West Virginia University, et al., Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscopes, 20982 [2010-9356]
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20982
Federal Register / Vol. 75, No. 77 / Thursday, April 22, 2010 / Notices
II. Method of Collection
DEPARTMENT OF COMMERCE
DEPARTMENT OF COMMERCE
Electronic applications and electronic
forms are required from participants,
and the primary methods of submittal
are email and Internet transmission of
electronic forms. Approximately 1% of
the application and reference forms may
be mailed.
International Trade Administration
International Trade Administration
West Virginia University, et al., Notice
of Consolidated Decision on
Applications for Duty–Free Entry of
Electron Microscopes
University of Michigan, et al., Notice of
Consolidated Decision on Applications
for Duty–Free Entry of Scientific
Instruments
This is a decision consolidated pursuant
to Section 6(c) of the Educational,
Scientific, and Cultural Materials
Importation Act of 1966 (Pub. L. 89–
651, as amended by Pub. L. 106–36; 80
Stat. 897; 15 CFR part 301). Related
records can be viewed between 8:30
A.M. and 5:00 P.M. in Room 3705, U.S.
Department of Commerce, 14th and
Constitution Avenue., NW, Washington,
D.C.
Docket Number: 09–067. Applicant:
West Virginia University, Morgantown,
WV 26506. Instrument: Electron
Microscope. Manufacturer: JEOL, Japan.
Intended Use: See notice at 75 FR
13486, March 22, 2010.
Docket Number: 10–001. Applicant:
United States Environmental Protection
Agency, Cincinnati, OH 45268.
Instrument: Electron Microscope.
Manufacturer: JEOL, Japan. Intended
Use: See notice at 75 FR 12175, March
15, 2010.
Docket Number: 10–003. Applicant: St.
Lawrence University, Canton, NY
13617. Instrument: Electron Microscope.
Manufacturer: FEI, Czech Republic.
Intended Use: See notice at 75 FR
13486, March 22, 2010.
Comments: None received. Decision:
Approved. No instrument of equivalent
scientific value to the foreign
instrument, for such purposes as these
instruments are intended to be used,
was being manufactured in the United
States at the time the instruments were
ordered. Reasons: Each foreign
instrument is an electron microscope
and is intended for research or scientific
educational uses requiring an electron
microscope. We know of no electron
microscope, or any other instrument
suited to these purposes, which was
being manufactured in the United States
at the time of order of each instrument.
This is a decision pursuant to Section
6(c) of the Educational, Scientific, and
Cultural Materials Importation Act of
1966 (Pub. L. 89–651, as amended by
Pub. L.106–36; 80 Stat. 897; 15 CFR part
301). Related records can be viewed
between 8:30 A.M. and 5:00 P.M. in
Room 3705, U.S. Department of
Commerce, 14th and Constitution Ave,
NW, Washington, D.C.
Comments: None received. Decision:
Approved. We know of no instruments
of equivalent scientific value to the
foreign instruments described below, for
such purposes as this is intended to be
used, that was being manufactured in
the United States at the time of its order.
Docket Number: 10–002. Applicant:
University of Michigan, Ann Arbor, MI
49109–2122. Instrument: Tester for TFT
Imager. Manufacturer: Siemens AG,
Corporate Technology, Germany.
Intended Use: See notice at 75 FR
12175, March 15, 2010. Reasons: This
instrument must be capable of
measuring dynamic rate, linearity and
noise. It must also support voltages in
the rate of -10 V to 20 V and support
maximum 60 Hz scanning speed.
Another pertinent specification for this
instrument is that it must be capable of
working with an imager, having 128
rows and 128 columns. We know of no
instrument suited to these purposes,
which was being manufactured in the
United States at the time of order of this
instrument.
Docket Number: 10–004. Applicant:
State University of New York College at
Geneseo, Geneseo, NY 14454.
