Battelle Memorial Institute, et al.; Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscopes, 68568 [E7-23576]

Download as PDF 68568 Federal Register / Vol. 72, No. 233 / Wednesday, December 5, 2007 / Notices investigation. Note, however, that one rate is calculated for the exporter and all of the producers which supplied subject merchandise to it during the period of investigation. This practice applies both to mandatory respondents receiving an individually calculated separate rate as well as the pool of non– investigated firms receiving the weighted–average of the individually calculated rates. This practice is referred to as the application of ‘‘combination rates’’ because such rates apply to specific combinations of exporters and one or more producers. The cash– deposit rate assigned to an exporter will apply only to merchandise both exported by the firm in question and produced by a firm that supplied the exporter during the period of investigation. (Emphasis added.) Separate Rates and Combination Rates Bulletin, at page 6. Dated: November 28, 2007. David M. Spooner, Assistant Secretary for Import Administration. [FR Doc. E7–23489 Filed 12–4–07; 8:45 am] Distribution of Copies of the Petitions Docket Number: 07–062. Applicant: Battelle Memorial Institute, Richland, WA 99354. Instrument: Electron Microscope, Model FIB/SEM. Manufacturer: FEI Company, Netherlands. Intended Use: See notice at 72 FR 63875, November 13, 2007. Docket Number: 07–063. Applicant: University of California, San Diego, La Jolla, CA 92093–0608. Instrument: Electron Microscope, Model Titan 80–300 C-Twin STEM. Manufacturer: FEI Company, Netherlands. Intended Use: See notice at 72 FR 63875, November 13, 2007. Docket Number: 07–066. Applicant: St. Jude Children’s Research Hospital, Memphis, TN 38105. Instrument: Electron Microscope, Model Tecnai G2 F20 TWIN. Manufacturer: FEI Company, Netherlands. Intended Use: See notice at 72 FR 63875, November 13, 2007. Docket Number: 07–067. Applicant: National Institute for Occupational Safety and Health, Cincinnati, OH 45226. Instrument: Electron Microscope, Model JEM–2100F. Manufacturer: Jeol Ltd., Japan. Intended Use: See notice at 72 FR 63875, November 13, 2007. Comments: None received. Decision: Approved. No instrument of equivalent scientific value to the foreign instrument, for such purposes as these instruments are intended to be used, was being manufactured in the United States at the time the instruments were ordered. Reasons: Each foreign instrument is an electron microscope and is intended for research or scientific educational uses requiring an electron microscope. We know of no electron microscope, or any other instrument suited to these purposes, which was being In accordance with section 732(b)(3)(A) of the Act and 19 CFR 351.202(f), copies of the public versions of the petitions have been provided to the representatives of the Governments of Germany and the PRC. We will attempt to provide a copy of the public version of the petitions to the foreign producers/exporters, consistent with 19 CFR 351.203(c)(2). International Trade Commission Notification We have notified the ITC of our initiations, as required by section 732(d) of the Act. mstockstill on PROD1PC66 with NOTICES Preliminary Determinations by the International Trade Commission The ITC will preliminarily determine, no later than December 24, 2007, whether there is a reasonable indication that imports of sodium nitrite from Germany and the PRC are materially injuring, or threatening material injury to, a U.S. industry. A negative ITC determination with respect to either of the investigations will result in that investigation being terminated; otherwise, these investigations will proceed according to statutory and regulatory time limits. This notice is issued and published pursuant to section 777(i) of the Act. VerDate Aug<31>2005 19:05 Dec 04, 2007 Jkt 214001 BILLING CODE 3510–DS–S manufactured in the United States at the time of order of each instrument. Faye Robinson, Director, Statutory Import Programs Staff, Import Administration. [FR Doc. E7–23576 Filed 12–4–07; 8:45 am] BILLING CODE 3510–DS–P DEPARTMENT OF COMMERCE DEPARTMENT OF COMMERCE International Trade Administration Battelle Memorial Institute, et al.; Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscopes This is a decision consolidated pursuant to Section 6(c) of the Educational, Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89–651, as amended by Pub. L. 106– 36, 80 Stat. 897; 15 CFR part 301). Related records can be viewed between 8:30 a.m. and 5 p.m. in Room 2104, U.S. Department of Commerce, 14th and Constitution Avenue, NW., Washington, DC. PO 00000 Frm 00016 Fmt 4703 Sfmt 4703 International Trade Administration [C–570–926] Sodium Nitrite from the People’s Republic of China: Initiation of Countervailing Duty Investigation Import Administration, International Trade Administration, Department of Commerce. EFFECTIVE DATE: (December 5, 2007. FOR FURTHER INFORMATION CONTACT: Sean Carey or Gene Calvert, AD/CVD Operations, Office 6, Import Administration, International Trade Administration, U.S. Department of Commerce, 14th Street and Constitution Avenue, N.W., Washington, D.C. 20230; telephone: (202) 482–3964 and (202) 482–3586, respectively. SUPPLEMENTARY INFORMATION: AGENCY: Initiation of Investigation: The Petition On November 8, 2007, the Department of Commerce (the Department) received a petition filed in proper form by General Chemical LLC (petitioner). On November 14 and November 15, 2007, the Department issued requests for additional information and clarification of certain areas of the petition involving general issues and the countervailable subsidy allegations, respectively. Based on the Department’s request, petitioner filed additional information concerning the petition on November 19 and November 20, 2007. In accordance with section 702(b)(1) of the Tariff Act of 1930, as amended (the Act), petitioner alleges that manufacturers, producers, or exporters of sodium nitrite in the People’s Republic of China (the PRC) received countervailable subsidies within the meaning of section 701 of the Act, and that such imports are materially injuring or threatening material injury to an industry in the United States. The Department finds that petitioner filed this petition on behalf of the domestic industry because it is an interested party as defined in section 771(9)(C) of the Act, and petitioner has demonstrated sufficient industry support with respect to the countervailing duty investigation that it E:\FR\FM\05DEN1.SGM 05DEN1

