Application(s) for Duty-Free Entry of Scientific Instruments, 67851 [E9-30322]

Download as PDF Federal Register / Vol. 74, No. 243 / Monday, December 21, 2009 / Notices DEPARTMENT OF COMMERCE International Trade Administration erowe on DSK5CLS3C1PROD with NOTICES Application(s) for Duty-Free Entry of Scientific Instruments Pursuant to Section 6(c) of the Educational, Scientific and Cultural Materials Importation Act of 1966 (Pub. L. 89–651, as amended by Pub. L. 106– 36; 80 Stat. 897; 15 CFR part 301), we invite comments on the question of whether instruments of equivalent scientific value, for the purposes for which the instruments shown below are intended to be used, are being manufactured in the United States. Comments must comply with 15 CFR 301.5(a)(3) and (4) of the regulations and be postmarked on or before January 11, 2010. Address written comments to Statutory Import Programs Staff, Room 3720, U.S. Department of Commerce, Washington, DC 20230. Applications may be examined between 8:30 a.m. and 5 p.m. at the U.S. Department of Commerce in Room 3720. Docket Number: 09–064. Applicant: Yale University, 15 Prospect St., P.O. Box 208284, New Haven, CT 06520– 8284. Instrument: Electron Microscope, Quanta 3D Dual-Beam Focused IonBeam Tool. Manufacturer: FEI Company, Czech Republic. Intended Use: The instrument will be used to study the physics and engineering of small structures, including the crystal structure of alumina. The instrument will be used for cutting precise crosssections of materials and devices using a focused beam of gallium ions. The instrument is also equipped with a scanning electron microscope for the non-destructive viewing of samples. Justification for Duty-Free Entry: No instruments of same general category are manufactured in the United States. Application accepted by Commissioner of Customs: November 6, 2009. Docket Number: 09–065. Applicant: U.S. Department of Homeland Security, Science and Technology Directorate, Office of National Labs, National Biodefense Analysis and Countermeasures Center, 8300 Research Plaza, Ft. Detrick, Frederick, MD 21702. Instrument: Scanning Electron Microscope, Quanta 200 FEG. Manufacturer: FEI Company, Czech Republic. Intended Use: The instrument will be used to study biological agents and specimens at the cellular and genomic levels. The instrument is an environmental/field emission system that allows specimens to be viewed without dehydration, a feature that can save time and allow greater flexibility in experimentation. This instrument VerDate Nov<24>2008 14:14 Dec 18, 2009 Jkt 220001 provides the most automated functions (alignment, stigmation, focus) that significantly improve the quality and volume of observations. Justification for Duty-Free Entry: No instruments of same general category are manufactured in the United States. Application accepted by Commissioner of Customs: November 13, 2009. Dated: December 14, 2009. Christopher Cassel, Director, IA Subsidies Enforcement Office. [FR Doc. E9–30322 Filed 12–18–09; 8:45 am] BILLING CODE 3510–DS–P DEPARTMENT OF COMMERCE National Oceanic and Atmospheric Administration [Docket No. 071213835–91361–02] RIN 0648–ZB84 Guidelines for the Marine Debris Program Grant Program AGENCY: National Ocean Service (NOS), National Oceanic and Atmospheric Administration (NOAA), Department of Commerce. ACTION: Notice of final guidelines for NOAA’s Marine Debris Program Grant Program. SUMMARY: The NOAA Marine Debris Division, Office of Response and Restoration, National Ocean Service, is issuing guidelines to implement the Marine Debris Program (MDP) grant program. The MDP was created by the Marine Debris Research, Prevention, and Reduction Act (33 U.S.C. 1951 et seq.) to coordinate, strengthen, and enhance the awareness of marine debris efforts within the agency, and to work with external partners to support research, prevention, and reduction activities related to the issue of marine debris. The NOAA MDP mission is to investigate and solve the problems that stem from marine debris through research, prevention, and reduction activities, in order to protect and conserve our nation’s living marine resources and ensure navigation safety. Within the Act, the MDP is directed to develop formal guidelines for the implementation of a grant program. This notice identifies those guidelines. ADDRESSES: Comments received may be viewed by contacting Sarah E. Morison, NOAA Marine Debris Program Coordinator, Office of Response and Restoration, N/ORR, 1305 East-West Highway, Silver Spring, MD 20910. FOR FURTHER INFORMATION CONTACT: Sarah E. Morison, Tel: 301–713–2989 PO 00000 Frm 00002 Fmt 4703 Sfmt 4703 67851 x120 or by e-mail at Sarah.Morison@NOAA.gov. NOAA’s Marine Debris Program (MDP) serves as a centralized marine debris capability within NOAA in order to coordinate, strengthen, and increase the visibility of marine debris issues and efforts within the agency, its partners, and the public. The mission of the NOAA Marine Debris Program is to investigate and solve the problems that stem from marine debris through research, prevention, and reduction activities, in order to protect and conserve our nation’s living marine resources and ensure navigation safety. Additionally, the MDP supports and works closely with various partners across the U.S. to fulfill the Program’s mission. The guidelines implementing the MDP’s grant program are set forth below. SUPPLEMENTARY INFORMATION: Electronic Access Information on the MDP can be found on the World Wide Web at: http:// marinedebris.noaa.gov. Discussion of Comments: Only one comment was received in response to the solicitation for comment on the NOAA Marine Debris Program Grant Program Guidelines published in the Federal Register on March 20, 2008. This comment referenced a 1951 Act and outlined enforcement actions that should be taken to address pollution from commercial shipping. The comment was not applicable to the Guidelines and therefore NOAA is not providing a response to the comment. The guidelines implementing the MDP grant program are set forth below. NOAA Marine Debris Program Grant Program Guidelines Section 1. Goals and Objectives The Marine Debris Research, Prevention, and Reduction Act (the Act) (33 U.S.C. 1951 et seq.) establishes a marine debris program within the National Oceanic and Atmospheric Administration (NOAA) to reduce and prevent the occurrence and adverse impacts of marine debris on the marine environment, and navigation safety through activities such as: • Mapping, identification, impact assessment, removal, and prevention; • Reducing and preventing loss of fishing gear; and • Outreach. The Act also directs the Administrator to provide financial assistance in the form of grants to accomplish the Act’s purpose of identifying, determining sources of, assessing, reducing, and preventing marine debris and its E:\FR\FM\21DEN1.SGM 21DEN1

