Applications for Duty-Free Entry of Scientific Instruments, 30378 [E8-11761]
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30378
Federal Register / Vol. 73, No. 102 / Tuesday, May 27, 2008 / Notices
including high-temperature
superconductors, high-temperature
metal alloys, evaporated metal films,
silicon-germanium quantum dots, soils
and geological materials and polymers.
The transmission electron microscope
will be used to measure the morphology
and orientation of grains and particles,
as well as the structure, long and short
range ordering, number and type of
defects and the elemental composition
of various phases in the materials.
Application accepted by Commissioner
of Customs: April 28, 2008.
Docket Number: 08–015. Applicant:
Texas Children’s Hospital, 6621 Fannin
St., Houston, TX 77030. Instrument:
Transmission Electron Microscope.
Manufacturer: FEI Company, Czech
Republic. Intended Use: The instrument
is intended to be used to analyze the
ultrastructural features and
characteristics of biomedical and
transgenic research samples. The
instrument will be used for tumor
classification or evaluation of research
protocols for various cancer therapies.
Application accepted by Commissioner
of Customs: April 24, 2008.
Docket Number: 08–020. Applicant:
Bergen County Technical Schools/
Bergen County Academies, 200
Hackensack Ave., Hackensack, NJ
07601. Instrument: Scanning Electron
Microscope. Manufacturer: FEI
Company, Czech Republic. Intended
Use: The instrument is intended to be
used to explore nanoscale materials and
phenomena, to characterize material
composition, orientation and
interactions in 2 and 3 dimensions, and,
in conjunction with lithography, to
create material structures unachievable
through other means. Application
accepted by Commissioner of Customs:
May 2, 2008.
Dated: May 16, 2008.
Faye Robinson,
Director, Statutory Import Programs Staff.
[FR Doc. E8–11563 Filed 5–23–08; 8:45 am]
BILLING CODE 3510–DS–M
DEPARTMENT OF COMMERCE
International Trade Administration
pwalker on PROD1PC71 with NOTICES
Applications for Duty-Free Entry of
Scientific Instruments
Pursuant to Section 6(c) of the
Educational, Scientific and Cultural
Materials Importation Act of 1966 (Pub.
L. 89–651, as amended by Pub. L. 106–
36; 80 Stat. 897; 15 CFR part 301), we
invite comments on the question of
whether instruments of equivalent
scientific value, for the purposes for
which the instruments shown below are
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19:50 May 23, 2008
Jkt 214001
intended to be used, are being
manufactured in the United States.
Comments must comply with 15 CFR
301.5(a)(3) and (4) of the regulations and
be postmarked on or before June 16,
2008. Address written comments to
Statutory Import Programs Staff, Room
2104, U.S. Department of Commerce,
Washington, D.C. 20230. Applications
may be examined between 8:30 A.M.
and 5:00 P.M. at the U.S. Department of
Commerce in Room 2104.
Docket Number: 08–019. Applicant:
Texas Christian University, 2800 South
University Drive, Fort Worth, Texas
76129. Instrument: Electron Microscope,
Model JEM–2100. Manufacturer: JEOL,
Inc., Japan. Intended Use: The
instrument is intended to be used to
study inorganic solid nanostructures
and biological materials, in particular
their structure and composition. These
materials will be structurally
characterized using the electron
microscope and, depending on their
composition, may undergo subsequent
analysis for their optical, electrical, or
biological activity. Application accepted
by Commissioner of Customs: May 5,
2008.
Docket Number: 08–023. Applicant:
Washington University in St. Louis, 1
Brookings Drive, University City, MO
63130. Instrument: Electron Microscope,
Model Tecnai G2 Spirit Twin.
Manufacturer: FEI Company, Czech
Republic. Intended Use: The instrument
is intended to be used to analyze the
surface morphology, shape, size, size–
distribution, uniformity and chemical
composition of various materials,
including nanostructured metals, metal–
oxides, semiconductors, polymers,
polymer fibers and biological materials.
Application accepted by Commissioner
of Customs: May 14, 2008.
Docket Number: 08–024. Applicant:
Washington University in St. Louis, 1
Brookings Drive, University City, MO
63130. Instrument: Electron Microscope,
Model Nova NanoSEM 230 .
Manufacturer: FEI Company, Czech
Republic. Intended Use: The instrument
is intended to be used to analyze the
surface morphology, shape, size, size–
distribution, uniformity and chemical
composition of various materials,
including nanostructured metals, metal–
oxides, semiconductors, polymers,
polymer fibers and biological materials.
Application accepted by Commissioner
of Customs: May 14, 2008.
Dated: May 21, 2008.
Faye Robinson,
Director, Statutory Import Programs Staff.
[FR Doc. E8–11761 Filed 5–23–08; 8:45 am]
BILLING CODE 3510–DS–S
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DEPARTMENT OF COMMERCE
International Trade Administration
(A–412–801)
Ball Bearings and Parts Thereof from
the United Kingdom: Preliminary
Results of Changed-Circumstances
Review
Import Administration,
International Trade Administration,
Department of Commerce.