Instrument: MultiView 2000TS
Microscope System. Manufacturer:
Nanonics Imaging Ltd., Israel. Intended
Use: See notice at 75 FR 13486, March
22, 2010. Reasons: A pertinent feature of
this instrument is the ability to switch
between scanning the tip and the
sample stage. Other unique features
include the ability to use conventional
AFM type silicon cantilevers as well as
cantilevered optical fiber probes with
exposed probed geometry, providing
normal force sensing; the capability to
image side walls with an exposed tip
glass AFM probe and the ability to
image in both NSOM and AFM with AC
operating modes. We know of no
instrument suited to these purposes,
which was being manufactured in the
III. Data
OMB Control Number: 0648–0568.
Form Number: None.
Type of Review: Regular submission.
Affected Public: Individuals or
households; business or other for-profit
organizations; not-for-profit institutions;
State, Local or Tribal Government.
Estimated Number of Respondents:
3,496.
Estimated Time Per Response:
Student tracker database form, 16 hours;
graduate application form, 8 hours;
undergraduate application form, 8
hours; reference forms, 1 hour;
voluntary alumni update form, 1 hour.
Estimated Total Annual Burden
Hours: 11,316.
Estimated Total Annual Cost to
Public: $300.
IV. Request for Comments
srobinson on DSKHWCL6B1PROD with NOTICES
Comments are invited on: (a) Whether
the proposed collection of information
is necessary for the proper performance
of the functions of the agency, including
whether the information shall have
practical utility; (b) the accuracy of the
agency’s estimate of the burden
(including hours and cost) of the
proposed collection of information; (c)
ways to enhance the quality, utility, and
clarity of the information to be
collected; and (d) ways to minimize the
burden of the collection of information
on respondents, including through the
use of automated collection techniques
or other forms of information
technology.
Comments submitted in response to
this notice will be summarized and/or
included in the request for OMB
approval of this information collection;
they also will become a matter of public
record.
Dated: April 19, 2010.
Gwellnar Banks,
Management Analyst, Office of the Chief
Information Officer.
Christopher Cassel,
Director, Subsidies Enforcement Office,
Import Administration.
[FR Doc. 2010–9356 Filed 4–21–10; 8:45 am]
BILLING CODE 3510–DS–S
[FR Doc. 2010–9316 Filed 4–21–10; 8:45 am]
BILLING CODE 3510–12–P
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[Federal Register Volume 75, Number 77 (Thursday, April 22, 2010)]
[Notices]
[Page 20982]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: 2010-9356]
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DEPARTMENT OF COMMERCE
International Trade Administration
West Virginia University, et al., Notice of Consolidated Decision
on Applications for Duty-Free Entry of Electron Microscopes
This is a decision consolidated pursuant to Section 6(c) of the
Educational, Scientific, and Cultural Materials Importation Act of 1966
(Pub. L. 89-651, as amended by Pub. L. 106-36; 80 Stat. 897; 15 CFR
part 301). Related records can be viewed between 8:30 A.M. and 5:00
P.M. in Room 3705, U.S. Department of Commerce, 14th and Constitution
Avenue., NW, Washington, D.C.
Docket Number: 09-067. Applicant: West Virginia University, Morgantown,
WV 26506. Instrument: Electron Microscope. Manufacturer: JEOL, Japan.
Intended Use: See notice at 75 FR 13486, March 22, 2010.
Docket Number: 10-001. Applicant: United States Environmental
Protection Agency, Cincinnati, OH 45268. Instrument: Electron
Microscope. Manufacturer: JEOL, Japan. Intended Use: See notice at 75
FR 12175, March 15, 2010.
Docket Number: 10-003. Applicant: St. Lawrence University, Canton, NY
13617. Instrument: Electron Microscope. Manufacturer: FEI, Czech
Republic. Intended Use: See notice at 75 FR 13486, March 22, 2010.
Comments: None received. Decision: Approved. No instrument of
equivalent scientific value to the foreign instrument, for such
purposes as these instruments are intended to be used, was being
manufactured in the United States at the time the instruments were
ordered. Reasons: Each foreign instrument is an electron microscope and
is intended for research or scientific educational uses requiring an
electron microscope. We know of no electron microscope, or any other
instrument suited to these purposes, which was being manufactured in
the United States at the time of order of each instrument.
Christopher Cassel,
Director, Subsidies Enforcement Office, Import Administration.
[FR Doc. 2010-9356 Filed 4-21-10; 8:45 am]
BILLING CODE 3510-DS-S