Agencies

[Federal Register Volume 74, Number 243 (Monday, December 21, 2009)]
[Notices]
[Page 67851]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: E9-30322]



[[Page 67851]]

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DEPARTMENT OF COMMERCE

International Trade Administration


Application(s) for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended 
by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments 
on the question of whether instruments of equivalent scientific value, 
for the purposes for which the instruments shown below are intended to 
be used, are being manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be postmarked on or before January 11, 2010. Address 
written comments to Statutory Import Programs Staff, Room 3720, U.S. 
Department of Commerce, Washington, DC 20230. Applications may be 
examined between 8:30 a.m. and 5 p.m. at the U.S. Department of 
Commerce in Room 3720.
    Docket Number: 09-064. Applicant: Yale University, 15 Prospect St., 
P.O. Box 208284, New Haven, CT 06520-8284. Instrument: Electron 
Microscope, Quanta 3D Dual-Beam Focused Ion-Beam Tool. Manufacturer: 
FEI Company, Czech Republic. Intended Use: The instrument will be used 
to study the physics and engineering of small structures, including the 
crystal structure of alumina. The instrument will be used for cutting 
precise cross-sections of materials and devices using a focused beam of 
gallium ions. The instrument is also equipped with a scanning electron 
microscope for the non-destructive viewing of samples. Justification 
for Duty-Free Entry: No instruments of same general category are 
manufactured in the United States. Application accepted by Commissioner 
of Customs: November 6, 2009.
    Docket Number: 09-065. Applicant: U.S. Department of Homeland 
Security, Science and Technology Directorate, Office of National Labs, 
National Biodefense Analysis and Countermeasures Center, 8300 Research 
Plaza, Ft. Detrick, Frederick, MD 21702. Instrument: Scanning Electron 
Microscope, Quanta 200 FEG. Manufacturer: FEI Company, Czech Republic. 
Intended Use: The instrument will be used to study biological agents 
and specimens at the cellular and genomic levels. The instrument is an 
environmental/field emission system that allows specimens to be viewed 
without dehydration, a feature that can save time and allow greater 
flexibility in experimentation. This instrument provides the most 
automated functions (alignment, stigmation, focus) that significantly 
improve the quality and volume of observations. Justification for Duty-
Free Entry: No instruments of same general category are manufactured in 
the United States. Application accepted by Commissioner of Customs: 
November 13, 2009.

    Dated: December 14, 2009.
Christopher Cassel,
Director, IA Subsidies Enforcement Office.
[FR Doc. E9-30322 Filed 12-18-09; 8:45 am]
BILLING CODE 3510-DS-P