Applications for Duty-Free Entry of Scientific Instruments, 46037 [E7-16152]

Download as PDF Federal Register / Vol. 72, No. 158 / Thursday, August 16, 2007 / Notices duties occurred and the subsequent assessment of double antidumping duties. Notification Regarding Administrative Protective Order This notice also serves as a reminder to parties subject to administrative protective orders (APO) of their responsibility concerning the disposition of proprietary information disclosed under APO as explained in the administrative protective order itself. Timely written notification of the return/destruction of APO materials or conversion to judicial protective order is hereby requested. Failure to comply with the regulations and terms of an APO is a sanctionable violation. These final results of administrative review and notice are issued and published in accordance with sections 751(a)(1) and 777(i)(1) of the Act. Dated: August 9, 2007. Joseph A. Spetrini, Deputy Assistant Secretary for Import Administration. [FR Doc. E7–16156 Filed 8–15–07; 8:45 am] BILLING CODE 3510–DS–S DEPARTMENT OF COMMERCE International Trade Administration rwilkins on PROD1PC63 with NOTICES Applications for Duty–Free Entry of Scientific Instruments Pursuant to Section 6(c) of the Educational, Scientific and Cultural Materials Importation Act of 1966 (Pub. L. 89–651; as amended by Pub. L. 106– 36; 80 Stat. 897; 15 CFR part 301), we invite comments on the question of whether instruments of equivalent scientific value, for the purposes for which the instruments shown below are intended to be used, are being manufactured in the United States. Comments must comply with 15 CFR 301.5(a)(3) and (4) of the regulations and be filed within 20 days with the Statutory Import Programs Staff, U.S. Department of Commerce 14th and Constitution Ave., NW, Room 2104 Washington, D.C. 20230. Applications may be examined between 8:30 A.M. and 5:00 P.M. in Room 2104, U.S. Department of Commerce. Docket Number: 07–051. Applicant: Colorado College, Department of Physics, 14 E. Cache la Poudre, Colorado Springs, CO 80903 Instrument: Low Temperature Ulta–High Vacuum Scanning Tunneling Microscope. Manufacturer: Omicron Nanotechnology GmbH, Germany Intended Use: The instrument is intended to be used in a collaborative project with NIST to VerDate Aug<31>2005 18:41 Aug 15, 2007 Jkt 211001 develop a Josephson–junction based quantum computer. The instrument will provide detailed maps of the electron density of the materials as a function of spacial position and energy. Since electrical conductivity derives from electron density, the maps will allow study of how well electrons are locally conducted through various materials. The instrument provides: (a) A scanning tunneling microscope mounted inside a 4 K liquid helium reservoir (with a 22– hour liquid helium refill time); (b) Operation at an equilibrium temperature of 4 K with in–situ sample preparation and tip transfer capability); (c) Low drift rates of 1 angstrom/hour (d) RMS vibration amplitudes of <0.005 angstrom in a 300 Hz bandwidth; and (e) Sample registry after deposition. Application accepted by Commissioner of Customs: July 31, 2007. Docket Number: 07–053. Applicant: University of Kentucky, Dept. Civil Engineering, 161 Raymond Building, Lexington, KY 40506 Instrument: Soil Stiffness Testing System. Manufacturer: GDS Instruments, Ltd., UK. Intended Use: The instrument is intended to be used to measure soil stiffness at very small strains in a specially modified automated triaxial test apparatus. These measurements are critical to understanding and consequently predicting soil behavior for all geotechnical systems. The instrument provides a vertically propagating S–wave transmitter and a P–wave receiver along with a vertically propagating P–wave transmitter and S– wave receiver and a master signal conditioning unit along with GDSBES software to control data acquisition and drive signal generation for S and P wave velocity tests as well as a Hall effect local strain set (2 axial,1 radial)and mid–plane pore pressure kit. No domestic sources making similar devices provide an integrated system of this type of testing with the resolution required for advanced geotechnical research. Application accepted by Commissioner of Customs: August 3, 2007. Faye Robinson, Director, Statutory Import Programs Staff, Import Administration. [FR Doc. E7–16152 Filed 8–15–07; 8:45 am] BILLING CODE 3510–DS–S PO 00000 46037 DEPARTMENT OF COMMERCE International Trade Administration Applications for Duty–Free Entry of Scientific Instruments Pursuant to Section 6(c) of the Educational, Scientific and Cultural Materials Importation Act of 1966 (Pub. L. 89–651, as amended by Pub. L. 106– 36; 80 Stat. 897; 15 CFR part 301), we invite comments on the question of whether instruments of equivalent scientific value, for the purposes for which the instruments shown below are intended to be used, are being manufactured in the United States. Comments must comply with 15 CFR 301.5(a)(3) and (4) of the regulations and be filed within 20 days with Statutory Import Programs Staff, U.S. Department of Commerce, Room 2104, 14th and Constitution Ave., Washington, D.C. 20230. Applications may be examined between 8:30 A.M. and 5:00 P.M. in Room 2104, U.S. Department of Commerce. Docket Number: 07–047. Applicant: University of Southern California, University Park, Los Angeles, CA 90089. Instrument: Electron Microscope, Model JEM–1400. Manufacturer: JEOL, Ltd., Japan. Intended Use: The instrument is intended to be used to decipher local structural organization in cells and tissues, to visualize the shapes of proteins as they undergo conformational reorganization into elongated amyloid fibrils and other spherical structures and to investigate other larger molecular nano- particles. Application accepted by Commissioner of Customs: June 18, 2007. Docket Number: 07–050. Applicant: University of Massachusetts Medical School, 55 Lake Avenue North Worcester, MA 01655. Instrument: Electron Microscope, Model Quanta 200 FEG . Manufacturer: FEI Company, Czech Republic Intended Use: The instrument is intended to be used to study the distribution of cilia on cell surfaces, the structure of bone cells in healthy and diseased bone, the structure of fly antennae in flies with mutations homologous to human disease mutations, the structure of mouse embryos, the means of entry of pathogens into cells and the distribution of cell surface receptors involved in the immune response and various other biological issues. Application accepted by Commissioner of Customs: July 23, 2007. Docket Number: 07–049. Applicant: Indiana University, 400 East Seventh Frm 00006 Fmt 4703 Sfmt 4703 E:\FR\FM\16AUN1.SGM 16AUN1

