Argonne National Laboratory, et al.; Notice of Decision on Applications for Duty-Free Entry of Scientific Instruments, 56986 [2010-23347]
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56986
Federal Register / Vol. 75, No. 180 / Friday, September 17, 2010 / Notices
inspection, cleaning, upgrading,
welding, and balancing) of customerowned gas and steam turbine
components (rotors, valves, blades,
gears, couplings, airfoils, hubs and
stationaries) and generators. Foreignorigin turbines and generators would
also be distributed from the MPSA
facility. The application indicates that
large gas and steam turbines will be
manufactured at the facility in the
future, but MPSA is not seeking
authority to produce these products
under FTZ procedures at this time.
FTZ procedures could exempt MPSA
from customs duty payments on foreign
materials and components used in
export production. On its domestic
shipments, MPSA would be able to
choose the duty rate that applies to
finished gas turbine combustor baskets
and transition pieces (2.4%) for the
foreign nickel alloy inputs noted above.
MPSA would also be exempt from duty
payments on any foreign-origin nickel
alloy that becomes scrap or waste
during manufacturing. Duties also could
possibly be deferred or reduced on
foreign status production equipment.
Customs duties could be reduced on
foreign-origin turbines (6.7%) that may
be withdrawn from the zone with
generators for customs entry as
complete generating sets (2.5%). FTZ
procedures would further allow MPSA
to realize logistical benefits through the
use of weekly customs entry procedures.
The application indicates that the
savings from FTZ procedures would
help improve the facility’s international
competitiveness.
In accordance with the Board’s
regulations, Pierre Duy of the FTZ Staff
is designated examiner to evaluate and
analyze the facts and information
presented in the application and case
record and to report findings and
recommendations to the Board.
Public comment is invited from
interested parties. Submissions (original
and 3 copies) shall be addressed to the
Board’s Executive Secretary at the
following address: Office of the
Executive Secretary, Room 2111, U.S.
Department of Commerce, 1401
Constitution Avenue, NW., Washington,
DC 20230–0002. The closing period for
receipt of comments is November 16,
2010. Rebuttal comments in response to
material submitted during the foregoing
period may be submitted during the
subsequent 15-day period to December
1, 2010.
A copy of the application will be
available for public inspection at the
Office of the Foreign-Trade Zones
Board’s Executive Secretary at the
address listed above and in the ‘‘Reading
Room’’ section of the Board’s Web site,
VerDate Mar<15>2010
14:46 Sep 16, 2010
Jkt 220001
which is accessible via https://
www.trade.gov/ftz. For further
information, contact Pierre Duy at
Pierre.Duy@trade.gov or (202) 482–1378.
Dated: September 13, 2010.
Elizabeth Whiteman,
Acting Executive Secretary.
[FR Doc. 2010–23355 Filed 9–16–10; 8:45 am]
BILLING CODE 3510–DS–P
DEPARTMENT OF COMMERCE
International Trade Administration
Argonne National Laboratory, et al.;
Notice of Decision on Applications for
Duty-Free Entry of Scientific
Instruments
This is a decision pursuant to Section
6(c) of the Educational, Scientific, and
Cultural Materials Importation Act of
1966 (Pub. L. 89–651, as amended by
Pub. L. 106–36; 80 Stat. 897; 15 CFR
part 301). Related records can be viewed
between 8:30 a.m. and 5 p.m. in Room
3720, U.S. Department of Commerce,
14th and Constitution Ave., NW.,
Washington, DC.
Comments: None received. Decision:
Approved. We know of no instruments
of equivalent scientific value to the
foreign instruments described below, for
such purposes as this is intended to be
used, that was being manufactured in
the United States at the time of its order.
Docket Number: 10–052. Applicant:
Argonne National Laboratory,
University of Chicago Argonne, Lemont,
IL 60439. Instrument: Pilatus 2M Pixel
Detector System. Manufacturer: Dectris
Ltd., Switzerland. Intended Use: See
notice at 75 FR 51239, August 19, 2010.
Reasons: The instrument will be used to
obtain fine structural information for
materials during chemical reactions,
such as catalysis. The instrument has
gatable data processing as well as high
time resolution and high spatial
resolution, which makes the instrument
unique. Other unique features include
direct detection of x-rays in singlephoton-counting mode, a radiationtolerant design, a high dynamic range, a
short readout time, high frame rates,
high counting rates, and shutterless
operation.
Docket Number: 10–053. Applicant:
Argonne National Laboratory,
University of Chicago Argonne, Lemont,
IL 60439. Instrument: UHV LowTemperature Atomic Force Microscope
System for Application in High
Magnetic Fields. Manufacturer:
Omicron Nanotechnology, Germany.
Intended Use: See notice at 75 FR
51239, August 19, 2010. Reasons: The
instrument will be used to study atomic
PO 00000
Frm 00008
Fmt 4703
Sfmt 4703
scale electrical and magnetic properties
of electrically conduction as well as
insulation nanostructures prepared by
in situ deposition onto clean surfaces.
