Application(s) for Duty-Free Entry of Scientific Instruments, 11199-11200 [2011-4515]
Download as PDF
<![CDATA[
Federal Register / Vol. 76, No. 40 / Tuesday, March 1, 2011 / Notices
11199
Department Contact
Suspended Investigations
No Sunset Review of suspended investigations are scheduled for initiation in April 2011.
The Department’s procedures for the
conduct of Sunset Reviews are set forth
in 19 CFR 351.218. Guidance on
methodological or analytical issues
relevant to the Department’s conduct of
Sunset Reviews is set forth in the
Department’s Policy Bulletin 98.3—
Policies Regarding the Conduct of Fiveyear (‘‘Sunset’’) Reviews of Antidumping
and Countervailing Duty Orders; Policy
Bulletin, 63 FR 18871 (April 16, 1998).
The Notice of Initiation of Five-Year
(‘‘Sunset’’) Reviews provides further
information regarding what is required
of all parties to participate in Sunset
Reviews.
Pursuant to 19 CFR 351.103(c), the
Department will maintain and make
available a service list for these
proceedings. To facilitate the timely
preparation of the service list(s), it is
requested that those seeking recognition
as interested parties to a proceeding
contact the Department in writing
within 10 days of the publication of the
Notice of Initiation.
Please note that if the Department
receives a Notice of Intent to Participate
from a member of the domestic industry
within 15 days of the date of initiation,
the review will continue. Thereafter,
any interested party wishing to
participate in the Sunset Review must
provide substantive comments in
response to the notice of initiation no
later than 30 days after the date of
initiation.
This notice is not required by statute
but is published as a service to the
international trading community.
Dated: February 16, 2011.
Christian Marsh,
Deputy Assistant Secretary for Antidumping
and Countervailing Duty Operations.
[FR Doc. 2011–4523 Filed 2–28–11; 8:45 am]
BILLING CODE 3510–DS–P
DEPARTMENT OF COMMERCE
International Trade Administration
jlentini on DSKJ8SOYB1PROD with NOTICES
Application(s) for Duty-Free Entry of
Scientific Instruments
Pursuant to Section 6(c) of the
Educational, Scientific and Cultural
Materials Importation Act of 1966 (Pub.
L. 89–651, as amended by Public Law
106–36; 80 Stat. 897; 15 CFR part 301),
we invite comments on the question of
whether instruments of equivalent
scientific value, for the purposes for
VerDate Mar<15>2010
18:42 Feb 28, 2011
Jkt 223001
which the instruments shown below are
intended to be used, are being
manufactured in the United States.
Comments must comply with 15 CFR
301.5(a)(3) and (4) of the regulations and
be postmarked on or before March 21,
2011. Address written comments to
Statutory Import Programs Staff, Room
3720, U.S. Department of Commerce,
Washington, DC 20230. Applications
may be examined between 8:30 a.m. and
5 p.m. at the U.S. Department of
Commerce in Room 3720.
Docket Number: 10–045. Applicant:
Battelle Memorial Institute, Pacific
Northwest Division, Pacific Northwest
National Laboratory, 3335 Q Ave.,
Richland, WA 99354. Instrument:
Electron Microscope. Manufacturer: FEI
Company, the Netherlands. Intended
Use: This instrument will be used as an
analytical tool for doing serial
sectioning and producing 3D analytical
analysis for both geological and material
science samples. Justification for DutyFree Entry: There are no instruments of
the same general category manufactured
in the United States. Application
accepted by Commissioner of Customs:
February 2, 2011.
Docket Number: 10–072. Applicant:
University of Puerto Rico, Institute of
Neurobiology, PO Box 365067, San
Juan, Puerto Rico 00936–5067.
Instrument: Electron Microscope.
Manufacturer: JEOL Ltd., Japan.
Intended Use: The instrument will be
used to reconstruct the remodeling
synapses in the regenerating tectum,
quantify the numbers and types of
synapses, and quantify the effect that
changes in brain-derived neurotrophic
factors have on these synapses made by
regenerated axons in the brain. The
instrument will also enable the
unequivocal identification of synapses
made by Engrailed-expressing neurons,
something that is impossible to do any
other way. Additionally, the instrument
will be used to study the location of
aminergic receptors and transporter
molecules in specific areas of the central
nervous systems of freshwater prawns.
Justification for Duty-Free Entry: There
are no instruments of the same general
category manufactured in the United
States. Application accepted by
Commissioner of Customs: December
22, 2010.
