Columbia University, et al.; Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscope, 5776 [2013-01702]

Download as PDF 5776 Federal Register / Vol. 78, No. 18 / Monday, January 28, 2013 / Notices 5112.11.60 and 5112.19.95). Amount allocated: 5,500,000 square meters. DEPARTMENT OF COMMERCE DEPARTMENT OF COMMERCE Companies Receiving Allocation International Trade Administration International Trade Administration Adrian Jules Ltd.—Rochester, NY Gil Sewing Corp.—Chicago, IL HMX, LLC—New York, NY Hugo Boss Fashions, Inc.—Brooklyn, OH J.A. Apparel Corp.—New York, NY John H. Daniel Co.—Knoxville, TN Miller’s Oath—New York, NY Saint Laurie Ltd.—New York, NY Tom James Co.—Franklin, TN Warren Sewell Clothing Co., Inc.— Bremen, GA HTS 9902.51.15, fabrics, of worsted wool, with average fiber diameter of 18.5 micron or less, certified by the importer as suitable for use in making suits, suit-type jackets, or trousers (provided for in subheading 5112.11.30 and 5112.19.60). Amount allocated: 5,000,000 square meters. Columbia University, et al.; Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscope University of Colorado Boulder, et al.; Notice of Consolidated Decision on Applications for Duty-Free Entry of Scientific Instruments Companies Receiving Allocation Adrian Jules Ltd.—Rochester, NY Brooks Brothers Group—New York, NY Elevee Custom Clothing—Van Nuys, CA Gil Sewing Corp.—Chicago, IL HMX, LLC—New York, NY Hugo Boss Fashions, Inc.—Brooklyn, OH J.A. Apparel Corp.—New York, NY John H. Daniel Co.—Knoxville, TN Martin Greenfield Clothiers—Brooklyn, NY Miller’s Oath—New York, NY Saint Laurie Ltd.—New York, NY Shelton and Company—East Rutherford, NJ Southwick Apparel LLC—Haverhill, MA Tom James Co.—Franklin, TN Warren Sewell Clothing Co., Inc.— Bremen, GA HTS 9902.51.16, fabrics, of worsted wool, with average fiber diameter of 18.5 micron or less, certified by the importer as suitable for use in making men’s and boy’s suits (provided for in subheading 5112.11.30 and 5112.19.60). Amount allocated: 2,000,000 square meters. Companies Receiving Allocation tkelley on DSK3SPTVN1PROD with Warren Corporation—Stafford Springs, CT Dated: January 22, 2013. Kim Glas, Deputy Assistant Secretary for Textiles and Apparel [FR Doc. 2013–01703 Filed 1–25–13; 8:45 am] This is a decision consolidated pursuant to Section 6(c) of the Educational, Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89–651, as amended by Pub. L. 106– 36; 80 Stat. 897; 15 CFR part 301). Related records can be viewed between 8:30 a.m. and 5:00 p.m. in Room 3720, U.S. Department of Commerce, 14th and Constitution Avenue NW., Washington, DC. Docket Number: 12–047. Applicant: Columbia University, New York, NY 10027. Instrument: Electron Microscope. Manufacturer: FEI Co., Czech Republic. Intended Use: See notice at 77 FR 72826, December 6, 2012. Docket Number: 12–052. Applicant: Stanford University, Stanford, CA 94305. Instrument: Titan 80–300 Environmental Transmission Electron Microscope. Manufacturer: FEI Co., the Netherlands. Intended Use: See notice at 77 FR 72826, December 6, 2012. Docket Number: 12–059. Applicant: Stanford University, Stanford, CA 94305. Instrument: Helios 600i Dual Beam Focused Ion Beam/Scanning Electron Microscope. Manufacturer: FEI Co., the Netherlands. Intended Use: See notice at 77 FR 72826, December 6, 2012. Comments: None received. Decision: Approved. No instrument of equivalent scientific value to the foreign instrument, for such purposes as this instrument is intended to be used, is being manufactured in the United States at the time the instrument was ordered. Reasons: Each foreign instrument is an electron microscope and is intended for research or scientific educational uses requiring an electron microscope. We know of no electron microscope, or any other instrument suited to these purposes, which was being manufactured in the United States at the time of order of each instrument. Dated: January 22, 2013. Gregory W. Campbell, Director, Subsidies Enforcement Office, Import Administration. [FR Doc. 2013–01702 Filed 1–25–13; 8:45 am] BILLING CODE 3510–DS–P BILLING CODE 3510–DS–P VerDate Mar<15>2010 18:22 Jan 25, 2013 Jkt 229001 PO 00000 Frm 00006 Fmt 4703 Sfmt 4703 This is a decision pursuant to Section 6(c) of the Educational, Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89–651, as amended by Pub. L. 106–36; 80 Stat. 897; 15 CFR part 301). Related records can be viewed between 8:30 a.m. and 5:00 p.m. in Room 3720, U.S. Department of Commerce, 14th and Constitution Ave. NW., Washington, DC. Comments: None received. Decision: Approved. We know of no instruments of equivalent scientific value to the foreign instruments described below, for such purposes as each is intended to be used, that was being manufactured in the United States at the time of its order. Docket Number: 12–053. Applicant: University of Colorado Boulder, Denver, CO 80203. Instrument: HF2LI Lock-In System. Manufacturer: Zurich Instruments AG, Switzerland. Intended Use: See notice at 77 FR 74647, December 17, 2012. Comments: None received. Decision: Approved. We know of no instruments of equivalent scientific value to the foreign instruments described below, for such purposes as this is intended to be used, that was being manufactured in the United States at the time of order. Reasons: The instrument will be used to measure detected near-field signals scattered off an Atomic Force Microscope (AFM) tip in a scatteringScanning Near-field Optical Microscope (s-SNOM). The instrument will detect the magnitude and phase of the light scattered by an AFM tip to measure the electromagnetic near-field of optical antennas, plasmonics in metals and semiconductors (including graphene), photonic crystals, and other nanoscale spectroscopy applications. The instrument has the ability to fully digitize the measured signal and analyze it at 50 MHz, as well as the ability to demodulate many frequencies at once, which is essential to the measurement technique. Demodulation at 50 MHz is necessary because the AFM tip oscillates at 350–300 kHz, and higher harmonics (5th or 6th) of this oscillation must be measured to isolate the nearfield signal. Docket Number: 12–054. Applicant: Purdue University, West Lafayette, IN 47909–2036. Instrument: DD Neutron Generator. Manufacturer: NSD Fusion, Germany. Intended Use: See notice at 77 E:\FR\FM\28JAN1.SGM 28JAN1

