University of Alabama, et al., Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscopes, 55167-55168 [06-7935]
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Federal Register / Vol. 71, No. 183 / Thursday, September 21, 2006 / Notices
jlentini on PROD1PC65 with NOTICES
than cast iron) or steel (both carbon and
alloy), whether seamless or welded,
whether or not conforming to American
Petroleum Institute (API) or non–API
specifications, whether finished or
unfinished (including green tubes and
limited service OCTG products). This
scope does not cover casing, tubing, or
drill pipe containing 10.5 percent or
more of chromium. The products
subject to this order are currently
classified in the Harmonized Tariff
Schedule of the United States (HTSUS)
under item numbers: 7304.21.30.00,
7304.21.60.30, 7304.21.60.45,
7304.21.60.60, 7304.29.10.10,
7304.29.10.20, 7304.29.10.30,
7304.29.10.40, 7304.29.10.50,
7304.29.10.60, 7304.29.10.80,
7304.29.20.10, 7304.29.20.20,
7304.29.20.30, 7304.29.20.40,
7304.29.20.50, 7304.29.20.60,
7304.29.20.80, 7304.29.30.10,
7304.29.30.20, 7304.29.30.30,
7304.29.30.40, 7304.29.30.50,
7304.29.30.60, 7304.29.30.80,
7304.29.40.10, 7304.29.40.20,
7304.29.40.30, 7304.29.40.40,
7304.29.40.50, 7304.29.40.60,
7304.29.40.80, 7304.29.50.15,
7304.29.50.30, 7304.29.50.45,
7304.29.50.60, 7304.29.50.75,
7304.29.60.15, 7304.29.60.30,
7304.29.60.45, 7304.29.60.60,
7304.29.60.75, 7305.20.20.00,
7305.20.40.00, 7305.20.60.00,
7305.20.80.00, 7306.20.10.30,
7306.20.10.90, 7306.20.20.00,
7306.20.30.00, 7306.20.40.00,
7306.20.60.10, 7306.20.60.50,
7306.20.80.10, and 7306.20.80.50.
Although the HTSUS subheadings are
provided for convenience and customs
purposes, our written description of the
scope of this order is dispositive.
Final Results of Review
As stated in the Preliminary Results,
the Department determined that JFE and
NKK had no shipments of subject
merchandise, and that Nippon and SMI
had no reviewable sales of subject
merchandise during the POR. Although
our review of data from U.S. Customs
and Border Protection (CBP) showed
that there were entries during the POR
of merchandise produced by Nippon
and SMI, based on information and
documentation submitted by Nippon
and SMI, we determined that those
entries were either made by unaffiliated
resellers without the knowledge of
either Nippon or SMI, or were sample
merchandise. As such, they are not
subject to the administrative review of
Nippon and SMI. See memorandum
from Jun Jack Zhao to Barbara E.
Tillman through Dana Mermelstein,
Analysis Memorandum regarding the
VerDate Aug<31>2005
16:30 Sep 20, 2006
Jkt 208001
Administrative Review of the
Antidumping Duty Order on Oil Country
Tubular Goods from Japan (A–588–835),
dated June 15, 2006. We did not receive
comments from any of the interested
parties on the Preliminary Results.
Accordingly, we do not have any reason
to reconsider our preliminary decision.
Therefore, consistent with the
Department’s preliminary results of this
review, and in accordance with 19 CFR
§ 351.213(d)(3), we are rescinding the
review with respect to all four
companies.
Duty Assessment
The Department will determine, and
CBP shall assess, antidumping duties on
all appropriate entries, pursuant to 19
CFR § 351.212(b). We will direct CBP to
liquidate any entries of subject
merchandise manufactured by JFE,
Nippon, NKK, SMI, and entered or
withdrawn from warehouse for
consumption during the POR, at the ‘‘all
others’’ rate, 44.20 percent, in
accordance with the Department’s
clarification of its assessment
regulation, as the sale of any such
entries were made by intermediary
companies (e.g., resellers) not covered
in this review, a prior review, or the less
than fair value (LTFV) investigation. See
Antidumping and Countervailing Duty
Proceedings: Assessment of
Antidumping Duties, 68 FR 23954(May
6, 2003). The Department will issue
appropriate assessment instructions
directly to CBP within 15 days of
publication of these final results of
review.
