University of Virginia, et al.; Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscopes, 36166 [E9-17422]
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36166
Federal Register / Vol. 74, No. 139 / Wednesday, July 22, 2009 / Notices
Dated: July 17, 2009.
Pierre V. Duy,
Acting Executive Secretary.
[FR Doc. E9–17425 Filed 7–21–09; 8:45 am]
BILLING CODE 3510–DS–P
DEPARTMENT OF COMMERCE
Foreign-Trade Zones Board
[Docket 28–2009]
jlentini on DSKJ8SOYB1PROD with NOTICES
Foreign-Trade Zone 260—Lubbock, TX;
Application for Reorganization Under
Alternative Site Framework
An application has been submitted to
the Foreign-Trade Zones (FTZ) Board
(the Board) by the City of Lubbock,
Texas, grantee of FTZ 260, requesting
authority to reorganize the zone under
the alternative site framework (ASF)
adopted by the Board (74 FR 1170, 01/
12/09; correction 74 FR 3987, 01/22/09).
The ASF is an option for grantees for the
establishment or reorganization of
general-purpose zones and can permit
significantly greater flexibility in the
designation of new ‘‘usage-driven’’ FTZ
sites for operators/users located within
a grantee’s ‘‘service area’’ in the context
of the Board’s standard 2,000-acre
activation limit for a general-purpose
zone project. The application was
submitted pursuant to the Foreign-Trade
Zones Act, as amended (19 U.S.C. 81a–
81u), and the regulations of the Board
(15 CFR part 400). It was formally filed
on July 15, 2009.
The grantee’s proposed service area
under the ASF would be Garza, Hale,
Hockley, Lubbock and Terry Counties,
Texas. If approved, the grantee would be
able to serve sites throughout the service
area based on companies’ needs for FTZ
designation. The proposed service area
is adjacent to the Lubbock Customs and
Border Protection port of entry.
FTZ 260 was approved by the FTZ
Board on January 14, 2004 (Board Order
1315, 69 FR 3876, 1/27/04). The
applicant is requesting to include the
following current sites in the
reorganized zone as ‘‘magnet’’ sites:
Proposed Site 1 (693 acres)-Lubbock
International Airport, 5401 N. Martin
Luther King, Jr. Blvd., Lubbock; and
Proposed Site 2 (1700 acres)-Reese
Technology Center, 9801 Reese Blvd.,
Lubbock. The applicant proposes that
Site 1 be exempt from ‘‘sunset’’ time
limits that otherwise apply to sites
under the ASF. The applicant is also
requesting approval of the following
initial ‘‘usage-driven’’ sites: Proposed
Site 3 (1.4 acres)—Holiday LiteSource,
301 Southeast Loop 289, Lubbock; and
Proposed Site 4 (5.3 acres)—J&B
VerDate Nov<24>2008
16:04 Jul 21, 2009
Jkt 217001
Industrial Services, Inc., 529 N.E. Loop
289, Lubbock.
In accordance with the Board’s
regulations, Kathleen Boyce of the FTZ
Staff is designated examiner to evaluate
and analyze the facts and information
presented in the application and case
record and to report findings and
recommendations to the Board.
Public comment is invited from
interested parties. Submissions (original
and 3 copies) shall be addressed to the
Board’s Executive Secretary at the
address below. The closing period for
their receipt is September 21, 2009.
Rebuttal comments in response to
material submitted during the foregoing
period may be submitted during the
subsequent 15-day period (to October 5,
2009).
A copy of the application will be
available for public inspection at the
Office of the Executive Secretary,
Foreign-Trade Zones Board, Room 2111,
U.S. Department of Commerce, 1401
Constitution Avenue, NW., Washington,
DC 20230–0002, and in the ‘‘Reading
Room’’ section of the Board’s Web site,
which is accessible via https://
www.trade.gov/ftz. For further
information, contact Kathleen Boyce at
Kathleen_Boyce@ita.doc.gov or 202–
482–1346.
Dated: July 15, 2009.
Andrew McGilvray,
Executive Secretary.
[FR Doc. E9–17426 Filed 7–21–09; 8:45 am]
BILLING CODE 3510–DS–P
DEPARTMENT OF COMMERCE
International Trade Administration
University of Virginia, et al.; Notice of
Consolidated Decision on Applications
for Duty-Free Entry of Electron
Microscopes
This is a decision consolidated
pursuant to Section 6(c) of the
Educational, Scientific, and Cultural
Materials Importation Act of 1966 (Pub.
L. 89–651, as amended by Pub. L. 106–
36; 80 Stat. 897; 15 CFR part 301).
Related records can be viewed between
8:30 a.m. and 5:00 p.m. in Room 3705,
U.S. Department of Commerce, 14th and
Constitution Avenue, NW., Washington,
DC.
Docket Number: 09–029. Applicant:
University of Virginia, Charlottesville,
VA 22908. Instrument: Electron
Microscope. Manufacturer: FEI
Company, the Netherlands. Intended
Use: See notice at 74 FR 30046, June 24,
2009.
Docket Number: 09–030. Applicant:
University of Texas at El Paso, El Paso,
PO 00000
Frm 00004
Fmt 4703
Sfmt 4703
TX 79968. Instrument: Electron
Microscope. Manufacturer: Hitachi
High-Technologies Corporation, Japan.
