National Institutes of Health, et al.;, 67950 [2010-27889]

Download as PDF 67950 Federal Register / Vol. 75, No. 213 / Thursday, November 4, 2010 / Notices be postmarked on or before November 24, 2010. Address written comments to Statutory Import Programs Staff, Room 3720, U.S. Department of Commerce, Washington, DC 20230. Applications may be examined between 8:30 a.m. and 5 p.m. at the U.S. Department of Commerce in Room 3720. Docket Number: 10–064. Applicant: The University of Texas at Austin, Center for Electromechanics, Pickle Research Campus 10100 Burnet Road, Bldg. 133, Austin, Texas 78758–4497. Instrument: Hexapod Actuators. Manufacturer: ADS International, S.r.l., Italy. Intended Use: The instrument will be used on the Hobby-Eberly Telescope for the study of ‘‘Dark Energy.’’ The instrument is unique because of its ability to achieve the desired accuracy of +/¥ 2 microns, the stiffness of 400 N/ micron, the end mounts ability to rotate up to +/¥ 20 degrees in two axes and a stiffness of 250 N/micron, is actively cooled, and is able to generate 30kN of continuous force for extended periods of time. Justification for Duty-Free Entry: There are no instruments of the same general category being manufactured in the United States. Application accepted by Commissioner of Customs: October 20, 2010. Dated: October 29, 2010. Gregory Campbell, Acting Director, IA Subsidies Enforcement Office. Instrument: Electron Microscope. Manufacturer: FEI Company, the Netherlands. Intended Use: See notice at 75 FR 57738, September 22, 2010. Docket Number: 10–057. Applicant: Curators of the University of Missouri, Rolla, MO 56049. Instrument: Electron Microscope. Manufacturer: FEI Company, the Netherlands. Intended Use: See notice at 75 FR 57738, September 22, 2010. Docket Number: 10–058. Applicant: SUNY Upstate Medical University, Syracuse, NY 13210. Instrument: Electron Microscope. Manufacturer: JEOL, Ltd., Japan. Intended Use: See notice at 75 FR 57738, September 22, 2010. Comments: None received. Decision: Approved. No instrument of equivalent scientific value to the foreign instrument, for such purposes as these instruments are intended to be used, was being manufactured in the United States at the time the instruments were ordered. Reasons: Each foreign instrument is an electron microscope and is intended for research or scientific educational uses requiring an electron microscope. We know of no electron microscope, or any other instrument suited to these purposes, which was being manufactured in the United States at the time of order of each instrument. Dated: October 29, 2010. Gregory W. Campbell, Acting Director, Subsidies Enforcement Office, Import Administration. [FR Doc. 2010–27887 Filed 11–3–10; 8:45 am] BILLING CODE 3510–DS–P September 22, 2010. Comments: None received. Decision: Approved. Reasons: The instrument must meet the following specifications: an 11 mm diameter beam aperture, a He leak rate of < 2 × 10∧ ¥ 8 mbar I/sec, HV compatible to < 5 × 10 ¥ 7 mbar vacuum, an operational range of 2 bar to 7 bar, a 6 mm pneumatic air connection, and a 24 VCD (1.2W) at 50 mA solenoid with flying leads. We know of no instruments of equivalent scientific value to the foreign instruments described below, for such purposes as this is intended to be used, that was being manufactured in the United States at the time of its order. Docket Number: 10–059. Applicant: University of Chicago, LLC, Lemont, IL 60439. Instrument: Micropitting Test Machine. Manufacturer: Primelia Consulting Services Limited, United Kingdom. Intended Use: See notice at 75 FR 57738, September 22, 2010. Comments: None received. Decision: Approved. Reasons: The instrument has capabilities that are tailored for the specific micropitting analysis, specifically the accelerometer measurement to monitor for onset of fatigue failure. The instrument also has three points of contact which will increase the speed at which tests are made. We know of no instruments of equivalent scientific value to the foreign instruments described below, for such purposes as this is intended to be used, that was being manufactured in the United States at the time of its order. BILLING CODE 3510–DS–P International Trade Administration Dated: October 29, 2010. Gregory W. Campbell, Acting Director, Subsidies Enforcement Office, Import Administration. DEPARTMENT OF COMMERCE [FR Doc. 2010–27888 Filed 11–3–10; 8:45 am] National Institutes of Health, et al.; Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscopes International Trade Administration BILLING CODE 3510–DS–P [FR Doc. 2010–27889 Filed 11–3–10; 8:45 am] jlentini on DSKJ8SOYB1PROD with NOTICES DEPARTMENT OF COMMERCE This is a decision consolidated pursuant to Section 6(c) of the Educational, Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89–651, as amended by Pub. L. 106– 36; 80 Stat. 897; 15 CFR part 301). Related records can be viewed between 8:30 a.m. and 5 p.m. in Room 3720, U.S. Department of Commerce, 14th and Constitution Avenue, NW., Washington, DC. Docket Number: 10–055. Applicant: National Institutes of Health, Bethesda, MD 20892. Instrument: Electron Microscope. Manufacturer: JEOL Limited, Japan. Intended Use: See notice at 75 FR 57738, September 22, 2010. Docket Number: 10–056. Applicant: University of Notre Dame, Procurement Services, Notre Dame, IN 46556. VerDate Mar<15>2010 17:55 Nov 03, 2010 Jkt 223001 The University of Georgia (UGA), et al.; Notice of Decision on Applications for Duty-Free Entry of Scientific Instruments This is a decision pursuant to Section 6(c) of the Educational, Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89–651, as amended by Pub. L. 06–36; 80 Stat. 897; 15 CFR part 301). Related records can be viewed between 8:30 a.m. and 5 p.m. in Room 3720, U.S. Department of Commerce, 14th and Constitution Ave., NW., Washington, DC. Docket Number: 10–054. Applicant: The University of Georgia (UGA), Athens, GA 30602–7229. Instrument: HV Pneumatic Quadrant Beam Position Monitor with I404 Quad Current Integrator. Manufacturer: FMB Oxford Limited, United Kingdom. Intended Use: See notice at 75 FR 57738, PO 00000 Frm 00006 Fmt 4703 Sfmt 4703 DEPARTMENT OF COMMERCE National Oceanic and Atmospheric Administration Notice of Designation of the Lake Superior National Estuarine Research Reserve in Wisconsin Estuarine Reserves Division, Office of Ocean and Coastal Resource Management, National Ocean Service, National Oceanic and Atmospheric Administration, U.S. Department of Commerce. ACTION: Notice of Designation and availability of Notice of Record of Decision. AGENCY: Notice is hereby given that the National Oceanic and Atmospheric Administration (NOAA), U.S. Department of Commerce, has SUMMARY: E:\FR\FM\04NON1.SGM 04NON1

