Application(s) for Duty-Free Entry of Scientific Instruments, 2914-2916 [2015-00936]
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2914
Federal Register / Vol. 80, No. 13 / Wednesday, January 21, 2015 / Notices
SUMMER FOOD SERVICE PROGRAM OPERATING COMPONENT OF 2015 REIMBURSEMENT RATES
All states except Alaska
and Hawaii
Operating rates in U.S. dollars, rounded down to the nearest whole cent
Breakfast ......................................................................................................................................
Lunch or Supper ..........................................................................................................................
Snack ...........................................................................................................................................
Administrative Rates
The administrative cost component of
the reimbursement is authorized under
section 13(b)(3) of the NSLA, 42 U.S.C.
Alaska
1.89
3.30
0.77
1761(b)(3). Rates are higher for sponsors
of sites located in rural areas and for
‘‘self-prep’’ sponsors that prepare their
own meals, at the SFSP site or at a
central facility, instead of purchasing
Hawaii
3.07
5.35
1.25
2.21
3.86
0.90
them from vendors. The administrative
portion of SFSP rates are adjusted,
either up or down, to the nearest
quarter-cent.
SUMMER FOOD SERVICE PROGRAM ADMINISTRATIVE COMPONENT OF 2015 REIMBURSEMENT RATES
Administrative rates in U.S. dollars, adjusted, up or down, to the nearest quarter-cent
All states except Alaska and
Hawaii
Rural or selfprep sites
Breakfast ..................................................
Lunch or Supper ......................................
Snack .......................................................
0.1875
0.3450
0.0950
Authority: Sections 9, 13, and 14, Richard
B. Russell National School Lunch Act, 42
U.S.C. 1758, 1761, and 1762a, respectively.
Dated: January 14, 2015.
Audrey Rowe,
Administrator.
[FR Doc. 2015–00877 Filed 1–20–15; 8:45 am]
BILLING CODE 3410–30–P
DEPARTMENT OF COMMERCE
Foreign-Trade Zones Board
[S–3–2015]
asabaliauskas on DSK5VPTVN1PROD with NOTICES
Foreign-Trade Zone 245—Decatur,
Illinois, Application for Subzone,
Thyssenkrupp Presta Danville, LLC,
Danville, Illinois
An application has been submitted to
the Foreign-Trade Zones Board (the
Board) by the Economic Development
Corporation of Decatur & Macon
County, grantee of FTZ 245, requesting
subzone status for the facility of
Thyssenkrupp Presta Danville, LLC
(Thyssenkrupp Presta), located in
Danville, Illinois. The application was
submitted pursuant to the provisions of
the Foreign-Trade Zones Act, as
amended (19 U.S.C. 81a–81u), and the
regulations of the Board (15 CFR part
400). It was formally docketed on
January 14, 2015.
The proposed subzone (42.6 acres) is
located at 75 Walz Creek Drive,
Danville, Vermilion County. The
applicant has indicated that a
notification of proposed production
VerDate Sep<11>2014
17:50 Jan 20, 2015
Jkt 235001
All other types
of sites
Alaska
Rural or selfprep sites
0.1475
0.2875
0.0750
FOR FURTHER INFORMATION CONTACT:
Elizabeth Whiteman at
Elizabeth.Whiteman@trade.gov or (202)
482–0473.
Frm 00003
Fmt 4703
Sfmt 4703
All other types
of sites
0.3050
0.5600
0.1525
activity will be submitted. Any such
notification will be published separately
for public comment. The proposed
subzone would be subject to the existing
activation limit of FTZ 245.
In accordance with the Board’s
regulations, Elizabeth Whiteman of the
FTZ Staff is designated examiner to
review the application and make
recommendations to the Executive
Secretary.
Public comment is invited from
interested parties. Submissions shall be
addressed to the Board’s Executive
Secretary at the address below. The
closing period for their receipt is March
2, 2015. Rebuttal comments in response
to material submitted during the
foregoing period may be submitted
during the subsequent 15-day period to
March 17, 2015.
