Ohio State University, et al.; Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscopes, 34917 [E8-13886]

Download as PDF mstockstill on PROD1PC66 with NOTICES Federal Register / Vol. 73, No. 119 / Thursday, June 19, 2008 / Notices procedures within FTZ 50. It was formally filed on June 13, 2008. The PMI facility (24,500 sq.ft./15 employees) is located at 401 S. Doubleday Avenue (Site 1) in Ontario, California. The facility, currently under construction, will be used to produce electric–powered, light–duty passenger vehicles (sport utility trucks, sport utility vehicles; HTSUS 8703.90; duty rate: 2.5%) for export and the domestic market. At full capacity, the facility (about 50 employees) will assemble up to approximately 30,000 vehicles annually. Under FTZ procedures, PMI would admit foreign semi–finished vehicle bodies (HTSUS 8707.10, duty rate: 2.5%) to FTZ 50 to be equipped with domestic electric drive train systems and batteries. FTZ procedures would exempt PMI from customs duty payments on the foreign vehicle bodies used in export production. On its domestic sales, PMI would be able to defer payment of customs duties on the foreign vehicle bodies until the finished motor vehicles are entered for consumption from the zone. Customs duties also could possibly be deferred or reduced on foreign status production equipment. The application indicates that the savings from FTZ procedures would help improve the facility’s international competitiveness. In accordance with the Board’s regulations, Pierre Duy of the FTZ Staff is designated examiner to investigate the application and report to the Board. Public comment is invited from interested parties. Submissions (original and 3 copies) shall be addressed to the Board’s Executive Secretary at the following address: Office of the Executive Secretary, Room 2111, U.S. Department of Commerce, 1401 Constitution Avenue, NW, Washington, DC 20230–0002. The closing period for receipt of comments is August 18, 2008. Rebuttal comments in response to material submitted during the foregoing period may be submitted during the subsequent 15-day period toSeptember 2, 2008. A copy of the application will be available for public inspection at the Office of the Foreign–Trade Zones Board’s Executive Secretary at the address listed above. For further information, contact Pierre Duy, examiner, at: pierrelduy@ita.doc.gov, or (202) 482–1378. Dated: June 13, 2008. Andrew McGilvray, Executive Secretary, [FR Doc. E8–13883 Filed 6–18–08; 8:45 am] DEPARTMENT OF COMMERCE DEPARTMENT OF COMMERCE International Trade Administration International Trade Administration Ohio State University, et al.; Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscopes Texas Christian University, et al.; Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscopes This is a decision consolidated pursuant to Section 6(c) of the Educational, Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89–651, 80 Stat. 897; 15 CFR part 301). Related records can be viewed between 8:30 a.m. and 5 p.m. in Room 2104, U.S. Department of Commerce, 14th and Constitution Avenue., NW., Washington, DC. Docket Number: 08–014. Applicant: Ohio State University, Columbus OH 43210. Instrument: Electron Microscope. Manufacturer: FEI Company, The Netherlands. Intended Use: See notice at 73 FR 30377. Docket Number: 08–015. Applicant: Texas Children’s Hospital, Houston, TX 77030. Instrument: Transmission Electron Microscope. Manufacturer: FEI Company, Czech Republic. Intended Use: See notice at 73 FR 30377. Docket Number: 08–020. Applicant: Bergen County Technical Schools/ Bergen County Academies, Hackensack, NJ 07601. Instrument: Scanning Electron Microscope. Manufacturer: FEI Company, Czech Republic. Intended Use: See notice at 73 FR 30377. Comments: None received. Decision: Approved. No instrument of equivalent scientific value to the foreign instrument, for such purposes as these instruments are intended to be used, was being manufactured in the United States at the time the instruments were ordered. Reasons: Each foreign instrument is an electron microscope and is intended for research or scientific educational uses requiring an electron microscope. We know of no electron microscope, or any other instrument suited to these purposes, which was being manufactured in the United States at the time of order of each instrument. This is a decision consolidated pursuant to Section 6(c) of the Educational, Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89–651, as amended by Pub. L. 106– 36; 80 Stat. 897; 15 CFR part 301). Related records can be viewed between 8:30 a.m. and 5 p.m. in Room 2104, U.S. Department of Commerce, 14th and Constitution Avenue., NW., Washington, DC. Docket Number: 08–019. Applicant: Texas Christian University, Fort Worth, TX 76129. Instrument: Electron Microscope, Model JEM–2100. Manufacturer: JEOL, Inc., Japan. Intended Use: See notice at 73 FR 30378, May 27, 2008. Docket Number: 08–023. Applicant: Washington University in St. Louis, University City, MO 63130. Instrument: Electron Microscope, Model Tecnai G2 Spirit Twin. Manufacturer: FEI Company, Czech Republic. Intended Use: See notice at 73 FR 30378, May 27, 2008. Docket Number: 08–024. Applicant: Washington University in St. Louis, University City, MO 63130. Instrument: Electron Microscope, Model Nova NanoSEM 230. Manufacturer: FEI Company, Czech Republic. Intended Use: See notice at 73 FR 30378, May 27, 2008. Comments: None received. Decision: Approved. No instrument of equivalent scientific value to the foreign instrument, for such purposes as these instruments are intended to be used, was being manufactured in the United States at the time the instruments were ordered. Reasons: Each foreign instrument is an electron microscope and is intended for research or scientific educational uses requiring an electron microscope. We know of no electron microscope, or any other instrument suited to these purposes, which was being manufactured in the United States at the time of order of each instrument. Dated: June 16, 2008. Faye Robinson, Director, Statutory Import Programs Staff, Import Administration. [FR Doc. E8–13886 Filed 6–18–08; 8:45 am] BILLING CODE 3510–DS–P BILLING CODE 3510–DS–S VerDate Aug<31>2005 19:59 Jun 18, 2008 Dated: June 16, 2008. Faye Robinson, Director, Statutory Import Programs Staff, Import Administration. [FR Doc. E8–13888 Filed 6–18–08; 8:45 am] BILLING CODE 3510–DS–P Jkt 214001 34917 PO 00000 Frm 00004 Fmt 4703 Sfmt 4703 E:\FR\FM\19JNN1.SGM 19JNN1

