Applications for Duty-Free Entry of Scientific Instruments, 63434 [E8-25437]

Download as PDF 63434 Federal Register / Vol. 73, No. 207 / Friday, October 24, 2008 / Notices April 21, 2008, the effective date of the new planning rule, conform to the planning process of the 2008 planning rule and for that reason, the plan revision process does not need to be restarted. Therefore, the National Forests in Mississippi is resuming its plan revision process by moving forward with developing a draft plan for formal public review. Future meetings will be announced on the National Forests in Mississippi Web site, and a formal comment opportunity will be provided when the draft plan is completed. The Forest plan revision World Wide Web Internet address is: https://www.fs.fed.us/r8/mississippi/ forest_plan/forestrevision/index.htm. Authority: 16 U.S.C. 1600–1614; 36 CFR 219.14. Dated: October 15, 2008. R.E. Vann, III, Acting Forest Supervisor, National Forests in Mississippi. [FR Doc. E8–25390 Filed 10–23–08; 8:45 am] BILLING CODE 3410–11–P DEPARTMENT OF COMMERCE Bureau of Industry and Security Sensors and Instrumentation Technical Advisory Committee; Notice of Partially Closed Meeting The Sensors and Instrumentation Technical Advisory Committee (SITAC) will meet on October 28, 2008, 9:30 a.m., in the Herbert C. Hoover Building, Room 3884, 14th Street between Constitution and Pennsylvania Avenues, NW., Washington, DC. The Committee advises the Office of the Assistant Secretary for Export Administration on technical questions that affect the level of export controls applicable to sensors and instrumentation equipment and technology. Agenda Public Session 1. Welcome and Introductions. 2. Remarks from Bureau of Industry and Security Management. 3. Industry Presentations. 4. New Business. jlentini on PROD1PC65 with NOTICES Closed Session 5. Discussion of matters determined to be exempt from the provisions relating to public meetings found in 5 U.S.C. app. 2 §§ 10(a)(1) and 10(a)(3). The open session will be accessible via teleconference to 20 participants on a first come, first serve basis. To join the conference, submit inquiries to Ms. VerDate Aug<31>2005 16:48 Oct 23, 2008 Jkt 217001 Yvette Springer at Yspringer@bis.doc.gov no later than October 24, 2008. A limited number of seats will be available during the public session of the meeting. Reservations are not accepted. To the extent that time permits, members of the public may present oral statements to the Committee. The public may submit written statements at any time before or after the meeting. However, to facilitate distribution of public presentation materials to the Committee members, the Committee suggests that the materials be forwarded before the meeting to Ms. Springer. The Assistant Secretary for Administration, with the concurrence of the General Counsel, formally determined on June 30, 2008 pursuant to Section 10(d) of the Federal Advisory Committee Act, as amended (5 U.S.C. app. 2 § 10(d)), that the portion of this meeting dealing with pre-decisional changes to the Commerce Control List and U.S. export control policies shall be exempt from the provisions relating to public meetings found in 5 U.S.C. app. 2 §§ 10(a)(1) and 10(a)(3). The remaining portions of the meeting will be open to the public. For more information contact Yvette Springer on (202) 482–2813. Dated: October 20, 2008. Yvette Springer, Committee Liaison Officer. [FR Doc. E8–25448 Filed 10–23–08; 8:45 am] BILLING CODE 3510–JT–P DEPARTMENT OF COMMERCE International Trade Administration Applications for Duty–Free Entry of Scientific Instruments Pursuant to Section 6(c) of the Educational, Scientific and Cultural Materials Importation Act of 1966 (Pub. L. 89–651, as amended by Pub. L. 106– 36; 80 Stat. 897; 15 CFR part 301), we invite comments on the question of whether instruments of equivalent scientific value, for the purposes for which the instruments shown below are intended to be used, are being manufactured in the United States. Comments must comply with 15 CFR 301.5(a)(3) and (4) of the regulations and be postmarked on or before November 13, 2008. Address written comments to Statutory Import Programs Staff, Room 2104, U.S. Department of Commerce, Washington, D.C. 20230. Applications may be examined between 8:30 A.M. and 5:00 P.M. at the U.S. Department of Commerce in Room 2104. PO 00000 Frm 00010 Fmt 4703 Sfmt 4703 Docket Number: 08–048. Applicant: University of Puerto Rico, P.O. Box 23334, San Juan, PR 00931–3334. Instrument: Electron Microscope, Model JEM 2100–F. Manufacturer: JEOL Ltd., Japan. Intended Use: The instrument is intended to be used for materials characterization, including microscopy and elemental analysis at nanometer dimensions and at atomic resolution. A unique feature of this the instrument is that it has a variable voltage Field Emission electron source with an energy filter and X–ray fluorescence detector. Application accepted by Commissioner of Customs: September 24, 2008. Docket Number: 08–049. Applicant: University of Puerto Rico, P.O. Box 23334, San Juan, PR 00931–3334. Instrument: Electron Microscope, Model JEM 2200–FS. Manufacturer: JEOL Ltd., Japan. Intended Use: The instrument is intended to be used for materials characterization, including microscopy and elemental analysis at nanometer dimensions and at atomic resolution. A unique feature of this the instrument is that it has a 200kV Field Emission electron source with an energy filter and X–ray fluorescence detector. Application accepted by Commissioner of Customs: September 24, 2008. Docket Number: 08–053. Applicant: Purdue University, 701 Northwester Ave., School of Materials Engineering, West Lafayette, IN 47907. Instrument: Electron Microscope, Model Tecnai G2 F20 TEM. Manufacturer: FEI Company, Czech Republic. Intended Use: The instrument is intended to be used to study the composition and structure of materials such as metals, semiconductors, ceramic, polymers and biomaterials through standard electron microscopy techniques. More specifically, the instrument will be used to demonstrate the use of electron diffraction and light field and dark field imaging in characterizing the structure and composition of these materials. Application accepted by Commissioner of Customs: October 3, 2008. Dated: October 20, 2008. Faye Robinson, Director, Statutory Import Programs Staff. [FR Doc. E8–25437 Filed 10–23–04; 8:45 am] BILLING CODE 3510–DS–S E:\FR\FM\24OCN1.SGM 24OCN1