Agencies

[Federal Register Volume 72, Number 158 (Thursday, August 16, 2007)]
[Notices]
[Page 46037]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: E7-16152]


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DEPARTMENT OF COMMERCE

International Trade Administration


Applications for Duty-Free Entry of Scientific Instruments

Pursuant to Section 6(c) of the Educational, Scientific and Cultural 
Materials Importation Act of 1966 (Pub. L. 89-651; as amended by Pub. 
L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments on the 
question of whether instruments of equivalent scientific value, for the 
purposes for which the instruments shown below are intended to be used, 
are being manufactured in the United States.
Comments must comply with 15 CFR 301.5(a)(3) and (4) of the regulations 
and be filed within 20 days with the Statutory Import Programs Staff, 
U.S. Department of Commerce 14th and Constitution Ave., NW, Room 2104 
Washington, D.C. 20230. Applications may be examined between 8:30 A.M. 
and 5:00 P.M. in Room 2104, U.S. Department of Commerce.
Docket Number: 07-051. Applicant: Colorado College, Department of 
Physics, 14 E. Cache la Poudre, Colorado Springs, CO 80903 Instrument: 
Low Temperature Ulta-High Vacuum Scanning Tunneling Microscope. 
Manufacturer: Omicron Nanotechnology GmbH, Germany Intended Use: The 
instrument is intended to be used in a collaborative project with NIST 
to develop a Josephson-junction based quantum computer. The instrument 
will provide detailed maps of the electron density of the materials as 
a function of spacial position and energy. Since electrical 
conductivity derives from electron density, the maps will allow study 
of how well electrons are locally conducted through various materials.
The instrument provides: (a) A scanning tunneling microscope mounted 
inside a 4 K liquid helium reservoir (with a 22-hour liquid helium 
refill time); (b) Operation at an equilibrium temperature of 4 K with 
in-situ sample preparation and tip transfer capability); (c) Low drift 
rates of 1 angstrom/hour (d) RMS vibration amplitudes of <0.005 
angstrom in a 300 Hz bandwidth; and (e) Sample registry after 
deposition. Application accepted by Commissioner of Customs: July 31, 
2007.
Docket Number: 07-053. Applicant: University of Kentucky, Dept. Civil 
Engineering, 161 Raymond Building, Lexington, KY 40506 Instrument: Soil 
Stiffness Testing System. Manufacturer: GDS Instruments, Ltd., UK. 
Intended Use: The instrument is intended to be used to measure soil 
stiffness at very small strains in a specially modified automated 
triaxial test apparatus. These measurements are critical to 
understanding and consequently predicting soil behavior for all 
geotechnical systems.
The instrument provides a vertically propagating S-wave transmitter and 
a P-wave receiver along with a vertically propagating P-wave 
transmitter and S-wave receiver and a master signal conditioning unit 
along with GDSBES software to control data acquisition and drive signal 
generation for S and P wave velocity tests as well as a Hall effect 
local strain set (2 axial,1 radial)and mid-plane pore pressure kit. No 
domestic sources making similar devices provide an integrated system of 
this type of testing with the resolution required for advanced 
geotechnical research. Application accepted by Commissioner of Customs: 
August 3, 2007.

Faye Robinson,
Director, Statutory Import Programs Staff, Import Administration.
[FR Doc. E7-16152 Filed 8-15-07; 8:45 am]
BILLING CODE 3510-DS-S