Applications for Duty-Free Entry of Scientific Instruments, 41495-41496 [E7-14669]

Agencies

• DEPARTMENT OF COMMERCE
• International Trade Administration

[Federal Register Volume 72, Number 145 (Monday, July 30, 2007)]
[Notices]
[Pages 41495-41496]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: E7-14669]


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DEPARTMENT OF COMMERCE

International Trade Administration


Applications for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended 
by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments 
on the question of whether instruments of equivalent scientific value, 
for the purposes for which the instruments shown below are intended to 
be used, are being manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be filed within 20 days with Statutory Import Programs 
Staff, U.S. Department of Commerce, Room 2104, 14th and Constitution 
Ave., NW., Washington, DC 20230. Applications may be examined between 
8:30 a.m. and 5:00 p.m. in Room 2104, U.S. Department of Commerce.
    Docket Number: 07-041. Applicant: University of Georgia, Driftmier 
Engineering Center, Athens, GA. Instrument: Electron Microscope, Model 
Inspect F. Manufacturer: FEI Company, The Netherlands. Intended Use: 
The instrument is intended to be used to investigate the morphology, 
size and size distribution of various synthesized nanomaterials. 
Results will be used to optimize the growth conditions to

[[Page 41496]]

achieve controlled growth of nanostructures with desired morphology, 
size and functionalities. Application accepted by Commissioner of 
Customs: June 29, 2007.

    Docket Number: 07-045. Applicant: Florida Fish and Wildlife 
Research Institute, Saint Petersburg, FL. Instrument: Electron 
Microscope, Model JEM-1400. Manufacturer: JEOL Ltd., Japan. Intended 
Use: The instrument is intended to be used to visualize the 
ultrastructure of various organisms to understand growth and disease 
processes. Examples include studies of: screening for viruses in sea 
grass, fish testis and ovarian development, termination of harmful 
algal blooms and the reproductive developmental processes in the blue 
crab and in clams. Application accepted by Commissioner of Customs: 
June 11, 2007.
    Docket Number: 07-046. Applicant: Howard Hughes Medical Institute, 
Chevy Chase, MD. Instrument: Electron Microscope, Model Tecnai G2 20 
TWIN. Manufacturer: FEI Company, Czech Republic. Intended Use: The 
instrument is intended to be used initially for a large scale brain 
imaging effort based on thin sections of tissue from model organisms 
such as the rat, the fruit fly and the nematode. The objective is to 
provide complete brain circuitry information based on high resolution 
imaging of these organisms. Application accepted by Commissioner of 
Customs: July 16, 2007.
    Docket Number: 07-048. Applicant: The University of Michigan, 
Department of Materials Science and Engineering, Ann Arbor, MI. 
Instrument: Low Voltage Electron Microscope. Manufacturer: Delong 
Instruments, Czech Republic. Intended Use: The instrument is intended 
to be used for the design and optimization of materials that can be 
used to create a stable, sensitive interface between electrically 
active tissue and electronic devices and to characterize the thickness, 
morphology, crystallinity, and uniformity of coatings developed to 
accommodate the variations in mechanical properties, electrical 
activity, and bioactive response across the interface between a 
mechanical device and tissue. Application accepted by Commissioner of 
Customs: July 19, 2007.
    Docket Number: 07-042. Applicant: University of Arizona, Department 
of Physics, Tucson, AZ. Instrument: Low Temperature Ultra-high Vacuum 
Scanning Tunneling Microscope. Manufacturer: Omicron NanoTechnology 
GmbH, Germany. Intended Use: The instrument is intended to be used to 
study several low-dimensional materials including carbon nanotubes and 
semiconductor nanowires in order to: (1) Correlate electrical 
properties with optical techniques to understand the role of excitons 
in the measured optical properties, (2) Determine the limits to carbon 
nanotube device performance by measuring the scattering lengths which 
degrade their performance and (3) Develop a fundamental understanding 
of low-dimensional materials in particular unique aspects of one-
dimensional metals.
    The instrument must provide a temperature at the sample down to 5 
K, cool down time to 5 K as low as 6 hours, with 15 hours between 
refills, Z-resolution to 0.01 nm and achievable vacuum to 10 to the 
11th mbar with guaranteed atomic resolution in constant current and 
constant height on Au(111). Application accepted by Commissioner of 
Customs: June 29, 2007.

    Dated: July 25, 2007.
Faye Robinson,
Director, Statutory Import Programs Staff, Import Administration.
[FR Doc. E7-14669 Filed 7-27-07; 8:45 am]
BILLING CODE 3510-DS-P