Pacific Northwest National Laboratory, et al.: Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscope, 54625 [2013-21641]
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Federal Register / Vol. 78, No. 172 / Thursday, September 5, 2013 / Notices
sanctions), including the views of
foreign purchasers or prospective
customers regarding U.S. foreign policybased export controls.
2. Information on controls maintained
by U.S. trade partners. For example, to
what extent do U.S. trade partners have
similar controls on goods and
technology on a worldwide basis or to
specific destinations?
3. Information on licensing policies or
practices by our foreign trade partners
that are similar to U.S. foreign policy
based export controls, including license
review criteria, use of conditions, and
requirements for pre- and post-shipment
verifications (preferably supported by
examples of approvals, denials and
foreign regulations).
4. Suggestions for bringing foreign
policy-based export controls more into
line with multilateral practice.
5. Comments or suggestions to make
multilateral controls more effective.
6. Information that illustrates the
effect of foreign policy-based export
controls on trade or acquisitions by
intended targets of the controls.
7. Data or other information on the
effect of foreign policy-based export
controls on overall trade at the level of
individual industrial sectors.
8. Suggestions for measuring the effect
of foreign policy-based export controls
on trade.
9. Information on the use of foreign
policy-based export controls on targeted
countries, entities, or individuals. BIS is
also interested in comments relating
generally to the extension or revision of
existing foreign policy-based export
controls.
Parties submitting comments are
asked to be as specific as possible. All
comments received before the close of
the comment period will be considered
by BIS in reviewing the controls and in
developing the report to Congress. All
comments received in response to this
notice will be displayed on BIS’s
Freedom of Information Act (FOIA) Web
site at https://efoia.bis.doc.gov/ and on
the Federal e-Rulemaking portal at
www.Regulations.gov. All comments
will also be included in a report to
Congress, as required by section 6 of the
EAA, which directs that BIS report to
Congress the results of its consultations
with industry on the effects of foreign
policy-based controls.
Dated: August 28, 2013.
Matthew S. Borman,
Deputy Assistant Secretary for Export
Administration.
[FR Doc. 2013–21577 Filed 9–4–13; 8:45 am]
BILLING CODE 3510–33–P
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DEPARTMENT OF COMMERCE
International Trade Administration
Pacific Northwest National Laboratory,
et al.: Notice of Consolidated Decision
on Applications for Duty-Free Entry of
Electron Microscope
This is a decision consolidated
pursuant to Section 6(c) of the
Educational, Scientific, and Cultural
Materials Importation Act of 1966 (Pub.
L. 89–651, as amended by Pub. L. 106–
36; 80 Stat. 897; 15 CFR part 301).
Related records can be viewed between
8:30 a.m. and 5:00 p.m. in Room 3720,
U.S. Department of Commerce, 14th and
Constitution Avenue NW., Washington,
DC.
Docket Number: 13–016. Applicant:
Pacific Northwest National Laboratory,
Richland, WA 99352. Instrument:
Electron Microscope. Manufacturer:
JEOL Ltd., Japan. Intended Use: See
notice at 78 FR 34990, June 11, 2013.
Docket Number: 13–018. Applicant:
The Scripps Institute, La Jolla, CA
92037. Instrument: Electron Microscope.
Manufacturer: FEI Company, Czech
Republic. Intended Use: See notice at 78
FR 34990, June 11, 2013.
Docket Number: 13–021. Applicant:
University of Massachusetts Amherst,
Amherst, MA 01003. Instrument:
Electron Microscope. Manufacturer:
JEOL Ltd, Japan. Intended Use: See
notice at 78 FR 37206–07, June 20, 2013.
Docket Number: 13–022. Applicant:
University of Utah, Salt Lake City, UT
84132. Instrument: Electron Microscope.
Manufacturer: JEOL Ltd., Japan.
Intended Use: See notice at 78 FR
34990–91, June 11, 2013.
Docket Number: 13–024. Applicant:
University of Pennsylvania, Biomedical
Research Building, Philadelphia, PA
19104. Instrument: Electron Microscope.
Manufacturer: FEI Company, Czech
Republic. Intended Use: See notice at 78
FR 34990–91, June 11, 2013.
Comments: None received. Decision:
Approved. No instrument of equivalent
scientific value to the foreign
instrument, for such purposes as this
instrument is intended to be used, is
being manufactured in the United States
at the time the instrument was ordered.
Reasons: Each foreign instrument is an
electron microscope and is intended for
research or scientific educational uses
requiring an electron microscope. We
know of no electron microscope, or any
other instrument suited to these
purposes, which was being
manufactured in the United States at the
time of order of each instrument.
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54625
Dated: August 27, 2013.
Richard Herring,
Acting Director, Subsidies Enforcement
Office, Import Administration.
