Application(s) for Duty-Free Entry of Scientific Instruments, 46773-46774 [2014-18953]
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Federal Register / Vol. 79, No. 154 / Monday, August 11, 2014 / Notices
and strip from France pursuant to 19
CFR 351.213(d)(1).
DEPARTMENT OF COMMERCE
International Trade Administration
Assessment
The Department will instruct U.S.
Customs and Border Protection (CBP) to
assess antidumping duties on all
appropriate entries. Antidumping duties
shall be assessed at rates equal to the
cash deposit of estimated antidumping
duties required at the time of entry or
withdrawal from warehouse, for
consumption, in accordance with 19
CFR 351.212(c)(1)(i). The Department
intends to issue appropriate assessment
instructions directly to CBP 15 days
after publication of this notice.
Notifications
mstockstill on DSK4VPTVN1PROD with NOTICES
This notice serves as a final reminder
to importers for whom this review is
being rescinded of their responsibility
under 19 CFR 351.402(f)(2) to file a
certificate regarding the reimbursement
of antidumping duties prior to
liquidation of the relevant entries
during this review period. Failure to
comply with this requirement could
result in the Secretary’s presumption
that reimbursement of the antidumping
duties occurred and the subsequent
assessment of double antidumping
duties.
This notice also serves as a reminder
to parties subject to administrative
protective orders (APO) of their
responsibility concerning the return or
destruction of proprietary information
disclosed under APO in accordance
with 19 CFR 351.305, which continues
to govern business proprietary
information in this segment of the
proceeding. Timely written notification
of the return/destruction of APO
materials or conversion to judicial
protective order is hereby requested.
Failure to comply with the regulations
and terms of an APO is a violation
which is subject to sanction.
This notice is issued and published in
accordance with section 751(a)(1) of the
Tariff Act of 1930, as amended, and 19
CFR 351.213(d)(4).
Dated: August 1, 2014.
Christian Marsh,
Deputy Assistant Secretary for Antidumping
and Countervailing Duty Operations.
[FR Doc. 2014–18956 Filed 8–8–14; 8:45 am]
BILLING CODE 3510–DS–P
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Application(s) for Duty-Free Entry of
Scientific Instruments
Pursuant to Section 6(c) of the
Educational, Scientific and Cultural
Materials Importation Act of 1966 (Pub.
L. 89–651, as amended by Pub. L. 106–
36; 80 Stat. 897; 15 CFR part 301), we
invite comments on the question of
whether instruments of equivalent
scientific value, for the purposes for
which the instruments shown below are
intended to be used, are being
manufactured in the United States.
Comments must comply with 15 CFR
301.5(a)(3) and (4) of the regulations and
be postmarked on or before September
2, 2014. Address written comments to
Statutory Import Programs Staff, Room
3720, U.S. Department of Commerce,
Washington, DC 20230. Applications
may be examined between 8:30 a.m. and
5:00 p.m. at the U.S. Department of
Commerce in Room 3720.
Docket Number: 14–013. Applicant:
Howard Hughes Medical University,
4000 Jones Bridge Road, Chevy Chase,
MD 20815. Instrument: Vitrobot
Vitrification Robot for Cryopreservation.
Manufacturer: FEI, Czech Republic.
Intended Use: The instrument is used to
produce high-quality frozen-hydrated
biological specimens for observation in
cryo-TEM, to determine the structure of
macromolecular biological complexes. It
is equipped with an environmental
chamber and fully automated control of
blotting and plunge-freezing conditions.
The computerized control of the
humidity/temperature environment
specimen chamber and blotting/freezing
conditions is essential to reproducibly
obtaining high quality samples for TEM,
free of freezing artifacts. Justification for
Duty-Free Entry: There are no
instruments of the same general
category manufactured in the United
States. Application accepted by
Commissioner of Customs: June 26,
2014.
Docket Number: 14–015. Applicant:
South Dakota State University, Room
214 Daktronics Engineering Hall, South
Dakota State University, Brookings, SD
57007. Instrument: SUNALE R–150
Atomic Layer Deposition Reactor.
Manufacturer: Picosun, Finland.
Intended Use: The instrument will be
used to obtain ultrathin dielectric films
with full coverage of semiconductor
device surface to prevent electric
leakage, and fabricate amorphous metal
thin films, by depositing oxide films
onto metal layer surfaces and studying
the effect of the diode, in order to study
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46773
film uniformity, adhesion, dielectric
constant, and optical constants. Unique
features of the instrument include a
dual vacuum chamber, which allows
different reaction chambers to be fit into
the same vacuum chamber, allowing
easy scale up to batch process and
deposition on different substrates,
source lines that are pre-heated before
entering the reactor chamber, improving
the deposition quality, and the option of
ultra-high vacuum system by using
metal seal flanges. Another unique
feature is the hot-wall reaction chamber,
which allows a metal-metal sealing
surface and pressure control that keeps
all process gases inside the reaction
chamber with no condensation
occurring in the vacuum chamber walls.
