Application(s) for Duty-Free Entry of Scientific Instruments, 29974-29975 [2010-12962]
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29974
Federal Register / Vol. 75, No. 103 / Friday, May 28, 2010 / Notices
Issue 7: Whether the Department’s
calculations correctly considered the
weight of the green pipe caps.
Issue 8: Whether the Department should
adjust the adverse facts available rate
applied to TPCO’s U.S. affiliate’s
downstream sales.
[FR Doc. 2010–12960 Filed 5–27–10; 8:45 am]
BILLING CODE 3510–DS–S
DEPARTMENT OF COMMERCE
Foreign-Trade Zones Board
[Docket 39–2010]
jlentini on DSKJ8SOYB1PROD with NOTICES
Foreign-Trade Zone 3—San Francisco,
CA; Application for Reorganization
under Alternative Site Framework
An application has been submitted to
the Foreign-Trade Zones (FTZ) Board
(the Board) by the San Francisco Port
Commission, grantee of FTZ 3,
requesting authority to reorganize the
zone under the alternative site
framework (ASF) adopted by the Board
(74 FR 1170, 1/12/09; correction 74 FR
3987, 1/22/09). The ASF is an option for
grantees for the establishment or
reorganization of general-purpose zones
and can permit significantly greater
flexibility in the designation of new
‘‘usage-driven’’ FTZ sites for operators/
users located within a grantee’s ‘‘service
area’’ in the context of the Board’s
standard 2,000-acre activation limit for
a general-purpose zone project. The
application was submitted pursuant to
the Foreign-Trade Zones Act, as
amended (19 U.S.C. 81a–81u), and the
regulations of the Board (15 CFR part
400). It was formally filed on May 21,
2010.
FTZ 3 was approved by the Board on
March 10, 1948 (Board Order 12, 13 FR
1459, 3/19/48) and the boundaries were
modified on July 31, 1950 (Board Order
25, 15 FR 1653, 9/8/50) and on
December 20, 1956 (Board Order 43, 21
FR 10434, 12/28/56). FTZ 3 was
relocated on May 5, 1958 (Board Order
46, 23 FR 3277, 5/14/58), an extension
of the relocation granted May 5, 1965
(Board Order 66, 30 FR 6596, 5/13/65)
and the zone was relocated again on
July 13, 1977 (Board Order 121, 42 FR
38942, 8/1/77). FTZ 3 was expanded on
November 21, 2000 (Board Order 1129,
65 FR 76217, 12/6/00).
The current zone project includes the
following sites: Site 1 (5.82 acres)—Pier
19, Pier 23, Pier 50 and Pier 80 port
facilities on the Embarcadero, San
Francisco; Site 2 (42.50 acres)—San
Francisco International Airport jet-fuel
storage and distribution system, which
consists of the airport hydrant and
storage facilities, two adjacent off-
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17:43 May 27, 2010
Jkt 220001
airport terminals, a pipeline and two
off-site terminals and related pipelines
in Brisbane and South San Francisco;
Site 3 (55 acres)—Selby Terminal
petroleum facilities, 90 San Pablo
Avenue, Crockett; and, Site 4 (164
acres)—Martinez Terminal petroleum
facilities, 2801 Waterfront Road,
Martinez.
The grantee’s proposed service area
under the ASF would be the City and
County of San Francisco and the County
of San Mateo, California, as described in
the application. If approved, the grantee
would be able to serve sites throughout
the service area based on companies’
needs for FTZ designation. The
proposed service area is within and
adjacent to the San Francisco Customs
and Border Protection port of entry.
The applicant is requesting authority
to reorganize its existing zone project to
include existing sites 2, 3 and 4 as
‘‘usage-driven’’ sites. The applicant is
also requesting authority to remove Site
1 from the zone project due to changed
circumstances. Because the ASF only
pertains to establishing or reorganizing
a general-purpose zone, the application
would have no impact on FTZ 3’s
authorized subzones.
In accordance with the Board’s
regulations, Christopher Kemp of the
FTZ Staff is designated examiner to
evaluate and analyze the facts and
information presented in the application
and case record and to report findings
and recommendations to the Board.
Public comment is invited from
interested parties. Submissions (original
and 3 copies) shall be addressed to the
Board’s Executive Secretary at the
address below. The closing period for
their receipt is July 27, 2010. Rebuttal
comments in response to material
submitted during the foregoing period
may be submitted during the subsequent
15-day period to August 11, 2010.
