University of Illinois, et al.; Notice of Decision on Applications for Duty-Free Entry of Scientific Instruments, 39712 [2013-15883]

Download as PDF 39712 Federal Register / Vol. 78, No. 127 / Tuesday, July 2, 2013 / Notices above, the Department will instruct CBP to assess antidumping or countervailing duties on those entries at a rate equal to the cash deposit of (or bond for) estimated antidumping or countervailing duties required on those entries at the time of entry, or withdrawal from warehouse, for consumption and to continue to collect the cash deposit previously ordered. For the first administrative review of any order, there will be no assessment of antidumping or countervailing duties on entries of subject merchandise entered, or withdrawn from warehouse, for consumption during the relevant provisional-measures ‘‘gap’’ period, of the order, if such a gap period is applicable to the period of review. This notice is not required by statute but is published as a service to the international trading community. Dated: June 14, 2013. Christian Marsh, Deputy Assistant Secretary for Antidumping and Countervailing Duty Operations. [FR Doc. 2013–15761 Filed 7–1–13; 8:45 am] BILLING CODE 3510–DS–P DEPARTMENT OF COMMERCE International Trade Administration tkelley on DSK3SPTVN1PROD with NOTICES University of Illinois, et al.; Notice of Decision on Applications for Duty-Free Entry of Scientific Instruments This is a decision pursuant to Section 6(c) of the Educational, Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89–651, as amended by Pub. L. 106–36; 80 Stat. 897; 15 CFR part 301). Related records can be viewed between 8:30 a.m. and 5:00 p.m. in Room 3720, U.S. Department of Commerce, 14th and Constitution Ave, NW., Washington, DC. Docket Number: 13–007. Applicant: University of Illinois, Urbana, IL 61801. Instrument: Electron Microscope. Manufacturer: FEI Company, Czech Republic. Intended Use: See notice at 78 FR 20614–20615, April 5, 2013. Comments: None received. Decision: Approved. We know of no instruments of equivalent scientific value to the foreign instruments described below, for such purposes as this is intended to be used, that was being manufactured in the United States at the time of its order. Reasons: The instrument will be used to seek the measurement and potentially direct-tailoring of materials properties, through the study of the relation of structure to catalytic activity, strain and composition within nanostructures, the effects of impurities on the strength of materials, and other properties of VerDate Mar<15>2010 16:48 Jul 01, 2013 Jkt 229001 catalytic materials such as Pt, Ru, and Mo, semiconductor nanostructures (Si, Ge, InAs), metal alloys such as Ni/Al, and other materials. Docket Number: 13–010. Applicant: University of Pittsburgh, Pittsburgh, PA 15261. Instrument: Electron Microscope. Manufacturer: FEI Czech Republic. Intended Use: See notice at 78 FR 20614–20615, April 5, 2013. Comments: None received. Decision: Approved. We know of no instruments of equivalent scientific value to the foreign instruments described below, for such purposes as this is intended to be used, that was being manufactured in the United States at the time of its order. Reasons: The instrument will be used to gain a better understanding of the relationship between microstructure and the performance of materials, through the analysis of crystallographic texture, the identification of crystallographic orientation relationships between precipitates and the matrix, precipitate size distributions and the analysis of chemical compositions of electronic materials, advanced ceramics for medical applications, advanced Ni-based Superalloys, stainless steels (for energy applications), advanced high-strength steels, and many other materials. Docket Number: 13–011. Applicant: National Institutes of Health, Bethesda, MD 20892. Instrument: Electron Microscope. Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 78 FR 20614–20615, April 5, 2013. Comments: None received. Decision: Approved. We know of no instruments of equivalent scientific value to the foreign instruments described below, for such purposes as this is intended to be used, that was being manufactured in the United States at the time of its order. Reasons: The instrument will be used to help understand how the human body functions normally, such as in learning, memory or hearing, and to understand the pathologies of human diseases. In order to understand these functions, this instrument will be used in experiments such as identifying the molecular components of a structure in an adult and in development, as well as looking for changes in the structure brought on by disease or by normal functional changes in cells of living organisms such as nerve cells or neurons of the brain, as well as inner ear cells. Dated: June 26, 2013. Gregory W. Campbell, Director, Subsidies Enforcement Office, Import Administration. [FR Doc. 2013–15883 Filed 7–1–13; 8:45 am] BILLING CODE 3510–DS–P PO 00000 Frm 00009 Fmt 4703 Sfmt 4703 DEPARTMENT OF COMMERCE International Trade Administration Critical Infrastructure Protection and Cyber Security Trade Mission to Saudi Arabia and Kuwait Clarification and Amendment International Trade Administration, Department of Commerce. ACTION: Notice. AGENCY: The United States Department of Commerce, International Trade Administration, U.S. and Foreign Commercial Service (CS) is publishing this supplement to the Notice of the Renewable Energy and Energy Efficiency Executive Business Development Mission, 78 FR 6807, January 31, 2013, to clarify eligibility and amend the Notice to revise the dates and provide for selection of applicants on a rolling basis. SUPPLEMENTARY INFORMATION: SUMMARY: Amendments To Revise the Dates and Provide for Selection of Applicants on a Rolling Basis Background Recruitment for this Mission began at the end of January, and some pending applicants have indicated a need to finalize their schedules and travel arrangements for the July/summer holidays. We would like to extend the recruitment deadline until mid-July to allow them time to apply and to more easily vet all applicants and make selection decisions, CS is amending the Notice to allow for vetting and selection decisions on a rolling basis until July 15, 2013, until the maximum of 20 participants is selected, all interested U.S. IT and cyber-security firms and trade organizations which have not already submitted an application are encouraged to do so as soon as possible. Amendments 1. For the reasons stated above, the Selection Timeline section of the Notice of the Renewable Energy and Energy Efficiency Executive Business Development Mission, 78 FR 6807, January 31, 2013, is amended to read as follows: Selection Timeline Mission recruitment will be conducted in an open and public manner, including publication in the Federal Register, posting on the Commerce Department trade mission calendar (https://www.ita.doc.gov/ doctm/tmcal.html) and other Internet Web sites, press releases to general and E:\FR\FM\02JYN1.SGM 02JYN1

