University of Alabama, et al., Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscopes, 55167-55168 [06-7935]

Download as PDF Federal Register / Vol. 71, No. 183 / Thursday, September 21, 2006 / Notices jlentini on PROD1PC65 with NOTICES than cast iron) or steel (both carbon and alloy), whether seamless or welded, whether or not conforming to American Petroleum Institute (API) or non–API specifications, whether finished or unfinished (including green tubes and limited service OCTG products). This scope does not cover casing, tubing, or drill pipe containing 10.5 percent or more of chromium. The products subject to this order are currently classified in the Harmonized Tariff Schedule of the United States (HTSUS) under item numbers: 7304.21.30.00, 7304.21.60.30, 7304.21.60.45, 7304.21.60.60, 7304.29.10.10, 7304.29.10.20, 7304.29.10.30, 7304.29.10.40, 7304.29.10.50, 7304.29.10.60, 7304.29.10.80, 7304.29.20.10, 7304.29.20.20, 7304.29.20.30, 7304.29.20.40, 7304.29.20.50, 7304.29.20.60, 7304.29.20.80, 7304.29.30.10, 7304.29.30.20, 7304.29.30.30, 7304.29.30.40, 7304.29.30.50, 7304.29.30.60, 7304.29.30.80, 7304.29.40.10, 7304.29.40.20, 7304.29.40.30, 7304.29.40.40, 7304.29.40.50, 7304.29.40.60, 7304.29.40.80, 7304.29.50.15, 7304.29.50.30, 7304.29.50.45, 7304.29.50.60, 7304.29.50.75, 7304.29.60.15, 7304.29.60.30, 7304.29.60.45, 7304.29.60.60, 7304.29.60.75, 7305.20.20.00, 7305.20.40.00, 7305.20.60.00, 7305.20.80.00, 7306.20.10.30, 7306.20.10.90, 7306.20.20.00, 7306.20.30.00, 7306.20.40.00, 7306.20.60.10, 7306.20.60.50, 7306.20.80.10, and 7306.20.80.50. Although the HTSUS subheadings are provided for convenience and customs purposes, our written description of the scope of this order is dispositive. Final Results of Review As stated in the Preliminary Results, the Department determined that JFE and NKK had no shipments of subject merchandise, and that Nippon and SMI had no reviewable sales of subject merchandise during the POR. Although our review of data from U.S. Customs and Border Protection (CBP) showed that there were entries during the POR of merchandise produced by Nippon and SMI, based on information and documentation submitted by Nippon and SMI, we determined that those entries were either made by unaffiliated resellers without the knowledge of either Nippon or SMI, or were sample merchandise. As such, they are not subject to the administrative review of Nippon and SMI. See memorandum from Jun Jack Zhao to Barbara E. Tillman through Dana Mermelstein, Analysis Memorandum regarding the VerDate Aug<31>2005 16:30 Sep 20, 2006 Jkt 208001 Administrative Review of the Antidumping Duty Order on Oil Country Tubular Goods from Japan (A–588–835), dated June 15, 2006. We did not receive comments from any of the interested parties on the Preliminary Results. Accordingly, we do not have any reason to reconsider our preliminary decision. Therefore, consistent with the Department’s preliminary results of this review, and in accordance with 19 CFR § 351.213(d)(3), we are rescinding the review with respect to all four companies. Duty Assessment The Department will determine, and CBP shall assess, antidumping duties on all appropriate entries, pursuant to 19 CFR § 351.212(b). We will direct CBP to liquidate any entries of subject merchandise manufactured by JFE, Nippon, NKK, SMI, and entered or withdrawn from warehouse for consumption during the POR, at the ‘‘all others’’ rate, 44.20 percent, in accordance with the Department’s clarification of its assessment regulation, as the sale of any such entries were made by intermediary companies (e.g., resellers) not covered in this review, a prior review, or the less than fair value (LTFV) investigation. See Antidumping and Countervailing Duty Proceedings: Assessment of Antidumping Duties, 68 FR 23954(May 6, 2003). The Department will issue appropriate assessment instructions directly to CBP within 15 days of publication of these final results of review. Cash Deposit Requirements The following cash deposit rates will be effective with respect to all shipments of OCTG from Japan entered, or withdrawn from warehouse, for consumption on or after the publication date of the final results, as provided for by section 751(a)(1) of the Act: (1) for all four companies, JFE, NKK, Nippon and SMI, the cash deposit rate will remain unchanged and will be the company– specific rate established for the most recent period; (2) for previously reviewed or investigated companies not listed above, the cash deposit rate will be the company–specific rate established for the most recent period; (3) if the exporter is not a firm covered in this review, a prior