SUMMARY: The Department of Commerce
is conducting a changed–circumstances
review of the antidumping duty order
on ball bearings and parts thereof from
the United Kingdom pursuant to section
751(b) of the Tariff Act of 1930, as
amended. We preliminarily determine
that SKF (UK) Ltd. is the successor–ininterest to SNFA Bearings Ltd.
Interested parties are invited to
comment on these preliminary results.
EFFECTIVE DATE: May 27, 2008.
FOR FURTHER INFORMATION CONTACT:
Kristin Case at (202) 482–3174 or
Richard Rimlinger at (202) 482–4477,
AD/CVD Operations, Office 5, Import
Administration, International Trade
Administration, U.S. Department of
Commerce, 14th Street and Constitution
Avenue, NW, Washington, DC 20230.
SUPPLEMENTARY INFORMATION:
AGENCY:
Background
The Department of Commerce (the
Department) published an antidumping
duty order on ball bearings and parts
thereof from the United Kingdom on
May 15, 1989. See Antidumping Duty
Orders and Amendments to the Final
Determinations of Sales at Less Than
Fair Value: Ball Bearings and
Cylindrical Roller Bearings and Parts
Thereof From the United Kingdom, 54
FR 20910 (May 15, 1989). On July 12,
2001, the Department revoked the
antidumping duty order on ball bearings
and parts thereof from the United
Kingdom with respect to SNFA Bearings
Ltd. (SNFA UK). See Antifriction
Bearings (Other Than Tapered Roller
Bearings) and Parts Thereof From
France, Germany, Italy, Japan, Sweden,
and the United Kingdom: Final Results
of Antidumping Duty Administrative
Reviews and Revocation of Orders in
Part, 66 FR 36551 (July 12, 2001).
On January 26, 2007, SNFA UK, a
subsidiary of SNFA S.A.S.U. (SNFA),
and SKF UK Ltd. (SKF UK) notified the
Department of a change in ownership of
SNFA. Specifically, SNFA UK and SKF
UK notified the Department that, on July
4, 2006, through its subsidiary SKF
Holding France S.A., AB SKF purchased
all outstanding shares of SNFA. On
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27MYN1
Agencies
[Federal Register Volume 73, Number 102 (Tuesday, May 27, 2008)]
[Notices]
[Page 30378]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: E8-11761]
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DEPARTMENT OF COMMERCE
International Trade Administration
Applications for Duty-Free Entry of Scientific Instruments
Pursuant to Section 6(c) of the Educational, Scientific and
Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended
by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments
on the question of whether instruments of equivalent scientific value,
for the purposes for which the instruments shown below are intended to
be used, are being manufactured in the United States.
Comments must comply with 15 CFR 301.5(a)(3) and (4) of the
regulations and be postmarked on or before June 16, 2008. Address
written comments to Statutory Import Programs Staff, Room 2104, U.S.
Department of Commerce, Washington, D.C. 20230. Applications may be
examined between 8:30 A.M. and 5:00 P.M. at the U.S. Department of
Commerce in Room 2104.
Docket Number: 08-019. Applicant: Texas Christian University, 2800
South University Drive, Fort Worth, Texas 76129. Instrument: Electron
Microscope, Model JEM-2100. Manufacturer: JEOL, Inc., Japan. Intended
Use: The instrument is intended to be used to study inorganic solid
nanostructures and biological materials, in particular their structure
and composition. These materials will be structurally characterized
using the electron microscope and, depending on their composition, may
undergo subsequent analysis for their optical, electrical, or
biological activity. Application accepted by Commissioner of Customs:
May 5, 2008.
Docket Number: 08-023. Applicant: Washington University in St.
Louis, 1 Brookings Drive, University City, MO 63130. Instrument:
Electron Microscope, Model Tecnai G2 Spirit Twin. Manufacturer: FEI
Company, Czech Republic. Intended Use: The instrument is intended to be
used to analyze the surface morphology, shape, size, size-distribution,
uniformity and chemical composition of various materials, including
nanostructured metals, metal-oxides, semiconductors, polymers, polymer
fibers and biological materials. Application accepted by Commissioner
of Customs: May 14, 2008.
Docket Number: 08-024. Applicant: Washington University in St.
Louis, 1 Brookings Drive, University City, MO 63130. Instrument:
Electron Microscope, Model Nova NanoSEM 230 . Manufacturer: FEI
Company, Czech Republic. Intended Use: The instrument is intended to be
used to analyze the surface morphology, shape, size, size-distribution,
uniformity and chemical composition of various materials, including
nanostructured metals, metal-oxides, semiconductors, polymers, polymer
fibers and biological materials. Application accepted by Commissioner
of Customs: May 14, 2008.
Dated: May 21, 2008.
Faye Robinson,
Director, Statutory Import Programs Staff.
[FR Doc. E8-11761 Filed 5-23-08; 8:45 am]
BILLING CODE 3510-DS-S