Docket Number: 10–076. Applicant:
Regents of the University of Minnesota,
12 Shepherd Labs 100 Union St, SE.,
PO 00000
Frm 00007
Fmt 4703
Sfmt 4703
Minneapolis, MN 55455. Instrument:
Electron Microscope. Manufacturer: FEI
Inc., Czech Republic. Intended Use: The
instrument will support structural study
of the mechanisms of virus assembly
and infection, kidney structure and
function in disease, bacterial infection
and host response, and other
applications. Justification for Duty-Free
Entry: There are no instruments of the
same general category manufactured in
the United States. Application accepted
by Commissioner of Customs: December
29, 2010.
Docket Number: 11–002. Applicant:
Weill Cornell Medical College of Cornell
University, 1300 York Avenue, New
York, NY 10065. Instrument: Electron
Microscope. Manufacturer: JEOL Ltd.,
Japan. Intended Use: The instrument
will allow users to acquire well focused,
high contrast, high quality images
through the full range of magnifications,
from 50x to 1,200,000x. Justification for
Duty-Free Entry: There are no
instruments of the same general
category manufactured in the United
States. Application accepted by
Commissioner of Customs: January 11,
2011.
Docket Number: 11–003. Applicant:
Armed Forces Institute of Pathology,
Department of Veterinary Pathology,
Bldg. 54, Room G111, 6825 16th St.,
NW., Washington, DC 20306–6000.
Instrument: Electron Microscope.
Manufacturer: JEOL Ltd., Japan.
Intended Use: The instrument will be
used to examine tissue specimens to
identify and characterize pathologic
tissue changes, determine disease
diagnosis and severity, and aid in
prognosis and treatment of patients as
applicable. The required capabilities
that this instrument provides are a
voltage range between 40kV and 120 kV,
a resolution of 0.2nm line and 0.38nm
point, and a magnification of x50 to
600,000, among other requirements.
Justification for Duty-Free Entry: There
are no instruments of the same general
category manufactured in the United
States. Application accepted by
Commissioner of Customs: January 11,
2011.
Docket Number: 11–004. Applicant:
San Diego State University, 5500
Campanile Drive, San Diego, CA 92182.
Instrument: Electron Microscope.
Manufacturer: FEI Inc., Czech Republic.
Intended Use: The instrument will be
used for many applications including
E:\FR\FM\01MRN1.SGM
01MRN1
jlentini on DSKJ8SOYB1PROD with NOTICES
11200
Federal Register / Vol. 76, No. 40 / Tuesday, March 1, 2011 / Notices
the study of unicellular photosynthetic
cells, arachnid systematics, and
geochronology and provenance studies.
The instrument will allow high quality,
high throughput flow with a scope of
advanced capability. It will also allow
uncoated museum samples to be viewed
without damage. Justification for DutyFree Entry: There are no instruments of
the same general category manufactured
in the United States. Application
accepted by Commissioner of Customs:
January 13, 2011.
Docket Number: 11–005. Applicant:
National Institute of Standards and
Technology, DOC, 325 Broadway,
Boulder, Colorado 80305–3328.
Instrument: Electron Microscope.
Manufacturer: JEOL Ltd., Japan.
Intended Use: The instrument will be
used to study semiconductor, metallic
magnetic and nanostructured materials’
structure and composition, with
nanoscale and atomic level resolution.
The required capabilities that the
instrument provides include high
resolution energy filtered and scanning
transmission electron miscroscopy,
convergent beam and selected area
electron diffraction, and electron energy
loss and energy dispersive X-ray
spectroscopy. Justification for Duty-Free
Entry: There are no instruments of the
same general category manufactured in
the United States. Application accepted
by Commissioner of Customs: January
14, 2011.
Docket Number: 11–006. Applicant:
University of Vermont, 19 Roosevelt
Hwy., Suite 120 Colchester, Vermont
65446. Instrument: Electron Microscope.
Manufacturer: JEOL Ltd., Japan.
Intended Use: The instrument will be
used to investigate advanced glycation
end product localization using postembedding immunoelectron microscopy
techniques on thin sections from human
cardiac biopsies. Required
characteristics of the instrument include
120 kV accelerating voltage, and an
electron gun assembly with Cool Beam
Illumination System—LaB6 filament
standard. Justification for Duty-Free
Entry: There are no instruments of the
same general category manufactured in
the United States. Application accepted
by Commissioner of Customs: January
19, 2011.