A copy of the application will be
available for public inspection at the
Office of the Executive Secretary,
Foreign-Trade Zones Board, Room 2111,
U.S. Department of Commerce, 1401
Constitution Avenue, NW., Washington,
DC 20230–0002, and in the ‘‘Reading
Room’’ section of the Board’s Web site,
which is accessible via https://
www.trade.gov/ftz. For further
information, contact Christopher Kemp
at Christopher.Kemp@trade.gov or (202)
482–0862.
Dated: May 21, 2010.
Andrew McGilvray,
Executive Secretary.
[FR Doc. 2010–12957 Filed 5–27–10; 8:45 am]
BILLING CODE 3510–DS–P
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DEPARTMENT OF COMMERCE
International Trade Administration
Application(s) for Duty-Free Entry of
Scientific Instruments
Pursuant to Section 6(c) of the
Educational, Scientific and Cultural
Materials Importation Act of 1966 (Pub.
L. 89–651, as amended by Pub. L. 106–
36; 80 Stat. 897; 15 CFR part 301), we
invite comments on the question of
whether instruments of equivalent
scientific value, for the purposes for
which the instruments shown below are
intended to be used, are being
manufactured in the United States.
Comments must comply with 15 CFR
301.5(a)(3) and (4) of the regulations and
be postmarked on or before June 17,
2010. Address written comments to
Statutory Import Programs Staff, Room
3720, U.S. Department of Commerce,
Washington, DC 20230. Applications
may be examined between 8:30 a.m. and
5 p.m. at the U.S. Department of
Commerce in Room 3720.
Docket Number: 10–010. Applicant:
University of Maine System, 16 Central
St., Bangor, ME 04401. Instrument: Live
Color Cathodoluminescence detector
accessory for Scanning Electron
Microscope. Manufacturer: Gatan, UK.
Intended Use: The instrument will be
used to study the morphology and
microstructure of primarily geological
but also some archaeological and
biological materials. Techniques include
imaging using three components of light
(red, green, blue) split from a
panchromatic signal induced in the
sample by an incident electron beam
inside an SEM. This instrument offers
live color detectors, i.e., panchromatic
cathodoluminescence detectors in
which the intensity of the light across
the entire visible spectrum is measured.
Justification for Duty-Free Entry: There
are no domestic manufacturers of this
instrument. Application accepted by
Commissioner of Customs: April 27,
2010.
Docket Number: 10–011. Applicant:
Washington University in St. Louis,
Purchasing Dept., 1 Brookings Drive,
Campus Box 1069, St. Louis, MO 63130.
Instrument: Electron Microscope.
Manufacturer: Japanese Electron-Optics,
Limited (JEOL), Japan. Intended Use:
This instrument will be used to study a
complete range of medically relevant
cells, tissues, and molecules and
understand the molecular and cellular
basis of a wide range of human diseases.
The instrument allows for techniques
including advanced forms of biological
specimen preparation, as well as more
classical procedures for fixation,
E:\FR\FM\28MYN1.SGM
28MYN1
jlentini on DSKJ8SOYB1PROD with NOTICES
Federal Register / Vol. 75, No. 103 / Friday, May 28, 2010 / Notices
dehydration, plastic embedding and
thin-sectioning of biological materials.
Justification for Duty-Free Entry: No
instruments of same general category are
manufactured in the United States.
Application accepted by Commissioner
of Customs: April 30, 2010.
Docket Number: 10–012. Applicant:
California Institute of Technology, 1200
E. California Blvd., M/C 127–72,
Pasadena, CA 91125. Instrument:
Electron Microscope. Manufacturer: FEI
Company, Czech Republic. Intended
Use: The instrument will be used to
improve researchers’ understanding of
the structural dynamics of materials like
graphite, as well as ultrafast structural
changes over time in microscopy.
Techniques used with the instrument
include imaging, both in real space and
using diffraction. Imaging is done using
light as opposed to thermal heating or
field ionization. Justification for DutyFree Entry: There are no domestic
manufacturers of this type of electron
microscope. Application accepted by
Commissioner of Customs: May 5, 2010.
Docket Number: 10–013. Applicant:
Howard Hughes Medical Institute, 4000
Jones Bridge Road, Chevy Chase, MD
20815. Instrument: Electron Microscope.
Manufacturer: FEI Company, Czech
Republic. Intended Use: The instrument
will be used to examine portions of
vertebrate and invertebrate organisms
embedded in plastic resins and cut into
thin sections mounted on support grids
for examination. The objective is to
examine, at high resolution, the
ultrastructural organization of complex
biological structures to help elucidate
function. The instrument can be used
for 2D and 3D imaging of stained or
even unstained, low-contrast samples.
