Max Planck Florida Institute, et al.; Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscope, 14504 [2012-5934]
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14504
Federal Register / Vol. 77, No. 48 / Monday, March 12, 2012 / Notices
company-specific rate established for
the most recent period; (3) if the
exporter is not a firm covered in this
review, a prior review, or the less-thanfair-value investigation, but the
producer is, the cash deposit rate will be
the rate established for the most recent
period for the manufacturer of the
subject merchandise; and (4) if neither
the exporter nor the producer is a firm
covered in this review, a prior review,
or the investigation, the cash deposit
rate will be 17.70 percent, the all-others
rate established in the less-than-fairvalue investigation. These deposit
requirements shall remain in effect until
further notice.
B. Company-Specific Issues
Reimbursement of Duties
This notice also serves as a final
reminder to importers of their
responsibility under 19 CFR 351.402(f)
to file a certificate regarding the
reimbursement of antidumping and/or
countervailing duties prior to
liquidation of the relevant entries
during this review period. Failure to
comply with this requirement could
result in the presumption that
reimbursement of antidumping and/or
countervailing duties occurred and the
subsequent increase in antidumping
duties by the amount of antidumping
and/or countervailing duties
reimbursed.
Dongbu
Comment 9: Treatment of Home
Market Billing Adjustments.
Administrative Protective Order
This notice also is the only reminder
to parties subject to administrative
protective order (APO) of their
responsibility concerning the return or
destruction of proprietary information
disclosed under APO in accordance
with 19 CFR 351.305. Timely written
notification of the return/destruction of
APO materials or conversion to judicial
protective order is hereby requested.
Failure to comply with the regulations
and the terms of an APO is a
sanctionable violation.
We are issuing and publishing these
results and notice in accordance with
sections 751(a)(1) and 777(i)(1) of the
Act.
pmangrum on DSK3VPTVN1PROD with NOTICES
Dated: March 5, 2012.
Paul Piquado,
Assistant Secretary for Import
Administration.
Appendix I
List of Comments in the
Accompanying Issues and Decision
Memorandum:
A. General Issues
Comment 1: Treatment of ‘‘Negative
Dumping Margins’’ (Zeroing).
Comment 2: Collapsing Union and
POSCO.
VerDate Mar<15>2010
14:55 Mar 09, 2012
Jkt 226001
Hyundai HYSCO
Comment 3: Treatment of Non-temper
Rolled Merchandise.
Comment 4: Date of Sale for U.S.
Sales.
The POSCO Group
Comment 5: Revocation from the
Order.
Comment 6: Date of Sale for U.S.
Sales.
Union
Comment 7: Date of Sale for U.S.
Sales.
Comment 8: Missing Payment Dates.
[FR Doc. 2012–5937 Filed 3–9–12; 8:45 am]
BILLING CODE 3510–DS–P
DEPARTMENT OF COMMERCE
International Trade Administration
Max Planck Florida Institute, et al.;
Notice of Consolidated Decision on
Applications for Duty-Free Entry of
Electron Microscope
This is a decision consolidated
pursuant to Section 6(c) of the
Educational, Scientific, and Cultural
Materials Importation Act of 1966 (Pub.
L. 89–651, as amended by Pub. L. 106–
36; 80 Stat. 897; 15 CFR part 301).
Related records can be viewed between
8:30 a.m. and 5 p.m. in Room 3720, U.S.
Department of Commerce, 14th and
Constitution Avenue NW., Washington,
DC.
Docket Number: 11–061. Applicant:
Max Planck Florida Institute, Jupiter, FL
33458. Instrument: Electron Microscope.
Manufacturer: FEI Company, Czech
Republic. Intended Use: See notice at 77
FR 5767, February 6, 2012.
Docket Number: 11–070. Applicant:
University of Utah, Salt Lake City, UT
84112. Instrument: Electron Microscope.
Manufacturer: FEI Company, Czech
Republic. Intended Use: See notice at 77
FR 5767, February 6, 2012.
Docket Number: 11–071. Applicant:
Texas Tech University, Lubbock, TX
79409–3103. Instrument: Electron
Microscope. Manufacturer: Hitachi
High-Technologies Corporation, Japan.
Intended Use: See notice at 77 FR 5767,
February 6, 2012.
Docket Number: 11–073. Applicant:
Ball State University, Muncie, IN 47306.
Instrument: Electron Microscope.
Manufacturer: JEOL Ltd., Japan.
Intended Use: See notice at 77 FR 5767,
February 6, 2012.
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Docket Number: 11–075. Applicant:
Cleveland State University, Cleveland,
OH 44115–2214. Instrument: Electron
Microscope. Manufacturer: FEI
Company, Czech Republic. Intended
Use: See notice at 77 FR 5767, February
6, 2012.
Docket Number: 12–003. Applicant:
University of California, Irvine, Irvine,
CA 92697. Instrument: Electron
Microscope. Manufacturer: FEI
Company, Czech Republic. Intended
Use: See notice at 77 FR 5767, February
6, 2012.
