Application(s) for Duty-Free Entry of Scientific Instruments, 2647 [2011-776]

Download as PDF Federal Register / Vol. 76, No. 10 / Friday, January 14, 2011 / Notices the decennial census. The Committee has been established in accordance with the Federal Advisory Committee Act (Title 5, United States Code, Appendix 2, Section 10(a)(b)). The meeting is open to the public, and a brief period is set aside for public comments and questions. However, individuals with extensive statements for the record must submit them in writing to the Census Bureau Committee Liaison Officer named above at least three working days prior to the meeting. Seating is available to the public on a first-come, first-served basis. The meeting is physically accessible to people with disabilities. Requests for sign language interpretation or other auxiliary aids should be directed to the Census Bureau Committee Liaison Officer as soon as known, and preferably two weeks prior to the meeting. Due to increased security and for access to the meeting, please call 301– 763–9906 upon arrival at the Census Bureau on the day of the meeting. A photo ID must be presented in order to receive your visitor’s badge. Visitors are not allowed beyond the first floor. Dated: January 11, 2011. Robert M. Groves, Director, Bureau of the Census. [FR Doc. 2011–814 Filed 1–13–11; 8:45 am] BILLING CODE 3510–07–P DEPARTMENT OF COMMERCE International Trade Administration mstockstill on DSKH9S0YB1PROD with NOTICES Application(s) for Duty-Free Entry of Scientific Instruments Pursuant to Section 6(c) of the Educational, Scientific and Cultural Materials Importation Act of 1966 (Pub. L. 89–651, as amended by Pub. L. 106– 36; 80 Stat. 897; 15 CFR part 301), we invite comments on the question of whether instruments of equivalent scientific value, for the purposes for which the instruments shown below are intended to be used, are being manufactured in the United States. Comments must comply with 15 CFR 301.5(a)(3) and (4) of the regulations and be postmarked on or before February 3, 2011. Address written comments to Statutory Import Programs Staff, Room 3720, U.S. Department of Commerce, Washington, DC 20230. Applications may be examined between 8:30 a.m. and 5 p.m. at the U.S. Department of Commerce in Room 3720. Docket Number: 10–070. Applicant: Stanford University, 450 Serra Mall, Stanford, CA 94305. Instrument: Electron Microscope. Manufacturer: FEI VerDate Mar<15>2010 17:03 Jan 13, 2011 Jkt 223001 Company, the Netherlands. Intended Use: The instrument will be used for a wide variety of research projects, including the study of graphene nanoribbons, carbon nanotube networks as transparent electrodes, and functionalized nanoparticles and nanotubes for medical applications. The instrument will offer much improved resolution, as well as enhanced capabilities in characterizing insulating materials. Justification for Duty-Free Entry: There are no instruments of the same general category manufactured in the United States. Application accepted by Commissioner of Customs: December 22, 2010. Docket Number: 10–071. Applicant: Stanford University, 450 Serra Mall, Stanford, CA 94305. Instrument: Electron Microscope. Manufacturer: FEI Company, the Netherlands. Intended Use: The instrument will be used for a wide variety of research projects including the study of artificial atoms, nanomagnetic research, and advanced semiconductor devices. The device will be used to complement a highresolution electron beam lithography system. Electron beam lithography is required for the creation of the fine electrode or etch patterns to define an artificial atom, for quantitative detection of local magnetic fields, and to fabricate semiconductor devices with extreme short channels. Justification for DutyFree Entry: There are no instruments of the same general category manufactured in the United States. Application accepted by Commissioner of Customs: December 22, 2010. Docket Number: 10–074. Applicant: Wake Forest University Health Sciences, Medical Center Blvd., Winston-Salem, NC 27157. Instrument: Electron Microscope. Manufacturer: FEI Company, Czech Republic. Intended Use: The instrument will be used for the examination of the fine structural details of diseased tissues, such as cancer, the structure of biological molecules, such as DNA and proteins, and the location of specifically labeled molecules inside these structures. The instrument is necessary to achieve sufficient resolution and detail for the research. Justification for Duty-Free Entry: There are no instruments of the same general category manufactured in the United States. Application accepted by Commissioner of Customs: December 23, 2010. Docket Number: 10–075. Applicant: The Virginia Tech Carilion Research Institute, 2 Riverside Circle, Roanoke, VA 24016. Instrument: Electron Microscope. Manufacturer: FEI Company, Czech Republic. Intended Use: The instrument will be used for the PO 00000 Frm 00003 Fmt 4703 Sfmt 4703 2647 examination of biological specimens including proteins, protein complexes and other cellular constituents. Justification for Duty-Free Entry: There are no instruments of the same general category manufactured in the United States. Application accepted by Commissioner of Customs: December 23, 2010. Dated: January 7, 2011. Gregory Campbell, Director, IA Subsidies Enforcement Office. [FR Doc. 2011–776 Filed 1–13–11; 8:45 am] BILLING CODE 3510–DS–P DEPARTMENT OF COMMERCE International Trade Administration [A–427–801, A–428–801, A–475–801, A–588– 804, A–412–801] Ball Bearings and Parts Thereof From France, Germany, Italy, Japan, and the United Kingdom: Extension of Time Limit for Preliminary Results of Antidumping Duty Administrative Reviews Import Administration, International Trade Administration, Department of Commerce. DATES: Effective Date: January 14, 2011. FOR FURTHER INFORMATION CONTACT: Yang Jin Chun, AD/CVD Operations, Office 5, Import Administration, International Trade Administration, U.S. Department of Commerce, 14th Street and Constitution Avenue, NW., Washington, DC 20230; telephone: (202) 482–5760. SUPPLEMENTARY INFORMATION: AGENCY: Background At the request of interested parties, the Department of Commerce (the Department) initiated administrative reviews of the antidumping duty orders on ball bearings and parts thereof from France, Germany, Italy, Japan, and the United Kingdom for the period May 1, 2009, through April 30, 2010. See Initiation of Antidumping and Countervailing Duty Administrative Reviews and Requests for Revocation in Part, 75 FR 37759 (June 30, 2010). The preliminary results of the reviews are currently due no later than January 31, 2011. Extension of Time Limit for Preliminary Results Section 751(a)(3)(A) of the Tariff Act of 1930, as amended (the Act), requires the Department to complete the preliminary results within 245 days after the last day of the anniversary month of an order for which a review E:\FR\FM\14JAN1.SGM 14JAN1

