Application(s) for Duty-Free Entry of Scientific Instruments, 59916 [2013-23778]

Agencies

• DEPARTMENT OF COMMERCE
• International Trade Administration

[Federal Register Volume 78, Number 189 (Monday, September 30, 2013)]
[Notices]
[Page 59916]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: 2013-23778]


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DEPARTMENT OF COMMERCE

International Trade Administration


Application(s) for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended 
by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments 
on the question of whether instruments of equivalent scientific value, 
for the purposes for which the instruments shown below are intended to 
be used, are being manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be postmarked on or before October 21, 2013. Address 
written comments to Statutory Import Programs Staff, Room 3720, U.S. 
Department of Commerce, Washington, DC 20230. Applications may be 
examined between 8:30 a.m. and 5:00 p.m. at the U.S. Department of 
Commerce in Room 3720.
    Docket Number: 13-028. Applicant: University of Minnesota, Dept. of 
Chemical Engineering & Material Science, 421 Washington Avenue SE, 
Minneapolis, MN 55455. Instrument: Electron Microscope. Manufacturer: 
FEI Company, the Netherlands. Intended Use: The instrument will be used 
to study chemical bonds between atoms in bulk crystals and defects near 
those, which requires aberration-corrected ADF-STEM imaging with sub-
0.2 eV resolution EELS, as well as the study of the magnetic and 
electronic properties of heterostructured magnetic materials, which 
also requires atomic-resolution EDS. Justification for Duty-Free Entry: 
There are no instruments of the same general category manufactured in 
the United States. Application accepted by Commissioner of Customs: 
August 8, 2013.
    Docket Number: 13-035. Applicant: Colorado State University, 
Department of Chemistry, 1872 Campus Delivery, Fort Collins, CO 80523-
1872. Instrument: Electron Microscope. Manufacturer: JEOL Ltd., Japan. 
Intended Use: The instrument will be used to determine the uniformity 
of particle formation, bulk transport and absorption properties of 
Cu2ZnSnS4 nanoparticles in photovoltaics, the elemental composition of 
CuSi nanowires, accurate measure of pore structures in plasma formed 
tubule structures that are less than 50nm, characterization of plasma 
induced damage to multi-walled carbon nanotubes, grain size and filing 
mechanisms in PbTiO3 nanotubes, structure and chemical makeup of 
nanoclusters of iridium or cobalt atoms used industrially as 
hydrogenation catalysts and structure of gold nanoparticles with a 
variable number and variety of attached thiolate ligands. Justification 
for Duty-Free Entry: There are no instruments of the same general 
category manufactured in the United States. Application accepted by 
Commissioner of Customs: August 12, 2013.
    Docket Number: 13-038. Applicant: Air Force Institute of 
Technology, 2950 Hobson Way, Wright-Patterson AFB, OH, 45433-7765. 
Instrument: Electron Microscope. Manufacturer: FEI Company, Czech 
Republic. Intended Use: The instrument will be used to study non-
biological microelectronics, micro-electromechanical systems (MEMS) as 
well as nanotechnology materials and devices. Justification for Duty-
Free Entry: There are no instruments of the same general category 
manufactured in the United States. Application accepted by Commissioner 
of Customs: September 10, 2013.
    Docket Number: 13-039. Applicant: Department of Transportation, 
Turner Fairbank Highway Research Center, 6300 Georgetown Pike, McClean, 
VA 22101. Instrument: Electron Microscope. Manufacturer: FEI Company, 
Czech Republic. Intended Use: The instrument will be used to observe 
the crystal structure changes in the cement in 3 hydrates, as well as 
to investigate the causes of premature failures in highway structures. 
The experiments will involve the study of the rate of setting or 
hydration of concrete mixtures in which a large portion of the cement 
is replaced by fly ash from coal burning power plants. The objective is 
to reduce the amount cement (a major source of greenhouse gases) with a 
waste product, fly ash, which is produced by coal burning power plants. 
Justification for Duty-Free Entry: There are no instruments of the same 
general category manufactured in the United States. Application 
accepted by Commissioner of Customs: September 13, 2013.
    Docket Number: 13-040. Applicant: Center for Disease Control and 
Prevention, 2920 Brandywine Road, RM 3000, Atlanta, GA 3041-5539. 
Instrument: Electron Microscope. Manufacturer: FEI Company, Czech 
Republic. Intended Use: The instrument will be used to expand the 
understanding of impacts of tobacco use on individuals as part of U.S. 
Public Health studies, including how the particle size and composition 
in the smoke affects the change in type and pulmonary location of 
cancers prevalent in smokers. Justification for Duty-Free Entry: There 
are no instruments of the same general category manufactured in the 
United States. Application accepted by Commissioner of Customs: 
September 12, 2013.
    Docket Number: 13-041. Applicant: Sanford-Burnham Medical Research, 
10901 No. Torrey Pines Road, La Jolla, CA 92037. Instrument: Electron 
Microscope. Manufacturer: FEI Company, the Netherlands. Intended Use: 
The instrument will be used to learn how molecules that work inside 
living cells like Arp2/3 complex, adhesosomes, and ribosomes work 
together to perform their cellular duties. Justification for Duty-Free 
Entry: There are no instruments of the same general category 
manufactured in the United States. Application accepted by Commissioner 
of Customs: September 12, 2013.

     Dated: September 23, 2013.
Gregory W. Campbell,
Director of Subsidies Enforcement, Import Administration.
[FR Doc. 2013-23778 Filed 9-27-13; 8:45 am]
BILLING CODE 3510-DS-P