Cash Deposit Requirements
The following cash deposit rates will
be effective with respect to all
shipments of OCTG from Japan entered,
or withdrawn from warehouse, for
consumption on or after the publication
date of the final results, as provided for
by section 751(a)(1) of the Act: (1) for all
four companies, JFE, NKK, Nippon and
SMI, the cash deposit rate will remain
unchanged and will be the company–
specific rate established for the most
recent period; (2) for previously
reviewed or investigated companies not
listed above, the cash deposit rate will
be the company–specific rate
established for the most recent period;
(3) if the exporter is not a firm covered
in this review, a prior review, or the
LTFV investigation, but the
manufacturer is, the cash deposit rate
will be the rate established for the most
recent period for the manufacturer of
the subject merchandise; and (4) if
neither the exporter nor the
manufacturer is a firm covered by this
review, a prior review, or the LTFV
PO 00000
Frm 00008
Fmt 4703
Sfmt 4703
55167
investigation, the cash deposit rate shall
be the ‘‘all others’’ rate established in
the LTFV investigation, which is 44.20
percent. See Notice of Amended Final
Determination of Sales at Less Than
Fair Value and Antidumping Duty
Order: Oil Country Tubular Goods from
Japan, 60 FR 155 (August 11, 1995).
These deposit rates, when imposed,
shall remain in effect until publication
of the final results of the next
administrative review.
Notification to Importers
This notice serves as a final reminder
to importers of their responsibility
under19 CFR § 351.402(f) to file a
certificate regarding the reimbursement
of antidumping duties prior to
liquidation of the relevant entries
during this review period. Failure to
comply with this requirement could
result in the Secretary’s presumption
that reimbursement of antidumping
duties occurred and the subsequent
assessment of double antidumping
duties.
Administrative Protective Orders
This notice also serves as a reminder
to parties subject to administrative
protective orders (APOs) of their
responsibility concerning the return or
destruction of proprietary information
disclosed under APO in accordance
with 19 CFR § 351.305. Timely written
notification of the return/destruction of
APO materials or conversion to judicial
protective order is herebyrequested.
Failure to comply with the regulations
and terms of an APO is a violation that
is subject to sanction.
This administrative review and notice
are issued and published in accordance
with sections 751(a)(1) and 777(i)(1) of
the Act.
Dated: September 13, 2006.
David M. Spooner,
Assistant Secretary for Import
Administration.
[FR Doc. 06–7797 Filed 9–20–06; 8:45 am]
BILLING CODE 3510–DR–S
DEPARTMENT OF COMMERCE
International Trade Administration
University of Alabama, et al., Notice of
Consolidated Decision on Applications
for Duty–Free Entry of Electron
Microscopes
This is a decision consolidated pursuant
to Section 6(c) of the Educational,
Scientific, and Cultural Materials
Importation Act of 1966 (Pub. L. 89–
651, 80 Stat. 897; 15 CFR part 301).
Related records can be viewed between
E:\FR\FM\21SEN1.SGM
21SEN1
jlentini on PROD1PC65 with NOTICES
55168
Federal Register / Vol. 71, No. 183 / Thursday, September 21, 2006 / Notices
8:30 a.m. and 5 p.m. in Room 2104, U.S.
Department of Commerce, Statutory
Import Programs Staff, Room 2104, 14th
and Constitution Avenue, NW.,
Washington, DC.
Docket Number: 06–018. Applicant:
University of Alabama. Tuscaloosa, AL
35487. Instrument: Electron Microscope,
Model Technai G2 F20 S–TWIN.
Manufacturer: FEI Company, The
Netherlands. Intended Use: See notice at
71 FR 42631.
Docket Number: 06–019. Applicant:
University of Pittsburgh, Pittsburgh, PA
15261. Instrument: Electron Microscope,
Model JEM–2100F. Manufacturer: JEOL
Ltd., Japan. See notice at 71 FR 42631.
Docket Number: 06–020. Applicant:
Middle Tennessee State University,
Murfreesboro, TN 37132. Instrument:
Electron Microscope, Model H–7650
TEM. Manufacturer: Hitachi High
Technologies, Japan. Intended Use: See
notice at 71 FR 42631.
Docket Number: 06–021. Applicant: The
University of Texas, Dallas, TX 75390–
9056. Instrument: Electron Microscope,
Model Technai G2 Spirit BioTwin.
Manufacturer: FEI Company, Czech
Republic. Intended Use: See notice at 71
FR 42631.