The instrument also allows for
observation and analyses of samples at
both room and liquid-nitrogen
temperature. Justification for Duty-Free
Entry: There are no domestic
manufacturers of this type of electron
microscope. Application accepted by
Commissioner of Customs: May 12,
2010.
Docket Number: 10–014. Applicant:
Howard Hughes Medical Institute, 4000
Jones Bridge Road, Chevy Chase, MD
20815. Instrument: Electron Microscope.
Manufacturer: FEI Company, Czech
Republic. Intended Use: The instrument
will be used to examine portions of
vertebrate and invertebrate organisms
embedded in plastic resins and cut into
thin sections mounted on support grids
for examination. The objective is to
examine, at high resolution, the
ultrastructural organization of complex
biological structures to help elucidate
function. The instrument can be used
for 2D and 3D imaging of stained or
VerDate Mar<15>2010
17:43 May 27, 2010
Jkt 220001
even unstained, low-contrast samples.
The instrument also allows for
observation and analyses of samples at
both room and liquid-nitrogen
temperature. Justification for Duty-Free
Entry: There are no domestic
manufacturers of this type of electron
microscope. Application accepted by
Commissioner of Customs: May 14,
2010.
Docket Number: 10–016. Applicant:
United States Geological Survey, 6th
Ave. & Kipling St., P.O. Box 25046,
MS973, Denver Federal Center, Building
20, Denver, CO 80225. Instrument:
Electron Microscope. Manufacturer: FEI
Company, Czech Republic. Intended
Use: The instrument will be used for the
microanalysis of rocks, minerals and
other particulate matter. Analyses of the
morphology, surface textures, grain
boundaries, and other properties of the
materials investigated include the use of
chemical composition and
crystallographic orientation and strain.
The low vacuum and low voltage
features of the instrument allows for the
viewing of hydrated and un-coated
samples with minimal sample
degradation or alteration. The advantage
of this instrument is that it can operate
at high vacuum and high acceleration
voltages as well as atmospheric
pressures and/or low accelerating
voltages while still maintaining high
resolution and high beam currents.
Justification for Duty-Free Entry: There
are no domestic manufacturers of this
type of electron microscope.
Application accepted by Commissioner
of Customs: May 18, 2010.
Docket Number: 10–017. Applicant:
University of Massachusetts Medical
School, Department of Cell Biology, Rm.
S7–210, 55 Lake Avenue North,
Worcester, MA 01655. Instrument:
Electron Microscope. Manufacturer: FEI
Company, Czech Republic. Intended
Use: The instrument will enable the
study of tissue cell structures at high
resolution, the recording of images on
the Eagle CCD camera, and the
observation of cryo-fixed specimens at
low temperatures. Justification for DutyFree Entry: There are no domestic
manufacturers of this type of electron
microscope. Application accepted by
Commissioner of Customs: May 12,
2010.
Docket Number: 10–018. Applicant:
Texas Tech University, Department of
Mechanical Engineering, 7th Street and
Boston Ave., Lubbock, TX 79409–1021.
Instrument: Electron Microscope.
Manufacturer: Japanese Electron-Optics,
Limited (JEOL), Japan. Intended Use:
The instrument will be used to probe
the crystalline structure of materials at
a magnification beyond that required to
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29975
image dislocation behavior of fully
crystalline nanostructured metals. The
instrument will provide detailed surface
structures and faceting information.
Justification for Duty-Free Entry: No
instruments of same general category are
manufactured in the United States.
Application accepted by Commissioner
of Customs: May 17, 2010.
Docket Number: 10–020. Applicant:
Howard Hughes Medical Institute, 4000
Jones Bridge Road, Chevy Chase, MD
20815. Instrument: Electron Microscope.
Manufacturer: FEI Company, Czech
Republic. Intended Use: The instrument
will be used to examine portions of
vertebrate and invertebrate organisms
embedded in plastic resins and cut into
thin sections mounted on support grids
for examination. The objective is to
examine, at high resolution, the
ultrastructural organization of complex
biological structures to help elucidate
function. The instrument can be used
for 2D and 3D imaging of stained or
even unstained, low-contrast samples.
The instrument also allows for
observation and analyses of samples at
both room and liquid-nitrogen
temperature. Justification for Duty-Free
Entry: There are no domestic
manufacturers of this type of electron
microscope. Application accepted by
Commissioner of Customs: May 12,
2010.
Dated: May 24, 2010.
Christopher Cassel,
Director, IA Subsidies Enforcement Office.
