Application(s) for Duty-Free Entry of Scientific Instruments, 58002 [E9-27067]

Download as PDF 58002 Federal Register / Vol. 74, No. 216 / Tuesday, November 10, 2009 / Notices Instrument: Electron Microscope. Manufacturer: JEOL Ltd., Japan. Intended Use: This instrument will be used for the study of nanoscale magnetic and ferroelectric materials. Specifically, it will be used to study the magnetic domain or ferroelectric domain behavior of the such materials. The resolution of the instrument is such that it can correlate domain behavior directly with microstructure. Justification for Duty-Free Entry: No instruments of same general category are manufactured in the United States. Application accepted by Commissioner of Customs: October 19, 2009. Docket Number: 09–062. Applicant: Department of Homeland Security, Science & Technology Directorate, Office of National Labs, National Biodefense analysis and Countermeasures Center, 8300 Research Plaza, Fort Detrick, Frederick, MD 21702. Instrument: Electron Microscope. Manufacturer: FEI Company, Czech Republic. Intended Use: The instrument will be used to study biological agents and specimens at the cellular and genomic level. Justification for DutyFree Entry: No instruments of same general category are manufactured in the United States. Application accepted by Commissioner of Customs: October 21, 2009. Dated: November 3, 2009. Christopher Cassel, Director, IA Subsidies Enforcement Office. [FR Doc. E9–27070 Filed 11–9–09; 8:45 am] BILLING CODE 3510–DS–P DEPARTMENT OF COMMERCE International Trade Administration srobinson on DSKHWCL6B1PROD with NOTICES Application(s) for Duty-Free Entry of Scientific Instruments Pursuant to Section 6(c) of the Educational, Scientific and Cultural Materials Importation Act of 1966 (Pub. L. 89–651, as amended by Pub. L. 106– 36; 80 Stat. 897; 15 CFR part 301), we invite comments on the question of whether instruments of equivalent scientific value, for the purposes for which the instruments shown below are intended to be used, are being manufactured in the United States. Comments must comply with 15 CFR 301.5(a)(3) and (4) of the regulations and be postmarked on or before November 30, 2009. Address written comments to Statutory Import Programs Staff, Room 3720, U.S. Department of Commerce, Washington, DC 20230. Applications may be examined between 8:30 a.m. and 5 p.m. at the U.S. Department of Commerce in Room 3720. VerDate Nov<24>2008 16:45 Nov 09, 2009 Jkt 220001 Docket Number: 09–059. Applicant: Fermi Research Alliance LLC–Fermi National Accelerator Laboratory, Kirk Road & Wilson Street, P.O. Box 500, Batavia, IL 60510. Instrument: Wavelength Shifting Fiber. Manufacturer: Kuraray Co., Ltd.; Japan. Intended Use: This instrument will be used to observe the transmutation of muon neutrinos to electron neutrinos as they travel from their production point through the earth to a 20 kiloton detector. The instrument allows the light generated by neutrino interactions in the experiment’s 18 kilotons of liquid scintillator to be captured, wavelength shifted and transmitted to photodetectors. The fibers must be .7mm in diameter and 32 meters in length. Further, the light generated in the fiber must not suffer unacceptable attenuation in traveling down 16–20 m of the WLS fiber. As such, a pertinent characteristic of this instrument is that it have an attenuation length of >20m. Justification for Duty-Free Entry: There are instruments of the same general category being manufactured within the United States, but they could not be utilized for the purposes described above. Application accepted by Commissioner of Customs: October 9, 2009. Docket Number: 09–063. Applicant: Argonne National Laboratory, 9700 S. Cass Ave., Lemont, IL 60439. Instrument: CEOS Spherical Aberration Corrector. Manufacturer: CEOS Corrected Electron Optical Systems, GmbH; Germany. Intended Use: This instrument will be installed on a transmission electron microscope and used for the study of nanoscale magnetic and ferroelectric materials. The aberration corrector greatly enhances the spatial resolution with which the experiments described above can be carried out. All experiments will be carried out in Lorentz mode, and will include imaging and electron diffraction combined with certain in-situ techniques. A pertinent characteristic of this instrument is that it must be capable of compensating completing the spherical aberration of the low field objective lens on the 2100F TEM to which it will be attached. The spherical aberration coefficient of this lens is 200 mm. In addition the CEOS aberration corrector can compensate this value of spherical aberration while only increasing the chromatic aberration by approximately 20%. Justification for Duty-Free Entry: There are no instruments of the same general category being manufactured within the United States. Application accepted by PO 00000 Frm 00014 Fmt 4703 Sfmt 4703 Commissioner of Customs: October 21, 2009. Dated: November 3, 2009. Christopher Cassel, Acting Director, IA Subsidies Enforcement Office. [FR Doc. E9–27067 Filed 11–9–09; 8:45 am] BILLING CODE 3510–DS–P DEPARTMENT OF COMMERCE Foreign-Trade Zones Board [Docket 47–2009] Foreign-Trade Zone 121—Albany, NY; Application for Expansion and Reorganization Under Alternative Site Framework An application has been submitted to the Foreign-Trade Zones (FTZ) Board (the Board) by the Capital District Regional Planning Commission, grantee of FTZ 121, requesting authority to expand the zone and reorganize under the alternative site framework (ASF) adopted by the Board (74 FR 1170, 01/ 12/09; correction 74 FR 3987, 01/22/09). The ASF is an option for grantees for the establishment or reorganization of general-purpose zones and can permit significantly greater flexibility in the designation of new ‘‘usage-driven’’ FTZ sites for operators/users located within a grantee’s ‘‘service area’’ in the context of the Board’s standard 2,000-acre activation limit for a general-purpose zone project. The application was submitted pursuant to the provisions of the Foreign-Trade Zones Act, as amended (19 U.S.C. 81a–81u), and the regulations of the Board (15 CFR part 400). It was formally filed on November 3, 2009. The grantee’s proposed service area under the ASF would be Albany, Columbia, Greene, Fulton, Montgomery, Rensselaer, Saratoga, Schenectady, Warren and Washington counties, New York. If approved, the grantee would be able to serve sites throughout the service area based on companies’ needs for FTZ designation. The proposed service area is adjacent to or within the Albany Customs and Border Protection port of entry. FTZ 121 was approved by the Board on July 18, 1985 (Board Order 307, 50 FR 30986, July 31, 1985) and expanded on September 25, 1997 (Board Order 922, 62 FR 51830, October 3, 1997). The applicant is requesting to include its current sites as ‘‘magnet sites’’: Site 1, Northeastern Industrial Park, expanding the site from 20 acres to 514 acres; Site 2, Rotterdam Industrial Park, expanding the site from 7 acres to 225 acres; and E:\FR\FM\10NON1.SGM 10NON1

