Pacific Northwest National Laboratory, et al.: Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscope, 54625 [2013-21641]

Download as PDF ehiers on DSK2VPTVN1PROD with NOTICES Federal Register / Vol. 78, No. 172 / Thursday, September 5, 2013 / Notices sanctions), including the views of foreign purchasers or prospective customers regarding U.S. foreign policybased export controls. 2. Information on controls maintained by U.S. trade partners. For example, to what extent do U.S. trade partners have similar controls on goods and technology on a worldwide basis or to specific destinations? 3. Information on licensing policies or practices by our foreign trade partners that are similar to U.S. foreign policy based export controls, including license review criteria, use of conditions, and requirements for pre- and post-shipment verifications (preferably supported by examples of approvals, denials and foreign regulations). 4. Suggestions for bringing foreign policy-based export controls more into line with multilateral practice. 5. Comments or suggestions to make multilateral controls more effective. 6. Information that illustrates the effect of foreign policy-based export controls on trade or acquisitions by intended targets of the controls. 7. Data or other information on the effect of foreign policy-based export controls on overall trade at the level of individual industrial sectors. 8. Suggestions for measuring the effect of foreign policy-based export controls on trade. 9. Information on the use of foreign policy-based export controls on targeted countries, entities, or individuals. BIS is also interested in comments relating generally to the extension or revision of existing foreign policy-based export controls. Parties submitting comments are asked to be as specific as possible. All comments received before the close of the comment period will be considered by BIS in reviewing the controls and in developing the report to Congress. All comments received in response to this notice will be displayed on BIS’s Freedom of Information Act (FOIA) Web site at http://efoia.bis.doc.gov/ and on the Federal e-Rulemaking portal at www.Regulations.gov. All comments will also be included in a report to Congress, as required by section 6 of the EAA, which directs that BIS report to Congress the results of its consultations with industry on the effects of foreign policy-based controls. Dated: August 28, 2013. Matthew S. Borman, Deputy Assistant Secretary for Export Administration. [FR Doc. 2013–21577 Filed 9–4–13; 8:45 am] BILLING CODE 3510–33–P VerDate Mar<15>2010 14:10 Sep 04, 2013 Jkt 229001 DEPARTMENT OF COMMERCE International Trade Administration Pacific Northwest National Laboratory, et al.: Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscope This is a decision consolidated pursuant to Section 6(c) of the Educational, Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89–651, as amended by Pub. L. 106– 36; 80 Stat. 897; 15 CFR part 301). Related records can be viewed between 8:30 a.m. and 5:00 p.m. in Room 3720, U.S. Department of Commerce, 14th and Constitution Avenue NW., Washington, DC. Docket Number: 13–016. Applicant: Pacific Northwest National Laboratory, Richland, WA 99352. Instrument: Electron Microscope. Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 78 FR 34990, June 11, 2013. Docket Number: 13–018. Applicant: The Scripps Institute, La Jolla, CA 92037. Instrument: Electron Microscope. Manufacturer: FEI Company, Czech Republic. Intended Use: See notice at 78 FR 34990, June 11, 2013. Docket Number: 13–021. Applicant: University of Massachusetts Amherst, Amherst, MA 01003. Instrument: Electron Microscope. Manufacturer: JEOL Ltd, Japan. Intended Use: See notice at 78 FR 37206–07, June 20, 2013. Docket Number: 13–022. Applicant: University of Utah, Salt Lake City, UT 84132. Instrument: Electron Microscope. Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 78 FR 34990–91, June 11, 2013. Docket Number: 13–024. Applicant: University of Pennsylvania, Biomedical Research Building, Philadelphia, PA 19104. Instrument: Electron Microscope. Manufacturer: FEI Company, Czech Republic. Intended Use: See notice at 78 FR 34990–91, June 11, 2013. Comments: None received. Decision: Approved. No instrument of equivalent scientific value to the foreign instrument, for such purposes as this instrument is intended to be used, is being manufactured in the United States at the time the instrument was ordered. Reasons: Each foreign instrument is an electron microscope and is intended for research or scientific educational uses requiring an electron microscope. We know of no electron microscope, or any other instrument suited to these purposes, which was being manufactured in the United States at the time of order of each instrument. PO 00000 Frm 00009 Fmt 4703 Sfmt 4703 54625 Dated: August 27, 2013. Richard Herring, Acting Director, Subsidies Enforcement Office, Import Administration. [FR Doc. 2013–21641 Filed 9–4–13; 8:45 am] BILLING CODE 3510–DS–P DEPARTMENT OF COMMERCE International Trade Administration [C–570–938] Citric Acid and Certain Citrate Salts From the People’s Republic of China: Notice of Partial Rescission of Countervailing Duty Administrative Review Import Administration, International Trade Administration, Department of Commerce. DATES: Effective Date: September 5, 2013. FOR FURTHER INFORMATION CONTACT: Patricia M. Tran or Raquel Silva, AD/ CVD Operations, Office 8, Import Administration, International Trade Administration, U.S. Department of Commerce, 14th Street and Constitution Avenue NW., Washington, DC 20230; telephone: (202) 482–1503 or (202) 482– 6475, respectively. SUPPLEMENTARY INFORMATION: AGENCY: Background On May 1, 2013, the Department of Commerce (the Department) published a notice of opportunity to request an administrative review of the countervailing duty (CVD) order on citric acid and certain citrate salts from the People’s Republic of China (PRC) covering the period of January 1, 2012, through December 31, 2012.1 The Department received a timely request for a CVD administrative review from Petitioners 2 for RZBC Group Co., Ltd., RZBC Co., Ltd., RZBC Import & Export Co., Ltd., and RZBC (Juxian) Co., Ltd. (collectively, RZBC). The Department also received timely requests from RZBC and Laiwu Taihe Biochemistry Co., Ltd. (Laiwu) for a CVD administrative review of themselves. On June 28, 2013, the Department published the notice of initiation of this CVD administrative review with respect to the two companies.3 On July 31, 2013, Laiwu 1 See Antidumping or Countervailing Duty Order, Finding, or Suspended Investigation; Opportunity To Request Administrative Review, 78 FR 25423 (May 1, 2013). 2 Archer Daniels Midland Company, Cargill, Incorporated, and Tate & Lyle Ingredients Americas LLC (collectively, Petitioners). 3 See Initiation of Antidumping and Countervailing Duty Administrative Reviews and E:\FR\FM\05SEN1.SGM Continued 05SEN1

