Application(s) for Duty-Free Entry of Scientific Instruments, 58245 [2011-24122]

Download as PDF Federal Register / Vol. 76, No. 182 / Tuesday, September 20, 2011 / Notices Administrative Reviews and Deferral of Initiation of Administrative Review, 76 FR 53404 (August 26, 2011). On August 23, 2011, Vacmet and Polypacks withdrew their requests for an AD administrative review. Rescission, In Part Pursuant to 19 CFR 351.213(d)(1), the Secretary will rescind an administrative review, in whole or in part, if a party that requested the review withdraws the request within 90 days of the date of publication of notice of initiation of the requested review. Vacmet’s and Polypacks’ requests were submitted within the 90-day period and, thus, are timely. Because Vacmet’s and Polypacks’ withdrawals of request for an AD administrative review are timely and because no other party requested a review of Vacmet and Polypacks, in accordance with 19 CFR 351.213(d)(1), we are rescinding this AD administrative review with respect to Vacmet and Polypacks. Assessment The Department will instruct U.S. Customs and Border Protection (CBP) to assess antidumping duties on all appropriate entries. Vacmet and Polypacks shall be assessed antidumping duties at rates equal to the cash deposit of estimated antidumping duties required at the time of entry, or withdrawal from warehouse, for consumption, in accordance with 19 CFR 351.212(c)(1)(i). The Department intends to issue appropriate assessment instructions to CBP 15 days after publication of this notice. Emcdonald on DSK5VPTVN1PROD with NOTICES Notification to Importers This notice serves as a reminder to importers of their responsibility under 19 CFR 351.402(f)(2) to file a certificate regarding the reimbursement of antidumping duties prior to liquidation of the relevant entries during this review period. Failure to comply with this requirement could result in the Secretary’s presumption that reimbursement of antidumping duties occurred and the subsequent assessment of doubled antidumping duties. Notification Regarding Administrative Protective Orders This notice also serves as a reminder to parties subject to administrative protective order (APO) of their responsibility concerning the return or destruction of proprietary information disclosed under APO in accordance with 19 CFR 351.305, which continues to govern business proprietary information in this segment of the proceeding. Timely written notification VerDate Mar<15>2010 17:45 Sep 19, 2011 Jkt 223001 58245 of the return/destruction of APO materials or conversion to judicial protective order is hereby requested. Failure to comply with the regulations and terms of an APO is a violation which is subject to sanction. This notice is issued and published in accordance with section 777(i)(1) of the Tariff Act of 1930, as amended, and 19 CFR 351.213(d)(4). Dated: September 14, 2011. Gregory Campbell, Director, IA Subsidies Enforcement Office. Dated: September 14, 2011. Christian Marsh, Deputy Assistant Secretary for Antidumping and Countervailing Duty Operations. Ohio State University, et al.; Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscope [FR Doc. 2011–24148 Filed 9–19–11; 8:45 am] This is a decision consolidated pursuant to Section 6(c) of the Educational, Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89–651, as amended by Pub. L. 106– 36; 80 Stat. 897; 15 CFR part 301). Related records can be viewed between 8:30 a.m. and 5 p.m. in Room 3720, U.S. Department of Commerce, 14th and Constitution Avenue, NW., Washington, DC. Docket Number: 11–047. Applicant: Ohio State University, Columbus, OH 43210. Instrument: Electron Microscope. Manufacturer: FEI Company, Czech Republic. Intended Use: See notice at 76 FR 50997, August 17, 2011. Docket Number: 11–050. Applicant: Southwest Research Institute, San Antonio, TX 78239–5166. Instrument: Electron Microscope. Manufacturer: FEI Company, Czech Republic. Intended Use: See notice at 76 FR 50997, August 17, 2011. Docket Number: 11–052. Applicant: Southern University and A&M College, Baton Rouge, LA 70813. Instrument: Electron Microscope. Manufacturer: JEOL, Japan. Intended Use: See notice at 76 FR 50997, August 17, 2011. Docket Number: 11–053. Applicant: University of Texas Health Science Center-Houston, Houston, TX 77303. Instrument: Electron Microscope. Manufacturer: JEOL, Japan. Intended Use: See notice at 76 FR 50997, August 17, 2011. Docket Number: 11–054. Applicant: Battelle Energy Alliance, Idaho National Laboratory, Idaho Falls, ID 83415. Instrument: Electron Microscope. Manufacturer: FEI Company, Czech Republic. Intended Use: See notice at 76 FR 50997, August 17, 2011. Docket Number: 11–055. Applicant: University of Washington, Seattle, WA 98195. Instrument: Electron Microscope. Manufacturer: FEI Company, the Netherlands. Intended Use: See notice at 76 FR 50997, August 17, 2011. Comments: None received. Decision: Approved. No instrument of equivalent scientific value to the foreign BILLING CODE 3510–DS–P DEPARTMENT OF COMMERCE International Trade Administration Application(s) for Duty-Free Entry of Scientific Instruments Pursuant to Section 6(c) of the Educational, Scientific and Cultural Materials Importation Act of 1966 (Pub. L. 89–651, as amended by Pub. L. 106– 36; 80 Stat. 897; 15 CFR part 301), we invite comments on the question of whether instruments of equivalent scientific value, for the purposes for which the instruments shown below are intended to be used, are being manufactured in the United States. Comments must comply with 15 CFR 301.5(a)(3) and (4) of the regulations and be postmarked on or before October 11, 2011. Address written comments to Statutory Import Programs Staff, Room 3720, U.S. Department of Commerce, Washington, DC 20230. Applications may be examined between 8:30 a.m. and 5 p.m. at the U.S. Department of Commerce in Room 3720. Docket Number: 11–060. Applicant: Brookhaven National Laboratory, 480 Cornell Avenue, Upton, New York 11973. Instrument: Electron Microscope. Manufacturer: JEOL, Ltd., Japan. Intended Use: The instrument will be used to study crystalline and electronic structures of energy-related matter including superconductors and thermoelectric materials, using electron diffraction, high resolution imaging, and other techniques. The objectives include determining the links of structures to the physical properties of materials, to help improve the properties of such materials. Justification for Duty-Free Entry: There are no instruments of the same general category manufactured in the United States. Application accepted by Commissioner of Customs: August 24, 2011. PO 00000 Frm 00009 Fmt 4703 Sfmt 4703 [FR Doc. 2011–24122 Filed 9–19–11; 8:45 am] BILLING CODE 3510–DS–P DEPARTMENT OF COMMERCE International Trade Administration E:\FR\FM\20SEN1.SGM 20SEN1

