Application(s) for Duty-Free Entry of Scientific Instruments, 58002 [E9-27067]
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58002
Federal Register / Vol. 74, No. 216 / Tuesday, November 10, 2009 / Notices
Instrument: Electron Microscope.
Manufacturer: JEOL Ltd., Japan.
Intended Use: This instrument will be
used for the study of nanoscale
magnetic and ferroelectric materials.
Specifically, it will be used to study the
magnetic domain or ferroelectric
domain behavior of the such materials.
The resolution of the instrument is such
that it can correlate domain behavior
directly with microstructure.
Justification for Duty-Free Entry: No
instruments of same general category are
manufactured in the United States.
Application accepted by Commissioner
of Customs: October 19, 2009.
Docket Number: 09–062. Applicant:
Department of Homeland Security,
Science & Technology Directorate,
Office of National Labs, National Biodefense analysis and Countermeasures
Center, 8300 Research Plaza, Fort
Detrick, Frederick, MD 21702.
Instrument: Electron Microscope.
Manufacturer: FEI Company, Czech
Republic. Intended Use: The instrument
will be used to study biological agents
and specimens at the cellular and
genomic level. Justification for DutyFree Entry: No instruments of same
general category are manufactured in
the United States. Application accepted
by Commissioner of Customs: October
21, 2009.
Dated: November 3, 2009.
Christopher Cassel,
Director, IA Subsidies Enforcement Office.
[FR Doc. E9–27070 Filed 11–9–09; 8:45 am]
BILLING CODE 3510–DS–P
DEPARTMENT OF COMMERCE
International Trade Administration
srobinson on DSKHWCL6B1PROD with NOTICES
Application(s) for Duty-Free Entry of
Scientific Instruments
Pursuant to Section 6(c) of the
Educational, Scientific and Cultural
Materials Importation Act of 1966 (Pub.
L. 89–651, as amended by Pub. L. 106–
36; 80 Stat. 897; 15 CFR part 301), we
invite comments on the question of
whether instruments of equivalent
scientific value, for the purposes for
which the instruments shown below are
intended to be used, are being
manufactured in the United States.
Comments must comply with 15 CFR
301.5(a)(3) and (4) of the regulations and
be postmarked on or before November
30, 2009. Address written comments to
Statutory Import Programs Staff, Room
3720, U.S. Department of Commerce,
Washington, DC 20230. Applications
may be examined between 8:30 a.m. and
5 p.m. at the U.S. Department of
Commerce in Room 3720.
VerDate Nov<24>2008
16:45 Nov 09, 2009
Jkt 220001
Docket Number: 09–059. Applicant:
Fermi Research Alliance LLC–Fermi
National Accelerator Laboratory, Kirk
Road & Wilson Street, P.O. Box 500,
Batavia, IL 60510. Instrument:
Wavelength Shifting Fiber.
Manufacturer: Kuraray Co., Ltd.; Japan.
Intended Use: This instrument will be
used to observe the transmutation of
muon neutrinos to electron neutrinos as
they travel from their production point
through the earth to a 20 kiloton
detector. The instrument allows the
light generated by neutrino interactions
in the experiment’s 18 kilotons of liquid
scintillator to be captured, wavelength
shifted and transmitted to photodetectors. The fibers must be .7mm in
diameter and 32 meters in length.
Further, the light generated in the fiber
must not suffer unacceptable
attenuation in traveling down 16–20 m
of the WLS fiber. As such, a pertinent
characteristic of this instrument is that
it have an attenuation length of >20m.
Justification for Duty-Free Entry: There
are instruments of the same general
category being manufactured within the
United States, but they could not be
utilized for the purposes described
above. Application accepted by
Commissioner of Customs: October 9,
2009.
Docket Number: 09–063. Applicant:
Argonne National Laboratory, 9700 S.
Cass Ave., Lemont, IL 60439.
Instrument: CEOS Spherical Aberration
Corrector. Manufacturer: CEOS
Corrected Electron Optical Systems,
GmbH; Germany. Intended Use: This
instrument will be installed on a
transmission electron microscope and
used for the study of nanoscale
magnetic and ferroelectric materials.
The aberration corrector greatly
enhances the spatial resolution with
which the experiments described above
can be carried out. All experiments will
be carried out in Lorentz mode, and will
include imaging and electron diffraction
combined with certain in-situ
techniques. A pertinent characteristic of
this instrument is that it must be
capable of compensating completing the
spherical aberration of the low field
objective lens on the 2100F TEM to
which it will be attached. The spherical
aberration coefficient of this lens is 200
mm. In addition the CEOS aberration
corrector can compensate this value of
spherical aberration while only
increasing the chromatic aberration by
approximately 20%. Justification for
Duty-Free Entry: There are no
instruments of the same general
category being manufactured within the
United States. Application accepted by
PO 00000
Frm 00014
Fmt 4703
Sfmt 4703
Commissioner of Customs: October 21,
2009.
Dated: November 3, 2009.
Christopher Cassel,
Acting Director, IA Subsidies Enforcement
Office.
