Notice of Inventions Available for Licensing, 15738 [E8-6029]
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Federal Register / Vol. 73, No. 58 / Tuesday, March 25, 2008 / Notices
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represented; and
• Rank/seniority of the designated
company representative.
Any partisan political activities of an
applicant, including political
contributions, will be entirely irrelevant
to the selection process.
The mission will be promoted
through the following venues: ITA’s
Export Assistance Centers, the Health
and Consumer Goods team, the Service
Industries team, the Asia Pacific Team,
the Trade Events List https://
www.export.gov; the Federal Register;
relevant trade associations; past
Commerce health-care policy event
participants; and the Commerce
Department trade missions calendar:
https://www.ita.doc.gov/doctm/
tmcal.html.
Recruitment will begin immediately
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trade mission participation fee will be
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transportation, or some meals.
Participation is open to 15 qualified
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must submit the trade mission
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mission. After that time, other
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FOR FURTHER INFORMATION CONTACT:
Anthony Cino, U.S. Department of
Commerce, e-mail:
anthony_cino@ita.doc.gov, telephone:
VerDate Aug<31>2005
18:33 Mar 24, 2008
Jkt 214001
202–482–5679, facsimile: 202–482–
2266.
Anthony Cino,
Office of the Chinese Economic Area,
International Trade Administration, U.S.
Department of Commerce.
[FR Doc. E8–5935 Filed 3–24–08; 8:45 am]
BILLING CODE 3510–25–P
DEPARTMENT OF COMMERCE
National Institute of Standards and
Technology
Notice of Inventions Available for
Licensing
National Institute of Standards
and Technology, Commerce.
ACTION: Notice of inventions available
for licensing.
AGENCY:
SUMMARY: The inventions listed below
are owned in whole or in part by the
U.S. Government, as represented by the
Secretary of Commerce. The U.S.
Government’s interest in these
inventions is available for licensing in
accordance with 35 U.S.C. 207 and 37
CFR part 404 to achieve expeditious
commercialization of results of federally
funded research and development.
FOR FURTHER INFORMATION CONTACT:
Technical and licensing information on
these inventions may be obtained by
writing to: National Institute of
Standards and Technology, Office of
Technology Partnerships, Attn: Mary
Clague, Building 222, Room A155,
Gaithersburg, MD 20899. Information is
also available via telephone: 301–975–
4188, fax 301–975–3482, or e-mail:
mary.clague@nist.gov. Any request for
information should include the NIST
Docket number and title for the
invention as indicated below.
SUPPLEMENTARY INFORMATION: NIST may
enter into a Cooperative Research and
Development Agreement (‘‘CRADA’’)
with the licensee to perform further
research on the invention for purposes
of commercialization. The inventions
available for licensing are:
[NIST DOCKET NUMBER: 7–003]
Title: Highly Charged Ion Modified
Oxides (HCIMO) for Tunable Resistance.
Abstract: Highly Charged Ion
Modified Oxides (HCIMO) are achieved
by irradiating a thin, high resistance
oxide with highly charged ions (HCIs)
and then depositing a conducting
material of choice on top the irradiated
oxide. The irradiation by HCIs
preferentially ablates a region on the
order of a cubic nanometer at each HCI’s
impact site breaking a hole through the
ultra-thin oxide. This is demonstrated
PO 00000
Frm 00021
Fmt 4703
Sfmt 4703
by preparing an insulating layer of
aluminum oxide on a cobalt lower
electrode layer, exposing the oxide to
very dilute HCI radiation, and then
depositing a cobalt upper layer. The
data show a clear and systematic
decrease in the resistance of the
multilayer devices correlated to the HCI
dose at very dilute doses. The
nanometer dimensions of individual
HCI impacts and the precise control
over the dose combine to allow high
precision selection of the material’s
resistance over a wide range of values,
currently demonstrated over three
orders of magnitude. As HCI
modification only occurs within a few
nanometers of the surface and generally
does not affect metals, no special
measures are needed to protect
surrounding device structures from HCI
damage. Since the size of the material
modification is determined by the
properties of a single ion, precise
alignment is not required, only uniform
illumination of the device area by the
HCI beam, greatly simplifying
commercial integration of HCI
irradiation.