[FR Doc. 2013–21641 Filed 9–4–13; 8:45 am]
BILLING CODE 3510–DS–P
DEPARTMENT OF COMMERCE
International Trade Administration
[C–570–938]
Citric Acid and Certain Citrate Salts
From the People’s Republic of China:
Notice of Partial Rescission of
Countervailing Duty Administrative
Review
Import Administration,
International Trade Administration,
Department of Commerce.
DATES: Effective Date: September 5,
2013.
FOR FURTHER INFORMATION CONTACT:
Patricia M. Tran or Raquel Silva, AD/
CVD Operations, Office 8, Import
Administration, International Trade
Administration, U.S. Department of
Commerce, 14th Street and Constitution
Avenue NW., Washington, DC 20230;
telephone: (202) 482–1503 or (202) 482–
6475, respectively.
SUPPLEMENTARY INFORMATION:
AGENCY:
Background
On May 1, 2013, the Department of
Commerce (the Department) published a
notice of opportunity to request an
administrative review of the
countervailing duty (CVD) order on
citric acid and certain citrate salts from
the People’s Republic of China (PRC)
covering the period of January 1, 2012,
through December 31, 2012.1 The
Department received a timely request
for a CVD administrative review from
Petitioners 2 for RZBC Group Co., Ltd.,
RZBC Co., Ltd., RZBC Import & Export
Co., Ltd., and RZBC (Juxian) Co., Ltd.
(collectively, RZBC). The Department
also received timely requests from RZBC
and Laiwu Taihe Biochemistry Co., Ltd.
(Laiwu) for a CVD administrative review
of themselves. On June 28, 2013, the
Department published the notice of
initiation of this CVD administrative
review with respect to the two
companies.3 On July 31, 2013, Laiwu
1 See Antidumping or Countervailing Duty Order,
Finding, or Suspended Investigation; Opportunity
To Request Administrative Review, 78 FR 25423
(May 1, 2013).
2 Archer Daniels Midland Company, Cargill,
Incorporated, and Tate & Lyle Ingredients Americas
LLC (collectively, Petitioners).
3 See Initiation of Antidumping and
Countervailing Duty Administrative Reviews and
E:\FR\FM\05SEN1.SGM
Continued
05SEN1
Agencies
[Federal Register Volume 78, Number 172 (Thursday, September 5, 2013)]
[Notices]
[Page 54625]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: 2013-21641]
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DEPARTMENT OF COMMERCE
International Trade Administration
Pacific Northwest National Laboratory, et al.: Notice of
Consolidated Decision on Applications for Duty-Free Entry of Electron
Microscope
This is a decision consolidated pursuant to Section 6(c) of the
Educational, Scientific, and Cultural Materials Importation Act of 1966
(Pub. L. 89-651, as amended by Pub. L. 106-36; 80 Stat. 897; 15 CFR
part 301). Related records can be viewed between 8:30 a.m. and 5:00
p.m. in Room 3720, U.S. Department of Commerce, 14th and Constitution
Avenue NW., Washington, DC.
Docket Number: 13-016. Applicant: Pacific Northwest National
Laboratory, Richland, WA 99352. Instrument: Electron Microscope.
Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 78 FR
34990, June 11, 2013.
Docket Number: 13-018. Applicant: The Scripps Institute, La Jolla,
CA 92037. Instrument: Electron Microscope. Manufacturer: FEI Company,
Czech Republic. Intended Use: See notice at 78 FR 34990, June 11, 2013.
Docket Number: 13-021. Applicant: University of Massachusetts
Amherst, Amherst, MA 01003. Instrument: Electron Microscope.
Manufacturer: JEOL Ltd, Japan. Intended Use: See notice at 78 FR 37206-
07, June 20, 2013.
Docket Number: 13-022. Applicant: University of Utah, Salt Lake
City, UT 84132. Instrument: Electron Microscope. Manufacturer: JEOL
Ltd., Japan. Intended Use: See notice at 78 FR 34990-91, June 11, 2013.
Docket Number: 13-024. Applicant: University of Pennsylvania,
Biomedical Research Building, Philadelphia, PA 19104. Instrument:
Electron Microscope. Manufacturer: FEI Company, Czech Republic.
Intended Use: See notice at 78 FR 34990-91, June 11, 2013.
Comments: None received. Decision: Approved. No instrument of
equivalent scientific value to the foreign instrument, for such
purposes as this instrument is intended to be used, is being
manufactured in the United States at the time the instrument was
ordered. Reasons: Each foreign instrument is an electron microscope and
is intended for research or scientific educational uses requiring an
electron microscope. We know of no electron microscope, or any other
instrument suited to these purposes, which was being manufactured in
the United States at the time of order of each instrument.
Dated: August 27, 2013.
Richard Herring,
Acting Director, Subsidies Enforcement Office, Import Administration.
[FR Doc. 2013-21641 Filed 9-4-13; 8:45 am]
BILLING CODE 3510-DS-P