Applications for Duty-Free Entry of Scientific Instruments, 30377-30378 [E8-11563]

Download as PDF Federal Register / Vol. 73, No. 102 / Tuesday, May 27, 2008 / Notices pwalker on PROD1PC71 with NOTICES address for the HVS data is www.census.gov/hhes/www/housing/ hvs/hvs.html. Several other government agencies use these data on a continuing basis, for example, the Bureau of Economic Analysis uses the HVS data in calculating consumer expenditures for housing as a component of the gross domestic product; the Department of Housing and Urban Development relies on the HVS data to measure the adequacy of the supply of rental and homeowner units and works with the White House in measuring homeownership for minorities. The National Association of Home Builders, the National Association of Realtors, the Federal National Mortgage Association, the Federal Reserve Board, the Home Loan Mortgage Corporation, and the American Federation of Labor-Congress of Industrial Organizations (AFL–CIO) are among the many users in the private sector who routinely use the HVS data in making policy decisions relating to the housing market. In addition, investment firms use the HVS data to analyze market trends and for economic forecasting. Affected Public: Individuals or households. Frequency: Monthly. Respondent’s Obligation: Voluntary. Legal Authority: Title 13 U.S.C., Section 182. OMB Desk Officer: Brian HarrisKojetin, (202) 395–7314. Copies of the above information collection proposal can be obtained by calling or writing Diana Hynek, Departmental Paperwork Clearance Officer, (202) 482–0266, Department of Commerce, Room 6625, 14th and Constitution Avenue, NW., Washington, DC 20230 (or via the Internet at dhynek@doc.gov). Written comments and recommendations for the proposed information collection should be sent within 30 days of publication of this notice to Brian Harris-Kojetin, OMB Desk Officer either by fax (202) 395– 7245 or e-mail (bharrisk@omb.eop.gov). Dated: May 20, 2008. Gwellnar Banks, Management Analyst, Office of the Chief Information Officer. [FR Doc. E8–11599 Filed 5–23–08; 8:45 am] BILLING CODE 3510–07–P VerDate Aug<31>2005 17:22 May 23, 2008 Jkt 214001 DEPARTMENT OF COMMERCE International Trade Administration Application for Duty-Free Entry of Scientific Instruments Pursuant to Section 6(c) of the Educational, Scientific and Cultural Materials Importation Act of 1966 (Pub. L. 89–651; as amended by Pub. L. 106– 36; 80 Stat. 897; 15 CFR part 301), we invite comments on the question of whether instruments of equivalent scientific value, for the purposes for which the instruments shown below are intended to be used, are being manufactured in the United States. Comments must comply with 15 CFR 301.5(a)(3) and (4) of the regulations and be filed within 20 days with the Statutory Import Programs Staff, U.S. Department of Commerce, 14th and Constitution Ave., NW., Room 2104, Washington, DC 20230. Applications may be examined between 8:30 a.m. and 5 p.m. in Room 2104, U.S. Department of Commerce. Docket Number: 08–016. Applicant: University of Colorado, 572 UCB, Boulder, CO 80309–0572. Instrument: Three-Channel Digital Radio Vector Field Sensor (RVFS). Manufacturer: Swedish Institute of Space Physics, Sweden. Intended Use: The instrument is intended to be used in a scientific project on the verification of the theory of multiple scattering of HF signals in the ionosphere with small-scale irregularities. The RVFS must have a capability to work with dipole antennas of two different lengths (1 m and 3 m) and a capability to oversample the output l&Q data. These specifications enable the instrument to operate in both mobile-mount and stationary conditions. Application accepted by Commissioner of Customs: April 30, 2008. Docket Number: 08–017. Applicant: City College of the City University of New York, 160 Convent Ave., New York, NY 10031. Instrument: Ultrabroadband. Ti: Sapphire Laser Model Rainbow-DFG. Manufacturer: Femtolasers, Inc., Austria. Intended Use: The instrument will be used to develop experimental tools necessary to characterize ultrafast phenomena. A unique characteristic of this instrument is that it must generate optical pulses of less than 7 femtoseconds. The amplifier system will be coupled with a 6 femtosecond laser and streak camera system to provide high spatial, high temporal and high spectral resolution for characterization, tunneling and carrier/phonon dynamics studies for nanoscale semiconductor PO 00000 Frm 00003 Fmt 4703 Sfmt 4703 30377 quantum structures and devises. Application