Agencies

[Federal Register Volume 73, Number 119 (Thursday, June 19, 2008)]
[Notices]
[Page 34917]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: E8-13886]


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DEPARTMENT OF COMMERCE

International Trade Administration


Ohio State University, et al.; Notice of Consolidated Decision on 
Applications for Duty-Free Entry of Electron Microscopes

    This is a decision consolidated pursuant to Section 6(c) of the 
Educational, Scientific, and Cultural Materials Importation Act of 1966 
(Pub. L. 89-651, 80 Stat. 897; 15 CFR part 301).
    Related records can be viewed between 8:30 a.m. and 5 p.m. in Room 
2104, U.S. Department of Commerce, 14th and Constitution Avenue., NW., 
Washington, DC.
    Docket Number: 08-014. Applicant: Ohio State University, Columbus 
OH 43210. Instrument: Electron Microscope. Manufacturer: FEI Company, 
The Netherlands. Intended Use: See notice at 73 FR 30377.
    Docket Number: 08-015. Applicant: Texas Children's Hospital, 
Houston, TX 77030. Instrument: Transmission Electron Microscope. 
Manufacturer: FEI Company, Czech Republic. Intended Use: See notice at 
73 FR 30377.
    Docket Number: 08-020. Applicant: Bergen County Technical Schools/
Bergen County Academies, Hackensack, NJ 07601. Instrument: Scanning 
Electron Microscope. Manufacturer: FEI Company, Czech Republic. 
Intended Use: See notice at 73 FR 30377.
    Comments: None received. Decision: Approved. No instrument of 
equivalent scientific value to the foreign instrument, for such 
purposes as these instruments are intended to be used, was being 
manufactured in the United States at the time the instruments were 
ordered. Reasons: Each foreign instrument is an electron microscope and 
is intended for research or scientific educational uses requiring an 
electron microscope. We know of no electron microscope, or any other 
instrument suited to these purposes, which was being manufactured in 
the United States at the time of order of each instrument.

    Dated: June 16, 2008.
Faye Robinson,
Director, Statutory Import Programs Staff, Import Administration.
 [FR Doc. E8-13886 Filed 6-18-08; 8:45 am]
BILLING CODE 3510-DS-P