Battelle Memorial Institute, et al.; Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscopes, 17381 [2011-7226]

Download as PDF Federal Register / Vol. 76, No. 60 / Tuesday, March 29, 2011 / Notices to complete the review within these time periods, section 751(a)(3)(A) of the Act allows the Department to extend the time limit for the preliminary results to a maximum of 365 days after the last day of the anniversary month. We determine that it is not practicable to complete the preliminary results of this review by the current deadline of April 2, 2011, because we require additional time to analyze a complex affiliation issue pertaining to the exporter subject to this administrative review. Therefore, we are extending the time period for issuing the preliminary results of this review by 75 days to June 16, 2011. This notice is published in accordance with section 751(a)(3)(A) of the Act and 19 CFR 351.213(h)(2). Dated: March 23, 2011. Gary Taverman, Acting Deputy Assistant Secretary for Antidumping and Countervailing Duty Operations. [FR Doc. 2011–7361 Filed 3–28–11; 8:45 am] BILLING CODE 3510–DS–P DEPARTMENT OF COMMERCE International Trade Administration [A–580–816] Certain Corrosion-Resistant Carbon Steel Flat Products From the Republic of Korea: Notice of Final Results of the Sixteenth Administrative Review Correction In notice document 2011–6566 beginning on page 15291 in the issue of Monday, March 21, 2010, make the following corrections: On page 15293, in the first column, in the table at the bottom of the page, in the table column labeled ‘‘Percent margin’’, in the second row, ‘‘a9.05’’ should read ‘‘a0.05’’. On the same page, in the same table, in the same column, in the fifth row, ‘‘3.0%’’ should read ‘‘3.01’’. [FR Doc. C1–2011–6566 Filed 3–28–11; 8:45 am] BILLING CODE 1505–01–D DEPARTMENT OF COMMERCE jlentini on DSKJ8SOYB1PROD with NOTICES International Trade Administration Battelle Memorial Institute, et al.; Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscopes This is a decision consolidated pursuant to Section 6(c) of the Educational, Scientific, and Cultural Materials Importation Act of 1966 (Pub. VerDate Mar<15>2010 16:37 Mar 28, 2011 Jkt 223001 L. 89–651, as amended by Pub. L. 106– 36; 80 Stat. 897; 15 CFR part 301). Related records can be viewed between 8:30 a.m. and 5 p.m. in Room 3720, U.S. Department of Commerce, 14th and Constitution Avenue., NW., Washington, DC. Docket Number: 10–045. Applicant: Battelle Memorial Institute, Richland, WA 99354. Instrument: Electron Microscope. Manufacturer: FEI Company, the Netherlands. Intended Use: See notice at 76 FR 11199, March 1, 2011. Docket Number: 10–072. Applicant: University of Puerto Rico, San Juan, PR 00936–5067. Instrument: Electron Microscope. Manufacturer: JEOL, Ltd., Japan. Intended Use: See notice at 76 FR 11199, March 1, 2011. Docket Number: 10–076. Applicant: Regents of the University of Minnesota, Minneapolis, MN 55455. Instrument: Electron Microscope. Manufacturer: FEI Inc., Czech Republic. Intended Use: See notice at 76 FR 11199, March 1, 2011. Docket Number: 11–002. Applicant: Weill Cornell Medical College of Cornell University, New York, NY 10065. Instrument: Electron Microscope. Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 76 FR 11199, March 1, 2011. Docket Number: 11–003. Applicant: Armed Forces Institute of Pathology, Washington, DC 20306–6000. Instrument: Electron Microscope. Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 76 FR 11199, March 1, 2011. Docket Number: 11–004. Applicant: San Diego State University, San Diego, CA 92182. Instrument: Electron Microscope. Manufacturer: FEI Inc., Czech Republic. Intended Use: See notice at 76 FR 11199, March 1, 2011. Docket Number: 11–005. Applicant: National Institute of Standards and Technology, Boulder, CO 80305–3328. Instrument: Electron Microscope. Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 76 FR 11199, March 1, 2011. Docket Number: 11–006. Applicant: University of Vermont, Colchester, VT 65446. Instrument: Electron Microscope. Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 76 FR 11199, March 1, 2011. Docket Number: 11–007. Applicant: University of Arkansas, Fayetteville, AR 72701. Instrument: Electron Microscope. Manufacturer: FEI Inc., the Netherlands. Intended Use: See notice at 76 FR 11199, March 1, 2011. Docket Number: 11–015. Applicant: The Regents of the University of California, Berkeley, CA 94720. Instrument: Electron Microscope. PO 00000 Frm 00004 Fmt 4703 Sfmt 4703 17381 Manufacturer: Carl Zeiss SMT, Inc., Germany. Intended Use: See notice at 76 FR 11199, March 1, 2011. Comments: None received. Decision: Approved. No instrument of equivalent scientific value to the foreign instrument, for such purposes as these instruments are intended to be used, was being manufactured in the United States at the time the instruments were ordered. Reasons: Each foreign instrument is an electron microscope and is intended for research or scientific educational uses requiring an electron microscope. We know of no electron microscope, or any other instrument suited to these purposes, which was being manufactured in the United States at the time of order of each instrument. Dated: March 22, 2011. Gregory W. Campbell, Director, Subsidies Enforcement Office, Import Administration. [FR Doc. 2011–7226 Filed 3–28–11; 8:45 am] BILLING CODE 3510–DS–P DEPARTMENT OF COMMERCE National Oceanic and Atmospheric Administration RIN 0648–XA325 New England Fishery Management Council; Public Meeting National Marine Fisheries Service (NMFS), National Oceanic and Atmospheric Administration (NOAA), Commerce. ACTION: Notice; public meeting. AGENCY: The New England Fishery Management Council (Council) is scheduling a public meeting of its Research Steering Committee (Committee), in April, 2011, to consider actions affecting New England fisheries in the exclusive economic zone (EEZ). Recommendations from this group will be brought to the full Council for formal consideration and action, if appropriate. DATES: The meeting will be held on Thursday, April 14, 2011 at 10 a.m. ADDRESSES: The meeting will be held at the Holiday Inn, 31 Hampshire Street, Mansfield, MA 02048; telephone: (508) 339–2200; fax: (508) 339–1040. Council address: New England Fishery Management Council, 50 Water Street, Mill 2, Newburyport, MA 01950. FOR FURTHER INFORMATION CONTACT: Paul J. Howard, Executive Director, New England Fishery Management Council; telephone: (978) 465–0492. SUPPLEMENTARY INFORMATION: The committee will review final cooperative research project reports, including the SUMMARY: E:\FR\FM\29MRN1.SGM 29MRN1

