Application(s) for Duty-Free Entry of Scientific Instruments, 13486 [2010-6259]

Download as PDF 13486 Federal Register / Vol. 75, No. 54 / Monday, March 22, 2010 / Notices operations, 2 hours; members of private households participating in recreational activities, 30 minutes; and dive charter/ guide operations, 2 hours. Estimated Total Annual Burden Hours: 195. Estimated Total Annual Cost to Public: $0. IV. Request for Comments Comments are invited on: (a) Whether the proposed collection of information is necessary for the proper performance of the functions of the agency, including whether the information shall have practical utility; (b) the accuracy of the agency’s estimate of the burden (including hours and cost) of the proposed collection of information; (c) ways to enhance the quality, utility, and clarity of the information to be collected; and (d) ways to minimize the burden of the collection of information on respondents, including through the use of automated collection techniques or other forms of information technology. Comments submitted in response to this notice will be summarized and/or included in the request for OMB approval of this information collection; they also will become a matter of public record. Dated: March 16, 2010. Gwellnar Banks, Management Analyst, Office of the Chief Information Officer. Docket Number: 10–004. Applicant: State University of New York College at Geneseo, Erwin Hall 218, 1 College Circle, Geneseo, NY 14454. Instrument: MultiView 2000TS Microscope System. Manufacturer: Nanonics Imaging Ltd., Israel. Intended Use: This instrument will be used, among other things, to study the folding structure of A–beta proteins around nanostructures. This instrument combines an optical microscope with a scanning probe imaging system. Specifically, this instrument can perform near–field scanning optical microscopy. A pertinent feature of this instrument is the ability to switch between scanning the tip and the sample stage. It is also well suited for soft materials than other instruments, as it detects the probe coming close to the sample surface by monitoring a frequency shift in a nano– tuning fork. Other unique features include the ability to use conventional AFM type silicon cantilevers as well as cantilevered optical fiber probes with exposed probe geometry, providing normal force sensing; the capability to image side walls with an exposed tip glass AFM probe and the ability to image in both NSOM and AFM with AC operating modes. Justification for Duty– Free Entry: No instruments of same general category are believed to be manufactured in the United States. Application accepted by Commissioner of Customs: March 10, 2010. Dated: March 16, 2010. Christopher Cassel, Director, IA Subsidies Enforcement Office. [FR Doc. 2010–6070 Filed 3–19–10; 8:45 am] BILLING CODE 3510–NK–P [FR Doc. 2010–6255 Filed 3–19–10; 8:45 am] DEPARTMENT OF COMMERCE BILLING CODE 3510–DS–S International Trade Administration DEPARTMENT OF COMMERCE pwalker on DSK8KYBLC1PROD with NOTICES Application(s) for Duty–Free Entry of Scientific Instruments International Trade Administration Pursuant to Section 6(c) of the Educational, Scientific and Cultural Materials Importation Act of 1966 (Pub. L. 89–651, as amended by Pub. L. 106– 36; 80 Stat. 897; 15 CFR part 301), we invite comments on the question of whether instruments of equivalent scientific value, for the purposes for which the instruments shown below are intended to be used, are being manufactured in the United States. Comments must comply with 15 CFR 301.5(a)(3) and (4) of the regulations and be postmarked on or before April 12, 2010. Address written comments to Statutory Import Programs Staff, Room 3720, U.S. Department of Commerce, Washington, D.C. 20230. Applications may be examined between 8:30 A.M. and 5:00 P.M. at the U.S. Department of Commerce in Room 3720. VerDate Nov<24>2008 16:41 Mar 19, 2010 Jkt 220001 Application(s) for Duty–Free Entry of Scientific Instruments Pursuant to Section 6(c) of the Educational, Scientific and Cultural Materials Importation Act of 1966 (Pub. L. 89–651, as amended by Pub. L. 106– 36; 80 Stat. 897; 15 CFR part 301), we invite comments on the question of whether instruments of equivalent scientific value, for the purposes for which the instruments shown below are intended to be used, are being manufactured in the United States. Comments must comply with 15 CFR 301.5(a)(3) and (4) of the regulations and be postmarked on or before April 12, 2010. Address written comments to Statutory Import Programs Staff, Room 3720, U.S. Department of Commerce, Washington, D.C. 20230. Applications PO 00000 Frm 00004 Fmt 4703 Sfmt 4703 may be examined between 8:30 A.M. and 5:00 P.M. at the U.S. Department of Commerce in Room 3720. Docket Number: 09–067. Applicant: West Virginia University, One Waterfront Place, PO Box 6024, Morgantown, WV 26506. Instrument: Electron Microscope. Manufacturer: JEOL, Japan. Intended Use: The instrument will be used to study the microstructure and chemistry of a variety of metallic, ceramic and semiconductor materials. This instrument is capable of imaging crystal structure and defects from the micron to atomic scale using TEM and HREM. A unique feature of this instrument is an analytical pole piece for high resolution work while maintaining high tilting capability. Justification for Duty–Free Entry: There are no domestic manufacturers of this type of electron microscope. Application accepted by Commissioner of Customs: December 17, 2009. Docket Number: 10–003. Applicant: St. Lawrence University, 23 Romoda Drive, Canton, NY 13617. Instrument: Electron Microscope. Manufacturer: FEI, Czech Republic. Intended Use: This instrument will be used in the advanced study of diverse fields such as geochemistry, sedimentology and neurophysiology. This instrument has several SE detectors that are optimized for use in high–vacuum, low–vacuum and ultra–low vacuum environments and can be freely switched between these three modes. This allows for the investigation of conductive, non– conductive and high vacuum incompatible specimens. Justification for Duty–Free Entry: No instruments of same general category are manufactured in the United States. Application accepted by Commissioner of Customs: March 3, 2010. Dated: March 16, 2010. Christopher Cassel, Director, IA Subsidies Enforcement Office. [FR Doc. 2010–6259 Filed 3–19–10; 8:45 am] BILLING CODE 3510–DS–S DEPARTMENT OF COMMERCE National Oceanic and Atmospheric Administration [Docket No. 0907081109–010–05] RIN 0648–ZC10 Availability of Grant Funds for Fiscal Year 2010; Amendment AGENCY: National Oceanic and Atmospheric Administration (NOAA), Department of Commerce (DOC). E:\FR\FM\22MRN1.SGM 22MRN1