The reaction chamber walls are at the
same temperature as the substrate which
prevents secondary reaction routes
inside the reaction chamber that would
result in the loss of self-limited growth
mechanism of ALD, ensures no
corrosion occurs on the vacuum
chamber walls, and ensures the best
particle performance and long
maintenance cycles, and a maximum
deposition temperature of 500 degrees
Celsius. Justification for Duty-Free
Entry: There are no instruments of the
same general category manufactured in
the United States. Application accepted
by Commissioner of Customs: July 1,
2014.
Docket Number: 14–019. Applicant:
New Mexico Institute of Mining and
Technology, 801 Leroy Place, Socorro,
NM 87801. Instrument: Tip-Tilt/
Narrow-field Acquisition System (FTT/
NSA). Manufacturer: University of
Cambridge—Cavendish Labs, United
Kingdom. Intended Use: The instrument
will be used to acquire the astronomical
target by sensing its location in a
moderate field of view image and using
the position of the target relative to a
pre-determined location in the sensor
field of view to provide signals used to
adjust the pointing of the telescope, and
thereafter to detect and eliminate rapid
tip-tilt (i.e. angle of arrival) fluctuations
in the incoming light beam due to
atmospheric turbulence—sensing these
again by measuring the position of the
target relative to a pre-determined
location in the sensor field and using
these measurements to send high
frequency control signals to the active
secondary mirror of the telescope and
low frequency pointing corrections to
the telescope mount. The unique
features of the instrument are the
interferometer system which is designed
to fulfill the Science Reference Mission,
including a focus on modelindependent imaging as opposed to
E:\FR\FM\11AUN1.SGM
11AUN1
46774
Federal Register / Vol. 79, No. 154 / Monday, August 11, 2014 / Notices
astrometric or precision phase or
visibility measurement, which implies
the ability to relocate the telescope, in
particular the provision of a closepacked array configuration with shortest
inter-telescope separations of 7.8 m.
Another unique feature is the ability to
reach limiting magnitudes of H = 14 for
group delay fringe tracking and V = 16
for tip-tilt sensing to allow observations
of extragalactic targets (in particular
AGN, which have red colors). Other
unique features include a dual role as a
tip-tilt (angle of arrival) correction
system and target acquisition system, for
which a 60’’ field of view is required,
a level of opto-mechanical stability such
that the change in the effective tip-tilt
zero point is less than 0.015’’ on the sky
for a 5 degree Celsius change in ambient
temperature, which implies sub-micron
stability of the components of the
system over the course of a night, a
limiting sensitivity of 16th magnitude at
visual wavelengths (limiting magnitude
V = 16 for target acquisition and
residual tilt in fast tip-tilt mode
< 0.060’’ at V = 16), and the ability to
maintain the surface temperature of
FTT/MSA components close to the light
beam path within 2 degrees Celsius of
ambient, which, coupled with the wide
operating temperature range, requires
the camera to be housed in a special
environmentally-controlled enclosure.
Justification for Duty-Free Entry: There
are no instruments of the same general
category manufactured in the United
States. Application accepted by
Commissioner of Customs: July 3, 2014.
Dated: August 4, 2014.
Gregory W. Campbell,
Director of Subsidies Enforcement,
Enforcement and Compliance.
[FR Doc. 2014–18953 Filed 8–8–14; 8:45 am]
BILLING CODE 3510–DS–P
DEPARTMENT OF COMMERCE
National Institute of Standards and
Technology
Genome in a Bottle Consortium—
Progress and Planning Workshop
National Institute of Standards
& Technology (NIST), Commerce.
ACTION: Notice of public workshop.
AGENCY:
NIST announces the Genome
in a Bottle Consortium meeting to be
held on Thursday and Friday, August 14
and 15, 2014. The Genome in a Bottle
Consortium is developing the reference
materials, reference methods, and
reference data needed to assess
confidence in human whole genome
variant calls. A principal motivation for
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SUMMARY:
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this consortium is to enable
performance assessment of sequencing
and science-based regulatory oversight
of clinical sequencing. The purpose of
this meeting is to update participants
about progress of the consortium work,
continue to get broad input from
individual stakeholders to update or
refine the consortium work plan,
continue to broadly solicit consortium
membership from interested
stakeholders, and invite members to
participate in work plan
implementation. Topics of discussion at
this meeting will include examples of
laboratories using the pilot candidate
NIST Reference Material, progress on
the next set of NIST Reference
Materials, structural variants, and
potential Reference Materials for cancer
genomics.