[FR Doc. 2010–12962 Filed 5–27–10; 8:45 am]
BILLING CODE 3510–DS–P
DEPARTMENT OF COMMERCE
Foreign-Trade Zones Board
[Order No. 1679]
Expansion of Foreign-Trade Zone 272;
Lehigh Valley, Pennsylvania
Pursuant to its authority under the ForeignTrade Zones Act of June 18, 1934, as
amended (19 U.S.C. 81a–81u), the ForeignTrade Zones Board (the Board) adopts the
following Order:
Whereas, the Lehigh Valley Economic
Development Corporation, grantee of
Foreign-Trade Zone 272, submitted an
application to the Board for authority to
expand FTZ 272 to include a site in
Bethlehem, Pennsylvania, adjacent to
the Philadelphia Customs and Border
Protection port of entry (FTZ Docket 37–
2009, filed 9/9/2009);
Whereas, notice inviting public
comment has been given in the Federal
Register (74 FR 47920–47921,
September 18, 2009) and the application
E:\FR\FM\28MYN1.SGM
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]]>Agencies
[Federal Register Volume 75, Number 103 (Friday, May 28, 2010)]
[Notices]
[Pages 29974-29975]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: 2010-12962]
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DEPARTMENT OF COMMERCE
International Trade Administration
Application(s) for Duty-Free Entry of Scientific Instruments
Pursuant to Section 6(c) of the Educational, Scientific and
Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended
by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments
on the question of whether instruments of equivalent scientific value,
for the purposes for which the instruments shown below are intended to
be used, are being manufactured in the United States.
Comments must comply with 15 CFR 301.5(a)(3) and (4) of the
regulations and be postmarked on or before June 17, 2010. Address
written comments to Statutory Import Programs Staff, Room 3720, U.S.
Department of Commerce, Washington, DC 20230. Applications may be
examined between 8:30 a.m. and 5 p.m. at the U.S. Department of
Commerce in Room 3720.
Docket Number: 10-010. Applicant: University of Maine System, 16
Central St., Bangor, ME 04401. Instrument: Live Color
Cathodoluminescence detector accessory for Scanning Electron
Microscope. Manufacturer: Gatan, UK. Intended Use: The instrument will
be used to study the morphology and microstructure of primarily
geological but also some archaeological and biological materials.
Techniques include imaging using three components of light (red, green,
blue) split from a panchromatic signal induced in the sample by an
incident electron beam inside an SEM. This instrument offers live color
detectors, i.e., panchromatic cathodoluminescence detectors in which
the intensity of the light across the entire visible spectrum is
measured. Justification for Duty-Free Entry: There are no domestic
manufacturers of this instrument. Application accepted by Commissioner
of Customs: April 27, 2010.
Docket Number: 10-011. Applicant: Washington University in St.
Louis, Purchasing Dept., 1 Brookings Drive, Campus Box 1069, St. Louis,
MO 63130. Instrument: Electron Microscope. Manufacturer: Japanese
Electron-Optics, Limited (JEOL), Japan. Intended Use: This instrument
will be used to study a complete range of medically relevant cells,
tissues, and molecules and understand the molecular and cellular basis
of a wide range of human diseases. The instrument allows for techniques
including advanced forms of biological specimen preparation, as well as
more classical procedures for fixation,
[[Page 29975]]
dehydration, plastic embedding and thin-sectioning of biological
materials. Justification for Duty-Free Entry: No instruments of same
general category are manufactured in the United States. Application
accepted by Commissioner of Customs: April 30, 2010.
Docket Number: 10-012. Applicant: California Institute of
Technology, 1200 E. California Blvd., M/C 127-72, Pasadena, CA 91125.
Instrument: Electron Microscope. Manufacturer: FEI Company, Czech
Republic. Intended Use: The instrument will be used to improve
researchers' understanding of the structural dynamics of materials like
graphite, as well as ultrafast structural changes over time in
microscopy. Techniques used with the instrument include imaging, both
in real space and using diffraction. Imaging is done using light as
opposed to thermal heating or field ionization. Justification for Duty-
Free Entry: There are no domestic manufacturers of this type of
electron microscope. Application accepted by Commissioner of Customs:
May 5, 2010.
