Hunter College/CUNY et al.; Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscopes, 63386 [E9-28880]

Download as PDF 63386 Federal Register / Vol. 74, No. 231 / Thursday, December 3, 2009 / Notices 2009). On August 12, 2009, NTIA issued a clarification of the information collection requirements in the NOFA (See 74 FR 40569, Aug. 12, 2009). On September 10, 2009, NTIA issued an additional clarification announcing that NTIA will initially fund mapping and data collection efforts for two years to enable the agency to assess lessons learned, determine best practices, and investigate opportunities for improved data collection prior to obligating funding for subsequent years (See 74 FR 46573, Sept. 10, 2009). Applications for the grant program were received until August 14, 2009 and NTIA received applications representing all 50 States, 5 territories, and the District of Columbia. Each applicant for program funding submitted an application, on standard OMB-approved forms, proposing data collection through five years and providing five-year budgets. Applicants provided comprehensive descriptions of their plans to obtain and verify required data from all commercial or public providers in their respective states. Data collection and verification methods may vary between applicants and may include online and on-the-ground surveys of providers and the public, Web-enabled data searches, statistical modeling, drive testing of spectrum use and crowd-sourced data reporting. Data must be collected at least semiannually and initial data collection is due on February 1, 2010. On October 5, 2009, NTIA announced that it awarded the first four grants under the SBDD program to fund data collection in California, Indiana, North Carolina, and Vermont. jlentini on DSKJ8SOYB1PROD with NOTICES II. Method of Collection All reports from awardees will be submitted via the Internet (to allow for efficient posting on the NTIA Web site and public accessibility). III. Data OMB Control Number: 0660–0032. Form Number: None. Type of Review: Regular submission. Affected Public: Respondents include state, territory and the District of Columbia or their designees. Subrespondents include facilities-based providers of broadband connections, incumbent and competitive local exchange carriers (LECs), facilitiesbased mobile telephony service providers, and wireless Internet service providers (WISPs). Estimated Number of Total Respondents: 56 respondents and 2,000 subrespondents. Estimated Time Per Response: 3,120 hours for respondents and 50 hours for subrespondents. VerDate Nov<24>2008 16:16 Dec 02, 2009 Jkt 220001 Estimated Total Annual Burden Hours: 549,440. Estimated Total Annual Cost to the Public: $0. IV. Request for Comments Comments are invited on: (a) Whether the proposed collection of information is necessary for the proper performance of the functions of the agency, including whether the information will have practical utility; (b) the accuracy of the agency’s estimate of the burden (including hours and cost) of the proposed collection of information; (c) ways to enhance the quality, utility, and clarity of the information to be collected; and (d) ways to minimize the burden of the collection of information on respondents, e.g., the use of automated collection techniques or other forms of information technology. Comments submitted in response to this notice will be summarized and/or included in the request for OMB approval of the information collection. Comments will also become a matter of public record. Docket Number: 09–057. Applicant: Northwestern University, Evanston, IL 60208. Instrument: Electron Microscope. Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 74 FR 54959, October 26, 2009. Comments: None received. Decision: Approved. No instrument of equivalent scientific value to the foreign instrument, for such purposes as these instruments are intended to be used, was being manufactured in the United States at the time the instruments were ordered. Reasons: Each foreign instrument is an electron microscope and is intended for research or scientific educational uses requiring an electron microscope. We know of no electron microscope, or any other instrument suited to these purposes, which was being manufactured in the United States at the time of order of each instrument. Dated: November 25, 2009. Christopher Cassel, Director, Subsidies Enforcement Office, Import Administration. [FR Doc. E9–28880 Filed 12–2–09; 8:45 am] Dated: November 30, 2009. Gwellnar Banks, Management Analyst, Office of the Chief Information Officer. [FR Doc. E9–28886 Filed 12–2–09; 8:45 am] BILLING CODE 3510–DS–P BILLING CODE 3510–06–P [A–475–818] DEPARTMENT OF COMMERCE International Trade Administration Hunter College/CUNY et al.; Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscopes This is a decision consolidated pursuant to Section 6(c) of the Educational, Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89–651, as amended by Pub. L. 106– 36; 80 Stat. 897; 15 CFR part 301). Related records can be viewed between 8:30 a.m. and 5 p.m. in Room 3705, U.S. Department of Commerce, 14th and Constitution Avenue., NW., Washington, DC. Docket Number: 09–055. Applicant: Hunter College/CUNY, New York, NY 10065. Instrument: Electron Microscope. Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 74 FR 54959, October 26, 2009. Docket Number: 09–056. Applicant: University of California at Davis, Davis, CA 95616. Instrument: Electron Microscope. Manufacturer: FEI Company, Czech Republic. Intended Use: See notice at 74 FR 54959, October 26, 2009. PO 00000 Frm 00002 Fmt 4703 Sfmt 4703 DEPARTMENT OF COMMERCE International Trade Administration Pasta From Italy: Extension of Time Limits for the Final Results of Antidumping Duty Administrative Review AGENCY: Import Administration, International Trade Administration, Department of Commerce. FOR FURTHER INFORMATION CONTACT: Victoria Cho at (202) 482–5075, AD/ CVD Operations, Office 3, Import Administration, International Trade Administration, U.S. Department of Commerce, 14th Street and Constitution Ave, NW., Washington, DC 20230. Background On August 26, 2008, the U.S. Department of Commerce (Department) published a notice of initiation of the administrative review of the antidumping duty order on certain pasta from Italy, covering the period July 1, 2007, to June 30, 2008. See Initiation of Antidumping and Countervailing Duty Administrative Reviews, 73 FR 50308 (August 26, 2008). On August 6, 2009, the Department published the preliminary results of this review. See Certain Pasta from Italy: Notice of Preliminary Results of Twelfth Antidumping Duty Administrative Review, 74 FR 39285 (August 6, 2009). E:\FR\FM\03DEN1.SGM 03DEN1

