Application(s) for Duty-Free Entry of Scientific Instruments, 2914-2916 [2015-00936]

Download as PDF 2914 Federal Register / Vol. 80, No. 13 / Wednesday, January 21, 2015 / Notices SUMMER FOOD SERVICE PROGRAM OPERATING COMPONENT OF 2015 REIMBURSEMENT RATES All states except Alaska and Hawaii Operating rates in U.S. dollars, rounded down to the nearest whole cent Breakfast ...................................................................................................................................... Lunch or Supper .......................................................................................................................... Snack ........................................................................................................................................... Administrative Rates The administrative cost component of the reimbursement is authorized under section 13(b)(3) of the NSLA, 42 U.S.C. Alaska 1.89 3.30 0.77 1761(b)(3). Rates are higher for sponsors of sites located in rural areas and for ‘‘self-prep’’ sponsors that prepare their own meals, at the SFSP site or at a central facility, instead of purchasing Hawaii 3.07 5.35 1.25 2.21 3.86 0.90 them from vendors. The administrative portion of SFSP rates are adjusted, either up or down, to the nearest quarter-cent. SUMMER FOOD SERVICE PROGRAM ADMINISTRATIVE COMPONENT OF 2015 REIMBURSEMENT RATES Administrative rates in U.S. dollars, adjusted, up or down, to the nearest quarter-cent All states except Alaska and Hawaii Rural or selfprep sites Breakfast .................................................. Lunch or Supper ...................................... Snack ....................................................... 0.1875 0.3450 0.0950 Authority: Sections 9, 13, and 14, Richard B. Russell National School Lunch Act, 42 U.S.C. 1758, 1761, and 1762a, respectively. Dated: January 14, 2015. Audrey Rowe, Administrator. [FR Doc. 2015–00877 Filed 1–20–15; 8:45 am] BILLING CODE 3410–30–P DEPARTMENT OF COMMERCE Foreign-Trade Zones Board [S–3–2015] asabaliauskas on DSK5VPTVN1PROD with NOTICES Foreign-Trade Zone 245—Decatur, Illinois, Application for Subzone, Thyssenkrupp Presta Danville, LLC, Danville, Illinois An application has been submitted to the Foreign-Trade Zones Board (the Board) by the Economic Development Corporation of Decatur & Macon County, grantee of FTZ 245, requesting subzone status for the facility of Thyssenkrupp Presta Danville, LLC (Thyssenkrupp Presta), located in Danville, Illinois. The application was submitted pursuant to the provisions of the Foreign-Trade Zones Act, as amended (19 U.S.C. 81a–81u), and the regulations of the Board (15 CFR part 400). It was formally docketed on January 14, 2015. The proposed subzone (42.6 acres) is located at 75 Walz Creek Drive, Danville, Vermilion County. The applicant has indicated that a notification of proposed production VerDate Sep<11>2014 17:50 Jan 20, 2015 Jkt 235001 All other types of sites Alaska Rural or selfprep sites 0.1475 0.2875 0.0750 FOR FURTHER INFORMATION CONTACT: Elizabeth Whiteman at Elizabeth.Whiteman@trade.gov or (202) 482–0473. Frm 00003 Fmt 4703 Sfmt 4703 All other types of sites 0.3050 0.5600 0.1525 activity will be submitted. Any such notification will be published separately for public comment. The proposed subzone would be subject to the existing activation limit of FTZ 245. In accordance with the Board’s regulations, Elizabeth Whiteman of the FTZ Staff is designated examiner to review the application and make recommendations to the Executive Secretary. Public comment is invited from interested parties. Submissions shall be addressed to the Board’s Executive Secretary at the address below. The closing period for their receipt is March 2, 2015. Rebuttal comments in response to material submitted during the foregoing period may be submitted during the subsequent 15-day period to March 17, 2015. A copy of the application will be available for public inspection at the Office of the Executive Secretary, Foreign-Trade Zones Board, Room 21013, U.S. Department of Commerce, 1401 Constitution Avenue NW., Washington, DC 20230–0002, and in the ‘‘Reading Room’’ section of the Board’s Web site, which is accessible via www.trade.gov/ftz. PO 00000 Hawaii Rural or selfprep sites 0.2400 0.4650 0.1200 All other types of sites 0.2200 0.4050 0.1100 0.1725 0.3350 0.0875 Dated: January 14, 2015. Andrew McGilvray, Executive Secretary. [FR Doc. 2015–00937 Filed 1–20–15; 8:45 am] BILLING CODE 3510–DS–P DEPARTMENT OF COMMERCE International Trade Administration Application(s) for Duty-Free Entry of Scientific Instruments Pursuant to Section 6(c) of the Educational, Scientific and Cultural Materials Importation Act of 1966 (Pub. L. 89–651, as amended by Pub. L. 106– 36; 80 Stat. 897; 15 CFR part 301), we invite comments on the question of