review, or the LTFV investigation, but the manufacturer is, the cash deposit rate will be the rate established for the most recent period for the manufacturer of the subject merchandise; and (4) if neither the exporter nor the manufacturer is a firm covered by this review, a prior review, or the LTFV PO 00000 Frm 00008 Fmt 4703 Sfmt 4703 55167 investigation, the cash deposit rate shall be the ‘‘all others’’ rate established in the LTFV investigation, which is 44.20 percent. See Notice of Amended Final Determination of Sales at Less Than Fair Value and Antidumping Duty Order: Oil Country Tubular Goods from Japan, 60 FR 155 (August 11, 1995). These deposit rates, when imposed, shall remain in effect until publication of the final results of the next administrative review. Notification to Importers This notice serves as a final reminder to importers of their responsibility under19 CFR § 351.402(f) to file a certificate regarding the reimbursement of antidumping duties prior to liquidation of the relevant entries during this review period. Failure to comply with this requirement could result in the Secretary’s presumption that reimbursement of antidumping duties occurred and the subsequent assessment of double antidumping duties. Administrative Protective Orders This notice also serves as a reminder to parties subject to administrative protective orders (APOs) of their responsibility concerning the return or destruction of proprietary information disclosed under APO in accordance with 19 CFR § 351.305. Timely written notification of the return/destruction of APO materials or conversion to judicial protective order is herebyrequested. Failure to comply with the regulations and terms of an APO is a violation that is subject to sanction. This administrative review and notice are issued and published in accordance with sections 751(a)(1) and 777(i)(1) of the Act. Dated: September 13, 2006. David M. Spooner, Assistant Secretary for Import Administration. [FR Doc. 06–7797 Filed 9–20–06; 8:45 am] BILLING CODE 3510–DR–S DEPARTMENT OF COMMERCE International Trade Administration University of Alabama, et al., Notice of Consolidated Decision on Applications for Duty–Free Entry of Electron Microscopes This is a decision consolidated pursuant to Section 6(c) of the Educational, Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89– 651, 80 Stat. 897; 15 CFR part 301). Related records can be viewed between E:\FR\FM\21SEN1.SGM 21SEN1 jlentini on PROD1PC65 with NOTICES 55168 Federal Register / Vol. 71, No. 183 / Thursday, September 21, 2006 / Notices 8:30 a.m. and 5 p.m. in Room 2104, U.S. Department of Commerce, Statutory Import Programs Staff, Room 2104, 14th and Constitution Avenue, NW., Washington, DC. Docket Number: 06–018. Applicant: University of Alabama. Tuscaloosa, AL 35487. Instrument: Electron Microscope, Model Technai G2 F20 S–TWIN. Manufacturer: FEI Company, The Netherlands. Intended Use: See notice at 71 FR 42631. Docket Number: 06–019. Applicant: University of Pittsburgh, Pittsburgh, PA 15261. Instrument: Electron Microscope, Model JEM–2100F. Manufacturer: JEOL Ltd., Japan. See notice at 71 FR 42631. Docket Number: 06–020. Applicant: Middle Tennessee State University, Murfreesboro, TN 37132. Instrument: Electron Microscope, Model H–7650 TEM. Manufacturer: Hitachi High Technologies, Japan. Intended Use: See notice at 71 FR 42631. Docket Number: 06–021. Applicant: The University of Texas, Dallas, TX 75390– 9056. Instrument: Electron Microscope, Model Technai G2 Spirit BioTwin. Manufacturer: FEI Company, Czech Republic. Intended Use: See notice at 71 FR 42631. Docket Number: 06–022. Applicant: Battelle Memorial Institute, Pacific Northwest Division, Richland, WA 99352. Instrument: Electron Microscope, Model Technai G2 Sprint TWIN. Manufacturer: FEI Company, Czech Republic. Intended Use: See notice at 71 FR 42631. Docket Number: 06–023. Applicant: University of California, Lawrence Berkeley Lab for the US Department of Energy, Berkeley, CA 94720. Instrument: Electron Microscope, Model JEM–2100. Manufacturer: JEOL, Ltd., Japan. Intended Use: See notice at 71 FR 42631. Docket Number: 06–024. Applicant: The University of Alabama, Tuscaloosa, AL 35487–0344. Instrument: Electron Microscope, Model H–7650–II TEM. Manufacturer: Hitachi High– Technologies Corp, Japan. Intended Use: See notice at 71 FR 42631. Docket Number: 06–025. Applicant: The Ohio State University, Campus Microscopy and Imaging Facility, Columbus, OH 43210. Instrument: Electron Microscope, Model Technai G2 Spirit BioTwin. Manufacturer: FEI Company, Czech Republic. Intended Use: See notice at 71 FR 42631. Docket Number: 06–026. Applicant: The New York Structural Biology Center, New York, NY 10027. Instrument: Electron Microscope, Model JEM– 3200FSC. Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 71 FR 42631. VerDate Aug<31>2005 16:30 Sep 20, 2006 Jkt 208001 Docket Number: 06–027. Applicant: The University of Akron, Akron, OH 44325. Instrument: Electron Microscope, Model JEM–1230. Manufacturer: Joel Ltd., Japan. Intended Use: See notice at 71 FR 42631. Docket Number: 06–028. Applicant: Clarion Health Partners, Indianapolis, IN 46204. Instrument: Electron Microscope, Model Technai G2 Spirit BioTwin. Manufacturer: FEI Company, Czech Republic. Intended Use: See notice at 71 FR 42632. Docket Number: 06–029. Applicant: U.S. Department of Commerce, National Institute of Standards and Technology, MD 20899. Instrument: Aberration– Corrected Monochromated Electron Microscope, Model ACEM: Technai G3 TF30CSP. Manufacturer: FEI Company, The Netherlands . Intended Use: See notice at 71 FR 42632. Docket Number: 06–030. Applicant: Florida State University, Department of Biological Science, Tallahassee, FL 32306 Instrument: Electron Microscope, Model Nova 400 NanoSEM. Manufacturer: FEI Company, Czech Republic. Intended Use: See notice at 71 FR 42632. Docket Number: 06–031. Applicant: Jackson State University, Jackson, MI 18540. Instrument: Electron Microscope, Model JEM–1011 Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 71 FR 42632. Docket Number: 06–032. Applicant: Smithsonian Institution, National Museum of Natural History, Washington DC 20560–0019. Instrument: Electron Microscope, Model Nova 600 NanoSEM. Manufacturer: FEI Company, Czech Republic. Intended Use: See notice at 71 FR 42632. Docket Number: 06–033. Applicant: University of North Florida, Jacksonville FL 32224. Instrument: Electron Microscope, Model Quantum 200 ESEM. Manufacturer: FEI Company, Czech Republic. Intended Use: See notice at 71 FR 42632. Docket Number: 06–034. Applicant: NYS Institute for Basic Research, Staten Island, NY 10314. Instrument: Electron Microscope, Model H–7500. Manufacturer: Hitachi High– Technologies Corporation, Japan. Intended Use: See notice at 71 FR 42632. Docket Number: 06–035. Applicant: Carnegie Mellon University, Pittsburgh, Pa 15213. Instrument: Electron Microscope, Model Nova 600 NanoLab Dual Beam. Manufacturer: FEI Company, The Netherlands. Intended Use: See notice at 71 FR 42632. Docket Number: 06–036. Applicant: Texas Tech University, Health Sciences Center, Lubbock, TX 79430. Instrument: PO 00000 Frm 00009 Fmt 4703 Sfmt 4703 Electron Microscope, Model H–7650–II TEM. Manufacturer: Hitachi High– Technologies Corporation, Japan . Intended Use: See notice at 71 FR 42632. Docket Number: 06–038. Applicant: The Ohio State University, Campus Microscopy and Imaging Facility, Columbus, OH 43210. Instrument: Electron Microscope, Model Technai G2 Spirit BioTwin. Manufacturer: FEI Company, Czech Republic. Intended Use: See notice at 71 FR 42633. Docket Number: 06–039. Applicant: University of Louisville, Speed School Of Engineering, Louisville, KY 40292. Instrument: Electron Microscope, Model Technai G2 F–20 X–TWIN. Manufacturer: FEI Company, The Netherlands. Intended Use: See notice at 71 FR 42633. Docket Number: 06–040. Applicant: UC Irvine Medical Center, Orange, CA, 92868. Instrument: Electron Microscope, Model Technai G2 Spirit. Manufacturer: FEI Company, Czech Republic. Intended Use: See notice at 71 FR 42633. Docket Number: 06–042. Applicant: The University of Illinois at Urbana– Champaign, Champaign, IL 61820. Instrument: Electron Microscope, Model JEM–220FS with STEM & Monochrometer. Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 71 FR 42633. Docket Number: 06–043. Applicant: SUNY Upstate Medical University, Syracuse, NY 13210. Instrument: Electron Microscope, Model JEM–2100. Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 42633. Comments: None received. Decision: Approved. No instrument of equivalent scientific value to the foreign instrument, for such purposes as these instruments are intended to be used, was being manufactured in the United States at the time the instruments were ordered. Reasons: Each foreign instrument is an electron microscope and is intended for research or scientific educational uses requiring an electron microscope. We know of no electron microscope, or any other instrument suited to these purposes, which was being manufactured in the United States at the time of order of each instrument. Gerald A. Zerdy, Program ManagerStatutory Import Programs Staff. [FR Doc. 06–7935 Filed 9–20–06; 8:45 am] BILLING CODE 3510–DS–S E:\FR\FM\21SEN1.SGM 21SEN1