Agencies

[Federal Register Volume 78, Number 18 (Monday, January 28, 2013)]
[Notices]
[Page 5776]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: 2013-01702]


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DEPARTMENT OF COMMERCE

International Trade Administration


Columbia University, et al.; Notice of Consolidated Decision on 
Applications for Duty-Free Entry of Electron Microscope

    This is a decision consolidated pursuant to Section 6(c) of the 
Educational, Scientific, and Cultural Materials Importation Act of 1966 
(Pub. L. 89-651, as amended by Pub. L. 106-36; 80 Stat. 897; 15 CFR 
part 301). Related records can be viewed between 8:30 a.m. and 5:00 
p.m. in Room 3720, U.S. Department of Commerce, 14th and Constitution 
Avenue NW., Washington, DC.
    Docket Number: 12-047. Applicant: Columbia University, New York, NY 
10027. Instrument: Electron Microscope. Manufacturer: FEI Co., Czech 
Republic. Intended Use: See notice at 77 FR 72826, December 6, 2012.
    Docket Number: 12-052. Applicant: Stanford University, Stanford, CA 
94305. Instrument: Titan 80-300 Environmental Transmission Electron 
Microscope. Manufacturer: FEI Co., the Netherlands. Intended Use: See 
notice at 77 FR 72826, December 6, 2012.
    Docket Number: 12-059. Applicant: Stanford University, Stanford, CA 
94305. Instrument: Helios 600i Dual Beam Focused Ion Beam/Scanning 
Electron Microscope. Manufacturer: FEI Co., the Netherlands. Intended 
Use: See notice at 77 FR 72826, December 6, 2012.
    Comments: None received. Decision: Approved. No instrument of 
equivalent scientific value to the foreign instrument, for such 
purposes as this instrument is intended to be used, is being 
manufactured in the United States at the time the instrument was 
ordered. Reasons: Each foreign instrument is an electron microscope and 
is intended for research or scientific educational uses requiring an 
electron microscope. We know of no electron microscope, or any other 
instrument suited to these purposes, which was being manufactured in 
the United States at the time of order of each instrument.

     Dated: January 22, 2013.
Gregory W. Campbell,
Director, Subsidies Enforcement Office, Import Administration.
[FR Doc. 2013-01702 Filed 1-25-13; 8:45 am]
BILLING CODE 3510-DS-P
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