whether instruments of equivalent scientific value, for the purposes for which the instruments shown below are intended to be used, are being manufactured in the United States. Comments must comply with 15 CFR 301.5(a)(3) and (4) of the regulations and be postmarked on or before February 10, 2015. Address written comments to Statutory Import Programs Staff, Room 3720, U.S. Department of Commerce, Washington, DC 20230. Applications may be examined between 8:30 a.m. and 5:00 p.m. at the U.S. Department of Commerce in Room 3720. Docket Number: 14–031. Applicant: Harvard University, 11 Oxford St., Cambridge, MA 02138. Instrument: Electron Microscope. Manufacturer: JEOL Ltd., Japan. Intended Use: The instrument will be used to examine the E:\FR\FM\21JAN1.SGM 21JAN1 asabaliauskas on DSK5VPTVN1PROD with NOTICES Federal Register / Vol. 80, No. 13 / Wednesday, January 21, 2015 / Notices properties of materials and physics associated with nanoscale materials systems, such as semi-conducting systems found in computers and electronic devices fabricated from carbon, silicon, silicon-oxide, germanium and metals such as copper, gold, platinum, aluminum, aluminum oxide and ruthenium. The properties studied will include materials composition chemical analysis, electronic band structure, density of states and dopant atoms distribution. Justification for Duty-Free Entry: There are no instruments of the same general category manufactured in the United States. Application accepted by Commissioner of Customs: November 17, 2014. Docket Number: 14–032. Applicant: New Mexico Institute of Mining and Technology, 801 Leroy Place, Socorro, NM 87801. Instrument: DelayLine Trolley (DLT). Manufacturer: University of Cambridge/Cavendish Lab, United Kingdom. Intended Use: The instrument will be used within the Magdalena Ridge Observatory Interferometer (MROI) to equalize path lengths traveled by the light from a target object, via the telescopes, to the point where interference takes place, by acting as a continuously movable retro-reflector. Each trolley moves continuously within an evacuated pipe in order to introduce the optical path delay appropriate for the target, time of observation, and inter-telescope separations in use. For most of the sky to be accessible, a delay range approximately equal to the longest inter-telescope separation must be available, requiring an unprecedented monolithic delay line length of almost 200m. The instrument is essentially a cat’s-eye assembly that is flexuremounted and voice coil actuated on a motorized wheeled carriage, which runs directly on the inner surface of the delay line pipe, not on pre-installed rails. Its position is precisely measured by a laser metrology system and computer controlled so as to introduce the appropriate optical path compensation as a function of time. The following specifications are required for the research: a focus on model-independent imaging as opposed to astrometric or precision phase or visibility measurement, a wavelength of operation that covers both the visible and near infrared, between 600 nm and 2400 nm, accommodation for baseline lengths as long as 250m, a concern for polarization fidelity in the image, and a requirement to reach a limiting group-delay tracking magnitude of H=14 to allow observations of extragalactic targets while tracking on the science object VerDate Sep<11>2014 17:50 Jan 20, 2015 Jkt 235001 rather than a nearby reference star. Justification for Duty-Free Entry: There are no instruments of the same general category manufactured in the United States. Application accepted by Commissioner of Customs: November 14, 2014. Docket Number: 14–033. Applicant: University of South Carolina School of Medicine, 6439 Garner’s Ferry Road, Columbia, SC 29208. Instrument: Electron Microscope. Manufacturer: JEOL Ltd., Japan. Intended Use: The instrument will be used to examine the ultrastructural changes in cells and tissues in response to a disease process and subsequent treatment of the disease through a variety of protocols, in biomedical research samples such as heart, colon, and skeletal muscle, to study cardiovascular disease, cancer and inflammation. Justification for Duty-Free Entry: There are no instruments of the same general category manufactured in the United States. Application accepted by Commissioner of Customs: November 26, 2014. Docket Number: 14–034. Applicant: National Institutes of Health, 50 South Dr., Bldg. 50, Rm. 1517, Bethesda, MD 20892–8025. Instrument: Falcon II Direct Detection Camera. Manufacturer: FEI Company, the Netherlands. Intended Use: The instrument will be used in cryo-electron microscopy experiments, to visualize biological specimens suspended in vitreous ice involving recording electron micrographs of the highest possible quality and subjecting them to digital image analysis to