Harvard University, et al.; Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscope, 24236 [2015-10132]

Download as PDF 24236 Federal Register / Vol. 80, No. 83 / Thursday, April 30, 2015 / Notices mstockstill on DSK4VPTVN1PROD with NOTICES The modification clarifies that parties may request an extension of time limits before a time limit established under Part 351 expires, or as otherwise specified by the Secretary. In general, an extension request will be considered untimely if it is filed after the time limit established under Part 351 expires. For submissions which are due from multiple parties simultaneously, an extension request will be considered untimely if it is filed after 10:00 a.m. on the due date. Examples include, but are not limited to: (1) Case and rebuttal briefs, filed pursuant to 19 CFR 351.309; (2) factual information to value factors under 19 CFR 351.408(c), or to measure the adequacy of remuneration under 19 CFR 351.511(a)(2), filed pursuant to 19 CFR 351.301(c)(3) and rebuttal, clarification and correction filed pursuant to 19 CFR 351.301(c)(3)(iv); (3) comments concerning the selection of a surrogate country and surrogate values and rebuttal; (4) comments concerning U.S. Customs and Border Protection data; and (5) quantity and value questionnaires. Under certain circumstances, the Department may elect to specify a different time limit by which extension requests will be considered untimely for submissions which are due from multiple parties simultaneously. In such a case, the Department will inform parties in the letter or memorandum setting forth the deadline (including a specified time) by which extension requests must be filed to be considered timely. This modification also requires that an extension request must be made in a separate, stand-alone submission, and clarifies the circumstances under which the Department will grant untimelyfiled requests for the extension of time limits. These modifications are effective for all segments initiated on or after October 21, 2013. Please review the final rule, available at http:// www.gpo.gov/fdsys/pkg/FR-2013-09-20/ html/2013-22853.htm, prior to submitting factual information in these segments. These initiations and this notice are in accordance with section 751(a) of the Act (19 U.S.C. 1675(a)) and 19 CFR 351.221(c)(1)(i). Dated: April 24, 2015. Christian Marsh, Deputy Assistant Secretary for Antidumping and Countervailing Duty Operations. [FR Doc. 2015–10134 Filed 4–29–15; 8:45 am] BILLING CODE 3510–DS–P VerDate Sep<11>2014 17:01 Apr 29, 2015 Jkt 235001 DEPARTMENT OF COMMERCE International Trade Administration Harvard University, et al.; Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscope This is a decision consolidated pursuant to Section 6(c) of the Educational, Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89–651, as amended by Pub. L. 106– 36; 80 Stat. 897; 15 CFR part 301). Related records can be viewed between 8:30 a.m. and 5:00 p.m. in Room 3720, U.S. Department of Commerce, 14th and Constitution Avenue NW., Washington, DC. Docket Number: 14–031. Applicant: Harvard University, Cambridge, MA 02138. Instrument: Electron Microscope. Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 80 FR 2914– 15, January 21, 2015. Docket Number: 14–033. Applicant: University of South Carolina School of Medicine, Columbia, SC 29208. Instrument: Electron Microscope. Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 80 FR 2914– 15, January 21, 2015. Docket Number: 14–036. Applicant: University of Michigan, Ann Arbor, MI 48109–2200. Instrument: Electron Microscope. Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 80 FR 2914–15, January 21, 2015. Docket Number: 14–037. Applicant: University of Arizona, Tucson, AZ 85721. Instrument: Electron Microscope. Manufacturer: FEI Company, Czech Republic. Intended Use: See notice at 80 FR 2914–15, January 21, 2015. Docket Number: 14–038. Applicant: University of North Dakota, Grand Forks, ND 58202–8153. Instrument: Electron Microscope. Manufacturer: FEI Company, Czech Republic. Intended Use: See notice at 80 FR 2914–15, January 21, 2015. Comments: None received. Decision: Approved. No instrument of equivalent scientific value to the foreign instrument, for such purposes as this instrument is intended to be used, is being manufactured in the United States at the time the instrument was ordered. Reasons: Each foreign instrument is an electron microscope and is intended for research or scientific educational uses requiring an electron microscope. We know of no electron microscope, or any other instrument suited to these purposes, which was being manufactured in the United States at the time of order of each instrument. PO 00000 Frm 00007 Fmt 4703 Sfmt 4703 Dated: April 24, 2015. Gregory W. Campbell, Director, Subsidies Enforcement Office, Enforcement and Compliance. [FR Doc. 2015–10132 Filed 4–29–15; 8:45 am] BILLING CODE 3510–DS–P DEPARTMENT OF COMMERCE International Trade Administration New Mexico Institute of Mining and Technology, et al.; Notice of Decision on Application for Duty-Free Entry of Scientific Instruments This is a decision pursuant to Section 6(c) of the Educational, Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89–651, as amended by Pub. L. 106–36; 80 Stat. 897; 15 CFR part 301). Related records can be viewed between 8:30 a.m. and 5:00 p.m. in Room 3720, U.S. Department of Commerce, 14th and Constitution Ave. NW., Washington, DC. Docket Number: 14–032. Applicant: New Mexico Institute of Mining and Technology, Socorro, NM 87801. Instrument: Delay Line Trolley (DLT). Manufacturer: University of Cambridge/ Cavendish Lab, United Kingdom. Intended Use: See notice at 80 FR 2914– 15, January 21, 2015. Comments: None received. Decision: Approved. We know of no instruments of equivalent scientific value to the foreign instruments described below, for such purposes as this is intended to be used, that was being manufactured in the United States at the time of order. Reasons: The instrument will be used within the Magdalena Ridge Observatory Interferometer (MROI) to equalize path lengths traveled by the light from a target object, via the telescopes, to the point where interference takes place, by acting as a continuously movable retro-reflector. Each trolley moves continuously within an evacuated pipe in order to introduce the optical path delay appropriate for the target, time of observation, and inter-telescope separations in use. For most of the sky to be accessible, a delay range approximately equal to the longest inter-telescope separation must be available, requiring an unprecedented monolithic delay line length of almost 200m. The instrument is essentially a cat’s-eye assembly that is flexuremounted and voice coil actuated on a motorized wheeled carriage, which runs directly on the inner surface of the delay line pipe, not on pre-installed rails. Its position is precisely measured by a laser metrology system and computer controlled so as to introduce the E:\FR\FM\30APN1.SGM 30APN1

