Brandeis University, et al.; Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscope, 56157 [2011-23277]

Download as PDF Federal Register / Vol. 76, No. 176 / Monday, September 12, 2011 / Notices Panel Decision: On April 14, 2010, the initial decision was issued by this panel remanding to the U.S. Department of Commerce to: (1) Recalculate Mexinox’s dumping margins without zeroing, and (2) to recalculate the indirect selling expense ratio (ISE) in a manner not inconsistent with the panel’s opinion and affirming Commerce’s determinations on all other issues being contested. The Department’s decision in the final results of the 2004/2005 antidumping review was, in all other respects, upheld. On August 19, 2011, with two dissenting views, the panel majority remanded to Commerce its Remand Determination to comply with its instructions in the April 2010 initial decision. The panel directed Commerce to issue its Final Re-determination on this second remand within thirty (30) days from the date of this panel decision. Dated: September 6, 2011. Ellen M. Bohon, U.S. Secretary, NAFTA Secretariat. Republic. Intended Use: See notice at 76 FR 48803, August 9, 2011. Docket Number: 11–051. Applicant: DOD Uniformed Services University of the Health Sciences, Bethesda, MD 20814–4799. Instrument: Transmission Electron Microscope. Manufacturer: JEOL, Ltd., Japan. Intended Use: See notice at 76 FR 48803, August 9, 2011. Comments: None received. Decision: Approved. No instrument of equivalent scientific value to the foreign instrument, for such purposes as this instrument is intended to be used, is being manufactured in the United States at the time the instrument was ordered. Reasons: Each foreign instrument is an electron microscope and is intended for research or scientific educational uses requiring an electron microscope. We know of no electron microscope, or any other instrument suited to these purposes, which was being manufactured in the United States at the time of order of each instrument. Dated: September 2, 2011. Gregory W. Campbell, Director, Subsidies Enforcement Office, Import Administration. [FR Doc. 2011–23160 Filed 9–9–11; 8:45 am] BILLING CODE 3510–GT–P [FR Doc. 2011–23277 Filed 9–9–11; 8:45 am] BILLING CODE 3510–DS–P DEPARTMENT OF COMMERCE DEPARTMENT OF COMMERCE Brandeis University, et al.; Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscope mstockstill on DSK4VPTVN1PROD with NOTICES International Trade Administration International Trade Administration This is a decision consolidated pursuant to Section 6(c) of the Educational, Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89–651, as amended by Pub. L. 106– 36; 80 Stat. 897; 15 CFR part 301). Related records can be viewed between 8:30 a.m. and 5 p.m. in Room 3720, U.S. Department of Commerce, 14th and Constitution Avenue, NW., Washington, DC. Docket Number: 11–042. Applicant: Brandeis University, Waltham, MA 02454. Instrument: Technai G2 F20 Twin Electron Microscope. Manufacturer: FEI Company, the Netherlands. Intended Use: See notice at 76 FR 48803, August 9, 2011. Docket Number: 11–043. Applicant: Mississippi State University, Pearl, MS 39208. Instrument: Transmission Electron Microscope. Manufacturer: JEOL, Ltd., Japan. Intended Use: See notice at 76 FR 47148, August 4, 2011. Docket Number: 11–049. Applicant: University of Missouri, Columbia, MO 65211. Instrument: Electron Microscope. Manufacturer: FEI Company, Czech This is a decision pursuant to Section 6(c) of the Educational, Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89–651, as amended by Pub. L. 106–36; 80 Stat. 897; 15 CFR part 301). Related records can be viewed between 8:30 a.m. and 5 p.m. in Room 3720, U.S. Department of Commerce, 14th and Constitution Ave., NW., Washington, DC. Docket Number: 11–030. Applicant: University of Chicago, Institute for Genomic Systems and Biology, Chicago, IL 60637. Instrument: Digital Scanned Laser Microscope. Manufacturer: Emblem GMBH, Germany. Intended Use: See notice at 76 FR 48803, August 9, 2011. Comments: None received. Decision: Approved. We know of no instruments of equivalent scientific value to the foreign instruments described below, for such purposes as this is intended to be used, that was being manufactured in the United States at the time of its order. Reasons: The instrument will be used to study the functions and properties of biological materials, such as biomedical VerDate Mar<15>2010 16:36 Sep 09, 2011 Jkt 223001 University of Chicago, et al.; Notice of Decision on Applications for Duty-Free Entry of Scientific Instruments PO 00000 Frm 00017 Fmt 4703 Sfmt 4703 56157 specimens, through microscopy imaging and recording of fluorescently labeled, light-sensitive samples. The DSLM is a new prototype not available commercially. Docket Number: 11–044. Applicant: University of Chicago, Argonne National Laboratory, Lemont, IL 60439. Instrument: Magneto-optical Kerr Microscope System. Manufacturer: Evico Magnetics GmgH, Germany. Intended Use: See notice at 76 FR 47148, August 4, 2011. Comments: None received. Decision: Approved. We know of no instruments of equivalent scientific value to the foreign instruments described below, for such purposes as this is intended to be used, that was being manufactured in the United States at the time of its order. Reasons: The instrument will be used for real-time imaging of magnetic domains, as well as provide Kerr effect magnetic hysteresis loops, thereby providing important information on the reversal behavior in ferromagnetic films. Docket Number: 11–045. Applicant: University of California Santa Barbara, Santa Barbara, CA 93106–5050. Instrument: Ultrasonic Fatigue Testing Equipment. Manufacturer: University of Natural Resources and Applied Life Sciences, Austria. Intended Use: See notice at 76 FR 48803, August 9, 2011. Comments: None received. Decision: Approved. We know of no instruments of equivalent scientific value to the foreign instruments described below, for such purposes as this is intended to be used, that was being manufactured in the United States at the time of its order. Reasons: The instrument is a highly specialized system for studying a wide range of materials used in very high cycle, high temperature applications, such as light metals, composite metal/ ceramics, titanium alloys and superalloys. Docket Number: 11–046. Applicant: University of California Los Angeles, Los Angeles, CA 90095. Instrument: Luminescence Reader. Manufacturer: Technical University of Denmark, Riso National Laboratory, Denmark. Intended Use: See notice at 76 FR 48803, August 9, 2011. Comments: None received. Decision: Approved. We know of no instruments of equivalent scientific value to the foreign instruments described below, for such purposes as this is intended to be used, that was being manufactured in the United States at the time of its order. Reasons: The instrument will be used to study the age of rock and sediment samples using thermoluminescence, optically stimulated luminescence and infrared luminescence. E:\FR\FM\12SEN1.SGM 12SEN1