elicit the maximum amount of structural information and interpretation, taking into account all pertinent complimentary data. Sensor specifications required for this research include a pixel size of ∼14 mm which predicates a magnification of ∼100 kx, optimal performance as measured by Detective Quantum Efficiency at a typical dose rate of 10–20 e/pixel/ second, and protection of the sensor against accidental high-dose exposures to the microscope’s electron beam. Justification for Duty-Free Entry: There are no instruments of the same general category manufactured in the United States. Application accepted by Commissioner of Customs: December 19, 2014. Docket Number: 14–036. Applicant: University of Michigan, 109 Zina Pitcher Place, Ann Arbor, Michigan 48109–2200. Instrument: Electron Microscope. Manufacturer: JEOL Ltd., Japan. Intended Use: The instrument will be used to study tissue and cells to assist in the understanding of cancer cells, morphology, and general PO 00000 Frm 00004 Fmt 4703 Sfmt 4703 2915 histochemical analysis, using diffraction analysis of organic compounds. Justification for Duty-Free Entry: There are no instruments of the same general category manufactured in the United States. Application accepted by Commissioner of Customs: December 19, 2014. Docket Number: 14–037. Applicant: University of Arizona, 1629 E. University Blvd., Tucson, AZ 85721. Instrument: Electron Microscope. Manufacturer: FEI Company, Czech Republic. Intended Use: The instrument will be used to characterize the structural and compositional properties of a wide variety of materials including meteorites, samples of the moon, solar cell structures, polymers, thin-film semiconductors and other technologically relevant materials, in order to determine the origins of our solar system and the moon and the underlying physics of technologically relevant materials for solar cells and optical devices. Justification for DutyFree Entry: There are no instruments of the same general category manufactured in the United States. Application accepted by Commissioner of Customs: December 19, 2014. Docket Number: 14–038. Applicant: University of North Dakota, 243 Centennial Drive, Stop 8153, Grand Forks, ND 58202–8153. Instrument: Electron Microscope. Manufacturer: FEI Company, Czech Republic. Intended Use: The instrument will be used to understand ore mineralogy and texture from upstream ore characterization and metallurgical testing to mineral and drilling processing, as well as to create digital mineral and texture maps of cores, rocks, soil and sediment. The instrument will provide surficial topomorphological image analysis, lithotype, porosity characteristics and texture properties, accompanying quantitative chemical composition analysis made possible by the equipped EDS detector. Justification for Duty-Free Entry: There are no instruments of the same general category manufactured in the United States. Application accepted by Commissioner of Customs: December 23, 2014. Docket Number: 15–001. Applicant: University of Kentucky, 177 Anderson Tower, Lexington, KY 40506–0046. Instrument: Electron Microscope. Manufacturer: FEI Company, Czech Republic. Intended Use: The instrument will be used to characterize the structure and morphology of materials such as metals and alloys, ceramic materials, polymers, and biological samples. The instrument includes a Focused Ion Beam (FIB) column for milling away material and achieving E:\FR\FM\21JAN1.SGM 21JAN1 2916 Federal Register / Vol. 80, No. 13 / Wednesday, January 21, 2015 / Notices high spatial precision (2.5nm resolution for the FIB beam), as well as cutting cross-sectional trenches into samples for characterization of the internal structure. Justification for Duty-Free Entry: There are no instruments of the same general category manufactured in the United States. Application accepted by Commissioner of Customs: January 5, 2015. Dated: January 13, 2015. Gregory W. Campbell, Director of Subsidies Enforcement, Enforcement and Compliance. [FR Doc. 2015–00936 Filed 1–20–15; 8:45 am] BILLING CODE 3510–DS–P DEPARTMENT OF COMMERCE National Oceanic and Atmospheric Administration Proposed Information Collection; Comment Request; STORMREADY®, STORMREADY/TSUNAMIREADYTM, AND STORMREADY® SUPPORTER Application Forms National Oceanic and Atmospheric Administration (NOAA), Commerce. ACTION: Notice. AGENCY: The Department of Commerce, as part of its continuing effort to reduce paperwork and respondent burden, invites the general public and other Federal agencies to take this opportunity to comment on proposed and/or continuing information collections, as required by the Paperwork Reduction Act of 1995. DATES: Written comments must be submitted on or before March 23, 2015. ADDRESSES: Direct all written comments to Jennifer Jessup, Departmental Paperwork Clearance