Agencies

[Federal Register Volume 74, Number 216 (Tuesday, November 10, 2009)]
[Notices]
[Page 58002]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: E9-27067]


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DEPARTMENT OF COMMERCE

International Trade Administration


Application(s) for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended 
by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments 
on the question of whether instruments of equivalent scientific value, 
for the purposes for which the instruments shown below are intended to 
be used, are being manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be postmarked on or before November 30, 2009. Address 
written comments to Statutory Import Programs Staff, Room 3720, U.S. 
Department of Commerce, Washington, DC 20230. Applications may be 
examined between 8:30 a.m. and 5 p.m. at the U.S. Department of 
Commerce in Room 3720.
    Docket Number: 09-059. Applicant: Fermi Research Alliance LLC-Fermi 
National Accelerator Laboratory, Kirk Road & Wilson Street, P.O. Box 
500, Batavia, IL 60510. Instrument: Wavelength Shifting Fiber. 
Manufacturer: Kuraray Co., Ltd.; Japan. Intended Use: This instrument 
will be used to observe the transmutation of muon neutrinos to electron 
neutrinos as they travel from their production point through the earth 
to a 20 kiloton detector. The instrument allows the light generated by 
neutrino interactions in the experiment's 18 kilotons of liquid 
scintillator to be captured, wavelength shifted and transmitted to 
photo-detectors. The fibers must be .7mm in diameter and 32 meters in 
length. Further, the light generated in the fiber must not suffer 
unacceptable attenuation in traveling down 16-20 m of the WLS fiber. As 
such, a pertinent characteristic of this instrument is that it have an 
attenuation length of >20m. Justification for Duty-Free Entry: There 
are instruments of the same general category being manufactured within 
the United States, but they could not be utilized for the purposes 
described above. Application accepted by Commissioner of Customs: 
October 9, 2009.
    Docket Number: 09-063. Applicant: Argonne National Laboratory, 9700 
S. Cass Ave., Lemont, IL 60439. Instrument: CEOS Spherical Aberration 
Corrector. Manufacturer: CEOS Corrected Electron Optical Systems, GmbH; 
Germany. Intended Use: This instrument will be installed on a 
transmission electron microscope and used for the study of nanoscale 
magnetic and ferroelectric materials. The aberration corrector greatly 
enhances the spatial resolution with which the experiments described 
above can be carried out. All experiments will be carried out in 
Lorentz mode, and will include imaging and electron diffraction 
combined with certain in-situ techniques. A pertinent characteristic of 
this instrument is that it must be capable of compensating completing 
the spherical aberration of the low field objective lens on the 2100F 
TEM to which it will be attached. The spherical aberration coefficient 
of this lens is 200 mm. In addition the CEOS aberration corrector can 
compensate this value of spherical aberration while only increasing the 
chromatic aberration by approximately 20%. Justification for Duty-Free 
Entry: There are no instruments of the same general category being 
manufactured within the United States. Application accepted by 
Commissioner of Customs: October 21, 2009.

    Dated: November 3, 2009.
Christopher Cassel,
Acting Director, IA Subsidies Enforcement Office.
[FR Doc. E9-27067 Filed 11-9-09; 8:45 am]
BILLING CODE 3510-DS-P

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