[FR Doc. E9–27067 Filed 11–9–09; 8:45 am]
BILLING CODE 3510–DS–P
DEPARTMENT OF COMMERCE
Foreign-Trade Zones Board
[Docket 47–2009]
Foreign-Trade Zone 121—Albany, NY;
Application for Expansion and
Reorganization Under Alternative Site
Framework
An application has been submitted to
the Foreign-Trade Zones (FTZ) Board
(the Board) by the Capital District
Regional Planning Commission, grantee
of FTZ 121, requesting authority to
expand the zone and reorganize under
the alternative site framework (ASF)
adopted by the Board (74 FR 1170, 01/
12/09; correction 74 FR 3987, 01/22/09).
The ASF is an option for grantees for the
establishment or reorganization of
general-purpose zones and can permit
significantly greater flexibility in the
designation of new ‘‘usage-driven’’ FTZ
sites for operators/users located within
a grantee’s ‘‘service area’’ in the context
of the Board’s standard 2,000-acre
activation limit for a general-purpose
zone project. The application was
submitted pursuant to the provisions of
the Foreign-Trade Zones Act, as
amended (19 U.S.C. 81a–81u), and the
regulations of the Board (15 CFR part
400). It was formally filed on November
3, 2009.
The grantee’s proposed service area
under the ASF would be Albany,
Columbia, Greene, Fulton, Montgomery,
Rensselaer, Saratoga, Schenectady,
Warren and Washington counties, New
York. If approved, the grantee would be
able to serve sites throughout the service
area based on companies’ needs for FTZ
designation. The proposed service area
is adjacent to or within the Albany
Customs and Border Protection port of
entry.
FTZ 121 was approved by the Board
on July 18, 1985 (Board Order 307, 50
FR 30986, July 31, 1985) and expanded
on September 25, 1997 (Board Order
922, 62 FR 51830, October 3, 1997). The
applicant is requesting to include its
current sites as ‘‘magnet sites’’: Site 1,
Northeastern Industrial Park, expanding
the site from 20 acres to 514 acres; Site
2, Rotterdam Industrial Park, expanding
the site from 7 acres to 225 acres; and
E:\FR\FM\10NON1.SGM
10NON1
]]>Agencies
[Federal Register Volume 74, Number 216 (Tuesday, November 10, 2009)]
[Notices]
[Page 58002]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: E9-27067]
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DEPARTMENT OF COMMERCE
International Trade Administration
Application(s) for Duty-Free Entry of Scientific Instruments
Pursuant to Section 6(c) of the Educational, Scientific and
Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended
by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments
on the question of whether instruments of equivalent scientific value,
for the purposes for which the instruments shown below are intended to
be used, are being manufactured in the United States.
Comments must comply with 15 CFR 301.5(a)(3) and (4) of the
regulations and be postmarked on or before November 30, 2009. Address
written comments to Statutory Import Programs Staff, Room 3720, U.S.
Department of Commerce, Washington, DC 20230. Applications may be
examined between 8:30 a.m. and 5 p.m. at the U.S. Department of
Commerce in Room 3720.
Docket Number: 09-059. Applicant: Fermi Research Alliance LLC-Fermi
National Accelerator Laboratory, Kirk Road & Wilson Street, P.O. Box
500, Batavia, IL 60510. Instrument: Wavelength Shifting Fiber.
Manufacturer: Kuraray Co., Ltd.; Japan. Intended Use: This instrument
will be used to observe the transmutation of muon neutrinos to electron
neutrinos as they travel from their production point through the earth
to a 20 kiloton detector. The instrument allows the light generated by
neutrino interactions in the experiment's 18 kilotons of liquid
scintillator to be captured, wavelength shifted and transmitted to
photo-detectors. The fibers must be .7mm in diameter and 32 meters in
length. Further, the light generated in the fiber must not suffer
unacceptable attenuation in traveling down 16-20 m of the WLS fiber. As
such, a pertinent characteristic of this instrument is that it have an
attenuation length of >20m. Justification for Duty-Free Entry: There
are instruments of the same general category being manufactured within
the United States, but they could not be utilized for the purposes
described above. Application accepted by Commissioner of Customs:
October 9, 2009.
Docket Number: 09-063. Applicant: Argonne National Laboratory, 9700
S. Cass Ave., Lemont, IL 60439. Instrument: CEOS Spherical Aberration
Corrector. Manufacturer: CEOS Corrected Electron Optical Systems, GmbH;
Germany. Intended Use: This instrument will be installed on a
transmission electron microscope and used for the study of nanoscale
magnetic and ferroelectric materials. The aberration corrector greatly
enhances the spatial resolution with which the experiments described
above can be carried out. All experiments will be carried out in
Lorentz mode, and will include imaging and electron diffraction
combined with certain in-situ techniques. A pertinent characteristic of
this instrument is that it must be capable of compensating completing
the spherical aberration of the low field objective lens on the 2100F
TEM to which it will be attached. The spherical aberration coefficient
of this lens is 200 mm. In addition the CEOS aberration corrector can
compensate this value of spherical aberration while only increasing the
chromatic aberration by approximately 20%. Justification for Duty-Free
Entry: There are no instruments of the same general category being
manufactured within the United States. Application accepted by
Commissioner of Customs: October 21, 2009.
Dated: November 3, 2009.
Christopher Cassel,
Acting Director, IA Subsidies Enforcement Office.
[FR Doc. E9-27067 Filed 11-9-09; 8:45 am]
BILLING CODE 3510-DS-P
