National Center for Toxicological Research, et al.; Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscopes, 43918 [2010-18390]

Download as PDF 43918 Federal Register / Vol. 75, No. 143 / Tuesday, July 27, 2010 / Notices surrender shall be final, and shall apply only to that TRQ year. DOC will notify licensees of any amount surrendered and the application period for requests for reallocation. A licensee that imported, or intends to import, a quantity exceeding the quantity set forth in its license may apply (state the maximum amount of additional allocation the applicant will be able to use) to receive additional allocation from the amount to be reallocated. II. Method of Collection Forms are available on the Internet and by mail to requesting firms. III. Data OMB Control Number: 0625–0240. Form Number(s): ITA–4139 and ITA– 4140P. Type of Review: Regular submission. Affected Public: Business or other forprofit organizations. Estimated Number of Respondents: 20. Estimated Time per Response: Application process, 3 hours; and reallocation request, 1 hour. Estimated Total Annual Burden Hours: 160. Estimated Total Annual Costs: $5,400 sroberts on DSKD5P82C1PROD with NOTICES IV. Request for Comments Comments are invited on (a) whether the proposed collection of information is necessary for the proper performance of the functions of the agency, including whether the information shall have practical utility; (b) the accuracy of the agency’s estimate of the burden (including hours and costs) of the proposed collection of information; (c) ways to enhance the quality, utility, and clarity of the information to be collected; and (d) ways to minimize the burden of the collection of information on respondents, including through the use of automated collection techniques or forms of information technology. Comments submitted in response to this notice will be summarized and/or included in the request for OMB approval of this information collection; they also will become a matter of public record. Dated: July 22, 2010. Gwellnar Banks, Management Analyst, Office of the Chief Information Officer. [FR Doc. 2010–18345 Filed 7–26–10; 8:45 am] BILLING CODE 3510–DR–P VerDate Mar<15>2010 16:30 Jul 26, 2010 Jkt 220001 DEPARTMENT OF COMMERCE International Trade Administration National Center for Toxicological Research, et al.; Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscopes This is a decision consolidated pursuant to Section 6(c) of the Educational, Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89–651, as amended by Pub. L. 106– 36; 80 Stat. 897; 15 CFR part 301). Related records can be viewed between 8:30 a.m. and 5 p.m. in Room 3720, U.S. Department of Commerce, 14th and Constitution Avenue, NW., Washington, DC. Docket Number: 10–015. Applicant: National Center for Toxicological Research, (USFDA), Jefferson, AK 72079. Instrument: Electron Microscope. Manufacturer: JEOL, Ltd., Japan. Intended Use: See notice at 75 FR 37384, June 29, 2010. Docket Number: 10–023. Applicant: University of Virginia, Charlottesville, VA 22903. Instrument: Electron Microscope. Manufacturer: FEI Company, the Netherlands. Intended Use: See notice at 75 FR 37384, June 29, 2010. Docket Number: 10–029. Applicant: Argonne National Laboratory, Lemont, IL 60439. Instrument: Electron Microscope. Manufacturer: JEOL, Ltd., Japan. Intended Use: See notice at 75 FR 37384, June 29, 2010. Docket Number: 10–030. Applicant: University of California, Davis, CA 95616. Instrument: Electron Microscope. Manufacturer: Elionix Co., Ltd., Japan. Intended Use: See notice at 75 FR 37384, June 29, 2010. Docket Number: 10–031. Applicant: National Institutes of Health, Bethesda, MD 20892. Instrument: Electron Microscope. Manufacturer: JEOL, Ltd., Japan. Intended Use: See notice at 75 FR 37384, June 29, 2010. Docket Number: 10–032. Applicant: Battelle Memorial Institute, Richland, WA 99354. Instrument: Electron Microscope. Manufacturer: FEI Company, the Netherlands. Intended Use: See notice at 75 FR 37384, June 29, 2010. Docket Number: 10–033. Applicant: Massachusetts General Hospital, Charlestown, MA 02120. Instrument: Electron Microscope. Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 75 FR 37384, June 29, 2010. Docket Number: 10–035. Applicant: University of Maine System, St., Bangor, ME 04401. Instrument: Electron PO 00000 Frm 00004 Fmt 4703 Sfmt 9990 Microscope. Manufacturer: Tescan, Czech Republic. Intended Use: See notice at 75 FR 37384, June 29, 2010. Docket Number: 10–036. Applicant: University of Kansas Medical Center, Kansas City, KS 66160. Instrument: Electron Microscope. Manufacturer: JEOL, Ltd., Japan. Intended Use: See notice at 75 FR 37384, June 29, 2010. Docket Number: 10–037. Applicant: University of South Dakota, Vermillion, SD 57069. Instrument: Electron Microscope. Manufacturer: FEI Company, Czech Republic. Intended Use: See notice at 75 FR 37384, June 29, 2010. Docket Number: 10–040. Applicant: Illinois State University, Normal, IL 61790–4120. Instrument: Electron Microscope. Manufacturer: FEI Company, Czech Republic. Intended Use: See notice at 75 FR 37384, June 29, 2010. Docket Number: 10–041. Applicant: Temple University, Philadelphia, PA 19122. Instrument: Electron Microscope. Manufacturer: JEOL, Ltd., Japan. Intended Use: See notice at 75 FR 37384, June 29, 2010. Docket Number: 10–042. Applicant: University of Arkansas for Medical Sciences, Little Rock, AR 72205. Instrument: Electron Microscope. Manufacturer: FEI, the Netherlands. Intended Use: See notice at 75 FR 37384, June 29, 2010. Comments: None received. Decision: Approved. No instrument of equivalent scientific value to the foreign instrument, for such purposes as these instruments are intended to be used, was being manufactured in the United States at the time the instruments were ordered. Reasons: Each foreign instrument is an electron microscope and is intended for research or scientific educational uses requiring an electron microscope. We know of no electron microscope, or any other instrument suited to these purposes, which was being manufactured in the United States at the time of order of each instrument. Dated: July 21, 2010. Christopher Cassel, Director, Subsidies Enforcement Office, Import Administration. [FR Doc. 2010–18390 Filed 7–26–10; 8:45 am] BILLING CODE 3510–DS–P E:\FR\FM\27JYN1.SGM 27JYN1