Officer, Department of Commerce, Room 6616, 14th and Constitution Avenue NW., Washington, DC 20230 (or via the Internet at JJessup@doc.gov). FOR FURTHER INFORMATION CONTACT: Requests for additional information or copies of the information collection instrument and instructions should be directed to Donna Franklin, (301) 427– 9305 or chris.maier@noaa.gov. SUPPLEMENTARY INFORMATION: asabaliauskas on DSK5VPTVN1PROD with NOTICES SUMMARY: I. Abstract StormReady and TsunamiReady are voluntary programs offered as a means of providing guidance and incentive to officials interested in improving their respective hazardous weather operations. The StormReady Application Form, Tsunami-Ready VerDate Sep<11>2014 17:50 Jan 20, 2015 Jkt 235001 Application Form and TsunamiReady/ StormReady Application Form are used by localities to apply for initial StormReady or TsunamiReady and StormReady recognition and renewal of that recognition every six years. The government will use the information collected to determine whether a community has met all of the criteria to receive StormReady and/or TsunamiReady recognition. In addition, businesses, schools, non-profit organizations and other nongovernmental entities often establish severe weather safety plans and actively promote severe weather safety awareness activities but may not have the resources necessary to fulfill all the eligibility requirements to achieve the full StormReady recognition. These entities may apply through the StormReady Supporter program for recognition. II. Method of Collection Applications may be faxed, mailed or emailed. III. Data OMB Control Number: 0648–0419. Form Number(s): None. Type of Review: Regular submission (extension of a currently approved information collection). Affected Public: Business or other forprofit organizations; not for profit institutions; state, local and tribal governments. Estimated Number of Respondents: 265. Estimated Time per Response: Initial applications, 2 hours; renewal applications, 1 hour. Estimated Total Annual Burden Hours: 505. Estimated Total Annual Cost to Public: $130 in recordkeeping/reporting costs. IV. Request for Comments Comments are invited on: (a) Whether the proposed collection of information is necessary for the proper performance of the functions of the agency, including whether the information shall have practical utility; (b) the accuracy of the agency’s estimate of the burden (including hours and cost) of the proposed collection of information; (c) ways to enhance the quality, utility, and clarity of the information to be collected; and (d) ways to minimize the burden of the collection of information on respondents, including through the use of automated collection techniques or other forms of information technology. Comments submitted in response to this notice will be summarized and/or PO 00000 Frm 00005 Fmt 4703 Sfmt 4703 included in the request for OMB approval of this information collection; they also will become a matter of public record. Dated: January 15, 2015. Glenna Mickelson, Management Analyst, Office of the Chief Information Officer. [FR Doc. 2015–00888 Filed 1–20–15; 8:45 am] BILLING CODE 3510–KE–P DEPARTMENT OF COMMERCE National Oceanic and Atmospheric Administration RIN 0648–XD457 Atlantic Highly Migratory Species; Atlantic Shark Management Measures; 2015 Research Fishery National Marine Fisheries Service (NMFS), National Oceanic and Atmospheric Administration (NOAA), Commerce. ACTION: Notice of intent; request for applications. AGENCY: NMFS announces its second request for applications for the 2015 shark research fishery from commercial shark fishermen with directed or incidental shark limited access permits. In this second request, NMFS is specifically requesting applications only from commercial shark fishermen who are fishing or plan to fish in the Gulf of Mexico fishing region. The shark research fishery allows for the collection of fishery-dependent and biological data for future stock assessments to meet the shark research objectives of the Agency. The only commercial vessels authorized to land sandbar sharks are those participating in the shark research fishery. Shark research fishery permittees may also land other large coastal sharks (LCS), small coastal sharks (SCS), and pelagic sharks. Commercial shark fishermen who are interested in participating in the shark research fishery need to submit a completed Shark Research Fishery Permit Application in order to be considered. DATES: Shark Research Fishery Applications must be received no later than 5 p.m., local time, on February 5, 2015. ADDRESSES: Please submit completed applications to the HMS Management Division at: ´ • Mail: Attn: Guy DuBeck, HMS Management Division (F/SF1), NMFS, 1315 East-West Highway, Silver Spring, MD 20910. • Fax: (301) 713–1917. SUMMARY: E:\FR\FM\21JAN1.SGM 21JAN1