accepted by Commissioner of Customs: April 24, 2008. Docket Number: 08–018. Applicant: Washington University, One Brookings Drive, St. Louis, MO 63130. Instrument: Modular Hot Cell—COMECER Model MIP1–1P–1350. Manufacturer: COMECER, Italy. Intended Use: The instrument will be used to evaluate the kinetics, biodistribution stability, dosimetry and safety of PET radiopharmaceuticals i.e., [18F]FHBG. The hot cell MIP1350 will house an automated chemistry module used to synthesize [18F]FHBG. Unique features of this instrument include a sealed enclosure independent of the door as well as stainless steel enclosures. Application accepted by Commissioner of Customs: April 29, 2008. Dated: May 16, 2008. Faye Robinson, Director, Statutory Import Programs Staff, Import Administration. [FR Doc. E8–11561 Filed 5–23–08; 8:45 am] BILLING CODE 3510–DS–M DEPARTMENT OF COMMERCE International Trade Administration Applications for Duty-Free Entry of Scientific Instruments Pursuant to Section 6(c) of the Educational, Scientific and Cultural Materials Importation Act of 1966 (Pub. L. 89–651, as amended by Pub. L. 106– 36; 80 Stat. 897; 15 CFR part 301), we invite comments on the question of whether instruments of equivalent scientific value, for the purposes for which the instruments shown below are intended to be used, are being manufactured in the United States. Comments must comply with 15 CFR 301.5(a)(3) and (4) of the regulations and be postmarked on or before June 16, 2008. Address written comments to Statutory Import Programs Staff, Room 2104, U.S. Department of Commerce, Washington, DC 20230. Applications may be examined between 8:30 a.m. and 5 p.m. at the U.S. Department of Commerce in Room 2104. Docket Number: 08–014. Applicant: Ohio State University, Materials Science and Engineering, 2041 College Rd., Columbus, OH 43210. Instrument: Transmission Electron Microscope. Manufacturer: FEI Company/Philips Electron Optics, the Netherlands. Intended Use: The instrument is intended to be used to study different types of solid state materials. It will be used for general morphological and structural studies of ceramics, metals, E:\FR\FM\27MYN1.SGM 27MYN1 30378 Federal Register / Vol. 73, No. 102 / Tuesday, May 27, 2008 / Notices including high-temperature superconductors, high-temperature metal alloys, evaporated metal films, silicon-germanium quantum dots, soils and geological materials and polymers. The transmission electron microscope will be used to measure the morphology and orientation of grains and particles, as well as the structure, long and short range ordering, number and type of defects and the elemental composition of various phases in the materials. Application accepted by Commissioner of Customs: April 28, 2008. Docket Number: 08–015. Applicant: Texas Children’s Hospital, 6621 Fannin St., Houston, TX 77030. Instrument: Transmission Electron Microscope. Manufacturer: FEI Company, Czech Republic. Intended Use: The instrument is intended to be used to analyze the ultrastructural features and characteristics of biomedical and transgenic research samples. The instrument will be used for tumor classification or evaluation of research protocols for various cancer therapies. Application accepted by Commissioner of Customs: April 24, 2008. Docket Number: 08–020. Applicant: Bergen County Technical Schools/ Bergen County Academies, 200 Hackensack Ave., Hackensack, NJ 07601. Instrument: Scanning Electron Microscope. Manufacturer: FEI Company, Czech Republic. Intended Use: The instrument is intended to be used to explore nanoscale materials and phenomena, to characterize material composition, orientation and interactions in 2 and 3 dimensions, and, in conjunction with lithography, to create material structures unachievable through other means. Application accepted by Commissioner of Customs: May 2, 2008. Dated: May 16, 2008. Faye Robinson, Director, Statutory Import Programs Staff. [FR Doc. E8–11563 Filed 5–23–08; 8:45 am] BILLING CODE 3510–DS–M DEPARTMENT OF COMMERCE International Trade Administration pwalker on PROD1PC71 with NOTICES Applications for Duty-Free Entry of Scientific Instruments Pursuant to Section 6(c) of the Educational, Scientific and Cultural Materials Importation Act of 1966 (Pub. L. 89–651, as amended by Pub. L. 106– 36; 80 Stat. 897; 15 CFR part 301), we invite comments on the question of whether instruments of equivalent scientific value, for the purposes for which the instruments shown below are VerDate Aug<31>2005 19:50 May 23, 2008 Jkt 214001 intended to be used, are