DATES: The Genome in a Bottle
Consortium meeting will be held on
Thursday, August 14, 2014 from 9:00
a.m. to 5:30 p.m. Eastern Time and
Friday, August 15, 2014 from 9:00 a.m.
to 12:45 p.m. Eastern Time. Attendees
must register by 5:00 p.m. Eastern Time
on Monday, August 11, 2014.
ADDRESSES: The meeting will be held at
the National Institute of Standards and
Technology, 100 Bureau Drive,
Gaithersburg, MD 20899 in Room C103–
C106, Building 215. Please note
admittance instructions under the
SUPPLEMENTARY INFORMATION section of
this notice.
FOR FURTHER INFORMATION CONTACT: For
further information contact Justin Zook
by email at jzook@nist.gov or by phone
at (301) 975–4133 or Marc Salit by email
at salit@nist.gov or by phone at (650)
350–2338. To register, go to: https://
www-s.nist.gov/CRS/conf_disclosure.
cfm?conf_id=7372
SUPPLEMENTARY INFORMATION: Clinical
application of ultra high throughput
sequencing (UHTS) for hereditary
genetic diseases and oncology is rapidly
growing. At present, there are no widely
accepted genomic standards or
quantitative performance metrics for
confidence in variant calling. These
standards and quantitative performance
metrics are needed to achieve the
confidence in measurement results
expected for sound, reproducible
research and regulated applications in
the clinic. On April 13, 2012, NIST
convened the workshop ‘‘Genome in a
Bottle’’ to initiate a consortium to
develop the reference materials,
reference methods, and reference data
needed to assess confidence in human
whole genome variant calls
(www.genomeinabottle.org). On August
16–17, 2012, NIST hosted the first large
public meeting of the Genome in a
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Fmt 4703
Sfmt 4703
Bottle Consortium, with about 100
participants from government,
academic, and industry. This meeting
was announced in the Federal Register
(77 FR 43237) on July 24, 2012. A
principal motivation for this consortium
is to enable science-based regulatory
oversight of clinical sequencing.
At the August 2012 meeting, the
consortium established work plans for
four technical working groups with the
following responsibilities:
(1) Reference Material (RM) Selection
and Design: Select appropriate sources
for whole genome RMs and identify or
design synthetic DNA constructs that
could be spiked-in to samples for
measurement assurance.
(2) Measurements for Reference
Material Characterization: Design and
carry out experiments to characterize
the RMs using multiple sequencing
methods, other methods, and validation
of selected variants using orthogonal
technologies.
(3) Bioinformatics, Data Integration,
and Data Representation: Develop
methods to analyze and integrate the
data for each RM, as well as select
appropriate formats to represent the
data.
(4) Performance Metrics and Figures
of Merit: Develop useful performance
metrics and figures of merit that can be
obtained through measurement of the
RMs.
The products of these technical
working groups will be a set of wellcharacterized whole genome and
synthetic DNA RMs along with the
methods (documentary standards) and
reference data necessary for use of the
RMs. These products will be designed to
help enable translation of whole genome
sequencing to regulated clinical
applications. The consortium meets in
workshops two times per year, in
January at Stanford University in Palo
Alto, CA, and in August at the National
Institute of Standards and Technology
in Gaithersburg, MD. At these
workshops, including the last meeting at
NIST in August 2013, participants in the
consortium have discussed progress
developing well-characterized genomes
for NIST Reference Materials and
planned future experiments and
analysis of these genomes (see https://
federalregister.gov/a/2012-18064 and
https://federalregister.gov/a/2013-18934
for past workshops at NIST). The
August 2013 meeting, which included
meetings of each of the four working
groups, was announced in the Federal
Register (78 FR 47674) on August 6,
2013, and the meeting is summarized at
https://genomeinabottle.org/blog-entry/
giab-workshop-summary-august-15-162013.
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Agencies
[Federal Register Volume 79, Number 154 (Monday, August 11, 2014)]
[Notices]
[Pages 46773-46774]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: 2014-18953]
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DEPARTMENT OF COMMERCE
International Trade Administration
Application(s) for Duty-Free Entry of Scientific Instruments
Pursuant to Section 6(c) of the Educational, Scientific and
Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended
by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments
on the question of whether instruments of equivalent scientific value,
for the purposes for which the instruments shown below are intended to
be used, are being manufactured in the United States.
Comments must comply with 15 CFR 301.5(a)(3) and (4) of the
regulations and be postmarked on or before September 2, 2014. Address
written comments to Statutory Import Programs Staff, Room 3720, U.S.
Department of Commerce, Washington, DC 20230. Applications may be
examined between 8:30 a.m. and 5:00 p.m. at the U.S. Department of
Commerce in Room 3720.