Agencies

[Federal Register Volume 75, Number 213 (Thursday, November 4, 2010)]
[Notices]
[Page 67950]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: 2010-27889]


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DEPARTMENT OF COMMERCE

International Trade Administration


National Institutes of Health, et al.; Notice of Consolidated 
Decision on Applications for Duty-Free Entry of Electron Microscopes

    This is a decision consolidated pursuant to Section 6(c) of the 
Educational, Scientific, and Cultural Materials Importation Act of 1966 
(Pub. L. 89-651, as amended by Pub. L. 106-36; 80 Stat. 897; 15 CFR 
part 301). Related records can be viewed between 8:30 a.m. and 5 p.m. 
in Room 3720, U.S. Department of Commerce, 14th and Constitution 
Avenue, NW., Washington, DC.
    Docket Number: 10-055. Applicant: National Institutes of Health, 
Bethesda, MD 20892. Instrument: Electron Microscope. Manufacturer: JEOL 
Limited, Japan. Intended Use: See notice at 75 FR 57738, September 22, 
2010.
    Docket Number: 10-056. Applicant: University of Notre Dame, 
Procurement Services, Notre Dame, IN 46556. Instrument: Electron 
Microscope. Manufacturer: FEI Company, the Netherlands. Intended Use: 
See notice at 75 FR 57738, September 22, 2010.
    Docket Number: 10-057. Applicant: Curators of the University of 
Missouri, Rolla, MO 56049. Instrument: Electron Microscope. 
Manufacturer: FEI Company, the Netherlands. Intended Use: See notice at 
75 FR 57738, September 22, 2010.
    Docket Number: 10-058. Applicant: SUNY Upstate Medical University, 
Syracuse, NY 13210. Instrument: Electron Microscope. Manufacturer: 
JEOL, Ltd., Japan. Intended Use: See notice at 75 FR 57738, September 
22, 2010.
    Comments: None received. Decision: Approved. No instrument of 
equivalent scientific value to the foreign instrument, for such 
purposes as these instruments are intended to be used, was being 
manufactured in the United States at the time the instruments were 
ordered. Reasons: Each foreign instrument is an electron microscope and 
is intended for research or scientific educational uses requiring an 
electron microscope. We know of no electron microscope, or any other 
instrument suited to these purposes, which was being manufactured in 
the United States at the time of order of each instrument.

    Dated: October 29, 2010.
Gregory W. Campbell,
Acting Director, Subsidies Enforcement Office, Import Administration.
[FR Doc. 2010-27889 Filed 11-3-10; 8:45 am]
BILLING CODE 3510-DS-P

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