Applications for Duty-Free Entry of Scientific Instruments, 46037 [E7-16152]
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Federal Register / Vol. 72, No. 158 / Thursday, August 16, 2007 / Notices
duties occurred and the subsequent
assessment of double antidumping
duties.
Notification Regarding Administrative
Protective Order
This notice also serves as a reminder
to parties subject to administrative
protective orders (APO) of their
responsibility concerning the
disposition of proprietary information
disclosed under APO as explained in
the administrative protective order
itself. Timely written notification of the
return/destruction of APO materials or
conversion to judicial protective order is
hereby requested. Failure to comply
with the regulations and terms of an
APO is a sanctionable violation.
These final results of administrative
review and notice are issued and
published in accordance with sections
751(a)(1) and 777(i)(1) of the Act.
Dated: August 9, 2007.
Joseph A. Spetrini,
Deputy Assistant Secretary for Import
Administration.
[FR Doc. E7–16156 Filed 8–15–07; 8:45 am]
BILLING CODE 3510–DS–S
DEPARTMENT OF COMMERCE
International Trade Administration
rwilkins on PROD1PC63 with NOTICES
Applications for Duty–Free Entry of
Scientific Instruments
Pursuant to Section 6(c) of the
Educational, Scientific and Cultural
Materials Importation Act of 1966 (Pub.
L. 89–651; as amended by Pub. L. 106–
36; 80 Stat. 897; 15 CFR part 301), we
invite comments on the question of
whether instruments of equivalent
scientific value, for the purposes for
which the instruments shown below are
intended to be used, are being
manufactured in the United States.
Comments must comply with 15 CFR
301.5(a)(3) and (4) of the regulations and
be filed within 20 days with the
Statutory Import Programs Staff, U.S.
Department of Commerce 14th and
Constitution Ave., NW, Room 2104
Washington, D.C. 20230. Applications
may be examined between 8:30 A.M.
and 5:00 P.M. in Room 2104, U.S.
Department of Commerce.
Docket Number: 07–051. Applicant:
Colorado College, Department of
Physics, 14 E. Cache la Poudre,
Colorado Springs, CO 80903 Instrument:
Low Temperature Ulta–High Vacuum
Scanning Tunneling Microscope.
Manufacturer: Omicron Nanotechnology
GmbH, Germany Intended Use: The
instrument is intended to be used in a
collaborative project with NIST to
VerDate Aug<31>2005
18:41 Aug 15, 2007
Jkt 211001
develop a Josephson–junction based
quantum computer. The instrument will
provide detailed maps of the electron
density of the materials as a function of
spacial position and energy. Since
electrical conductivity derives from
electron density, the maps will allow
study of how well electrons are locally
conducted through various materials.
The instrument provides: (a) A scanning
tunneling microscope mounted inside a
4 K liquid helium reservoir (with a 22–
hour liquid helium refill time); (b)
Operation at an equilibrium temperature
of 4 K with in–situ sample preparation
and tip transfer capability); (c) Low drift
rates of 1 angstrom/hour (d) RMS
vibration amplitudes of <0.005 angstrom
in a 300 Hz bandwidth; and (e) Sample
registry after deposition. Application
accepted by Commissioner of Customs:
July 31, 2007.
Docket Number: 07–053. Applicant:
University of Kentucky, Dept. Civil
Engineering, 161 Raymond Building,
Lexington, KY 40506 Instrument: Soil
Stiffness Testing System. Manufacturer:
GDS Instruments, Ltd., UK. Intended
Use: The instrument is intended to be
used to measure soil stiffness at very
small strains in a specially modified
automated triaxial test apparatus. These
measurements are critical to
understanding and consequently
predicting soil behavior for all
geotechnical systems.
The instrument provides a vertically
propagating S–wave transmitter and a
P–wave receiver along with a vertically
propagating P–wave transmitter and S–
wave receiver and a master signal
conditioning unit along with GDSBES
software to control data acquisition and
drive signal generation for S and P wave
velocity tests as well as a Hall effect
local strain set (2 axial,1 radial)and
mid–plane pore pressure kit. No
domestic sources making similar
devices provide an integrated system of
this type of testing with the resolution
required for advanced geotechnical
research. Application accepted by
Commissioner of Customs: August 3,
2007.
Faye Robinson,
Director, Statutory Import Programs Staff,
Import Administration.
[FR Doc. E7–16152 Filed 8–15–07; 8:45 am]
BILLING CODE 3510–DS–S
PO 00000
46037
DEPARTMENT OF COMMERCE
International Trade Administration
Applications for Duty–Free Entry of
Scientific Instruments
Pursuant to Section 6(c) of the
Educational, Scientific and Cultural
Materials Importation Act of 1966 (Pub.
L. 89–651, as amended by Pub. L. 106–
36; 80 Stat. 897; 15 CFR part 301), we
invite comments on the question of
whether instruments of equivalent
scientific value, for the purposes for
which the instruments shown below are
intended to be used, are being
manufactured in the United States.