Agencies

[Federal Register Volume 76, Number 182 (Tuesday, September 20, 2011)]
[Notices]
[Page 58245]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: 2011-24122]


-----------------------------------------------------------------------

DEPARTMENT OF COMMERCE

International Trade Administration


Application(s) for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended 
by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments 
on the question of whether instruments of equivalent scientific value, 
for the purposes for which the instruments shown below are intended to 
be used, are being manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be postmarked on or before October 11, 2011. Address 
written comments to Statutory Import Programs Staff, Room 3720, U.S. 
Department of Commerce, Washington, DC 20230. Applications may be 
examined between 8:30 a.m. and 5 p.m. at the U.S. Department of 
Commerce in Room 3720.
    Docket Number: 11-060. Applicant: Brookhaven National Laboratory, 
480 Cornell Avenue, Upton, New York 11973. Instrument: Electron 
Microscope. Manufacturer: JEOL, Ltd., Japan. Intended Use: The 
instrument will be used to study crystalline and electronic structures 
of energy-related matter including superconductors and thermoelectric 
materials, using electron diffraction, high resolution imaging, and 
other techniques. The objectives include determining the links of 
structures to the physical properties of materials, to help improve the 
properties of such materials. Justification for Duty-Free Entry: There 
are no instruments of the same general category manufactured in the 
United States. Application accepted by Commissioner of Customs: August 
24, 2011.

    Dated: September 14, 2011.
Gregory Campbell,
Director, IA Subsidies Enforcement Office.
[FR Doc. 2011-24122 Filed 9-19-11; 8:45 am]
BILLING CODE 3510-DS-P

This site is protected by reCAPTCHA and the Google Privacy Policy and Terms of Service apply.