[NIST DOCKET NUMBER: 7–008]
Title: A Four-Wave Mixing Source of
Squeezed Light for Image Processing
and Interferometry
Abstract: The invention provides a
source of squeezed light, generated
using a 4-level, four-wave mixing
scheme in rubidium vapor. Strong
relative-number squeezing between two
beams has been demonstrated; much
stronger than previously seen in any
four-wave mixing system. The scheme
relies on a chi(3) nonlinearity, and a
single-pass, no-cavity, experimental
implementation which has relaxed
phase matching requirements, as
compared to chi(2) crystal sources, and
easily produces squeezing in multiple
spatial modes.
Dated: March 18, 2008.
Richard F. Kayser,
Acting Deputy Director.
[FR Doc. E8–6029 Filed 3–24–08; 8:45 am]
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[Federal Register Volume 73, Number 58 (Tuesday, March 25, 2008)]
[Notices]
[Page 15738]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: E8-6029]
-----------------------------------------------------------------------
DEPARTMENT OF COMMERCE
National Institute of Standards and Technology
Notice of Inventions Available for Licensing
AGENCY: National Institute of Standards and Technology, Commerce.
ACTION: Notice of inventions available for licensing.
-----------------------------------------------------------------------
SUMMARY: The inventions listed below are owned in whole or in part by
the U.S. Government, as represented by the Secretary of Commerce. The
U.S. Government's interest in these inventions is available for
licensing in accordance with 35 U.S.C. 207 and 37 CFR part 404 to
achieve expeditious commercialization of results of federally funded
research and development.
FOR FURTHER INFORMATION CONTACT: Technical and licensing information on
these inventions may be obtained by writing to: National Institute of
Standards and Technology, Office of Technology Partnerships, Attn: Mary
Clague, Building 222, Room A155, Gaithersburg, MD 20899. Information is
also available via telephone: 301-975-4188, fax 301-975-3482, or e-
mail: mary.clague@nist.gov. Any request for information should include
the NIST Docket number and title for the invention as indicated below.
SUPPLEMENTARY INFORMATION: NIST may enter into a Cooperative Research
and Development Agreement (``CRADA'') with the licensee to perform
further research on the invention for purposes of commercialization.
The inventions available for licensing are:
[NIST DOCKET NUMBER: 7-003]
Title: Highly Charged Ion Modified Oxides (HCIMO) for Tunable
Resistance.
Abstract: Highly Charged Ion Modified Oxides (HCIMO) are achieved
by irradiating a thin, high resistance oxide with highly charged ions
(HCIs) and then depositing a conducting material of choice on top the
irradiated oxide. The irradiation by HCIs preferentially ablates a
region on the order of a cubic nanometer at each HCI's impact site
breaking a hole through the ultra-thin oxide. This is demonstrated by
preparing an insulating layer of aluminum oxide on a cobalt lower
electrode layer, exposing the oxide to very dilute HCI radiation, and
then depositing a cobalt upper layer. The data show a clear and
systematic decrease in the resistance of the multilayer devices
correlated to the HCI dose at very dilute doses. The nanometer
dimensions of individual HCI impacts and the precise control over the
dose combine to allow high precision selection of the material's
resistance over a wide range of values, currently demonstrated over
three orders of magnitude. As HCI modification only occurs within a few
nanometers of the surface and generally does not affect metals, no
special measures are needed to protect surrounding device structures
from HCI damage. Since the size of the material modification is
determined by the properties of a single ion, precise alignment is not
required, only uniform illumination of the device area by the HCI beam,
greatly simplifying commercial integration of HCI irradiation.
[NIST DOCKET NUMBER: 7-008]
Title: A Four-Wave Mixing Source of Squeezed Light for Image
Processing and Interferometry
Abstract: The invention provides a source of squeezed light,
generated using a 4-level, four-wave mixing scheme in rubidium vapor.
Strong relative-number squeezing between two beams has been
demonstrated; much stronger than previously seen in any four-wave
mixing system. The scheme relies on a chi(3) nonlinearity, and a
single-pass, no-cavity, experimental implementation which has relaxed
phase matching requirements, as compared to chi(2) crystal sources, and
easily produces squeezing in multiple spatial modes.
Dated: March 18, 2008.
Richard F. Kayser,
Acting Deputy Director.
[FR Doc. E8-6029 Filed 3-24-08; 8:45 am]
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