being manufactured in the United States. Comments must comply with 15 CFR 301.5(a)(3) and (4) of the regulations and be postmarked on or before June 16, 2008. Address written comments to Statutory Import Programs Staff, Room 2104, U.S. Department of Commerce, Washington, D.C. 20230. Applications may be examined between 8:30 A.M. and 5:00 P.M. at the U.S. Department of Commerce in Room 2104. Docket Number: 08–019. Applicant: Texas Christian University, 2800 South University Drive, Fort Worth, Texas 76129. Instrument: Electron Microscope, Model JEM–2100. Manufacturer: JEOL, Inc., Japan. Intended Use: The instrument is intended to be used to study inorganic solid nanostructures and biological materials, in particular their structure and composition. These materials will be structurally characterized using the electron microscope and, depending on their composition, may undergo subsequent analysis for their optical, electrical, or biological activity. Application accepted by Commissioner of Customs: May 5, 2008. Docket Number: 08–023. Applicant: Washington University in St. Louis, 1 Brookings Drive, University City, MO 63130. Instrument: Electron Microscope, Model Tecnai G2 Spirit Twin. Manufacturer: FEI Company, Czech Republic. Intended Use: The instrument is intended to be used to analyze the surface morphology, shape, size, size– distribution, uniformity and chemical composition of various materials, including nanostructured metals, metal– oxides, semiconductors, polymers, polymer fibers and biological materials. Application accepted by Commissioner of Customs: May 14, 2008. Docket Number: 08–024. Applicant: Washington University in St. Louis, 1 Brookings Drive, University City, MO 63130. Instrument: Electron Microscope, Model Nova NanoSEM 230 . Manufacturer: FEI Company, Czech Republic. Intended Use: The instrument is intended to be used to analyze the surface morphology, shape, size, size– distribution, uniformity and chemical composition of various materials, including nanostructured metals, metal– oxides, semiconductors, polymers, polymer fibers and biological materials. Application accepted by Commissioner of Customs: May 14, 2008. Dated: May 21, 2008. Faye Robinson, Director, Statutory Import Programs Staff. [FR Doc. E8–11761 Filed 5–23–08; 8:45 am] BILLING CODE 3510–DS–S PO 00000 Frm 00004 Fmt 4703 Sfmt 4703 DEPARTMENT OF COMMERCE International Trade Administration (A–412–801) Ball Bearings and Parts Thereof from the United Kingdom: Preliminary Results of Changed-Circumstances Review Import Administration, International Trade Administration, Department of Commerce. SUMMARY: The Department of Commerce is conducting a changed–circumstances review of the antidumping duty order on ball bearings and parts thereof from the United Kingdom pursuant to section 751(b) of the Tariff Act of 1930, as amended. We preliminarily determine that SKF (UK) Ltd. is the successor–ininterest to SNFA Bearings Ltd. Interested parties are invited to comment on these preliminary results. EFFECTIVE DATE: May 27, 2008. FOR FURTHER INFORMATION CONTACT: Kristin Case at (202) 482–3174 or Richard Rimlinger at (202) 482–4477, AD/CVD Operations, Office 5, Import Administration, International Trade Administration, U.S. Department of Commerce, 14th Street and Constitution Avenue, NW, Washington, DC 20230. SUPPLEMENTARY INFORMATION: AGENCY: Background The Department of Commerce (the Department) published an antidumping duty order on ball bearings and parts thereof from the United Kingdom on May 15, 1989. See Antidumping Duty Orders and Amendments to the Final Determinations of Sales at Less Than Fair Value: Ball Bearings and Cylindrical Roller Bearings and Parts Thereof From the United Kingdom, 54 FR 20910 (May 15, 1989). On July 12, 2001, the Department revoked the antidumping duty order on ball bearings and parts thereof from the United Kingdom with respect to SNFA Bearings Ltd. (SNFA UK). See Antifriction Bearings (Other Than Tapered Roller Bearings) and Parts Thereof From France, Germany, Italy, Japan, Sweden, and the United Kingdom: Final Results of Antidumping Duty Administrative Reviews and Revocation of Orders in Part, 66 FR 36551 (July 12, 2001). On January 26, 2007, SNFA UK, a subsidiary of SNFA S.A.S.U. (SNFA), and SKF UK Ltd. (SKF UK) notified the Department of a change in ownership of SNFA. Specifically, SNFA UK and SKF UK notified the Department that, on July 4, 2006, through its subsidiary SKF Holding France S.A., AB SKF purchased all outstanding shares of SNFA. On E:\FR\FM\27MYN1.SGM 27MYN1

