Applications for Duty-Free Entry of Scientific Instruments, 70961 [E8-27888]

Download as PDF Federal Register / Vol. 73, No. 227 / Monday, November 24, 2008 / Notices Dated: November 19, 2008. Stephen J. Claeys, Deputy Assistant Secretary for Antidumping and Countervailing Duty Operations. [FR Doc. E8–27977 Filed 11–21–08; 8:45 am] BILLING CODE 3510–DS–P DEPARTMENT OF COMMERCE films, biosensors and for the study of interplanetary materials and meteorites. Application accepted by Commissioner of Customs: October 21, 2008. Dated: November 18, 2008. Christopher Cassel, Acting Director, Subsidies Enforcement Office, Import Administration. [FR Doc. E8–27888 Filed 11–21–08; 8:45 am] BILLING CODE 3510–DS–P Applications for Duty-Free Entry of Scientific Instruments sroberts on PROD1PC70 with NOTICES International Trade Administration DEPARTMENT OF COMMERCE 19:32 Nov 21, 2008 Jkt 217001 Dated: November 18, 2008. Christopher Cassel, Acting Director, Subsidies Enforcement Office, Import Administration. [FR Doc. E8–27887 Filed 11–21–08; 8:45 am] BILLING CODE 3510–DS–P DEPARTMENT OF COMMERCE International Trade Administration [C–570–936] Pursuant to Section 6(c) of the Educational, Scientific and Cultural Materials Importation Act of 1966 (Pub. L. 89–651, as amended by Public Law 106–36; 80 Stat. 897; 15 CFR part 301), we invite comments on the question of whether instruments of equivalent scientific value, for the purposes for which the instruments shown below are intended to be used, are being manufactured in the United States. Comments must comply with 15 CFR 301.5(a)(3) and (4) of the regulations and be postmarked on or before December 15, 2008. Address written comments to Statutory Import Programs Staff, Room 2104, U.S. Department of Commerce, Washington, DC 20230. Applications may be examined between 8:30 a.m.and 5:30 p.m. at the U.S. Department of Commerce in Room 2104. Docket Number: 08–057. Applicant: Louisiana State University, Department of Chemistry, 232 Choppin Hall, Baton Rouge, LA 70803. Instrument: Electron Microscope, Model FEI Quanta 3D FEG DualBeam. Manufacturer: FEI Company, the Netherlands. Intended Use: The instrument is intended to be used for large area cross-sectioning and analytical work, automated 3D tomography, nanolithography, and TEM specimen preparation. This type of work necessitates a high performance Dualbeam system with Environmental SEM capabilities. Application accepted by Commissioner of Customs: October 21, 2008. Docket Number: 08–058. Applicant: University of New Mexico, Center for Micro-Engineered Materials, MSC01 1120 Farris Eng. CTR 203, 1 University of New Mexico, Albuquerque, NM 87131. Instrument: Electron Microscope, Model FEI Quanta 3D FEG Focused Ion Beam. Manufacturer: FEI Company, the Netherlands. Intended Use: The instrument is intended to be used to study nanoscale materials. Specifically, it will be used for the study of heterogeneous catalysts, heteraoepitaxial semiconductors, quantum dots, lasers, microfluidic devices, ion channels, free-standing thin VerDate Aug<31>2005 70961 International Trade Administration University of Puerto Rico, et al.; Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscopes This is a decision consolidated pursuant to section 6(c) of the Educational, Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89–651, as amended by Pub. L. 106– 36; 80 Stat. 897; 15 CFR part 301). Related records can be viewed between 8:30 a.m. and 5 p.m. in Room 2104, U.S. Department of Commerce, 14th and Constitution Avenue, NW., Washington, DC. Docket Number: 08–048. Applicant: University of Puerto Rico, San Juan, PR 00931–3334. Instrument: Electron Microscope, Model JEM 2100–F. Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 73 FR 63434, October 24, 2008. Docket Number: 08–049. Applicant: University of Puerto Rico, San Juan, PR 00931–3334. Instrument: Electron Microscope, Model JEM 2200–FS. Manufacturer: JEOL, Ltd., Japan. Intended Use: See notice at 73 FR 63434, October 24, 2008. Docket Number: 08–053. Applicant: Purdue University, West Lafayette, IN 47907. Instrument: Electron Microscope, Model Tecnai G2 F20 TEM. Manufacturer: FEI Company, Czech Republic. Intended Use: See notice at 73 FR 63434, October 24, 2008. Comments: None received. Decision: Approved. No instrument of equivalent scientific value to the foreign instrument, for such purposes as these instruments are intended to be used, was being manufactured in the United States at the time the instruments were ordered. Reasons: Each foreign instrument is an electron microscope and is intended for research or scientific educational uses requiring an electron microscope. We know of no electron microscope, or any other instrument suited to these purposes, which was being manufactured in the United States at the time of order of each instrument. PO 00000 Frm 00009 Fmt 4703 Sfmt 4703 Circular Welded Carbon Quality Steel Line Pipe from the People’s Republic of China: Final Affirmative Countervailing Duty Determination Import Administration, International Trade Administration, Department of Commerce. SUMMARY: The Department of Commerce (the Department) determines that countervailable subsidies are being provided to producers and exporters of circular welded carbon quality steel line pipe (line pipe) from the People’s Republic of China (the PRC). For information on the estimated subsidy rates, see the ‘‘Suspension of Liquidation’’ section of this notice. DATES: Effective Date: November 24, 2008. AGENCY: FOR FURTHER INFORMATION CONTACT: Kristen Johnson or John Conniff, AD/ CVD Operations, Office 3, Operations, Import Administration, U.S. Department of Commerce, Room 4014, 14th Street and Constitution Avenue, NW., Washington, DC 20230; telephone: (202) 482–4793 and (202) 482–1009, respectively. SUPPLEMENTARY INFORMATION: Background This investigation covers 30 programs and the following producers/exporters: Huludao Seven-Star Steel Pipe Group Co., Ltd. (Huludao Seven Star Group), Huludao Steel Pipe Industrial Co. Ltd. (Huludao Steel Pipe), and Huludao Bohai Oil Pipe Industrial Co. Ltd. (Huludao Bohai Oil Pipe) (collectively, the Huludao Companies), and Liaoning Northern Steel Pipe Co., Ltd. (Northern Steel). The petitioners in this investigation are United States Steel Corporation, Maverick Tube Corporation, Tex-Tube Company, and the United Steel, Paper and Forestry, Rubber, Manufacturing, Energy, Allied Industrial and Service Workers International Union, AFL–CIO– CLC (collectively, the petitioners). Period of Investigation The period of investigation (the POI) for which we are measuring subsidies is E:\FR\FM\24NON1.SGM 24NON1