A copy of the application will be
available for public inspection at the
Office of the Executive Secretary,
Foreign-Trade Zones Board, Room
21013, U.S. Department of Commerce,
1401 Constitution Avenue NW.,
Washington, DC 20230–0002, and in the
‘‘Reading Room’’ section of the Board’s
Web site, which is accessible via
www.trade.gov/ftz.
PO 00000
Hawaii
Rural or selfprep sites
0.2400
0.4650
0.1200
All other types
of sites
0.2200
0.4050
0.1100
0.1725
0.3350
0.0875
Dated: January 14, 2015.
Andrew McGilvray,
Executive Secretary.
[FR Doc. 2015–00937 Filed 1–20–15; 8:45 am]
BILLING CODE 3510–DS–P
DEPARTMENT OF COMMERCE
International Trade Administration
Application(s) for Duty-Free Entry of
Scientific Instruments
Pursuant to Section 6(c) of the
Educational, Scientific and Cultural
Materials Importation Act of 1966 (Pub.
L. 89–651, as amended by Pub. L. 106–
36; 80 Stat. 897; 15 CFR part 301), we
invite comments on the question of
whether instruments of equivalent
scientific value, for the purposes for
which the instruments shown below are
intended to be used, are being
manufactured in the United States.
Comments must comply with 15 CFR
301.5(a)(3) and (4) of the regulations and
be postmarked on or before February 10,
2015. Address written comments to
Statutory Import Programs Staff, Room
3720, U.S. Department of Commerce,
Washington, DC 20230. Applications
may be examined between 8:30 a.m. and
5:00 p.m. at the U.S. Department of
Commerce in Room 3720.
Docket Number: 14–031. Applicant:
Harvard University, 11 Oxford St.,
Cambridge, MA 02138. Instrument:
Electron Microscope. Manufacturer:
JEOL Ltd., Japan. Intended Use: The
instrument will be used to examine the
E:\FR\FM\21JAN1.SGM
21JAN1
asabaliauskas on DSK5VPTVN1PROD with NOTICES
Federal Register / Vol. 80, No. 13 / Wednesday, January 21, 2015 / Notices
properties of materials and physics
associated with nanoscale materials
systems, such as semi-conducting
systems found in computers and
electronic devices fabricated from
carbon, silicon, silicon-oxide,
germanium and metals such as copper,
gold, platinum, aluminum, aluminum
oxide and ruthenium. The properties
studied will include materials
composition chemical analysis,
electronic band structure, density of
states and dopant atoms distribution.
Justification for Duty-Free Entry: There
are no instruments of the same general
category manufactured in the United
States. Application accepted by
Commissioner of Customs: November
17, 2014.
Docket Number: 14–032. Applicant:
New Mexico Institute of Mining and
Technology, 801 Leroy Place, Socorro,
NM 87801. Instrument: DelayLine
Trolley (DLT). Manufacturer: University
of Cambridge/Cavendish Lab, United
Kingdom. Intended Use: The instrument
will be used within the Magdalena
Ridge Observatory Interferometer
(MROI) to equalize path lengths traveled
by the light from a target object, via the
telescopes, to the point where
interference takes place, by acting as a
continuously movable retro-reflector.