Docket Number: 14-013. Applicant: Howard Hughes Medical University,
4000 Jones Bridge Road, Chevy Chase, MD 20815. Instrument: Vitrobot
Vitrification Robot for Cryopreservation. Manufacturer: FEI, Czech
Republic. Intended Use: The instrument is used to produce high-quality
frozen-hydrated biological specimens for observation in cryo-TEM, to
determine the structure of macromolecular biological complexes. It is
equipped with an environmental chamber and fully automated control of
blotting and plunge-freezing conditions. The computerized control of
the humidity/temperature environment specimen chamber and blotting/
freezing conditions is essential to reproducibly obtaining high quality
samples for TEM, free of freezing artifacts. Justification for Duty-
Free Entry: There are no instruments of the same general category
manufactured in the United States. Application accepted by Commissioner
of Customs: June 26, 2014.
Docket Number: 14-015. Applicant: South Dakota State University,
Room 214 Daktronics Engineering Hall, South Dakota State University,
Brookings, SD 57007. Instrument: SUNALE R-150 Atomic Layer Deposition
Reactor. Manufacturer: Picosun, Finland. Intended Use: The instrument
will be used to obtain ultrathin dielectric films with full coverage of
semiconductor device surface to prevent electric leakage, and fabricate
amorphous metal thin films, by depositing oxide films onto metal layer
surfaces and studying the effect of the diode, in order to study film
uniformity, adhesion, dielectric constant, and optical constants.
Unique features of the instrument include a dual vacuum chamber, which
allows different reaction chambers to be fit into the same vacuum
chamber, allowing easy scale up to batch process and deposition on
different substrates, source lines that are pre-heated before entering
the reactor chamber, improving the deposition quality, and the option
of ultra-high vacuum system by using metal seal flanges. Another unique
feature is the hot-wall reaction chamber, which allows a metal-metal
sealing surface and pressure control that keeps all process gases
inside the reaction chamber with no condensation occurring in the
vacuum chamber walls. The reaction chamber walls are at the same
temperature as the substrate which prevents secondary reaction routes
inside the reaction chamber that would result in the loss of self-
limited growth mechanism of ALD, ensures no corrosion occurs on the
vacuum chamber walls, and ensures the best particle performance and
long maintenance cycles, and a maximum deposition temperature of 500
degrees Celsius. Justification for Duty-Free Entry: There are no
instruments of the same general category manufactured in the United
States. Application accepted by Commissioner of Customs: July 1, 2014.
Docket Number: 14-019. Applicant: New Mexico Institute of Mining
and Technology, 801 Leroy Place, Socorro, NM 87801. Instrument: Tip-
Tilt/Narrow-field Acquisition System (FTT/NSA). Manufacturer:
University of Cambridge--Cavendish Labs, United Kingdom. Intended Use:
The instrument will be used to acquire the astronomical target by
sensing its location in a moderate field of view image and using the
position of the target relative to a pre-determined location in the
sensor field of view to provide signals used to adjust the pointing of
the telescope, and thereafter to detect and eliminate rapid tip-tilt
(i.e. angle of arrival) fluctuations in the incoming light beam due to
atmospheric turbulence--sensing these again by measuring the position
of the target relative to a pre-determined location in the sensor field
and using these measurements to send high frequency control signals to
the active secondary mirror of the telescope and low frequency pointing
corrections to the telescope mount. The unique features of the
instrument are the interferometer system which is designed to fulfill
the Science Reference Mission, including a focus on model-independent
imaging as opposed to
[[Page 46774]]
astrometric or precision phase or visibility measurement, which implies
the ability to relocate the telescope, in particular the provision of a
close-packed array configuration with shortest inter-telescope
separations of 7.8 m. Another unique feature is the ability to reach
limiting magnitudes of H = 14 for group delay fringe tracking and V =
16 for tip-tilt sensing to allow observations of extragalactic targets
(in particular AGN, which have red colors). Other unique features
include a dual role as a tip-tilt (angle of arrival) correction system
and target acquisition system, for which a 60'' field of view is
required, a level of opto-mechanical stability such that the change in
the effective tip-tilt zero point is less than 0.015'' on the sky for a
5 degree Celsius change in ambient temperature, which implies sub-
micron stability of the components of the system over the course of a
night, a limiting sensitivity of 16th magnitude at visual wavelengths
(limiting magnitude V = 16 for target acquisition and residual tilt in
fast tip-tilt mode < 0.060'' at V = 16), and the ability to maintain
the surface temperature of FTT/MSA components close to the light beam
path within 2 degrees Celsius of ambient, which, coupled with the wide
operating temperature range, requires the camera to be housed in a
special environmentally-controlled enclosure. Justification for Duty-
Free Entry: There are no instruments of the same general category
manufactured in the United States. Application accepted by Commissioner
of Customs: July 3, 2014.
Dated: August 4, 2014.
Gregory W. Campbell,
Director of Subsidies Enforcement, Enforcement and Compliance.
[FR Doc. 2014-18953 Filed 8-8-14; 8:45 am]
BILLING CODE 3510-DS-P