Comments: None received. Decision:
Approved. No instrument of equivalent
scientific value to the foreign
instrument, for such purposes as this
instrument is intended to be used, is
being manufactured in the United States
at the time the instrument was ordered.
Reasons: Each foreign instrument is an
electron microscope and is intended for
research or scientific educational uses
requiring an electron microscope. We
know of no electron microscope, or any
other instrument suited to these
purposes, which was being
manufactured in the United States at the
time of order of each instrument.
Dated: March 5, 2012.
Gregory W. Campbell,
Director, Subsidies Enforcement Office,
Import Administration.
[FR Doc. 2012–5934 Filed 3–9–12; 8:45 am]
BILLING CODE 3510–DS–P
DEPARTMENT OF COMMERCE
International Trade Administration
University of California, Davis, et al.;
Notice of Decision on Applications for
Duty-Free Entry of Scientific
Instruments
This is a decision pursuant to Section
6(c) of the Educational, Scientific, and
Cultural Materials Importation Act of
1966 (Pub. L. 89–651, as amended by
Pub. L. 106–36; 80 Stat. 897; 15 CFR
part 301). Related records can be viewed
between 8:30 a.m. and 5 p.m. in Room
3720, U.S. Department of Commerce,
14th and Constitution Ave. NW.,
Washington, DC.
Docket Number: 11–072. Applicant:
University of California, Davis, NEAT
ORU, One Shields Avenue Davis, CA
95616. Instrument: Alexsys 1000
Calorimeter. Manufacturer: Setaram
Instrumentation, France. Intended Use:
See notice at 77 FR 5768, February 6,
2012. Comments: None received.
Decision: Approved. We know of no
instruments of equivalent scientific
value to the foreign instruments
described below, for such purposes as
E:\FR\FM\12MRN1.SGM
12MRN1
]]>Agencies
[Federal Register Volume 77, Number 48 (Monday, March 12, 2012)]
[Notices]
[Page 14504]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: 2012-5934]
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DEPARTMENT OF COMMERCE
International Trade Administration
Max Planck Florida Institute, et al.; Notice of Consolidated
Decision on Applications for Duty-Free Entry of Electron Microscope
This is a decision consolidated pursuant to Section 6(c) of the
Educational, Scientific, and Cultural Materials Importation Act of 1966
(Pub. L. 89-651, as amended by Pub. L. 106-36; 80 Stat. 897; 15 CFR
part 301). Related records can be viewed between 8:30 a.m. and 5 p.m.
in Room 3720, U.S. Department of Commerce, 14th and Constitution Avenue
NW., Washington, DC.
Docket Number: 11-061. Applicant: Max Planck Florida Institute,
Jupiter, FL 33458. Instrument: Electron Microscope. Manufacturer: FEI
Company, Czech Republic. Intended Use: See notice at 77 FR 5767,
February 6, 2012.
Docket Number: 11-070. Applicant: University of Utah, Salt Lake
City, UT 84112. Instrument: Electron Microscope. Manufacturer: FEI
Company, Czech Republic. Intended Use: See notice at 77 FR 5767,
February 6, 2012.
Docket Number: 11-071. Applicant: Texas Tech University, Lubbock,
TX 79409-3103. Instrument: Electron Microscope. Manufacturer: Hitachi
High-Technologies Corporation, Japan. Intended Use: See notice at 77 FR
5767, February 6, 2012.
Docket Number: 11-073. Applicant: Ball State University, Muncie, IN
47306. Instrument: Electron Microscope. Manufacturer: JEOL Ltd., Japan.
Intended Use: See notice at 77 FR 5767, February 6, 2012.
Docket Number: 11-075. Applicant: Cleveland State University,
Cleveland, OH 44115-2214. Instrument: Electron Microscope.
Manufacturer: FEI Company, Czech Republic. Intended Use: See notice at
77 FR 5767, February 6, 2012.
Docket Number: 12-003. Applicant: University of California, Irvine,
Irvine, CA 92697. Instrument: Electron Microscope. Manufacturer: FEI
Company, Czech Republic. Intended Use: See notice at 77 FR 5767,
February 6, 2012.
Comments: None received. Decision: Approved. No instrument of
equivalent scientific value to the foreign instrument, for such
purposes as this instrument is intended to be used, is being
manufactured in the United States at the time the instrument was
ordered. Reasons: Each foreign instrument is an electron microscope and
is intended for research or scientific educational uses requiring an
electron microscope. We know of no electron microscope, or any other
instrument suited to these purposes, which was being manufactured in
the United States at the time of order of each instrument.
Dated: March 5, 2012.
Gregory W. Campbell,
Director, Subsidies Enforcement Office, Import Administration.
[FR Doc. 2012-5934 Filed 3-9-12; 8:45 am]
BILLING CODE 3510-DS-P
