Ohio State University, et al.; Notice of Consolidated Decision on Applications for Duty-Free Entry of Scientific Instruments, 69645-69646 [2013-27831]

Agencies

• DEPARTMENT OF COMMERCE
• International Trade Administration

[Federal Register Volume 78, Number 224 (Wednesday, November 20, 2013)]
[Notices]
[Pages 69645-69646]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: 2013-27831]


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DEPARTMENT OF COMMERCE

International Trade Administration


Ohio State University, et al.; Notice of Consolidated Decision on 
Applications for Duty-Free Entry of Scientific Instruments

    This is a decision pursuant to Section 6(c) of the Educational, 
Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89-
651, as amended by Pub. L. 106-36; 80 Stat. 897; 15 CFR

[[Page 69646]]

part 301). Related records can be viewed between 8:30 a.m. and 5:00 
p.m. in Room 3720, U.S. Department of Commerce, 14th and Constitution 
Ave. NW., Washington, DC.
    Comments: None received. Decision: Approved. We know of no 
instruments of equivalent scientific value to the foreign instruments 
described below, for such purposes as each is intended to be used, that 
was being manufactured in the United States at the time of its order.
    Docket Number: 13-017. Applicant: Ohio State University, Columbus, 
OH 43210. Instrument: Cryo-SEM System with Aquilo Preparation Chamber. 
Manufacturer: Quorum Technologies, United Kingdom. Intended Use: See 
notice at 78 FR 37206-07, June 20, 2013. Comments: None received. 
Decision: Approved. We know of no instruments of equivalent scientific 
value to the foreign instruments described below, for such purposes as 
this is intended to be used, that was being manufactured in the United 
States at the time of order. Reasons: The instrument will be fitted to 
an existing dual beam focused ion beam (FIB) instrument in order to 
provide a new capability for 3-D imaging and analysis of polymeric 
materials and biomaterials at cryogenic temperatures below -109 degrees 
Celsius. The required performance characteristics for this instrument 
are a highly stable, thermally isolated nitrogen gas-cooled stage which 
attaches to the SEM stage and is capable of reaching a temperature 
range of +100 to -190 degrees Celsius, a separately cooled cold trap 
with independent temperature control capable of reaching temperatures 
below -190 degrees Celsius, a cryo-preparation, cryo-transfer chamber 
that is directly attached to the SEM, but with the turbomolecular 
vacuum pumping and advanced gas cooling system mounted remotely, as 
well as a high vacuum system consisting of a remotely positioned 70L/s 
turbomolecular pumping system capable of achieving a vacuum of 
10-6 mbar or better in the directly attached 
cryopreparation, cryo-transfer chamber. The instrument will be used for 
cryo-imaging that will provide new insights in the study of 
biocompatibility and failure of orthopaedic implants, and also the 
evaluation of new materials and implant surfaces for tissue engineering 
applications. The cryo-preparation, cryo-transfer and cryo-imaging 
capabilities will enable minimally invasive approaches to be used to 
investigate structures and interfaces in their near-native vitreous 
state.
    Docket Number: 13-019. Applicant: California State University 
Northridge, Northridge, CA 91330. Instrument: Ultrahigh Vacuum Low 
Temperature Scanning Tunneling Microscope. Manufacturer: Unisoku Co., 
Ltd., Japan. Intended Use: See notice at 78 FR 37206-07, June 20, 2013. 
Comments: None received. Decision: Approved. We know of no instruments 
of equivalent scientific value to the foreign instruments described 
below, for such purposes as this is intended to be used, that was being 
manufactured in the United States at the time of order. Reasons: The 
instrument will be used to study the electronic and spin-related 
phenomena (Kondo effect, spin flip, spin injection, etc.) in low 
dimensional materials including grapheme (one atomic layer of carbon 
atoms), magnetic materials (transition metals iron, cobalt, nickel and 
corresponding phthalocyanine molecules), and topological insulators. 
The techniques to be implemented include depositing magnetic atoms or 
molecules on grapheme and measuring scanning tunneling spectroscopy of 
these magnetic impurities on grapheme, growing grapheme on 
ferromagnetic materials (cobalt, iron) and measuring the spin-
polarization of grapheme induced by the ferromagnetic materials, as 
well measuring the scanning tunneling spectroscopy on topological 
insulators. The capabilities required for these experiments that this 
instrument fulfills include a high magnetic field of 8 Tesla, and 
measurements at low temperature (<5 Kelvin).
    Docket Number: 13-020. Applicant: University of Texas at Austin, 
Austin, TX 78712-1415. Instrument: V-Gait Dual Belt Instrumented 
Treadmill. Manufacturer: Motek Medial, the Netherlands. Intended Use: 
See notice at 78 FR 37206-07, June 20, 2013. Comments: None received. 
Decision: Approved. We know of no instruments of equivalent scientific 
value to the foreign instruments described below, for such purposes as 
this is intended to be used, that was being manufactured in the United 
States at the time of order. Reasons: The instrument will be used to 
identify structure/properties relationships of polymer based solar 
cells or for the structural analysis of polymer/nanoparticle hybrid 
materials for the development of high-density storage devices, as well 
as to study the self-assembly of bio-polymer systems for drug-delivery 
system development.
    Docket Number: 13-023. Applicant: Max Planck Florida Institute, 
Jupiter, FL 33458. Instrument: Quanta 250 FEG SEM (D8421). 
Manufacturer: FEI Company, Czech Republic. Intended Use: See notice at 
78 FR 37206-07, June 20, 2013.
    Comments: None received. Decision: Approved. We know of no 
instruments of equivalent scientific value to the foreign instruments 
described below, for such purposes as this is intended to be used, that 
was being manufactured in the United States at the time of order. 
Reasons: The instrument will be used for the fabrication of atomic 
force microscope cantilevers and electron beam deposition. The 
cantilevers are made from silicon or silicon nitride, with the radius 
of the tip curvature on the order of nanometers. Electron-beam 
deposition is a process of decomposing gaseous molecules by electron 
beam leading to deposition of non-volatile fragments onto a nearby 
substrate. The electron beam is usually provided by a scanning electron 
microscope that results in high spatial accuracy (less than one 
nanometer), and the possibility to produce free-standing, three-
dimensional structures. The cantilevers are observed by the scanning 
electron microscope. The chamber of the scanning electron microscope is 
filled with carbon gases. Then the electron from the scanning 
microscope focuses on the tip of cantilevers to deposit an amorphous 
carbon. The instrument needs to work with high beam parking precision 
(~1 nanometer) in the environment in which the material deposition is 
produced in relatively low vacuum.

    Dated: November 12, 2013.
Gregory W. Campbell,
Director, Subsidies Enforcement Office, Enforcement and Compliance.
[FR Doc. 2013-27831 Filed 11-19-13; 8:45 am]
BILLING CODE 3510-DS-P