Agencies

[Federal Register Volume 80, Number 13 (Wednesday, January 21, 2015)]
[Notices]
[Pages 2914-2916]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: 2015-00936]


-----------------------------------------------------------------------

DEPARTMENT OF COMMERCE

International Trade Administration


Application(s) for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended 
by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments 
on the question of whether instruments of equivalent scientific value, 
for the purposes for which the instruments shown below are intended to 
be used, are being manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be postmarked on or before February 10, 2015. Address 
written comments to Statutory Import Programs Staff, Room 3720, U.S. 
Department of Commerce, Washington, DC 20230. Applications may be 
examined between 8:30 a.m. and 5:00 p.m. at the U.S. Department of 
Commerce in Room 3720.
    Docket Number: 14-031. Applicant: Harvard University, 11 Oxford 
St., Cambridge, MA 02138. Instrument: Electron Microscope. 
Manufacturer: JEOL Ltd., Japan. Intended Use: The instrument will be 
used to examine the

[[Page 2915]]

properties of materials and physics associated with nanoscale materials 
systems, such as semi-conducting systems found in computers and 
electronic devices fabricated from carbon, silicon, silicon-oxide, 
germanium and metals such as copper, gold, platinum, aluminum, aluminum 
oxide and ruthenium. The properties studied will include materials 
composition chemical analysis, electronic band structure, density of 
states and dopant atoms distribution. Justification for Duty-Free 
Entry: There are no instruments of the same general category 
manufactured in the United States. Application accepted by Commissioner 
of Customs: November 17, 2014.
    Docket Number: 14-032. Applicant: New Mexico Institute of Mining 
and Technology, 801 Leroy Place, Socorro, NM 87801. Instrument: 
DelayLine Trolley (DLT). Manufacturer: University of Cambridge/
Cavendish Lab, United Kingdom. Intended Use: The instrument will be 
used within the Magdalena Ridge Observatory Interferometer (MROI) to 
equalize path lengths traveled by the light from a target object, via 
the telescopes, to the point where interference takes place, by acting 
as a continuously movable retro-reflector. Each trolley moves 
continuously within an evacuated pipe in order to introduce the optical 
path delay appropriate for the target, time of observation, and inter-
telescope separations in use. For most of the sky to be accessible, a 
delay range approximately equal to the longest inter-telescope 
separation must be available, requiring an unprecedented monolithic 
delay line length of almost 200m. The instrument is essentially a 
cat's-eye assembly that is flexure-mounted and voice coil actuated on a 
motorized wheeled carriage, which runs directly on the inner surface of 
the delay line pipe, not on pre-installed rails. Its position is 
precisely measured by a laser metrology system and computer controlled 
so as to introduce the appropriate optical path compensation as a 
function of time. The following specifications are required for the 
research: a focus on model-independent imaging as opposed to 
astrometric or precision phase or visibility measurement, a wavelength 
of operation that covers both the visible and near infrared, between 
600 nm and 2400 nm, accommodation for baseline lengths as long as 250m, 
a concern for polarization fidelity in the image, and a requirement to 
reach a limiting group-delay tracking magnitude of H=14 to allow 
observations of extragalactic targets while tracking on the science 
object rather than a nearby reference star. Justification for Duty-Free 
Entry: There are no instruments of the same general category 
manufactured in the United States. Application accepted by Commissioner 
of Customs: November 14, 2014.
    Docket Number: 14-033. Applicant: University of South Carolina 
School of Medicine, 6439 Garner's Ferry Road, Columbia, SC 29208. 
Instrument: Electron Microscope. Manufacturer: JEOL Ltd., Japan. 
Intended Use: The instrument will be used to examine the 
ultrastructural changes in cells and tissues in response to a disease 
process and subsequent treatment of the disease through a variety of 
protocols, in biomedical research samples such as heart, colon, and 
skeletal muscle, to study cardiovascular disease, cancer and 
inflammation. Justification for Duty-Free Entry: There are no 
instruments of the same general category manufactured in the United 