Agencies

[Federal Register Volume 80, Number 83 (Thursday, April 30, 2015)]
[Notices]
[Page 24236]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 2015-10132]


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DEPARTMENT OF COMMERCE

International Trade Administration


Harvard University, et al.; Notice of Consolidated Decision on 
Applications for Duty-Free Entry of Electron Microscope

    This is a decision consolidated pursuant to Section 6(c) of the 
Educational, Scientific, and Cultural Materials Importation Act of 1966 
(Pub. L. 89-651, as amended by Pub. L. 106-36; 80 Stat. 897; 15 CFR 
part 301). Related records can be viewed between 8:30 a.m. and 5:00 
p.m. in Room 3720, U.S. Department of Commerce, 14th and Constitution 
Avenue NW., Washington, DC.
    Docket Number: 14-031. Applicant: Harvard University, Cambridge, MA 
02138. Instrument: Electron Microscope.
    Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 80 FR 
2914-15, January 21, 2015.
    Docket Number: 14-033. Applicant: University of South Carolina 
School of Medicine, Columbia, SC 29208. Instrument: Electron 
Microscope.
    Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 80 FR 
2914-15, January 21, 2015.
    Docket Number: 14-036. Applicant: University of Michigan, Ann 
Arbor, MI 48109-2200. Instrument: Electron Microscope. Manufacturer: 
JEOL Ltd., Japan. Intended Use: See notice at 80 FR 2914-15, January 
21, 2015.
    Docket Number: 14-037. Applicant: University of Arizona, Tucson, AZ 
85721. Instrument: Electron Microscope. Manufacturer: FEI Company, 
Czech Republic. Intended Use: See notice at 80 FR 2914-15, January 21, 
2015.
    Docket Number: 14-038. Applicant: University of North Dakota, Grand 
Forks, ND 58202-8153. Instrument: Electron Microscope. Manufacturer: 
FEI Company, Czech Republic.
    Intended Use: See notice at 80 FR 2914-15, January 21, 2015.
    Comments: None received. Decision: Approved. No instrument of 
equivalent scientific value to the foreign instrument, for such 
purposes as this instrument is intended to be used, is being 
manufactured in the United States at the time the instrument was 
ordered. Reasons: Each foreign instrument is an electron microscope and 
is intended for research or scientific educational uses requiring an 
electron microscope. We know of no electron microscope, or any other 
instrument suited to these purposes, which was being manufactured in 
the United States at the time of order of each instrument.

    Dated: April 24, 2015.
Gregory W. Campbell,
Director, Subsidies Enforcement Office, Enforcement and Compliance.
[FR Doc. 2015-10132 Filed 4-29-15; 8:45 am]
 BILLING CODE 3510-DS-P