Agencies

[Federal Register Volume 71, Number 183 (Thursday, September 21, 2006)]
[Notices]
[Pages 55167-55168]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: 06-7935]


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DEPARTMENT OF COMMERCE

International Trade Administration


University of Alabama, et al., Notice of Consolidated Decision on 
Applications for Duty-Free Entry of Electron Microscopes

This is a decision consolidated pursuant to Section 6(c) of the 
Educational, Scientific, and Cultural Materials Importation Act of 1966 
(Pub. L. 89-651, 80 Stat. 897; 15 CFR part 301). Related records can be 
viewed between

[[Page 55168]]

8:30 a.m. and 5 p.m. in Room 2104, U.S. Department of Commerce, 
Statutory Import Programs Staff, Room 2104, 14\th\ and Constitution 
Avenue, NW., Washington, DC.
Docket Number: 06-018. Applicant: University of Alabama. Tuscaloosa, AL 
35487. Instrument: Electron Microscope, Model Technai G2 F20 S-TWIN. 
Manufacturer: FEI Company, The Netherlands. Intended Use: See notice at 
71 FR 42631.
Docket Number: 06-019. Applicant: University of Pittsburgh, Pittsburgh, 
PA 15261. Instrument: Electron Microscope, Model JEM-2100F. 
Manufacturer: JEOL Ltd., Japan. See notice at 71 FR 42631.
Docket Number: 06-020. Applicant: Middle Tennessee State University, 
Murfreesboro, TN 37132. Instrument: Electron Microscope, Model H-7650 
TEM. Manufacturer: Hitachi High Technologies, Japan. Intended Use: See 
notice at 71 FR 42631.
Docket Number: 06-021. Applicant: The University of Texas, Dallas, TX 
75390-9056. Instrument: Electron Microscope, Model Technai G2 Spirit 
BioTwin. Manufacturer: FEI Company, Czech Republic. Intended Use: See 
notice at 71 FR 42631.
Docket Number: 06-022. Applicant: Battelle Memorial Institute, Pacific 
Northwest Division, Richland, WA 99352. Instrument: Electron 
Microscope, Model Technai G2 Sprint TWIN. Manufacturer: FEI Company, 
Czech Republic. Intended Use: See notice at 71 FR 42631.
Docket Number: 06-023. Applicant: University of California, Lawrence 
Berkeley Lab for the US Department of Energy, Berkeley, CA 94720. 
Instrument: Electron Microscope, Model JEM-2100. Manufacturer: JEOL, 
Ltd., Japan. Intended Use: See notice at 71 FR 42631.
Docket Number: 06-024. Applicant: The University of Alabama, 
Tuscaloosa, AL 35487-0344. Instrument: Electron Microscope, Model H-
7650-II TEM. Manufacturer: Hitachi High-Technologies Corp, Japan. 
Intended Use: See notice at 71 FR 42631.
Docket Number: 06-025. Applicant: The Ohio State University, Campus 
Microscopy and Imaging Facility, Columbus, OH 43210. Instrument: 
Electron Microscope, Model Technai G2 Spirit BioTwin. Manufacturer: FEI 
Company, Czech Republic. Intended Use: See notice at 71 FR 42631.
Docket Number: 06-026. Applicant: The New York Structural Biology 
Center, New York, NY 10027. Instrument: Electron Microscope, Model JEM-
3200FSC. Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 71 
FR 42631.
Docket Number: 06-027. Applicant: The University of Akron, Akron, OH 
44325. Instrument: Electron Microscope, Model JEM-1230. Manufacturer: 
Joel Ltd., Japan. Intended Use: See notice at 71 FR 42631.
Docket Number: 06-028. Applicant: Clarion Health Partners, 
Indianapolis, IN 46204. Instrument: Electron Microscope, Model Technai 
G2 Spirit BioTwin. Manufacturer: FEI Company, Czech Republic. Intended 
Use: See notice at 71 FR 42632.
Docket Number: 06-029. Applicant: U.S. Department of Commerce, National 
Institute of Standards and Technology, MD 20899. Instrument: 
Aberration-Corrected Monochromated Electron Microscope, Model ACEM: 
Technai G3 TF30CSP. Manufacturer: FEI Company, The Netherlands . 