Agencies

[Federal Register Volume 76, Number 60 (Tuesday, March 29, 2011)]
[Notices]
[Page 17381]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: 2011-7226]


-----------------------------------------------------------------------

DEPARTMENT OF COMMERCE

International Trade Administration


Battelle Memorial Institute, et al.; Notice of Consolidated 
Decision on Applications for Duty-Free Entry of Electron Microscopes

    This is a decision consolidated pursuant to Section 6(c) of the 
Educational, Scientific, and Cultural Materials Importation Act of 1966 
(Pub. L. 89-651, as amended by Pub. L. 106-36; 80 Stat. 897; 15 CFR 
part 301). Related records can be viewed between 8:30 a.m. and 5 p.m. 
in Room 3720, U.S. Department of Commerce, 14th and Constitution 
Avenue., NW., Washington, DC.
    Docket Number: 10-045. Applicant: Battelle Memorial Institute, 
Richland, WA 99354. Instrument: Electron Microscope. Manufacturer: FEI 
Company, the Netherlands. Intended Use: See notice at 76 FR 11199, 
March 1, 2011.
    Docket Number: 10-072. Applicant: University of Puerto Rico, San 
Juan, PR 00936-5067. Instrument: Electron Microscope. Manufacturer: 
JEOL, Ltd., Japan. Intended Use: See notice at 76 FR 11199, March 1, 
2011.
    Docket Number: 10-076. Applicant: Regents of the University of 
Minnesota, Minneapolis, MN 55455. Instrument: Electron Microscope. 
Manufacturer: FEI Inc., Czech Republic. Intended Use: See notice at 76 
FR 11199, March 1, 2011.
    Docket Number: 11-002. Applicant: Weill Cornell Medical College of 
Cornell University, New York, NY 10065. Instrument: Electron 
Microscope. Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 
76 FR 11199, March 1, 2011.
    Docket Number: 11-003. Applicant: Armed Forces Institute of 
Pathology, Washington, DC 20306-6000. Instrument: Electron Microscope. 
Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 76 FR 
11199, March 1, 2011.
    Docket Number: 11-004. Applicant: San Diego State University, San 
Diego, CA 92182. Instrument: Electron Microscope. Manufacturer: FEI 
Inc., Czech Republic. Intended Use: See notice at 76 FR 11199, March 1, 
2011.
    Docket Number: 11-005. Applicant: National Institute of Standards 
and Technology, Boulder, CO 80305-3328. Instrument: Electron 
Microscope. Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 
76 FR 11199, March 1, 2011.
    Docket Number: 11-006. Applicant: University of Vermont, 
Colchester, VT 65446. Instrument: Electron Microscope. Manufacturer: 
JEOL Ltd., Japan. Intended Use: See notice at 76 FR 11199, March 1, 
2011.
    Docket Number: 11-007. Applicant: University of Arkansas, 
Fayetteville, AR 72701. Instrument: Electron Microscope. Manufacturer: 
FEI Inc., the Netherlands. Intended Use: See notice at 76 FR 11199, 
March 1, 2011.
    Docket Number: 11-015. Applicant: The Regents of the University of 
California, Berkeley, CA 94720. Instrument: Electron Microscope. 
Manufacturer: Carl Zeiss SMT, Inc., Germany. Intended Use: See notice 
at 76 FR 11199, March 1, 2011.
    Comments: None received. Decision: Approved. No instrument of 
equivalent scientific value to the foreign instrument, for such 
purposes as these instruments are intended to be used, was being 
manufactured in the United States at the time the instruments were 
ordered. Reasons: Each foreign instrument is an electron microscope and 
is intended for research or scientific educational uses requiring an 
electron microscope. We know of no electron microscope, or any other 
instrument suited to these purposes, which was being manufactured in 
the United States at the time of order of each instrument.

    Dated: March 22, 2011.
Gregory W. Campbell,
Director, Subsidies Enforcement Office, Import Administration.
[FR Doc. 2011-7226 Filed 3-28-11; 8:45 am]
BILLING CODE 3510-DS-P

This site is protected by reCAPTCHA and the Google Privacy Policy and Terms of Service apply.