Agencies

[Federal Register Volume 76, Number 10 (Friday, January 14, 2011)]
[Notices]
[Page 2647]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: 2011-776]


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DEPARTMENT OF COMMERCE

International Trade Administration


Application(s) for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended 
by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments 
on the question of whether instruments of equivalent scientific value, 
for the purposes for which the instruments shown below are intended to 
be used, are being manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be postmarked on or before February 3, 2011. Address 
written comments to Statutory Import Programs Staff, Room 3720, U.S. 
Department of Commerce, Washington, DC 20230. Applications may be 
examined between 8:30 a.m. and 5 p.m. at the U.S. Department of 
Commerce in Room 3720.

    Docket Number: 10-070. Applicant: Stanford University, 450 Serra 
Mall, Stanford, CA 94305. Instrument: Electron Microscope. 
Manufacturer: FEI Company, the Netherlands. Intended Use: The 
instrument will be used for a wide variety of research projects, 
including the study of graphene nanoribbons, carbon nanotube networks 
as transparent electrodes, and functionalized nanoparticles and 
nanotubes for medical applications. The instrument will offer much 
improved resolution, as well as enhanced capabilities in characterizing 
insulating materials. Justification for Duty-Free Entry: There are no 
instruments of the same general category manufactured in the United 
States. Application accepted by Commissioner of Customs: December 22, 
2010.
    Docket Number: 10-071. Applicant: Stanford University, 450 Serra 
Mall, Stanford, CA 94305. Instrument: Electron Microscope. 
Manufacturer: FEI Company, the Netherlands. Intended Use: The 
instrument will be used for a wide variety of research projects 
including the study of artificial atoms, nanomagnetic research, and 
advanced semiconductor devices. The device will be used to complement a 
high-resolution electron beam lithography system. Electron beam 
lithography is required for the creation of the fine electrode or etch 
patterns to define an artificial atom, for quantitative detection of 
local magnetic fields, and to fabricate semiconductor devices with 
extreme short channels. Justification for Duty-Free Entry: There are no 
instruments of the same general category manufactured in the United 
States. Application accepted by Commissioner of Customs: December 22, 
2010.
    Docket Number: 10-074. Applicant: Wake Forest University Health 
Sciences, Medical Center Blvd., Winston-Salem, NC 27157. Instrument: 
Electron Microscope. Manufacturer: FEI Company, Czech Republic. 
Intended Use: The instrument will be used for the examination of the 
fine structural details of diseased tissues, such as cancer, the 
structure of biological molecules, such as DNA and proteins, and the 
location of specifically labeled molecules inside these structures. The 
instrument is necessary to achieve sufficient resolution and detail for 
the research. Justification for Duty-Free Entry: There are no 
instruments of the same general category manufactured in the United 
States. Application accepted by Commissioner of Customs: December 23, 
2010.
    Docket Number: 10-075. Applicant: The Virginia Tech Carilion 
Research Institute, 2 Riverside Circle, Roanoke, VA 24016. Instrument: 
Electron Microscope. Manufacturer: FEI Company, Czech Republic. 
Intended Use: The instrument will be used for the examination of 
biological specimens including proteins, protein complexes and other 
cellular constituents. Justification for Duty-Free Entry: There are no 
instruments of the same general category manufactured in the United 
States. Application accepted by Commissioner of Customs: December 23, 
2010.

    Dated: January 7, 2011.
Gregory Campbell,
Director, IA Subsidies Enforcement Office.
[FR Doc. 2011-776 Filed 1-13-11; 8:45 am]
BILLING CODE 3510-DS-P

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