Intended Use: See notice at 71 FR 42632.
Docket Number: 06-030. Applicant: Florida State University, Department 
of Biological Science, Tallahassee, FL 32306 Instrument: Electron 
Microscope, Model Nova 400 NanoSEM. Manufacturer: FEI Company, Czech 
Republic. Intended Use: See notice at 71 FR 42632.
Docket Number: 06-031. Applicant: Jackson State University, Jackson, MI 
18540. Instrument: Electron Microscope, Model JEM-1011 Manufacturer: 
JEOL Ltd., Japan. Intended Use: See notice at 71 FR 42632.
Docket Number: 06-032. Applicant: Smithsonian Institution, National 
Museum of Natural History, Washington DC 20560-0019. Instrument: 
Electron Microscope, Model Nova 600 NanoSEM. Manufacturer: FEI Company, 
Czech Republic. Intended Use: See notice at 71 FR 42632.
Docket Number: 06-033. Applicant: University of North Florida, 
Jacksonville FL 32224. Instrument: Electron Microscope, Model Quantum 
200 ESEM. Manufacturer: FEI Company, Czech Republic. Intended Use: See 
notice at 71 FR 42632.
Docket Number: 06-034. Applicant: NYS Institute for Basic Research, 
Staten Island, NY 10314. Instrument: Electron Microscope, Model H-7500. 
Manufacturer: Hitachi High-Technologies Corporation, Japan. Intended 
Use: See notice at 71 FR 42632.
Docket Number: 06-035. Applicant: Carnegie Mellon University, 
Pittsburgh, Pa 15213. Instrument: Electron Microscope, Model Nova 600 
NanoLab Dual Beam. Manufacturer: FEI Company, The Netherlands. Intended 
Use: See notice at 71 FR 42632.
Docket Number: 06-036. Applicant: Texas Tech University, Health 
Sciences Center, Lubbock, TX 79430. Instrument: Electron Microscope, 
Model H-7650-II TEM. Manufacturer: Hitachi High-Technologies 
Corporation, Japan . Intended Use: See notice at 71 FR 42632.
Docket Number: 06-038. Applicant: The Ohio State University, Campus 
Microscopy and Imaging Facility, Columbus, OH 43210. Instrument: 
Electron Microscope, Model Technai G2 Spirit BioTwin. Manufacturer: FEI 
Company, Czech Republic. Intended Use: See notice at 71 FR 42633.
Docket Number: 06-039. Applicant: University of Louisville, Speed 
School Of Engineering, Louisville, KY 40292. Instrument: Electron 
Microscope, Model Technai G2 F-20 X-TWIN. Manufacturer: FEI Company, 
The Netherlands. Intended Use: See notice at 71 FR 42633.
Docket Number: 06-040. Applicant: UC Irvine Medical Center, Orange, CA, 
92868. Instrument: Electron Microscope, Model Technai G2 Spirit. 
Manufacturer: FEI Company, Czech Republic. Intended Use: See notice at 
71 FR 42633.
Docket Number: 06-042. Applicant: The University of Illinois at Urbana-
Champaign, Champaign, IL 61820. Instrument: Electron Microscope, Model 
JEM-220FS with STEM & Monochrometer. Manufacturer: JEOL Ltd., Japan. 
Intended Use: See notice at 71 FR 42633.
Docket Number: 06-043. Applicant: SUNY Upstate Medical University, 
Syracuse, NY 13210. Instrument: Electron Microscope, Model JEM-2100. 
Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 42633.
Comments: None received. Decision: Approved. No instrument of 
equivalent scientific value to the foreign instrument, for such 
purposes as these instruments are intended to be used, was being 
manufactured in the United States at the time the instruments were 
ordered. Reasons: Each foreign instrument is an electron microscope and 
is intended for research or scientific educational uses requiring an 
electron microscope. We know of no electron microscope, or any other 
instrument suited to these purposes, which was being manufactured in 
the United States at the time of order of each instrument.

Gerald A. Zerdy,
Program ManagerStatutory Import Programs Staff.
[FR Doc. 06-7935 Filed 9-20-06; 8:45 am]
BILLING CODE 3510-DS-S