Docket Number: 06–022. Applicant:
Battelle Memorial Institute, Pacific
Northwest Division, Richland, WA
99352. Instrument: Electron Microscope,
Model Technai G2 Sprint TWIN.
Manufacturer: FEI Company, Czech
Republic. Intended Use: See notice at 71
FR 42631.
Docket Number: 06–023. Applicant:
University of California, Lawrence
Berkeley Lab for the US Department of
Energy, Berkeley, CA 94720. Instrument:
Electron Microscope, Model JEM–2100.
Manufacturer: JEOL, Ltd., Japan.
Intended Use: See notice at 71 FR
42631.
Docket Number: 06–024. Applicant: The
University of Alabama, Tuscaloosa, AL
35487–0344. Instrument: Electron
Microscope, Model H–7650–II TEM.
Manufacturer: Hitachi High–
Technologies Corp, Japan. Intended Use:
See notice at 71 FR 42631.
Docket Number: 06–025. Applicant: The
Ohio State University, Campus
Microscopy and Imaging Facility,
Columbus, OH 43210. Instrument:
Electron Microscope, Model Technai G2
Spirit BioTwin. Manufacturer: FEI
Company, Czech Republic. Intended
Use: See notice at 71 FR 42631.
Docket Number: 06–026. Applicant: The
New York Structural Biology Center,
New York, NY 10027. Instrument:
Electron Microscope, Model JEM–
3200FSC. Manufacturer: JEOL Ltd.,
Japan. Intended Use: See notice at 71 FR
42631.
VerDate Aug<31>2005
16:30 Sep 20, 2006
Jkt 208001
Docket Number: 06–027. Applicant: The
University of Akron, Akron, OH 44325.
Instrument: Electron Microscope, Model
JEM–1230. Manufacturer: Joel Ltd.,
Japan. Intended Use: See notice at 71 FR
42631.
Docket Number: 06–028. Applicant:
Clarion Health Partners, Indianapolis,
IN 46204. Instrument: Electron
Microscope, Model Technai G2 Spirit
BioTwin. Manufacturer: FEI Company,
Czech Republic. Intended Use: See
notice at 71 FR 42632.
Docket Number: 06–029. Applicant:
U.S. Department of Commerce, National
Institute of Standards and Technology,
MD 20899. Instrument: Aberration–
Corrected Monochromated Electron
Microscope, Model ACEM: Technai G3
TF30CSP. Manufacturer: FEI Company,
The Netherlands . Intended Use: See
notice at 71 FR 42632.
Docket Number: 06–030. Applicant:
Florida State University, Department of
Biological Science, Tallahassee, FL
32306 Instrument: Electron Microscope,
Model Nova 400 NanoSEM.
Manufacturer: FEI Company, Czech
Republic. Intended Use: See notice at 71
FR 42632.
Docket Number: 06–031. Applicant:
Jackson State University, Jackson, MI
18540. Instrument: Electron Microscope,
Model JEM–1011 Manufacturer: JEOL
Ltd., Japan. Intended Use: See notice at
71 FR 42632.
Docket Number: 06–032. Applicant:
Smithsonian Institution, National
Museum of Natural History, Washington
DC 20560–0019. Instrument: Electron
Microscope, Model Nova 600 NanoSEM.
Manufacturer: FEI Company, Czech
Republic. Intended Use: See notice at 71
FR 42632.
Docket Number: 06–033. Applicant:
University of North Florida, Jacksonville
FL 32224. Instrument: Electron
Microscope, Model Quantum 200
ESEM. Manufacturer: FEI Company,
Czech Republic. Intended Use: See
notice at 71 FR 42632.
Docket Number: 06–034. Applicant:
NYS Institute for Basic Research, Staten
Island, NY 10314. Instrument: Electron
Microscope, Model H–7500.
Manufacturer: Hitachi High–
Technologies Corporation, Japan.
Intended Use: See notice at 71 FR
42632.
Docket Number: 06–035. Applicant:
Carnegie Mellon University, Pittsburgh,
Pa 15213. Instrument: Electron
Microscope, Model Nova 600 NanoLab
Dual Beam. Manufacturer: FEI
Company, The Netherlands. Intended
Use: See notice at 71 FR 42632.
Docket Number: 06–036. Applicant:
Texas Tech University, Health Sciences
Center, Lubbock, TX 79430. Instrument:
PO 00000
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Fmt 4703
Sfmt 4703
Electron Microscope, Model H–7650–II
TEM. Manufacturer: Hitachi High–
Technologies Corporation, Japan .