Docket Number: 11–007. Applicant:
University of Arkansas, Office of
Business Affairs, ADMN 321 Physics
Fayetteville, AR 72701. Instrument:
Electron Microscope. Manufacturer: FEI
Inc., the Netherlands. Intended Use: The
instrument will be used to complement
the FEI instruments already installed at
the facility, and be used to provide highresolution imaging, spectroscopy, and
sample preparation capabilities. The
VerDate Mar<15>2010
18:42 Feb 28, 2011
Jkt 223001
instrument has a unique 5-axis
motorized eucentric specimen stage
which reads out and displays all 5 axes
with an accuracy of 0.01 microns and
0.01 degrees. Justification for Duty-Free
Entry: There are no instruments of the
same general category manufactured in
the United States. Application accepted
by Commissioner of Customs: January
24, 2011.
Docket Number: 11–015. Applicant:
The Regents of the University of
California, Lawrence Berkeley National
Laboratory, 1 Cyclotron Road, M/S
71R0259, Berkeley, CA 94720.
Instrument: Electron Microscope.
Manufacturer: Carl Zeiss SMT, Inc.,
Germany. Intended Use: The instrument
will be used to investigate the structure
and composition of inorganic, polymer
and biological nano-materials. The
instrument allows for the employment
of transmission microscopy techniques,
such as high-resolution imaging and
tomography, cryo-imaging, energyfiltered imaging, energy loss
spectroscopy and selected-area
diffraction. It meets the necessary
specifications of the research, including
stability of sample stage and image with
respect to thermal drift and external
vibration, flexibility of stage motions,
flexibility of software for signal
acquisition and image processing,
overall system stability, and ease of use.
Justification for Duty-Free Entry: There
are no instruments of the same general
category being manufactured in the
United States. Application accepted by
Commissioner of Customs: December 7,
2010.
Dated: February 23, 2011.
Gregory Campbell,
Director, IA Subsidies Enforcement Office.
[FR Doc. 2011–4515 Filed 2–28–11; 8:45 am]
BILLING CODE 3510–DS–P
DEPARTMENT OF COMMERCE
International Trade Administration
Application(s) for Duty-Free Entry of
Scientific Instruments
Pursuant to Section 6(c) of the
Educational, Scientific and Cultural
Materials Importation Act of 1966 (Pub.
L. 89–651, as amended by Pub. L. 106–
36; 80 Stat. 897; 15 CFR part 301), we
invite comments on the question of
whether instruments of equivalent
scientific value, for the purposes for
which the instruments shown below are
intended to be used, are being
manufactured in the United States.
Comments must comply with 15 CFR
301.5(a)(3) and (4) of the regulations and
be postmarked on or before March 21,
PO 00000
Frm 00008
Fmt 4703
Sfmt 4703
2011. Address written comments to
Statutory Import Programs Staff, Room
3720, U.S. Department of Commerce,
Washington, DC 20230. Applications
may be examined between 8:30 a.m. and
5 p.m. at the U.S. Department of
Commerce in Room 3720.
Docket Number: 10–034. Applicant:
University of Colorado, 12801 E. 17th
Ave., RC1 South, Rm 10101, Box 6511,
Mailstop 8101, Aurora, CO 80045.
Instrument: Singer MSM System
300TSA. Manufacturer: Singer
Instrument Co. Ltd., United Kingdom.
Intended Use: The instrument will be
used to manipulate yeast cells and
spores for genetic analysis and
construction of strains with particular
mutations, pedigree analysis, cell and
zygote isolation and cell cycle and cell
aging studies. The instrument consists
of a micromanipulator device attached
to a microscope with a computerized
stage that allows the user to keep track
of the position. It also has a CCD camera
video monitor that reduces the eye
strain caused by prolonged peering
through microscope objectives. The
components of this instrument are
specifically designed for work with
yeast cells. This instrument is unique
because it has a motorized stage, which
can be programmed to automatically
move to predetermined positions, and
the joystick electronic. Justification for
Duty-Free Entry: There are no
instruments of the same general
category being manufactured in the
United States. Application accepted by
Commissioner of Customs: January 12,
2011.
Docket Number: 10–077. Applicant:
University of Chicago LLC, Operators of
Argonne National Laboratory, 9700
South Cass Ave., Lemont, IL 60439.
Instrument: Batch Furnace.