Agencies

[Federal Register Volume 73, Number 207 (Friday, October 24, 2008)]
[Notices]
[Page 63434]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: E8-25437]


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DEPARTMENT OF COMMERCE

International Trade Administration


Applications for Duty-Free Entry of Scientific Instruments

Pursuant to Section 6(c) of the Educational, Scientific and Cultural 
Materials Importation Act of 1966 (Pub. L. 89-651, as amended by Pub. 
L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments on the 
question of whether instruments of equivalent scientific value, for the 
purposes for which the instruments shown below are intended to be used, 
are being manufactured in the United States.
Comments must comply with 15 CFR 301.5(a)(3) and (4) of the regulations 
and be postmarked on or before November 13, 2008. Address written 
comments to Statutory Import Programs Staff, Room 2104, U.S. Department 
of Commerce, Washington, D.C. 20230. Applications may be examined 
between 8:30 A.M. and 5:00 P.M. at the U.S. Department of Commerce in 
Room 2104.
Docket Number: 08-048. Applicant: University of Puerto Rico, P.O. Box 
23334, San Juan, PR 00931-3334. Instrument: Electron Microscope, Model 
JEM 2100-F. Manufacturer: JEOL Ltd., Japan. Intended Use: The 
instrument is intended to be used for materials characterization, 
including microscopy and elemental analysis at nanometer dimensions and 
at atomic resolution. A unique feature of this the instrument is that 
it has a variable voltage Field Emission electron source with an energy 
filter and X-ray fluorescence detector. Application accepted by 
Commissioner of Customs: September 24, 2008.
Docket Number: 08-049. Applicant: University of Puerto Rico, P.O. Box 
23334, San Juan, PR 00931-3334. Instrument: Electron Microscope, Model 
JEM 2200-FS. Manufacturer: JEOL Ltd., Japan. Intended Use: The 
instrument is intended to be used for materials characterization, 
including microscopy and elemental analysis at nanometer dimensions and 
at atomic resolution. A unique feature of this the instrument is that 
it has a 200kV Field Emission electron source with an energy filter and 
X-ray fluorescence detector. Application accepted by Commissioner of 
Customs: September 24, 2008.
Docket Number: 08-053. Applicant: Purdue University, 701 Northwester 
Ave., School of Materials Engineering, West Lafayette, IN 47907. 
Instrument: Electron Microscope, Model Tecnai G2 F20 TEM. Manufacturer: 
FEI Company, Czech Republic. Intended Use: The instrument is intended 
to be used to study the composition and structure of materials such as 
metals, semiconductors, ceramic, polymers and biomaterials through 
standard electron microscopy techniques. More specifically, the 
instrument will be used to demonstrate the use of electron diffraction 
and light field and dark field imaging in characterizing the structure 
and composition of these materials. Application accepted by 
Commissioner of Customs: October 3, 2008.

    Dated: October 20, 2008.
Faye Robinson,
Director, Statutory Import Programs Staff.
[FR Doc. E8-25437 Filed 10-23-04; 8:45 am]
BILLING CODE 3510-DS-S

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