Intended Use: See notice at 71 FR
42632.
Docket Number: 06–038. Applicant: The
Ohio State University, Campus
Microscopy and Imaging Facility,
Columbus, OH 43210. Instrument:
Electron Microscope, Model Technai G2
Spirit BioTwin. Manufacturer: FEI
Company, Czech Republic. Intended
Use: See notice at 71 FR 42633.
Docket Number: 06–039. Applicant:
University of Louisville, Speed School
Of Engineering, Louisville, KY 40292.
Instrument: Electron Microscope, Model
Technai G2 F–20 X–TWIN.
Manufacturer: FEI Company, The
Netherlands. Intended Use: See notice at
71 FR 42633.
Docket Number: 06–040. Applicant: UC
Irvine Medical Center, Orange, CA,
92868. Instrument: Electron Microscope,
Model Technai G2 Spirit. Manufacturer:
FEI Company, Czech Republic. Intended
Use: See notice at 71 FR 42633.
Docket Number: 06–042. Applicant: The
University of Illinois at Urbana–
Champaign, Champaign, IL 61820.
Instrument: Electron Microscope, Model
JEM–220FS with STEM &
Monochrometer. Manufacturer: JEOL
Ltd., Japan. Intended Use: See notice at
71 FR 42633.
Docket Number: 06–043. Applicant:
SUNY Upstate Medical University,
Syracuse, NY 13210. Instrument:
Electron Microscope, Model JEM–2100.
Manufacturer: JEOL Ltd., Japan.
Intended Use: See notice at 42633.
Comments: None received. Decision:
Approved. No instrument of equivalent
scientific value to the foreign
instrument, for such purposes as these
instruments are intended to be used,
was being manufactured in the United
States at the time the instruments were
ordered. Reasons: Each foreign
instrument is an electron microscope
and is intended for research or scientific
educational uses requiring an electron
microscope. We know of no electron
microscope, or any other instrument
suited to these purposes, which was
being manufactured in the United States
at the time of order of each instrument.
Gerald A. Zerdy,
Program ManagerStatutory Import Programs
Staff.
[FR Doc. 06–7935 Filed 9–20–06; 8:45 am]
BILLING CODE 3510–DS–S
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]]>Agencies
[Federal Register Volume 71, Number 183 (Thursday, September 21, 2006)]
[Notices]
[Pages 55167-55168]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: 06-7935]
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DEPARTMENT OF COMMERCE
International Trade Administration
University of Alabama, et al., Notice of Consolidated Decision on
Applications for Duty-Free Entry of Electron Microscopes
This is a decision consolidated pursuant to Section 6(c) of the
Educational, Scientific, and Cultural Materials Importation Act of 1966
(Pub. L. 89-651, 80 Stat. 897; 15 CFR part 301). Related records can be
viewed between
[[Page 55168]]
8:30 a.m. and 5 p.m. in Room 2104, U.S. Department of Commerce,
Statutory Import Programs Staff, Room 2104, 14\th\ and Constitution
Avenue, NW., Washington, DC.
Docket Number: 06-018. Applicant: University of Alabama. Tuscaloosa, AL
35487. Instrument: Electron Microscope, Model Technai G2 F20 S-TWIN.
Manufacturer: FEI Company, The Netherlands. Intended Use: See notice at
71 FR 42631.
Docket Number: 06-019. Applicant: University of Pittsburgh, Pittsburgh,
PA 15261. Instrument: Electron Microscope, Model JEM-2100F.
Manufacturer: JEOL Ltd., Japan. See notice at 71 FR 42631.
Docket Number: 06-020. Applicant: Middle Tennessee State University,
Murfreesboro, TN 37132. Instrument: Electron Microscope, Model H-7650
TEM. Manufacturer: Hitachi High Technologies, Japan. Intended Use: See
notice at 71 FR 42631.
Docket Number: 06-021. Applicant: The University of Texas, Dallas, TX
75390-9056. Instrument: Electron Microscope, Model Technai G2 Spirit
BioTwin. Manufacturer: FEI Company, Czech Republic. Intended Use: See
notice at 71 FR 42631.
Docket Number: 06-022. Applicant: Battelle Memorial Institute, Pacific
Northwest Division, Richland, WA 99352. Instrument: Electron
Microscope, Model Technai G2 Sprint TWIN. Manufacturer: FEI Company,
Czech Republic. Intended Use: See notice at 71 FR 42631.