Manufacturer: NGK Insulators Ltd.,
Japan. Intended Use: The instrument
will be used in the synthesis of cathode
materials for lithium ion batteries. In
particular, the instrument will be
applied during the last step of the
synthesis—the calcination of the
cathode material. The techniques used
in calcinations are very dependent on
the calcination furnace. This
instrument’s furnace allows for heating
in oxygen flow. The uniformity of
heating and oxygen flow is critical to
obtain the cathode material because the
temperature, together with the oxygen
flow, ensures the removal of aqueous
residues on the material. The material
must be free of water because lithium
and water can react and have fatal
consequences. This batch furnace
includes high distribution of the sample
(multiple trays), which allows for faster
drying and greater uniformity than a
E:\FR\FM\01MRN1.SGM
01MRN1
]]>Agencies
[Federal Register Volume 76, Number 40 (Tuesday, March 1, 2011)]
[Notices]
[Pages 11199-11200]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: 2011-4515]
-----------------------------------------------------------------------
DEPARTMENT OF COMMERCE
International Trade Administration
Application(s) for Duty-Free Entry of Scientific Instruments
Pursuant to Section 6(c) of the Educational, Scientific and
Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended
by Public Law 106-36; 80 Stat. 897; 15 CFR part 301), we invite
comments on the question of whether instruments of equivalent
scientific value, for the purposes for which the instruments shown
below are intended to be used, are being manufactured in the United
States.
Comments must comply with 15 CFR 301.5(a)(3) and (4) of the
regulations and be postmarked on or before March 21, 2011. Address
written comments to Statutory Import Programs Staff, Room 3720, U.S.
Department of Commerce, Washington, DC 20230. Applications may be
examined between 8:30 a.m. and 5 p.m. at the U.S. Department of
Commerce in Room 3720.
Docket Number: 10-045. Applicant: Battelle Memorial Institute,
Pacific Northwest Division, Pacific Northwest National Laboratory, 3335
Q Ave., Richland, WA 99354. Instrument: Electron Microscope.
Manufacturer: FEI Company, the Netherlands. Intended Use: This
instrument will be used as an analytical tool for doing serial
sectioning and producing 3D analytical analysis for both geological and
material science samples. Justification for Duty-Free Entry: There are
no instruments of the same general category manufactured in the United
States. Application accepted by Commissioner of Customs: February 2,
2011.
Docket Number: 10-072. Applicant: University of Puerto Rico,
Institute of Neurobiology, PO Box 365067, San Juan, Puerto Rico 00936-
5067. Instrument: Electron Microscope. Manufacturer: JEOL Ltd., Japan.
Intended Use: The instrument will be used to reconstruct the remodeling
synapses in the regenerating tectum, quantify the numbers and types of
synapses, and quantify the effect that changes in brain-derived
neurotrophic factors have on these synapses made by regenerated axons
in the brain. The instrument will also enable the unequivocal
identification of synapses made by Engrailed-expressing neurons,
something that is impossible to do any other way. Additionally, the
instrument will be used to study the location of aminergic receptors
and transporter molecules in specific areas of the central nervous
systems of freshwater prawns. Justification for Duty-Free Entry: There
are no instruments of the same general category manufactured in the
United States. Application accepted by Commissioner of Customs:
December 22, 2010.
Docket Number: 10-076. Applicant: Regents of the University of
Minnesota, 12 Shepherd Labs 100 Union St, SE., Minneapolis, MN 55455.
Instrument: Electron Microscope. Manufacturer: FEI Inc., Czech
Republic. Intended Use: The instrument will support structural study of
the mechanisms of virus assembly and infection, kidney structure and
function in disease, bacterial infection and host response, and other
applications. Justification for Duty-Free Entry: There are no
instruments of the same general category manufactured in the United
States. Application accepted by Commissioner of Customs: December 29,
2010.
Docket Number: 11-002. Applicant: Weill Cornell Medical College of
Cornell University, 1300 York Avenue, New York, NY 10065. Instrument:
Electron Microscope. Manufacturer: JEOL Ltd., Japan. Intended Use: The
instrument will allow users to acquire well focused, high contrast,
high quality images through the full range of magnifications, from 50x
to 1,200,000x. Justification for Duty-Free Entry: There are no
instruments of the same general category manufactured in the United
States. Application accepted by Commissioner of Customs: January 11,
2011.
Docket Number: 11-003. Applicant: Armed Forces Institute of
Pathology, Department of Veterinary Pathology, Bldg. 54, Room G111,
6825 16th St., NW., Washington, DC 20306-6000. Instrument: Electron
Microscope. Manufacturer: JEOL Ltd., Japan. Intended Use: The
instrument will be used to examine tissue specimens to identify and
characterize pathologic tissue changes, determine disease diagnosis and
severity, and aid in prognosis and treatment of patients as applicable.