Agencies

[Federal Register Volume 78, Number 172 (Thursday, September 5, 2013)]
[Notices]
[Page 54625]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: 2013-21641]


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DEPARTMENT OF COMMERCE

International Trade Administration


Pacific Northwest National Laboratory, et al.: Notice of 
Consolidated Decision on Applications for Duty-Free Entry of Electron 
Microscope

    This is a decision consolidated pursuant to Section 6(c) of the 
Educational, Scientific, and Cultural Materials Importation Act of 1966 
(Pub. L. 89-651, as amended by Pub. L. 106-36; 80 Stat. 897; 15 CFR 
part 301). Related records can be viewed between 8:30 a.m. and 5:00 
p.m. in Room 3720, U.S. Department of Commerce, 14th and Constitution 
Avenue NW., Washington, DC.
    Docket Number: 13-016. Applicant: Pacific Northwest National 
Laboratory, Richland, WA 99352. Instrument: Electron Microscope. 
Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 78 FR 
34990, June 11, 2013.
    Docket Number: 13-018. Applicant: The Scripps Institute, La Jolla, 
CA 92037. Instrument: Electron Microscope. Manufacturer: FEI Company, 
Czech Republic. Intended Use: See notice at 78 FR 34990, June 11, 2013.
    Docket Number: 13-021. Applicant: University of Massachusetts 
Amherst, Amherst, MA 01003. Instrument: Electron Microscope. 
Manufacturer: JEOL Ltd, Japan. Intended Use: See notice at 78 FR 37206-
07, June 20, 2013.
    Docket Number: 13-022. Applicant: University of Utah, Salt Lake 
City, UT 84132. Instrument: Electron Microscope. Manufacturer: JEOL 
Ltd., Japan. Intended Use: See notice at 78 FR 34990-91, June 11, 2013.
    Docket Number: 13-024. Applicant: University of Pennsylvania, 
Biomedical Research Building, Philadelphia, PA 19104. Instrument: 
Electron Microscope. Manufacturer: FEI Company, Czech Republic. 
Intended Use: See notice at 78 FR 34990-91, June 11, 2013.
    Comments: None received. Decision: Approved. No instrument of 
equivalent scientific value to the foreign instrument, for such 
purposes as this instrument is intended to be used, is being 
manufactured in the United States at the time the instrument was 
ordered. Reasons: Each foreign instrument is an electron microscope and 
is intended for research or scientific educational uses requiring an 
electron microscope. We know of no electron microscope, or any other 
instrument suited to these purposes, which was being manufactured in 
the United States at the time of order of each instrument.

    Dated: August 27, 2013.
Richard Herring,
Acting Director, Subsidies Enforcement Office, Import Administration.
[FR Doc. 2013-21641 Filed 9-4-13; 8:45 am]
BILLING CODE 3510-DS-P