Agencies

[Federal Register Volume 74, Number 231 (Thursday, December 3, 2009)]
[Notices]
[Page 63386]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: E9-28880]


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DEPARTMENT OF COMMERCE

International Trade Administration


Hunter College/CUNY et al.; Notice of Consolidated Decision on 
Applications for Duty-Free Entry of Electron Microscopes

    This is a decision consolidated pursuant to Section 6(c) of the 
Educational, Scientific, and Cultural Materials Importation Act of 1966 
(Pub. L. 89-651, as amended by Pub. L. 106-36; 80 Stat. 897; 15 CFR 
part 301). Related records can be viewed between 8:30 a.m. and 5 p.m. 
in Room 3705, U.S. Department of Commerce, 14th and Constitution 
Avenue., NW., Washington, DC.
    Docket Number: 09-055. Applicant: Hunter College/CUNY, New York, NY 
10065. Instrument: Electron Microscope. Manufacturer: JEOL Ltd., Japan. 
Intended Use: See notice at 74 FR 54959, October 26, 2009.
    Docket Number: 09-056. Applicant: University of California at 
Davis, Davis, CA 95616. Instrument: Electron Microscope. Manufacturer: 
FEI Company, Czech Republic. Intended Use: See notice at 74 FR 54959, 
October 26, 2009.
    Docket Number: 09-057. Applicant: Northwestern University, 
Evanston, IL 60208. Instrument: Electron Microscope. Manufacturer: JEOL 
Ltd., Japan. Intended Use: See notice at 74 FR 54959, October 26, 2009.
    Comments: None received. Decision: Approved. No instrument of 
equivalent scientific value to the foreign instrument, for such 
purposes as these instruments are intended to be used, was being 
manufactured in the United States at the time the instruments were 
ordered. Reasons: Each foreign instrument is an electron microscope and 
is intended for research or scientific educational uses requiring an 
electron microscope. We know of no electron microscope, or any other 
instrument suited to these purposes, which was being manufactured in 
the United States at the time of order of each instrument.

    Dated: November 25, 2009.
Christopher Cassel,
Director, Subsidies Enforcement Office, Import Administration.
[FR Doc. E9-28880 Filed 12-2-09; 8:45 am]
BILLING CODE 3510-DS-P

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