The required capabilities that this instrument provides are a voltage
range between 40kV and 120 kV, a resolution of 0.2nm line and 0.38nm
point, and a magnification of x50 to 600,000, among other requirements.
Justification for Duty-Free Entry: There are no instruments of the same
general category manufactured in the United States. Application
accepted by Commissioner of Customs: January 11, 2011.
Docket Number: 11-004. Applicant: San Diego State University, 5500
Campanile Drive, San Diego, CA 92182. Instrument: Electron Microscope.
Manufacturer: FEI Inc., Czech Republic. Intended Use: The instrument
will be used for many applications including
[[Page 11200]]
the study of unicellular photosynthetic cells, arachnid systematics,
and geochronology and provenance studies. The instrument will allow
high quality, high throughput flow with a scope of advanced capability.
It will also allow uncoated museum samples to be viewed without damage.
Justification for Duty-Free Entry: There are no instruments of the same
general category manufactured in the United States. Application
accepted by Commissioner of Customs: January 13, 2011.
Docket Number: 11-005. Applicant: National Institute of Standards
and Technology, DOC, 325 Broadway, Boulder, Colorado 80305-3328.
Instrument: Electron Microscope. Manufacturer: JEOL Ltd., Japan.
Intended Use: The instrument will be used to study semiconductor,
metallic magnetic and nanostructured materials' structure and
composition, with nanoscale and atomic level resolution. The required
capabilities that the instrument provides include high resolution
energy filtered and scanning transmission electron miscroscopy,
convergent beam and selected area electron diffraction, and electron
energy loss and energy dispersive X-ray spectroscopy. Justification for
Duty-Free Entry: There are no instruments of the same general category
manufactured in the United States. Application accepted by Commissioner
of Customs: January 14, 2011.
Docket Number: 11-006. Applicant: University of Vermont, 19
Roosevelt Hwy., Suite 120 Colchester, Vermont 65446. Instrument:
Electron Microscope. Manufacturer: JEOL Ltd., Japan. Intended Use: The
instrument will be used to investigate advanced glycation end product
localization using post-embedding immunoelectron microscopy techniques
on thin sections from human cardiac biopsies. Required characteristics
of the instrument include 120 kV accelerating voltage, and an electron
gun assembly with Cool Beam Illumination System--LaB6 filament
standard. Justification for Duty-Free Entry: There are no instruments
of the same general category manufactured in the United States.
Application accepted by Commissioner of Customs: January 19, 2011.
Docket Number: 11-007. Applicant: University of Arkansas, Office of
Business Affairs, ADMN 321 Physics Fayetteville, AR 72701. Instrument:
Electron Microscope. Manufacturer: FEI Inc., the Netherlands. Intended
Use: The instrument will be used to complement the FEI instruments
already installed at the facility, and be used to provide high-
resolution imaging, spectroscopy, and sample preparation capabilities.
The instrument has a unique 5-axis motorized eucentric specimen stage
which reads out and displays all 5 axes with an accuracy of 0.01
microns and 0.01 degrees. Justification for Duty-Free Entry: There are
no instruments of the same general category manufactured in the United
States. Application accepted by Commissioner of Customs: January 24,
2011.
Docket Number: 11-015. Applicant: The Regents of the University of
California, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, M/
S 71R0259, Berkeley, CA 94720. Instrument: Electron Microscope.
Manufacturer: Carl Zeiss SMT, Inc., Germany. Intended Use: The
instrument will be used to investigate the structure and composition of
inorganic, polymer and biological nano-materials. The instrument allows
for the employment of transmission microscopy techniques, such as high-
resolution imaging and tomography, cryo-imaging, energy-filtered
imaging, energy loss spectroscopy and selected-area diffraction. It
meets the necessary specifications of the research, including stability
of sample stage and image with respect to thermal drift and external
vibration, flexibility of stage motions, flexibility of software for
signal acquisition and image processing, overall system stability, and
ease of use. Justification for Duty-Free Entry: There are no
instruments of the same general category being manufactured in the
United States. Application accepted by Commissioner of Customs:
December 7, 2010.
Dated: February 23, 2011.
Gregory Campbell,
Director, IA Subsidies Enforcement Office.
[FR Doc. 2011-4515 Filed 2-28-11; 8:45 am]
BILLING CODE 3510-DS-P