Each trolley moves continuously within
an evacuated pipe in order to introduce
the optical path delay appropriate for
the target, time of observation, and
inter-telescope separations in use. For
most of the sky to be accessible, a delay
range approximately equal to the longest
inter-telescope separation must be
available, requiring an unprecedented
monolithic delay line length of almost
200m. The instrument is essentially a
cat’s-eye assembly that is flexuremounted and voice coil actuated on a
motorized wheeled carriage, which runs
directly on the inner surface of the delay
line pipe, not on pre-installed rails. Its
position is precisely measured by a laser
metrology system and computer
controlled so as to introduce the
appropriate optical path compensation
as a function of time. The following
specifications are required for the
research: a focus on model-independent
imaging as opposed to astrometric or
precision phase or visibility
measurement, a wavelength of operation
that covers both the visible and near
infrared, between 600 nm and 2400 nm,
accommodation for baseline lengths as
long as 250m, a concern for polarization
fidelity in the image, and a requirement
to reach a limiting group-delay tracking
magnitude of H=14 to allow
observations of extragalactic targets
while tracking on the science object
VerDate Sep<11>2014
17:50 Jan 20, 2015
Jkt 235001
rather than a nearby reference star.
Justification for Duty-Free Entry: There
are no instruments of the same general
category manufactured in the United
States. Application accepted by
Commissioner of Customs: November
14, 2014.
Docket Number: 14–033. Applicant:
University of South Carolina School of
Medicine, 6439 Garner’s Ferry Road,
Columbia, SC 29208. Instrument:
Electron Microscope. Manufacturer:
JEOL Ltd., Japan. Intended Use: The
instrument will be used to examine the
ultrastructural changes in cells and
tissues in response to a disease process
and subsequent treatment of the disease
through a variety of protocols, in
biomedical research samples such as
heart, colon, and skeletal muscle, to
study cardiovascular disease, cancer
and inflammation. Justification for
Duty-Free Entry: There are no
instruments of the same general
category manufactured in the United
States. Application accepted by
Commissioner of Customs: November
26, 2014.
Docket Number: 14–034. Applicant:
National Institutes of Health, 50 South
Dr., Bldg. 50, Rm. 1517, Bethesda, MD
20892–8025. Instrument: Falcon II
Direct Detection Camera. Manufacturer:
FEI Company, the Netherlands.
Intended Use: The instrument will be
used in cryo-electron microscopy
experiments, to visualize biological
specimens suspended in vitreous ice
involving recording electron
micrographs of the highest possible
quality and subjecting them to digital
image analysis to elicit the maximum
amount of structural information and
interpretation, taking into account all
pertinent complimentary data. Sensor
specifications required for this research
include a pixel size of ∼14 mm which
predicates a magnification of ∼100 kx,
optimal performance as measured by
Detective Quantum Efficiency at a
typical dose rate of 10–20 e/pixel/
second, and protection of the sensor
against accidental high-dose exposures
to the microscope’s electron beam.
Justification for Duty-Free Entry: There
are no instruments of the same general
category manufactured in the United
States. Application accepted by
Commissioner of Customs: December
19, 2014.
Docket Number: 14–036. Applicant:
University of Michigan, 109 Zina
Pitcher Place, Ann Arbor, Michigan
48109–2200. Instrument: Electron
Microscope. Manufacturer: JEOL Ltd.,
Japan. Intended Use: The instrument
will be used to study tissue and cells to
assist in the understanding of cancer
cells, morphology, and general
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2915
histochemical analysis, using diffraction
analysis of organic compounds.
Justification for Duty-Free Entry: There
are no instruments of the same general
category manufactured in the United
States. Application accepted by
Commissioner of Customs: December
19, 2014.
Docket Number: 14–037. Applicant:
University of Arizona, 1629 E.
University Blvd., Tucson, AZ 85721.
Instrument: Electron Microscope.
Manufacturer: FEI Company, Czech
Republic. Intended Use: The instrument
will be used to characterize the
structural and compositional properties
of a wide variety of materials including
meteorites, samples of the moon, solar
cell structures, polymers, thin-film
semiconductors and other
technologically relevant materials, in
order to determine the origins of our
solar system and the moon and the
underlying physics of technologically
relevant materials for solar cells and
optical devices. Justification for DutyFree Entry: There are no instruments of
the same general category manufactured
in the United States. Application
accepted by Commissioner of Customs:
December 19, 2014.