Agencies

[Federal Register Volume 73, Number 227 (Monday, November 24, 2008)]
[Notices]
[Page 70961]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: E8-27888]


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DEPARTMENT OF COMMERCE

International Trade Administration


Applications for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended 
by Public Law 106-36; 80 Stat. 897; 15 CFR part 301), we invite 
comments on the question of whether instruments of equivalent 
scientific value, for the purposes for which the instruments shown 
below are intended to be used, are being manufactured in the United 
States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be postmarked on or before December 15, 2008. Address 
written comments to Statutory Import Programs Staff, Room 2104, U.S. 
Department of Commerce, Washington, DC 20230. Applications may be 
examined between 8:30 a.m.and 5:30 p.m. at the U.S. Department of 
Commerce in Room 2104.
    Docket Number: 08-057. Applicant: Louisiana State University, 
Department of Chemistry, 232 Choppin Hall, Baton Rouge, LA 70803. 
Instrument: Electron Microscope, Model FEI Quanta 3D FEG DualBeam. 
Manufacturer: FEI Company, the Netherlands. Intended Use: The 
instrument is intended to be used for large area cross-sectioning and 
analytical work, automated 3D tomography, nanolithography, and TEM 
specimen preparation. This type of work necessitates a high performance 
Dualbeam system with Environmental SEM capabilities. Application 
accepted by Commissioner of Customs: October 21, 2008.
    Docket Number: 08-058. Applicant: University of New Mexico, Center 
for Micro-Engineered Materials, MSC01 1120 Farris Eng. CTR 203, 1 
University of New Mexico, Albuquerque, NM 87131. Instrument: Electron 
Microscope, Model FEI Quanta 3D FEG Focused Ion Beam. Manufacturer: FEI 
Company, the Netherlands. Intended Use: The instrument is intended to 
be used to study nanoscale materials. Specifically, it will be used for 
the study of heterogeneous catalysts, heteraoepitaxial semiconductors, 
quantum dots, lasers, microfluidic devices, ion channels, free-standing 
thin films, biosensors and for the study of interplanetary materials 
and meteorites. Application accepted by Commissioner of Customs: 
October 21, 2008.

    Dated: November 18, 2008.
Christopher Cassel,
Acting Director, Subsidies Enforcement Office, Import Administration.
[FR Doc. E8-27888 Filed 11-21-08; 8:45 am]
BILLING CODE 3510-DS-P