Application(s) for Duty-Free Entry of Scientific Instruments, 15945 [2011-6736]
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Federal Register / Vol. 76, No. 55 / Tuesday, March 22, 2011 / Notices
DEPARTMENT OF COMMERCE
International Trade Administration
Application(s) for Duty-Free Entry of
Scientific Instruments
Pursuant to Section 6(c) of the
Educational, Scientific and Cultural
Materials Importation Act of 1966 (Pub.
L. 89–651, as amended by Pub. L. 106–
36; 80 Stat. 897; 15 CFR part 301), we
invite comments on the question of
whether instruments of equivalent
scientific value, for the purposes for
which the instruments shown below are
intended to be used, are being
manufactured in the United States.
Comments must comply with 15 CFR
301.5(a)(3) and (4) of the regulations and
be postmarked on or before April 11,
2011. Address written comments to
Statutory Import Programs Staff, Room
3720, U.S. Department of Commerce,
Washington, D.C. 20230. Applications
may be examined between 8:30 a.m. and
5 p.m. at the U.S. Department of
Commerce in Room 3720.
Docket Number: 11–021. Applicant:
Naval Postgraduate School, Department
of Physics, 833 Dyer Rd., Monterey, CA
93943. Instrument: Electron Microscope.
Manufacturer: FEI Company, Czech
Republic. Intended Use: The instrument
will be used to look at a range of
semiconducting and other light emitting
materials. It will be used to analyze the
surface topography of the samples and
the corresponding light emitted from the
materials.
Justification for Duty-Free Entry:
There are no instruments of the same
general category manufactured in the
United States. Application accepted by
Commissioner of Customs: March 1,
2011.
Dated: March 16, 2011.
Gregory Campbell,
Director, Subsidies Enforcement Office.
[FR Doc. 2011–6736 Filed 3–21–11; 8:45 am]
BILLING CODE 3510–DS–P
DEPARTMENT OF COMMERCE
International Trade Administration
srobinson on DSKHWCL6B1PROD with NOTICES
Application(s) for Duty-Free Entry of
Scientific Instruments
Pursuant to Section 6(c) of the
Educational, Scientific and Cultural
Materials Importation Act of 1966 (Pub.
L. 89–651, as amended by Pub. L. 106–
36; 80 Stat. 897; 15 CFR part 301), we
invite comments on the question of
whether instruments of equivalent
scientific value, for the purposes for
which the instruments shown below are
VerDate Mar<15>2010
17:11 Mar 21, 2011
Jkt 223001
intended to be used, are being
manufactured in the United States.
Comments must comply with 15 CFR
301.5(a)(3) and (4) of the regulations and
be postmarked on or before April 11,
2011. Address written comments to
Statutory Import Programs Staff, Room
3720, U.S. Department of Commerce,
Washington, DC 20230. Applications
may be examined between 8:30 a.m. and
5 p.m. at the U.S. Department of
Commerce in Room 3720.
Docket Number: 11–012. Applicant:
UChicago Argonne, LLC. 9700 South
Cass Ave., Lemont, IL 60439.
Instrument: TFS500 Atomic Layer
Deposition System. Manufacturer:
Beneq OY, Finland. Intended Use: The
instrument will be used in experiments
on atomic layer deposition (ALD)
growth of thin film materials to
determine the optimal conditions of
temperature, pressure, flux and
precursor combinations. For the
research the instrument is required to
have a modular deposition chamber so
that the system can be reconfigured to
optimize the coating process for
different substrates. It also requires a
precursor delivery system that can be
heated to 500 degrees Celsius to
vaporize non-volatile chemical
precursors. It also requires inert gas
purging between the deposition
chamber and outer heating chambers to
contain the precursors without the need
for a gas-tight seal at this junction.
Justification for Duty-Free Entry: There
are no instruments of the same general
category being manufactured in the
United States. Application accepted by
Commissioner of Customs: February 2,
2011.
Docket Number: 11–016. Applicant:
UChicago Argonne, LLC. 9700 South
Cass Ave., Lemont, IL 60439–4873.
Instrument: Single Roll Presser.