States. Application accepted by Commissioner of Customs: November 26, 
2014.
    Docket Number: 14-034. Applicant: National Institutes of Health, 50 
South Dr., Bldg. 50, Rm. 1517, Bethesda, MD 20892-8025. Instrument: 
Falcon II Direct Detection Camera. Manufacturer: FEI Company, the 
Netherlands. Intended Use: The instrument will be used in cryo-electron 
microscopy experiments, to visualize biological specimens suspended in 
vitreous ice involving recording electron micrographs of the highest 
possible quality and subjecting them to digital image analysis to 
elicit the maximum amount of structural information and interpretation, 
taking into account all pertinent complimentary data. Sensor 
specifications required for this research include a pixel size of ~14 
[mu]m which predicates a magnification of ~100 kx, optimal performance 
as measured by Detective Quantum Efficiency at a typical dose rate of 
10-20 e/pixel/second, and protection of the sensor against accidental 
high-dose exposures to the microscope's electron beam. Justification 
for Duty-Free Entry: There are no instruments of the same general 
category manufactured in the United States. Application accepted by 
Commissioner of Customs: December 19, 2014.
    Docket Number: 14-036. Applicant: University of Michigan, 109 Zina 
Pitcher Place, Ann Arbor, Michigan 48109-2200. Instrument: Electron 
Microscope. Manufacturer: JEOL Ltd., Japan. Intended Use: The 
instrument will be used to study tissue and cells to assist in the 
understanding of cancer cells, morphology, and general histochemical 
analysis, using diffraction analysis of organic compounds. 
Justification for Duty-Free Entry: There are no instruments of the same 
general category manufactured in the United States. Application 
accepted by Commissioner of Customs: December 19, 2014.
    Docket Number: 14-037. Applicant: University of Arizona, 1629 E. 
University Blvd., Tucson, AZ 85721. Instrument: Electron Microscope. 
Manufacturer: FEI Company, Czech Republic. Intended Use: The instrument 
will be used to characterize the structural and compositional 
properties of a wide variety of materials including meteorites, samples 
of the moon, solar cell structures, polymers, thin-film semiconductors 
and other technologically relevant materials, in order to determine the 
origins of our solar system and the moon and the underlying physics of 
technologically relevant materials for solar cells and optical devices. 
Justification for Duty-Free Entry: There are no instruments of the same 
general category manufactured in the United States. Application 
accepted by Commissioner of Customs: December 19, 2014.
    Docket Number: 14-038. Applicant: University of North Dakota, 243 
Centennial Drive, Stop 8153, Grand Forks, ND 58202-8153. Instrument: 
Electron Microscope. Manufacturer: FEI Company, Czech Republic. 
Intended Use: The instrument will be used to understand ore mineralogy 
and texture from upstream ore characterization and metallurgical 
testing to mineral and drilling processing, as well as to create 
digital mineral and texture maps of cores, rocks, soil and sediment. 
The instrument will provide surficial topo-morphological image 
analysis, lithotype, porosity characteristics and texture properties, 
accompanying quantitative chemical composition analysis made possible 
by the equipped EDS detector. Justification for Duty-Free Entry: There 
are no instruments of the same general category manufactured in the 
United States. Application accepted by Commissioner of Customs: 
December 23, 2014.
    Docket Number: 15-001. Applicant: University of Kentucky, 177 
Anderson Tower, Lexington, KY 40506-0046. Instrument: Electron 
Microscope. Manufacturer: FEI Company, Czech Republic. Intended Use: 
The instrument will be used to characterize the structure and 
morphology of materials such as metals and alloys, ceramic materials, 
polymers, and biological samples. The instrument includes a Focused Ion 
Beam (FIB) column for milling away material and achieving

[[Page 2916]]

high spatial precision (2.5nm resolution for the FIB beam), as well as 
cutting cross-sectional trenches into samples for characterization of 
the internal structure. Justification for Duty-Free Entry: There are no 
instruments of the same general category manufactured in the United 
States. Application accepted by Commissioner of Customs: January 5, 
2015.

    Dated: January 13, 2015.
Gregory W. Campbell,
Director of Subsidies Enforcement, Enforcement and Compliance.
[FR Doc. 2015-00936 Filed 1-20-15; 8:45 am]
BILLING CODE 3510-DS-P