Docket Number: 06-023. Applicant: University of California, Lawrence
Berkeley Lab for the US Department of Energy, Berkeley, CA 94720.
Instrument: Electron Microscope, Model JEM-2100. Manufacturer: JEOL,
Ltd., Japan. Intended Use: See notice at 71 FR 42631.
Docket Number: 06-024. Applicant: The University of Alabama,
Tuscaloosa, AL 35487-0344. Instrument: Electron Microscope, Model H-
7650-II TEM. Manufacturer: Hitachi High-Technologies Corp, Japan.
Intended Use: See notice at 71 FR 42631.
Docket Number: 06-025. Applicant: The Ohio State University, Campus
Microscopy and Imaging Facility, Columbus, OH 43210. Instrument:
Electron Microscope, Model Technai G2 Spirit BioTwin. Manufacturer: FEI
Company, Czech Republic. Intended Use: See notice at 71 FR 42631.
Docket Number: 06-026. Applicant: The New York Structural Biology
Center, New York, NY 10027. Instrument: Electron Microscope, Model JEM-
3200FSC. Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 71
FR 42631.
Docket Number: 06-027. Applicant: The University of Akron, Akron, OH
44325. Instrument: Electron Microscope, Model JEM-1230. Manufacturer:
Joel Ltd., Japan. Intended Use: See notice at 71 FR 42631.
Docket Number: 06-028. Applicant: Clarion Health Partners,
Indianapolis, IN 46204. Instrument: Electron Microscope, Model Technai
G2 Spirit BioTwin. Manufacturer: FEI Company, Czech Republic. Intended
Use: See notice at 71 FR 42632.
Docket Number: 06-029. Applicant: U.S. Department of Commerce, National
Institute of Standards and Technology, MD 20899. Instrument:
Aberration-Corrected Monochromated Electron Microscope, Model ACEM:
Technai G3 TF30CSP. Manufacturer: FEI Company, The Netherlands .
Intended Use: See notice at 71 FR 42632.
Docket Number: 06-030. Applicant: Florida State University, Department
of Biological Science, Tallahassee, FL 32306 Instrument: Electron
Microscope, Model Nova 400 NanoSEM. Manufacturer: FEI Company, Czech
Republic. Intended Use: See notice at 71 FR 42632.
Docket Number: 06-031. Applicant: Jackson State University, Jackson, MI
18540. Instrument: Electron Microscope, Model JEM-1011 Manufacturer:
JEOL Ltd., Japan. Intended Use: See notice at 71 FR 42632.
Docket Number: 06-032. Applicant: Smithsonian Institution, National
Museum of Natural History, Washington DC 20560-0019. Instrument:
Electron Microscope, Model Nova 600 NanoSEM. Manufacturer: FEI Company,
Czech Republic. Intended Use: See notice at 71 FR 42632.
Docket Number: 06-033. Applicant: University of North Florida,
Jacksonville FL 32224. Instrument: Electron Microscope, Model Quantum
200 ESEM. Manufacturer: FEI Company, Czech Republic. Intended Use: See
notice at 71 FR 42632.
Docket Number: 06-034. Applicant: NYS Institute for Basic Research,
Staten Island, NY 10314. Instrument: Electron Microscope, Model H-7500.
Manufacturer: Hitachi High-Technologies Corporation, Japan. Intended
Use: See notice at 71 FR 42632.
Docket Number: 06-035. Applicant: Carnegie Mellon University,
Pittsburgh, Pa 15213. Instrument: Electron Microscope, Model Nova 600
NanoLab Dual Beam. Manufacturer: FEI Company, The Netherlands. Intended
Use: See notice at 71 FR 42632.
Docket Number: 06-036. Applicant: Texas Tech University, Health
Sciences Center, Lubbock, TX 79430. Instrument: Electron Microscope,
Model H-7650-II TEM. Manufacturer: Hitachi High-Technologies
Corporation, Japan . Intended Use: See notice at 71 FR 42632.
Docket Number: 06-038. Applicant: The Ohio State University, Campus
Microscopy and Imaging Facility, Columbus, OH 43210. Instrument:
Electron Microscope, Model Technai G2 Spirit BioTwin. Manufacturer: FEI
Company, Czech Republic. Intended Use: See notice at 71 FR 42633.
Docket Number: 06-039. