816 F Engineering Tower, Irvine, CA 92697-2575. Instrument: Electron
Microscope. Manufacturer: JEOL Ltd., Japan. Intended Use: The
instrument will be used to determine nanoparticle size, crystal
structure, interface and defect structure, surface structure,
composition, electronic state, bad-gap, cell structure, magnetic domain
structure, 3D-structure and phase transformation of various materials
such as metals, ceramics, semiconductors, superconductors, polymers and
cells. Justification for Duty-Free Entry: There are no instruments of
the same general category manufactured in the United States.
Application accepted by Commissioner of Customs: June 12, 2015.
Docket Number: 15-031. Applicant: University of California, Irvine,
816 F Engineering Tower, Irvine, CA 92697-2575. Instrument: Electron
Microscope. Manufacturer: JEOL Ltd., Japan. Intended Use: The
instrument will be used to determine nanoparticle size, crystal
structure, interface and defect structure, surface structure,
composition, electronic state, bad-gap, cell structure, magnetic domain
structure, 3D-structure and phase transformation of various materials
such as metals, ceramics, semiconductors, superconductors, polymers and
cells. Justification for Duty-Free Entry: There are no instruments of
the same general category manufactured in the United States.
Application accepted by Commissioner of Customs: June 12, 2015.
Docket Number: 15-035. Applicant: Drexel University, 3141 Chestnut
Street, Philadelphia, PA 19104. Instrument: Electron Microscope.
Manufacturer: JEOL Ltd., Japan. Intended Use: The instrument will be
used to understand the structure of metal alloys, polymers, ceramics,
semiconductors and biological structures and relate this to the
material performance by obtaining structural and morphological
information about the materials using electron diffraction, bright
field and dark field imaging. Justification for Duty-Free Entry: There
are no instruments of the same general category manufactured in the
United States. Application accepted by Commissioner of Customs: July
20, 2015.
Docket Number: 15-036. Applicant: The Trustees of Princeton
University, 701 Carnegie Center, Princeton, NJ 08540. Instrument:
Electron Microscope. Manufacturer: FEI Czech Republic s.r.o., Czech
Republic. Intended Use: The instrument will be used for a wide range of
applications including microstructural and chemical analysis of the
first hydration products of cement, using samples prepared by
supercritical drying, to elucidate the process of strength development
and identify the effects of additives on the kinetics and
microstructure, and the structural analysis of non-conducting nanowires
used as gas sensors. Free Entry: There are no instruments of the same
general category manufactured in the United States. Application
accepted by Commissioner of Customs: July 20, 2015.
Docket Number: 15-037. Applicant: The Trustees of Princeton
University, 701 Carnegie Center, Princeton, NJ 08540. Instrument:
Electron Microscope. Manufacturer: FEI Electron Optics BV, the
Netherlands. Intended Use: The instrument will be used for research
such as the interfacial atomic structure of ferromagnetic insulator-
topological insulator heterostructures, using FIB prepared thin cross-
sections, to elucidate the temperature effect on near-stoichiometric
materials which might lead to the development of spintronic devices
based on the large anomalous Hall Effect, and the development and
fabrication of uniformly dispersed nanoparticle-doped chalcogenide
glass. Justification for Duty-Free Entry: There are no instruments of
the same general category manufactured in the United States.
Application accepted by Commissioner of Customs: July 30, 2015.
Docket Number: 15-038. Applicant: South Dakota State University,
1400 North Campus Drive, Agricultural and Biosystems Engineering Box
2120, South Dakota State University, Brookings, South Dakota 57007.
Instrument: Electron Microscope. Manufacturer: JEOL Ltd., Japan.
Intended Use: The instrument will be used to develop techniques for
stronger, lighter and cheaper next generation wind turbine blades by
characterizing internal and interface structure of nano-fiber enhanced
composites, as well as other research. Justification for Duty-Free
Entry: There are no instruments of the same general category
manufactured in the United States. Application accepted by Commissioner
of Customs: August 3, 2015.
Docket Number: 15-039. Applicant: University of Texas Southwestern
Medical Center, 5323 Harry Hines Blvd., Dallas, TX 75390. Instrument:
Electron Microscope. Manufacturer: FEI Company, the Netherlands.
Intended
[[Page 65985]]
Use: The instrument will be used to learn how imaged proteins and
molecules perform their cellular functions, using cryo-transmission
electron microscopy. Justification for Duty-Free Entry: There are no
instruments of the same general category manufactured in the United
States. Application accepted by Commissioner of Customs: August 10,
2015.
Docket Number: 15-040. Applicant: UT Battelle, Oak Ridge National
Laboratory, One Bethel Valley Road, P.O. Box 2008, Oak Ridge, TN 37831-
6138. Instrument: Electron Microscope. Manufacturer: FEI Company, Czech
Republic. Intended Use: The instrument will be used to study metals and
ceramics for nuclear power applications, using transmission electron
microscopy to study the evolution of defects in the crystalline
structures of the materials before and after irradiation. Justification
for Duty-Free Entry: There are no instruments of the same general
category manufactured in the United States. Application accepted by
Commissioner of Customs: August 14, 2015.
Docket Number: 15-041. Applicant: University of Minnesota, 116 Tate
Lab of Physics, Minneapolis, MN 55455-0149. Instrument: IVVI Measuring
System with Modules. Manufacturer: Delft University of Technology, the
Netherlands. Intended Use: The instrument will be used to uncover novel
quantum properties of certain semiconductors or superconductors, such
as InAs, GaSb or devices combining these with superconductors such As
Al and Nb, using high-sensitivity electronic current and voltage
measurements. Unique properties of this instrument include modular
integration of pA sensitivity ammeter, required to measure very small
electrical currents down to several pA, low-noise transimpedance
amplifier, required to transform the electrical currents into voltage
signals of a few mV that can be measured with conventional laboratory
voltmeters, and low-noise digital-to-analogue converter and signal
switchboxes. The entire setup is battery-operated and is programmable
via an optically-decoupled input to minimize electrical noise
interference from electrical power lines or other instruments.
Justification for Duty-Free Entry: There are no instruments of the same
general category manufactured in the United States. Application
accepted by Commissioner of Customs: August 18, 2015.
Docket Number: 15-042. Applicant: Purdue University, 610 Purdue
Mall, West Lafayette, IN 47907. Instrument: SuperK EXTREME EXR-20 20
MHz with SuperK VARIA High 50dB with Power Lock. Manufacturer: NKT
Photonics, Denmark. Intended Use: The instrument will be used to image
tissue or tissue like materials with high optical scatter using Optical
Diffusion Tomography (ODT), providing useful information for the study
of biological and chemical processes. The instrument has a wide turning
range, which is important for exciting different fluorophores of
interest, providing specificity to chemical processes, a short pulse
width which is important for performing time-gated measurements, high
laser power which is important for obtaining a high SNR from laser
light traveling through centimeters of tissue or related scattering
medium, and a 20MHz repetition rate which is important for time-gated
measurements given the temporal response time of tissue. Justification
for Duty-Free Entry: There are no instruments of the same general
category manufactured in the United States. Application accepted by
Commissioner of Customs: September 4, 2015.
Docket Number: 15-043. Applicant: New York Structural Biology
Center, 89 Convent Ave., New York, NY 10027. Instrument: Electron
Microscope. Manufacturer: FEI Co., the Netherlands. Intended Use: The
instrument will be used to determine the three-dimensional structure of
biological assemblies to determine the manner in which they function
and the mechanisms through which they interact with other cellular
components. Justification for Duty-Free Entry: There are no instruments
of the same general category manufactured in the United States.
Application accepted by Commissioner of Customs: August 27, 2015.
Docket Number: 15-045. Applicant: University of Massachusetts
Medical School, 55 Lake Avenue North, Worcester, MA 01655. Instrument:
Vitrobot. Manufacturer: FEI Electron Optics, B.V., the Netherlands.
Intended Use: The instrument will be used to understand the three-
dimensional structure of purified proteins and complexes at the atomic
level, and how this is related to their function, by freezing them,
then examining them in the frozen state in an electron microscope. The
instrument can precisely control the humidity at any level, and can
also control the temperature of the chamber, which is essential to
freeze the proteins and complexes under exactly defined conditions,
which is a requirement for all of the studies. The specimen remains in
the humidity-controlled environment until the instant of freezing,
which is essential to prevent any evaporation of water from the
specimen before freezing. Justification for Duty-Free Entry: There are
no instruments of the same general category manufactured in the United
States. Application accepted by Commissioner of Customs: September 15,
2015.
Docket Number: 15-046. Applicant: National Institute for
Occupational Safety & Health, 1095 Willowdale Rd., Room B104,
Morgantown, WV 26505. Instrument: Electron Microscope. Manufacturer:
JEOL Ltd., Japan. Intended Use: The instrument will be used to
determine the effects of exposing animal lung tissues and cells to
particles such as silica and asbestos, nanoparticles such as carbon
nanotubes, Titanium Dioxide, graphene and cellulose, in order to make
recommendations to industry as to how to protect workers from lung
disease. Justification for Duty-Free Entry: There are no instruments of
the same general category manufactured in the United States.
Application accepted by Commissioner of Customs: September 28, 2015.
Dated: October 20, 2015.
Gregory W. Campbell,
Director of Subsidies Enforcement, Enforcement and Compliance.
[FR Doc. 2015-27459 Filed 10-27-15; 8:45 am]
BILLING CODE 3510-DS-P