Agencies

[Federal Register Volume 73, Number 102 (Tuesday, May 27, 2008)]
[Notices]
[Pages 30377-30378]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: E8-11563]


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DEPARTMENT OF COMMERCE

International Trade Administration


Applications for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended 
by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments 
on the question of whether instruments of equivalent scientific value, 
for the purposes for which the instruments shown below are intended to 
be used, are being manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be postmarked on or before June 16, 2008. Address 
written comments to Statutory Import Programs Staff, Room 2104, U.S. 
Department of Commerce, Washington, DC 20230. Applications may be 
examined between 8:30 a.m. and 5 p.m. at the U.S. Department of 
Commerce in Room 2104.
    Docket Number: 08-014. Applicant: Ohio State University, Materials 
Science and Engineering, 2041 College Rd., Columbus, OH 43210. 
Instrument: Transmission Electron Microscope. Manufacturer: FEI 
Company/Philips Electron Optics, the Netherlands. Intended Use: The 
instrument is intended to be used to study different types of solid 
state materials. It will be used for general morphological and 
structural studies of ceramics, metals,

[[Page 30378]]

including high-temperature superconductors, high-temperature metal 
alloys, evaporated metal films, silicon-germanium quantum dots, soils 
and geological materials and polymers. The transmission electron 
microscope will be used to measure the morphology and orientation of 
grains and particles, as well as the structure, long and short range 
ordering, number and type of defects and the elemental composition of 
various phases in the materials. Application accepted by Commissioner 
of Customs: April 28, 2008.
    Docket Number: 08-015. Applicant: Texas Children's Hospital, 6621 
Fannin St., Houston, TX 77030. Instrument: Transmission Electron 
Microscope. Manufacturer: FEI Company, Czech Republic. Intended Use: 
The instrument is intended to be used to analyze the ultrastructural 
features and characteristics of biomedical and transgenic research 
samples. The instrument will be used for tumor classification or 
evaluation of research protocols for various cancer therapies. 
Application accepted by Commissioner of Customs: April 24, 2008.
    Docket Number: 08-020. Applicant: Bergen County Technical Schools/
Bergen County Academies, 200 Hackensack Ave., Hackensack, NJ 07601. 
Instrument: Scanning Electron Microscope. Manufacturer: FEI Company, 
Czech Republic. Intended Use: The instrument is intended to be used to 
explore nanoscale materials and phenomena, to characterize material 
composition, orientation and interactions in 2 and 3 dimensions, and, 
in conjunction with lithography, to create material structures 
unachievable through other means. Application accepted by Commissioner 
of Customs: May 2, 2008.

     Dated: May 16, 2008.
Faye Robinson,
Director, Statutory Import Programs Staff.
[FR Doc. E8-11563 Filed 5-23-08; 8:45 am]
BILLING CODE 3510-DS-M

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