Agencies

[Federal Register Volume 76, Number 176 (Monday, September 12, 2011)]
[Notices]
[Page 56157]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: 2011-23277]


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DEPARTMENT OF COMMERCE

International Trade Administration


Brandeis University, et al.; Notice of Consolidated Decision on 
Applications for Duty-Free Entry of Electron Microscope

    This is a decision consolidated pursuant to Section 6(c) of the 
Educational, Scientific, and Cultural Materials Importation Act of 1966 
(Pub. L. 89-651, as amended by Pub. L. 106-36; 80 Stat. 897; 15 CFR 
part 301). Related records can be viewed between 8:30 a.m. and 5 p.m. 
in Room 3720, U.S. Department of Commerce, 14th and Constitution 
Avenue, NW., Washington, DC.
    Docket Number: 11-042. Applicant: Brandeis University, Waltham, MA 
02454. Instrument: Technai G2 F20 Twin Electron Microscope. 
Manufacturer: FEI Company, the Netherlands. Intended Use: See notice at 
76 FR 48803, August 9, 2011.
    Docket Number: 11-043. Applicant: Mississippi State University, 
Pearl, MS 39208. Instrument: Transmission Electron Microscope. 
Manufacturer: JEOL, Ltd., Japan. Intended Use: See notice at 76 FR 
47148, August 4, 2011.
    Docket Number: 11-049. Applicant: University of Missouri, Columbia, 
MO 65211. Instrument: Electron Microscope. Manufacturer: FEI Company, 
Czech Republic. Intended Use: See notice at 76 FR 48803, August 9, 
2011.
    Docket Number: 11-051. Applicant: DOD Uniformed Services University 
of the Health Sciences, Bethesda, MD 20814-4799. Instrument: 
Transmission Electron Microscope. Manufacturer: JEOL, Ltd., Japan. 
Intended Use: See notice at 76 FR 48803, August 9, 2011.
    Comments: None received. Decision: Approved. No instrument of 
equivalent scientific value to the foreign instrument, for such 
purposes as this instrument is intended to be used, is being 
manufactured in the United States at the time the instrument was 
ordered. Reasons: Each foreign instrument is an electron microscope and 
is intended for research or scientific educational uses requiring an 
electron microscope. We know of no electron microscope, or any other 
instrument suited to these purposes, which was being manufactured in 
the United States at the time of order of each instrument.

    Dated: September 2, 2011.
Gregory W. Campbell,
Director, Subsidies Enforcement Office, Import Administration.
[FR Doc. 2011-23277 Filed 9-9-11; 8:45 am]
BILLING CODE 3510-DS-P