Docket Number: 10-013. Applicant: Howard Hughes Medical Institute,
4000 Jones Bridge Road, Chevy Chase, MD 20815. Instrument: Electron
Microscope. Manufacturer: FEI Company, Czech Republic. Intended Use:
The instrument will be used to examine portions of vertebrate and
invertebrate organisms embedded in plastic resins and cut into thin
sections mounted on support grids for examination. The objective is to
examine, at high resolution, the ultrastructural organization of
complex biological structures to help elucidate function. The
instrument can be used for 2D and 3D imaging of stained or even
unstained, low-contrast samples. The instrument also allows for
observation and analyses of samples at both room and liquid-nitrogen
temperature. Justification for Duty-Free Entry: There are no domestic
manufacturers of this type of electron microscope. Application accepted
by Commissioner of Customs: May 12, 2010.
Docket Number: 10-014. Applicant: Howard Hughes Medical Institute,
4000 Jones Bridge Road, Chevy Chase, MD 20815. Instrument: Electron
Microscope. Manufacturer: FEI Company, Czech Republic. Intended Use:
The instrument will be used to examine portions of vertebrate and
invertebrate organisms embedded in plastic resins and cut into thin
sections mounted on support grids for examination. The objective is to
examine, at high resolution, the ultrastructural organization of
complex biological structures to help elucidate function. The
instrument can be used for 2D and 3D imaging of stained or even
unstained, low-contrast samples. The instrument also allows for
observation and analyses of samples at both room and liquid-nitrogen
temperature. Justification for Duty-Free Entry: There are no domestic
manufacturers of this type of electron microscope. Application accepted
by Commissioner of Customs: May 14, 2010.
Docket Number: 10-016. Applicant: United States Geological Survey,
6th Ave. & Kipling St., P.O. Box 25046, MS973, Denver Federal Center,
Building 20, Denver, CO 80225. Instrument: Electron Microscope.
Manufacturer: FEI Company, Czech Republic. Intended Use: The instrument
will be used for the microanalysis of rocks, minerals and other
particulate matter. Analyses of the morphology, surface textures, grain
boundaries, and other properties of the materials investigated include
the use of chemical composition and crystallographic orientation and
strain. The low vacuum and low voltage features of the instrument
allows for the viewing of hydrated and un-coated samples with minimal
sample degradation or alteration. The advantage of this instrument is
that it can operate at high vacuum and high acceleration voltages as
well as atmospheric pressures and/or low accelerating voltages while
still maintaining high resolution and high beam currents. Justification
for Duty-Free Entry: There are no domestic manufacturers of this type
of electron microscope. Application accepted by Commissioner of
Customs: May 18, 2010.
Docket Number: 10-017. Applicant: University of Massachusetts
Medical School, Department of Cell Biology, Rm. S7-210, 55 Lake Avenue
North, Worcester, MA 01655. Instrument: Electron Microscope.
Manufacturer: FEI Company, Czech Republic. Intended Use: The instrument
will enable the study of tissue cell structures at high resolution, the
recording of images on the Eagle CCD camera, and the observation of
cryo-fixed specimens at low temperatures. Justification for Duty-Free
Entry: There are no domestic manufacturers of this type of electron
microscope. Application accepted by Commissioner of Customs: May 12,
2010.
Docket Number: 10-018. Applicant: Texas Tech University, Department
of Mechanical Engineering, 7th Street and Boston Ave., Lubbock, TX
79409-1021. Instrument: Electron Microscope. Manufacturer: Japanese
Electron-Optics, Limited (JEOL), Japan. Intended Use: The instrument
will be used to probe the crystalline structure of materials at a
magnification beyond that required to image dislocation behavior of
fully crystalline nanostructured metals. The instrument will provide
detailed surface structures and faceting information. Justification for
Duty-Free Entry: No instruments of same general category are
manufactured in the United States. Application accepted by Commissioner
of Customs: May 17, 2010.
Docket Number: 10-020. Applicant: Howard Hughes Medical Institute,
4000 Jones Bridge Road, Chevy Chase, MD 20815. Instrument: Electron
Microscope. Manufacturer: FEI Company, Czech Republic. Intended Use:
The instrument will be used to examine portions of vertebrate and
invertebrate organisms embedded in plastic resins and cut into thin
sections mounted on support grids for examination. The objective is to
examine, at high resolution, the ultrastructural organization of
complex biological structures to help elucidate function. The
instrument can be used for 2D and 3D imaging of stained or even
unstained, low-contrast samples. The instrument also allows for
observation and analyses of samples at both room and liquid-nitrogen
temperature. Justification for Duty-Free Entry: There are no domestic
manufacturers of this type of electron microscope. Application accepted
by Commissioner of Customs: May 12, 2010.
Dated: May 24, 2010.
Christopher Cassel,
Director, IA Subsidies Enforcement Office.
[FR Doc. 2010-12962 Filed 5-27-10; 8:45 am]
BILLING CODE 3510-DS-P