Comments must comply with 15 CFR
301.5(a)(3) and (4) of the regulations and
be filed within 20 days with Statutory
Import Programs Staff, U.S. Department
of Commerce, Room 2104, 14th and
Constitution Ave., Washington, D.C.
20230. Applications may be examined
between 8:30 A.M. and 5:00 P.M. in
Room 2104, U.S. Department of
Commerce.
Docket Number: 07–047. Applicant:
University of Southern California,
University Park, Los Angeles, CA 90089.
Instrument: Electron Microscope, Model
JEM–1400. Manufacturer: JEOL, Ltd.,
Japan. Intended Use: The instrument is
intended to be used to decipher local
structural organization in cells and
tissues, to visualize the shapes of
proteins as they undergo conformational
reorganization into elongated amyloid
fibrils and other spherical structures
and to investigate other larger molecular
nano- particles. Application accepted by
Commissioner of Customs: June 18,
2007.
Docket Number: 07–050. Applicant:
University of Massachusetts Medical
School, 55 Lake Avenue North
Worcester, MA 01655. Instrument:
Electron Microscope, Model Quanta 200
FEG . Manufacturer: FEI Company,
Czech Republic Intended Use: The
instrument is intended to be used to
study the distribution of cilia on cell
surfaces, the structure of bone cells in
healthy and diseased bone, the structure
of fly antennae in flies with mutations
homologous to human disease
mutations, the structure of mouse
embryos, the means of entry of
pathogens into cells and the distribution
of cell surface receptors involved in the
immune response and various other
biological issues. Application accepted
by Commissioner of Customs: July 23,
2007.
Docket Number: 07–049. Applicant:
Indiana University, 400 East Seventh
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[Federal Register Volume 72, Number 158 (Thursday, August 16, 2007)]
[Notices]
[Page 46037]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: E7-16152]
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DEPARTMENT OF COMMERCE
International Trade Administration
Applications for Duty-Free Entry of Scientific Instruments
Pursuant to Section 6(c) of the Educational, Scientific and Cultural
Materials Importation Act of 1966 (Pub. L. 89-651; as amended by Pub.
L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments on the
question of whether instruments of equivalent scientific value, for the
purposes for which the instruments shown below are intended to be used,
are being manufactured in the United States.
Comments must comply with 15 CFR 301.5(a)(3) and (4) of the regulations
and be filed within 20 days with the Statutory Import Programs Staff,
U.S. Department of Commerce 14th and Constitution Ave., NW, Room 2104
Washington, D.C. 20230. Applications may be examined between 8:30 A.M.
and 5:00 P.M. in Room 2104, U.S. Department of Commerce.
Docket Number: 07-051. Applicant: Colorado College, Department of
Physics, 14 E. Cache la Poudre, Colorado Springs, CO 80903 Instrument:
Low Temperature Ulta-High Vacuum Scanning Tunneling Microscope.
Manufacturer: Omicron Nanotechnology GmbH, Germany Intended Use: The
instrument is intended to be used in a collaborative project with NIST
to develop a Josephson-junction based quantum computer. The instrument
will provide detailed maps of the electron density of the materials as
a function of spacial position and energy. Since electrical
conductivity derives from electron density, the maps will allow study
of how well electrons are locally conducted through various materials.
The instrument provides: (a) A scanning tunneling microscope mounted
inside a 4 K liquid helium reservoir (with a 22-hour liquid helium
refill time); (b) Operation at an equilibrium temperature of 4 K with
in-situ sample preparation and tip transfer capability); (c) Low drift
rates of 1 angstrom/hour (d) RMS vibration amplitudes of <0.005
angstrom in a 300 Hz bandwidth; and (e) Sample registry after
deposition. Application accepted by Commissioner of Customs: July 31,
2007.
Docket Number: 07-053. Applicant: University of Kentucky, Dept. Civil
Engineering, 161 Raymond Building, Lexington, KY 40506 Instrument: Soil
Stiffness Testing System. Manufacturer: GDS Instruments, Ltd., UK.
Intended Use: The instrument is intended to be used to measure soil
stiffness at very small strains in a specially modified automated
triaxial test apparatus. These measurements are critical to
understanding and consequently predicting soil behavior for all
geotechnical systems.
The instrument provides a vertically propagating S-wave transmitter and
a P-wave receiver along with a vertically propagating P-wave
transmitter and S-wave receiver and a master signal conditioning unit
along with GDSBES software to control data acquisition and drive signal
generation for S and P wave velocity tests as well as a Hall effect
local strain set (2 axial,1 radial)and mid-plane pore pressure kit. No
domestic sources making similar devices provide an integrated system of
this type of testing with the resolution required for advanced
geotechnical research. Application accepted by Commissioner of Customs:
August 3, 2007.
Faye Robinson,
Director, Statutory Import Programs Staff, Import Administration.
[FR Doc. E7-16152 Filed 8-15-07; 8:45 am]
BILLING CODE 3510-DS-S