In-situ capacities allow the preparation
of clean and well-defined
nanostructures on pristine surfaces
which would contaminate otherwise.
Unique features of this instrument
include the capability of applying large
magnetic fields (>3 Tesla), which is
necessary to allow the clear separation
of structural, electronic, and magnetic
signals of nanostructures and the
evaluation of the properties to be
studied in these experiments. The
instrument also has in-situ preparation
capability and the ability to operate in
low temperatures. Further, the
instrument is capable of performing
imaging in two main modes of
operation, i.e., scanning tunneling
microscopy and atomic force
microscopy.
Dated: September 10, 2010.
Gregory W. Campbell,
Acting Director, Subsidies Enforcement
Office, Import Administration.
[FR Doc. 2010–23347 Filed 9–16–10; 8:45 am]
BILLING CODE 3510–DS–P
DEPARTMENT OF COMMERCE
National Oceanic and Atmospheric
Administration
RIN 0648–XY97
Endangered and Threatened Species;
Take of Anadromous Fish
National Marine Fisheries
Service (NMFS), National Oceanic and
Atmospheric Administration (NOAA),
Commerce.
ACTION: Applications for three new
scientific research permits.
AGENCY:
Notice is hereby given that
NMFS has received three scientific
research permit application requests
relating to Pacific salmon. The proposed
research is intended to increase
knowledge of species listed under the
Endangered Species Act (ESA) and to
help guide management and
conservation efforts. The applications
may be viewed online at: https://
apps.nmfs.noaa.gov/preview/
previewlopenlforlcomment.cfm
DATES: Comments or requests for a
public hearing on the applications must
be received at the appropriate address or
fax number (see ADDRESSES) no later
than 5 p.m. Pacific standard time on
October 18, 2010.
ADDRESSES: Written comments on the
applications should be sent to the
SUMMARY:
E:\FR\FM\17SEN1.SGM
17SEN1
]]>Agencies
[Federal Register Volume 75, Number 180 (Friday, September 17, 2010)]
[Notices]
[Page 56986]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: 2010-23347]
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DEPARTMENT OF COMMERCE
International Trade Administration
Argonne National Laboratory, et al.; Notice of Decision on
Applications for Duty-Free Entry of Scientific Instruments
This is a decision pursuant to Section 6(c) of the Educational,
Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89-
651, as amended by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301).
Related records can be viewed between 8:30 a.m. and 5 p.m. in Room
3720, U.S. Department of Commerce, 14th and Constitution Ave., NW.,
Washington, DC.
Comments: None received. Decision: Approved. We know of no
instruments of equivalent scientific value to the foreign instruments
described below, for such purposes as this is intended to be used, that
was being manufactured in the United States at the time of its order.
Docket Number: 10-052. Applicant: Argonne National Laboratory,
University of Chicago Argonne, Lemont, IL 60439. Instrument: Pilatus 2M
Pixel Detector System. Manufacturer: Dectris Ltd., Switzerland.
Intended Use: See notice at 75 FR 51239, August 19, 2010. Reasons: The
instrument will be used to obtain fine structural information for
materials during chemical reactions, such as catalysis. The instrument
has gatable data processing as well as high time resolution and high
spatial resolution, which makes the instrument unique. Other unique
features include direct detection of x-rays in single-photon-counting
mode, a radiation-tolerant design, a high dynamic range, a short
readout time, high frame rates, high counting rates, and shutterless
operation.
Docket Number: 10-053. Applicant: Argonne National Laboratory,
University of Chicago Argonne, Lemont, IL 60439. Instrument: UHV Low-
Temperature Atomic Force Microscope System for Application in High
Magnetic Fields. Manufacturer: Omicron Nanotechnology, Germany.
Intended Use: See notice at 75 FR 51239, August 19, 2010. Reasons: The
instrument will be used to study atomic scale electrical and magnetic
properties of electrically conduction as well as insulation
nanostructures prepared by in situ deposition onto clean surfaces. In-
situ capacities allow the preparation of clean and well-defined
nanostructures on pristine surfaces which would contaminate otherwise.
Unique features of this instrument include the capability of applying
large magnetic fields (>3 Tesla), which is necessary to allow the clear
separation of structural, electronic, and magnetic signals of
nanostructures and the evaluation of the properties to be studied in
these experiments. The instrument also has in-situ preparation
capability and the ability to operate in low temperatures. Further, the
instrument is capable of performing imaging in two main modes of
operation, i.e., scanning tunneling microscopy and atomic force
microscopy.
Dated: September 10, 2010.
Gregory W. Campbell,
Acting Director, Subsidies Enforcement Office, Import Administration.
[FR Doc. 2010-23347 Filed 9-16-10; 8:45 am]
BILLING CODE 3510-DS-P