Manufacturer: A–Pro Co., Ltd, South
Korea. Intended Use: The instrument
will be used for making novel electrodes
for lithium-ion cells, which are
subjected to electrochemical
performance testing to determine the
influence of the active materials in the
electrodes and electrolyte. The
instrument is unique in that it is semiautomated with a high attention to
dimensional tolerances, temperature
control and safety, helping guarantee
that the research cells made will be of
industrial level quality and consistency
for the experiments. Justification for
Duty-Free Entry: There are no
instruments of the same general
category being manufactured in the
United States. Application accepted by
Commissioner of Customs: February 2,
2011.
PO 00000
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15945
Docket Number: 11–018. Applicant:
Purdue University, Birck
Nanotechnology Center, 1205 West State
Street, West Lafayette, IN 47907–2057.
Instrument: Rapid Thermal Annealer.
Manufacturer: Qualiflow Jipelec,
France. Intended Use: The instrument
will be used to conduct fast temperature
ramping experiments with the purpose
of annealing the research sample within.
The instrument is designed for quick
ramping of temperature in order to keep
the thermal budget at a minimum. The
instrument has a temperature ramp rate
of 300 degrees Celsius per second. Other
key characteristics that distinguish this
instrument from others are vacuum
purge capability and contamination
control. Justification for Duty-Free
Entry: There are no instruments of the
same general category being
manufactured in the United States.
Application accepted by Commissioner
of Customs: March 1, 2011.
Dated: March 16, 2011.
Gregory Campbell,
Acting Director, IA Subsidies Enforcement
Office.
[FR Doc. 2011–6734 Filed 3–21–11; 8:45 am]
BILLING CODE 3510–DS–P
DEPARTMENT OF COMMERCE
National Institute of Standards and
Technology
National Voluntary Laboratory
Accreditation Program (NVLAP)
Workshop for Laboratories Interested
in the Testing of Health Information
Technology (HIT) Electronic Health
Record Technology
National Institute of Standards
and Technology (NIST), Commerce.
ACTION: Notice of public workshop.
AGENCY:
The National Voluntary
Laboratory Accreditation Program
(NVLAP) will hold a public workshop
on Tuesday, April 26, 2011 at the
Marriott Hotel, Gaithersburg Marriott
Washingtonian Center, located at 9751
Washingtonian Boulevard, Gaithersburg,
MD 20878. The purpose of the
workshop is the exchange of
information among NVLAP, the NIST
Information Technology Laboratory, the
Department of Health and Human
Services (HHS), laboratories interested
in seeking NVLAP accreditation to
perform Testing of Health Information
Technology (HIT) electronic health
record technology under the permanent
certification program administered
under the Office of the National
Coordinator for Health Information
Technology, HHS.
SUMMARY:
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22MRN1
]]>Agencies
[Federal Register Volume 76, Number 55 (Tuesday, March 22, 2011)]
[Notices]
[Page 15945]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: 2011-6736]
[[Page 15945]]
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DEPARTMENT OF COMMERCE
International Trade Administration
Application(s) for Duty-Free Entry of Scientific Instruments
Pursuant to Section 6(c) of the Educational, Scientific and
Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended
by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments
on the question of whether instruments of equivalent scientific value,
for the purposes for which the instruments shown below are intended to
be used, are being manufactured in the United States.
Comments must comply with 15 CFR 301.5(a)(3) and (4) of the
regulations and be postmarked on or before April 11, 2011. Address
written comments to Statutory Import Programs Staff, Room 3720, U.S.
Department of Commerce, Washington, D.C. 20230. Applications may be
examined between 8:30 a.m. and 5 p.m. at the U.S. Department of
Commerce in Room 3720.
Docket Number: 11-021. Applicant: Naval Postgraduate School,
Department of Physics, 833 Dyer Rd., Monterey, CA 93943. Instrument:
Electron Microscope. Manufacturer: FEI Company, Czech Republic.
Intended Use: The instrument will be used to look at a range of
semiconducting and other light emitting materials. It will be used to
analyze the surface topography of the samples and the corresponding
light emitted from the materials.
Justification for Duty-Free Entry: There are no instruments of the
same general category manufactured in the United States. Application
accepted by Commissioner of Customs: March 1, 2011.
Dated: March 16, 2011.
Gregory Campbell,
Director, Subsidies Enforcement Office.
[FR Doc. 2011-6736 Filed 3-21-11; 8:45 am]
BILLING CODE 3510-DS-P