Agencies

[Federal Register Volume 78, Number 127 (Tuesday, July 2, 2013)]
[Notices]
[Page 39712]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: 2013-15883]


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DEPARTMENT OF COMMERCE

International Trade Administration


University of Illinois, et al.; Notice of Decision on 
Applications for Duty-Free Entry of Scientific Instruments

    This is a decision pursuant to Section 6(c) of the Educational, 
Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89-
651, as amended by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301). 
Related records can be viewed between 8:30 a.m. and 5:00 p.m. in Room 
3720, U.S. Department of Commerce, 14th and Constitution Ave, NW., 
Washington, DC.
    Docket Number: 13-007. Applicant: University of Illinois, Urbana, 
IL 61801. Instrument: Electron Microscope. Manufacturer: FEI Company, 
Czech Republic. Intended Use: See notice at 78 FR 20614-20615, April 5, 
2013. Comments: None received. Decision: Approved. We know of no 
instruments of equivalent scientific value to the foreign instruments 
described below, for such purposes as this is intended to be used, that 
was being manufactured in the United States at the time of its order. 
Reasons: The instrument will be used to seek the measurement and 
potentially direct-tailoring of materials properties, through the study 
of the relation of structure to catalytic activity, strain and 
composition within nanostructures, the effects of impurities on the 
strength of materials, and other properties of catalytic materials such 
as Pt, Ru, and Mo, semiconductor nanostructures (Si, Ge, InAs), metal 
alloys such as Ni/Al, and other materials.
    Docket Number: 13-010. Applicant: University of Pittsburgh, 
Pittsburgh, PA 15261. Instrument: Electron Microscope. Manufacturer: 
FEI Czech Republic. Intended Use: See notice at 78 FR 20614-20615, 
April 5, 2013. Comments: None received. Decision: Approved. We know of 
no instruments of equivalent scientific value to the foreign 
instruments described below, for such purposes as this is intended to 
be used, that was being manufactured in the United States at the time 
of its order. Reasons: The instrument will be used to gain a better 
understanding of the relationship between microstructure and the 
performance of materials, through the analysis of crystallographic 
texture, the identification of crystallographic orientation 
relationships between precipitates and the matrix, precipitate size 
distributions and the analysis of chemical compositions of electronic 
materials, advanced ceramics for medical applications, advanced Ni-
based Superalloys, stainless steels (for energy applications), advanced 
high-strength steels, and many other materials.
    Docket Number: 13-011. Applicant: National Institutes of Health, 
Bethesda, MD 20892. Instrument: Electron Microscope. Manufacturer: JEOL 
Ltd., Japan. Intended Use: See notice at 78 FR 20614-20615, April 5, 
2013. Comments: None received. Decision: Approved. We know of no 
instruments of equivalent scientific value to the foreign instruments 
described below, for such purposes as this is intended to be used, that 
was being manufactured in the United States at the time of its order. 
Reasons: The instrument will be used to help understand how the human 
body functions normally, such as in learning, memory or hearing, and to 
understand the pathologies of human diseases. In order to understand 
these functions, this instrument will be used in experiments such as 
identifying the molecular components of a structure in an adult and in 
development, as well as looking for changes in the structure brought on 
by disease or by normal functional changes in cells of living organisms 
such as nerve cells or neurons of the brain, as well as inner ear 
cells.

    Dated: June 26, 2013.
Gregory W. Campbell,
Director, Subsidies Enforcement Office, Import Administration.
[FR Doc. 2013-15883 Filed 7-1-13; 8:45 am]
BILLING CODE 3510-DS-P