Agencies

[Federal Register Volume 72, Number 233 (Wednesday, December 5, 2007)]
[Notices]
[Page 68568]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: E7-23576]


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DEPARTMENT OF COMMERCE

International Trade Administration


Battelle Memorial Institute, et al.; Notice of Consolidated 
Decision on Applications for Duty-Free Entry of Electron Microscopes

    This is a decision consolidated pursuant to Section 6(c) of the 
Educational, Scientific, and Cultural Materials Importation Act of 1966 
(Pub. L. 89-651, as amended by Pub. L. 106-36, 80 Stat. 897; 15 CFR 
part 301). Related records can be viewed between 8:30 a.m. and 5 p.m. 
in Room 2104, U.S. Department of Commerce, 14th and Constitution 
Avenue, NW., Washington, DC.

    Docket Number: 07-062. Applicant: Battelle Memorial Institute, 
Richland, WA 99354. Instrument: Electron Microscope, Model FIB/SEM. 
Manufacturer: FEI Company, Netherlands. Intended Use: See notice at 
72 FR 63875, November 13, 2007.

    Docket Number: 07-063. Applicant: University of California, San 
Diego, La Jolla, CA 92093-0608. Instrument: Electron Microscope, 
Model Titan 80-300 C-Twin STEM. Manufacturer: FEI Company, 
Netherlands. Intended Use: See notice at 72 FR 63875, November 13, 
2007.

    Docket Number: 07-066. Applicant: St. Jude Children's Research 
Hospital, Memphis, TN 38105. Instrument: Electron Microscope, Model 
Tecnai G2 F20 TWIN. Manufacturer: FEI Company, Netherlands. Intended 
Use: See notice at 72 FR 63875, November 13, 2007.

    Docket Number: 07-067. Applicant: National Institute for 
Occupational Safety and Health, Cincinnati, OH 45226. Instrument: 
Electron Microscope, Model JEM-2100F. Manufacturer: Jeol Ltd., 
Japan. Intended Use: See notice at 72 FR 63875, November 13, 2007.

    Comments: None received. Decision: Approved. No instrument of 
equivalent scientific value to the foreign instrument, for such 
purposes as these instruments are intended to be used, was being 
manufactured in the United States at the time the instruments were 
ordered. Reasons: Each foreign instrument is an electron microscope 
and is intended for research or scientific educational uses 
requiring an electron microscope. We know of no electron microscope, 
or any other instrument suited to these purposes, which was being 
manufactured in the United States at the time of order of each 
instrument.

Faye Robinson,
Director, Statutory Import Programs Staff, Import Administration.
[FR Doc. E7-23576 Filed 12-4-07; 8:45 am]
BILLING CODE 3510-DS-P

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