Intended Use: See notice at 74 FR
30046, June 24, 2009.
Docket Number: 09–031. Applicant:
University of Toledo, Toledo, OH
43606. Instrument: Electron Microscope.
Manufacturer: FEI Company, Czech
Republic. Intended Use: See notice at 74
FR 30046, June 24, 2009.
Docket Number: 09–033. Applicant:
Case Western Reserve University,
Cleveland, OH 44106. Instrument:
Electron Microscope. Manufacturer: FEI,
the Netherlands. Intended Use: See
notice at 74 FR 30046, June 24, 2009.
Docket Number: 09–036. Applicant:
University of Texas Health Science
Center at Houston, Houston, TX 77030.
Instrument: Electron Microscope.
Manufacturer: JEOL, Japan. Intended
Use: See notice at 74 FR 30046, June 24,
2009.
Docket Number: 09–037. Applicant:
National Institutes of Health, Hamilton,
MT 59840. Instrument: Electron
Microscope. Manufacturer: FEI
Company, Czech Republic. Intended
Use: See notice at 74 FR 30046, June 24,
2009.
Comments: None received. Decision:
Approved. No instrument of equivalent
scientific value to the foreign
instrument, for such purposes as these
instruments are intended to be used,
was being manufactured in the United
States at the time the instruments were
ordered. Reasons: Each foreign
instrument is an electron microscope
and is intended for research or scientific
educational uses requiring an electron
microscope. We know of no electron
microscope, or any other instrument
suited to these purposes, which was
being manufactured in the United States
at the time of order of each instrument.
Dated: July 16, 2009.
Christopher Cassel,
Acting Director, Subsidies Enforcement
Office, Import Administration.
[FR Doc. E9–17422 Filed 7–21–09; 8:45 am]
BILLING CODE 3510–DS–P
DEPARTMENT OF COMMERCE
National Oceanic and Atmospheric
Administration
RIN: 0648–XQ37
New England Fishery Management
Council; Public Meeting
AGENCY: National Marine Fisheries
Service (NMFS), National Oceanic and
Atmospheric Administration (NOAA),
Commerce.
E:\FR\FM\22JYN1.SGM
22JYN1
Agencies
[Federal Register Volume 74, Number 139 (Wednesday, July 22, 2009)]
[Notices]
[Page 36166]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: E9-17422]
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DEPARTMENT OF COMMERCE
International Trade Administration
University of Virginia, et al.; Notice of Consolidated Decision
on Applications for Duty-Free Entry of Electron Microscopes
This is a decision consolidated pursuant to Section 6(c) of the
Educational, Scientific, and Cultural Materials Importation Act of 1966
(Pub. L. 89-651, as amended by Pub. L. 106-36; 80 Stat. 897; 15 CFR
part 301). Related records can be viewed between 8:30 a.m. and 5:00
p.m. in Room 3705, U.S. Department of Commerce, 14th and Constitution
Avenue, NW., Washington, DC.
Docket Number: 09-029. Applicant: University of Virginia,
Charlottesville, VA 22908. Instrument: Electron Microscope.
Manufacturer: FEI Company, the Netherlands. Intended Use: See notice at
74 FR 30046, June 24, 2009.
Docket Number: 09-030. Applicant: University of Texas at El Paso,
El Paso, TX 79968. Instrument: Electron Microscope. Manufacturer:
Hitachi High-Technologies Corporation, Japan. Intended Use: See notice
at 74 FR 30046, June 24, 2009.
Docket Number: 09-031. Applicant: University of Toledo, Toledo, OH
43606. Instrument: Electron Microscope. Manufacturer: FEI Company,
Czech Republic. Intended Use: See notice at 74 FR 30046, June 24, 2009.
Docket Number: 09-033. Applicant: Case Western Reserve University,
Cleveland, OH 44106. Instrument: Electron Microscope. Manufacturer:
FEI, the Netherlands. Intended Use: See notice at 74 FR 30046, June 24,
2009.
Docket Number: 09-036. Applicant: University of Texas Health
Science Center at Houston, Houston, TX 77030. Instrument: Electron
Microscope. Manufacturer: JEOL, Japan. Intended Use: See notice at 74
FR 30046, June 24, 2009.
Docket Number: 09-037. Applicant: National Institutes of Health,
Hamilton, MT 59840. Instrument: Electron Microscope. Manufacturer: FEI
Company, Czech Republic. Intended Use: See notice at 74 FR 30046, June
24, 2009.
Comments: None received. Decision: Approved. No instrument of
equivalent scientific value to the foreign instrument, for such
purposes as these instruments are intended to be used, was being
manufactured in the United States at the time the instruments were
ordered. Reasons: Each foreign instrument is an electron microscope and
is intended for research or scientific educational uses requiring an
electron microscope. We know of no electron microscope, or any other
instrument suited to these purposes, which was being manufactured in
the United States at the time of order of each instrument.
Dated: July 16, 2009.
Christopher Cassel,
Acting Director, Subsidies Enforcement Office, Import Administration.
[FR Doc. E9-17422 Filed 7-21-09; 8:45 am]
BILLING CODE 3510-DS-P