Agencies

[Federal Register Volume 75, Number 54 (Monday, March 22, 2010)]
[Notices]
[Page 13486]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: 2010-6259]


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DEPARTMENT OF COMMERCE

International Trade Administration


Application(s) for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended 
by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments 
on the question of whether instruments of equivalent scientific value, 
for the purposes for which the instruments shown below are intended to 
be used, are being manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be postmarked on or before April 12, 2010. Address 
written comments to Statutory Import Programs Staff, Room 3720, U.S. 
Department of Commerce, Washington, D.C. 20230. Applications may be 
examined between 8:30 A.M. and 5:00 P.M. at the U.S. Department of 
Commerce in Room 3720.
    Docket Number: 09-067. Applicant: West Virginia University, One 
Waterfront Place, PO Box 6024, Morgantown, WV 26506. Instrument: 
Electron Microscope. Manufacturer: JEOL, Japan. Intended Use: The 
instrument will be used to study the microstructure and chemistry of a 
variety of metallic, ceramic and semiconductor materials. This 
instrument is capable of imaging crystal structure and defects from the 
micron to atomic scale using TEM and HREM. A unique feature of this 
instrument is an analytical pole piece for high resolution work while 
maintaining high tilting capability. Justification for Duty-Free Entry: 
There are no domestic manufacturers of this type of electron 
microscope. Application accepted by Commissioner of Customs: December 
17, 2009.
    Docket Number: 10-003. Applicant: St. Lawrence University, 23 
Romoda Drive, Canton, NY 13617. Instrument: Electron Microscope. 
Manufacturer: FEI, Czech Republic. Intended Use: This instrument will 
be used in the advanced study of diverse fields such as geochemistry, 
sedimentology and neurophysiology. This instrument has several SE 
detectors that are optimized for use in high-vacuum, low-vacuum and 
ultra-low vacuum environments and can be freely switched between these 
three modes. This allows for the investigation of conductive, non-
conductive and high vacuum incompatible specimens. Justification for 
Duty-Free Entry: No instruments of same general category are 
manufactured in the United States. Application accepted by Commissioner 
of Customs: March 3, 2010.

    Dated: March 16, 2010.
Christopher Cassel,
Director, IA Subsidies Enforcement Office.
[FR Doc. 2010-6259 Filed 3-19-10; 8:45 am]
BILLING CODE 3510-DS-S