Docket Number: 14–038. Applicant:
University of North Dakota, 243
Centennial Drive, Stop 8153, Grand
Forks, ND 58202–8153. Instrument:
Electron Microscope. Manufacturer: FEI
Company, Czech Republic. Intended
Use: The instrument will be used to
understand ore mineralogy and texture
from upstream ore characterization and
metallurgical testing to mineral and
drilling processing, as well as to create
digital mineral and texture maps of
cores, rocks, soil and sediment. The
instrument will provide surficial topomorphological image analysis, lithotype,
porosity characteristics and texture
properties, accompanying quantitative
chemical composition analysis made
possible by the equipped EDS detector.
Justification for Duty-Free Entry: There
are no instruments of the same general
category manufactured in the United
States. Application accepted by
Commissioner of Customs: December
23, 2014.
Docket Number: 15–001. Applicant:
University of Kentucky, 177 Anderson
Tower, Lexington, KY 40506–0046.
Instrument: Electron Microscope.
Manufacturer: FEI Company, Czech
Republic. Intended Use: The instrument
will be used to characterize the
structure and morphology of materials
such as metals and alloys, ceramic
materials, polymers, and biological
samples. The instrument includes a
Focused Ion Beam (FIB) column for
milling away material and achieving
E:\FR\FM\21JAN1.SGM
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2916
Federal Register / Vol. 80, No. 13 / Wednesday, January 21, 2015 / Notices
high spatial precision (2.5nm resolution
for the FIB beam), as well as cutting
cross-sectional trenches into samples for
characterization of the internal
structure. Justification for Duty-Free
Entry: There are no instruments of the
same general category manufactured in
the United States. Application accepted
by Commissioner of Customs: January 5,
2015.
Dated: January 13, 2015.
Gregory W. Campbell,
Director of Subsidies Enforcement,
Enforcement and Compliance.
[FR Doc. 2015–00936 Filed 1–20–15; 8:45 am]
BILLING CODE 3510–DS–P
DEPARTMENT OF COMMERCE
National Oceanic and Atmospheric
Administration
Proposed Information Collection;
Comment Request; STORMREADY®,
STORMREADY/TSUNAMIREADYTM,
AND STORMREADY® SUPPORTER
Application Forms
National Oceanic and
Atmospheric Administration (NOAA),
Commerce.
ACTION: Notice.
AGENCY:
The Department of
Commerce, as part of its continuing
effort to reduce paperwork and
respondent burden, invites the general
public and other Federal agencies to
take this opportunity to comment on
proposed and/or continuing information
collections, as required by the
Paperwork Reduction Act of 1995.
DATES: Written comments must be
submitted on or before March 23, 2015.
ADDRESSES: Direct all written comments
to Jennifer Jessup, Departmental
Paperwork Clearance Officer,
Department of Commerce, Room 6616,
14th and Constitution Avenue NW.,
Washington, DC 20230 (or via the
Internet at JJessup@doc.gov).
FOR FURTHER INFORMATION CONTACT:
Requests for additional information or
copies of the information collection
instrument and instructions should be
directed to Donna Franklin, (301) 427–
9305 or chris.maier@noaa.gov.
SUPPLEMENTARY INFORMATION:
asabaliauskas on DSK5VPTVN1PROD with NOTICES
SUMMARY:
I. Abstract
StormReady and TsunamiReady are
voluntary programs offered as a means
of providing guidance and incentive to
officials interested in improving their
respective hazardous weather
operations. The StormReady
Application Form, Tsunami-Ready
VerDate Sep<11>2014
17:50 Jan 20, 2015
Jkt 235001
Application Form and TsunamiReady/
StormReady Application Form are used
by localities to apply for initial
StormReady or TsunamiReady and
StormReady recognition and renewal of
that recognition every six years. The
government will use the information
collected to determine whether a
community has met all of the criteria to
receive StormReady and/or
TsunamiReady recognition. In addition,
businesses, schools, non-profit
organizations and other nongovernmental entities often establish
severe weather safety plans and actively
promote severe weather safety
awareness activities but may not have
the resources necessary to fulfill all the
eligibility requirements to achieve the
full StormReady recognition. These
entities may apply through the
StormReady Supporter program for
recognition.