Agencies

[Federal Register Volume 75, Number 143 (Tuesday, July 27, 2010)]
[Notices]
[Page 43918]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: 2010-18390]


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DEPARTMENT OF COMMERCE

International Trade Administration


National Center for Toxicological Research, et al.; Notice of 
Consolidated Decision on Applications for Duty-Free Entry of Electron 
Microscopes

    This is a decision consolidated pursuant to Section 6(c) of the 
Educational, Scientific, and Cultural Materials Importation Act of 1966 
(Pub. L. 89-651, as amended by Pub. L. 106-36; 80 Stat. 897; 15 CFR 
part 301). Related records can be viewed between 8:30 a.m. and 5 p.m. 
in Room 3720, U.S. Department of Commerce, 14th and Constitution 
Avenue, NW., Washington, DC.
    Docket Number: 10-015. Applicant: National Center for Toxicological 
Research, (USFDA), Jefferson, AK 72079. Instrument: Electron 
Microscope. Manufacturer: JEOL, Ltd., Japan. Intended Use: See notice 
at 75 FR 37384, June 29, 2010.
    Docket Number: 10-023. Applicant: University of Virginia, 
Charlottesville, VA 22903. Instrument: Electron Microscope. 
Manufacturer: FEI Company, the Netherlands. Intended Use: See notice at 
75 FR 37384, June 29, 2010.
    Docket Number: 10-029. Applicant: Argonne National Laboratory, 
Lemont, IL 60439. Instrument: Electron Microscope. Manufacturer: JEOL, 
Ltd., Japan. Intended Use: See notice at 75 FR 37384, June 29, 2010.
    Docket Number: 10-030. Applicant: University of California, Davis, 
CA 95616. Instrument: Electron Microscope. Manufacturer: Elionix Co., 
Ltd., Japan. Intended Use: See notice at 75 FR 37384, June 29, 2010.
    Docket Number: 10-031. Applicant: National Institutes of Health, 
Bethesda, MD 20892. Instrument: Electron Microscope. Manufacturer: 
JEOL, Ltd., Japan. Intended Use: See notice at 75 FR 37384, June 29, 
2010.
    Docket Number: 10-032. Applicant: Battelle Memorial Institute, 
Richland, WA 99354. Instrument: Electron Microscope. Manufacturer: FEI 
Company, the Netherlands. Intended Use: See notice at 75 FR 37384, June 
29, 2010.
    Docket Number: 10-033. Applicant: Massachusetts General Hospital, 
Charlestown, MA 02120. Instrument: Electron Microscope. Manufacturer: 
JEOL Ltd., Japan. Intended Use: See notice at 75 FR 37384, June 29, 
2010.
    Docket Number: 10-035. Applicant: University of Maine System, St., 
Bangor, ME 04401. Instrument: Electron Microscope. Manufacturer: 
Tescan, Czech Republic. Intended Use: See notice at 75 FR 37384, June 
29, 2010.
    Docket Number: 10-036. Applicant: University of Kansas Medical 
Center, Kansas City, KS 66160. Instrument: Electron Microscope. 
Manufacturer: JEOL, Ltd., Japan. Intended Use: See notice at 75 FR 
37384, June 29, 2010.
    Docket Number: 10-037. Applicant: University of South Dakota, 
Vermillion, SD 57069. Instrument: Electron Microscope. Manufacturer: 
FEI Company, Czech Republic. Intended Use: See notice at 75 FR 37384, 
June 29, 2010.
    Docket Number: 10-040. Applicant: Illinois State University, 
Normal, IL 61790-4120. Instrument: Electron Microscope. Manufacturer: 
FEI Company, Czech Republic. Intended Use: See notice at 75 FR 37384, 
June 29, 2010.
    Docket Number: 10-041. Applicant: Temple University, Philadelphia, 
PA 19122. Instrument: Electron Microscope. Manufacturer: JEOL, Ltd., 
Japan. Intended Use: See notice at 75 FR 37384, June 29, 2010.
    Docket Number: 10-042. Applicant: University of Arkansas for 
Medical Sciences, Little Rock, AR 72205. Instrument: Electron 
Microscope. Manufacturer: FEI, the Netherlands. Intended Use: See 
notice at 75 FR 37384, June 29, 2010.
    Comments: None received. Decision: Approved. No instrument of 
equivalent scientific value to the foreign instrument, for such 
purposes as these instruments are intended to be used, was being 
manufactured in the United States at the time the instruments were 
ordered. Reasons: Each foreign instrument is an electron microscope and 
is intended for research or scientific educational uses requiring an 
electron microscope. We know of no electron microscope, or any other 
instrument suited to these purposes, which was being manufactured in 
the United States at the time of order of each instrument.

    Dated: July 21, 2010.
Christopher Cassel,
Director, Subsidies Enforcement Office, Import Administration.
[FR Doc. 2010-18390 Filed 7-26-10; 8:45 am]
BILLING CODE 3510-DS-P