II. Method of Collection
Applications may be faxed, mailed or
emailed.
III. Data
OMB Control Number: 0648–0419.
Form Number(s): None.
Type of Review: Regular submission
(extension of a currently approved
information collection).
Affected Public: Business or other forprofit organizations; not for profit
institutions; state, local and tribal
governments.
Estimated Number of Respondents:
265.
Estimated Time per Response: Initial
applications, 2 hours; renewal
applications, 1 hour.
Estimated Total Annual Burden
Hours: 505.
Estimated Total Annual Cost to
Public: $130 in recordkeeping/reporting
costs.
IV. Request for Comments
Comments are invited on: (a) Whether
the proposed collection of information
is necessary for the proper performance
of the functions of the agency, including
whether the information shall have
practical utility; (b) the accuracy of the
agency’s estimate of the burden
(including hours and cost) of the
proposed collection of information; (c)
ways to enhance the quality, utility, and
clarity of the information to be
collected; and (d) ways to minimize the
burden of the collection of information
on respondents, including through the
use of automated collection techniques
or other forms of information
technology.
Comments submitted in response to
this notice will be summarized and/or
PO 00000
Frm 00005
Fmt 4703
Sfmt 4703
included in the request for OMB
approval of this information collection;
they also will become a matter of public
record.
Dated: January 15, 2015.
Glenna Mickelson,
Management Analyst, Office of the Chief
Information Officer.
[FR Doc. 2015–00888 Filed 1–20–15; 8:45 am]
BILLING CODE 3510–KE–P
DEPARTMENT OF COMMERCE
National Oceanic and Atmospheric
Administration
RIN 0648–XD457
Atlantic Highly Migratory Species;
Atlantic Shark Management Measures;
2015 Research Fishery
National Marine Fisheries
Service (NMFS), National Oceanic and
Atmospheric Administration (NOAA),
Commerce.
ACTION: Notice of intent; request for
applications.
AGENCY:
NMFS announces its second
request for applications for the 2015
shark research fishery from commercial
shark fishermen with directed or
incidental shark limited access permits.
In this second request, NMFS is
specifically requesting applications only
from commercial shark fishermen who
are fishing or plan to fish in the Gulf of
Mexico fishing region. The shark
research fishery allows for the collection
of fishery-dependent and biological data
for future stock assessments to meet the
shark research objectives of the Agency.
The only commercial vessels authorized
to land sandbar sharks are those
participating in the shark research
fishery. Shark research fishery
permittees may also land other large
coastal sharks (LCS), small coastal
sharks (SCS), and pelagic sharks.
Commercial shark fishermen who are
interested in participating in the shark
research fishery need to submit a
completed Shark Research Fishery
Permit Application in order to be
considered.
DATES: Shark Research Fishery
Applications must be received no later
than 5 p.m., local time, on February 5,
2015.
ADDRESSES: Please submit completed
applications to the HMS Management
Division at:
´
• Mail: Attn: Guy DuBeck, HMS
Management Division (F/SF1), NMFS,
1315 East-West Highway, Silver Spring,
MD 20910.
• Fax: (301) 713–1917.
SUMMARY:
E:\FR\FM\21JAN1.SGM
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]]>Agencies
[Federal Register Volume 80, Number 13 (Wednesday, January 21, 2015)]
[Notices]
[Pages 2914-2916]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: 2015-00936]
-----------------------------------------------------------------------
DEPARTMENT OF COMMERCE
International Trade Administration
Application(s) for Duty-Free Entry of Scientific Instruments
Pursuant to Section 6(c) of the Educational, Scientific and
Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended
by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments
on the question of whether instruments of equivalent scientific value,
for the purposes for which the instruments shown below are intended to
be used, are being manufactured in the United States.
Comments must comply with 15 CFR 301.5(a)(3) and (4) of the
regulations and be postmarked on or before February 10, 2015. Address
written comments to Statutory Import Programs Staff, Room 3720, U.S.
Department of Commerce, Washington, DC 20230. Applications may be
examined between 8:30 a.m. and 5:00 p.m. at the U.S. Department of
Commerce in Room 3720.
Docket Number: 14-031. Applicant: Harvard University, 11 Oxford
St., Cambridge, MA 02138. Instrument: Electron Microscope.
Manufacturer: JEOL Ltd., Japan. Intended Use: The instrument will be
used to examine the
[[Page 2915]]
properties of materials and physics associated with nanoscale materials
systems, such as semi-conducting systems found in computers and
electronic devices fabricated from carbon, silicon, silicon-oxide,
germanium and metals such as copper, gold, platinum, aluminum, aluminum
oxide and ruthenium. The properties studied will include materials
composition chemical analysis, electronic band structure, density of
states and dopant atoms distribution. Justification for Duty-Free
Entry: There are no instruments of the same general category
manufactured in the United States. Application accepted by Commissioner
of Customs: November 17, 2014.
Docket Number: 14-032. Applicant: New Mexico Institute of Mining
and Technology, 801 Leroy Place, Socorro, NM 87801. Instrument:
DelayLine Trolley (DLT). Manufacturer: University of Cambridge/
Cavendish Lab, United Kingdom. Intended Use: The instrument will be
used within the Magdalena Ridge Observatory Interferometer (MROI) to
equalize path lengths traveled by the light from a target object, via
the telescopes, to the point where interference takes place, by acting
as a continuously movable retro-reflector. Each trolley moves
continuously within an evacuated pipe in order to introduce the optical
path delay appropriate for the target, time of observation, and inter-
telescope separations in use. For most of the sky to be accessible, a
delay range approximately equal to the longest inter-telescope
separation must be available, requiring an unprecedented monolithic
delay line length of almost 200m. The instrument is essentially a
cat's-eye assembly that is flexure-mounted and voice coil actuated on a
motorized wheeled carriage, which runs directly on the inner surface of
the delay line pipe, not on pre-installed rails. Its position is
precisely measured by a laser metrology system and computer controlled
so as to introduce the appropriate optical path compensation as a
function of time. The following specifications are required for the
research: a focus on model-independent imaging as opposed to
astrometric or precision phase or visibility measurement, a wavelength
of operation that covers both the visible and near infrared, between
600 nm and 2400 nm, accommodation for baseline lengths as long as 250m,
a concern for polarization fidelity in the image, and a requirement to
reach a limiting group-delay tracking magnitude of H=14 to allow
observations of extragalactic targets while tracking on the science
object rather than a nearby reference star. Justification for Duty-Free
Entry: There are no instruments of the same general category
manufactured in the United States. Application accepted by Commissioner
of Customs: November 14, 2014.
Docket Number: 14-033. Applicant: University of South Carolina
School of Medicine, 6439 Garner's Ferry Road, Columbia, SC 29208.
Instrument: Electron Microscope. Manufacturer: JEOL Ltd., Japan.
Intended Use: The instrument will be used to examine the
ultrastructural changes in cells and tissues in response to a disease
process and subsequent treatment of the disease through a variety of
protocols, in biomedical research samples such as heart, colon, and
skeletal muscle, to study cardiovascular disease, cancer and
inflammation. Justification for Duty-Free Entry: There are no
instruments of the same general category manufactured in the United
States. Application accepted by Commissioner of Customs: November 26,
2014.
Docket Number: 14-034. Applicant: National Institutes of Health, 50
South Dr., Bldg. 50, Rm. 1517, Bethesda, MD 20892-8025. Instrument:
Falcon II Direct Detection Camera. Manufacturer: FEI Company, the
Netherlands. Intended Use: The instrument will be used in cryo-electron
microscopy experiments, to visualize biological specimens suspended in
vitreous ice involving recording electron micrographs of the highest
possible quality and subjecting them to digital image analysis to
elicit the maximum amount of structural information and interpretation,
taking into account all pertinent complimentary data. Sensor
specifications required for this research include a pixel size of ~14
[mu]m which predicates a magnification of ~100 kx, optimal performance
as measured by Detective Quantum Efficiency at a typical dose rate of
10-20 e/pixel/second, and protection of the sensor against accidental
high-dose exposures to the microscope's electron beam. Justification
for Duty-Free Entry: There are no instruments of the same general
category manufactured in the United States. Application accepted by
Commissioner of Customs: December 19, 2014.
Docket Number: 14-036. Applicant: University of Michigan, 109 Zina
Pitcher Place, Ann Arbor, Michigan 48109-2200. Instrument: Electron
Microscope. Manufacturer: JEOL Ltd., Japan. Intended Use: The
instrument will be used to study tissue and cells to assist in the
understanding of cancer cells, morphology, and general histochemical
analysis, using diffraction analysis of organic compounds.
Justification for Duty-Free Entry: There are no instruments of the same
general category manufactured in the United States. Application
accepted by Commissioner of Customs: December 19, 2014.
Docket Number: 14-037. Applicant: University of Arizona, 1629 E.
University Blvd., Tucson, AZ 85721. Instrument: Electron Microscope.
Manufacturer: FEI Company, Czech Republic. Intended Use: The instrument
will be used to characterize the structural and compositional
properties of a wide variety of materials including meteorites, samples
of the moon, solar cell structures, polymers, thin-film semiconductors
and other technologically relevant materials, in order to determine the
origins of our solar system and the moon and the underlying physics of
technologically relevant materials for solar cells and optical devices.
Justification for Duty-Free Entry: There are no instruments of the same
general category manufactured in the United States. Application
accepted by Commissioner of Customs: December 19, 2014.
Docket Number: 14-038. Applicant: University of North Dakota, 243
Centennial Drive, Stop 8153, Grand Forks, ND 58202-8153. Instrument:
Electron Microscope. Manufacturer: FEI Company, Czech Republic.
Intended Use: The instrument will be used to understand ore mineralogy
and texture from upstream ore characterization and metallurgical
testing to mineral and drilling processing, as well as to create
digital mineral and texture maps of cores, rocks, soil and sediment.
The instrument will provide surficial topo-morphological image
analysis, lithotype, porosity characteristics and texture properties,
accompanying quantitative chemical composition analysis made possible
by the equipped EDS detector. Justification for Duty-Free Entry: There
are no instruments of the same general category manufactured in the
United States. Application accepted by Commissioner of Customs:
December 23, 2014.
Docket Number: 15-001. Applicant: University of Kentucky, 177
Anderson Tower, Lexington, KY 40506-0046. Instrument: Electron
Microscope. Manufacturer: FEI Company, Czech Republic. Intended Use:
The instrument will be used to characterize the structure and
morphology of materials such as metals and alloys, ceramic materials,
polymers, and biological samples. The instrument includes a Focused Ion
Beam (FIB) column for milling away material and achieving
[[Page 2916]]
high spatial precision (2.5nm resolution for the FIB beam), as well as
cutting cross-sectional trenches into samples for characterization of
the internal structure. Justification for Duty-Free Entry: There are no
instruments of the same general category manufactured in the United
States. Application accepted by Commissioner of Customs: January 5,
2015.
Dated: January 13, 2015.
Gregory W. Campbell,
Director of Subsidies Enforcement, Enforcement and Compliance.
[FR Doc. 2015-00936 Filed 1-20-15; 8:45 am]
BILLING CODE 3510-DS-P
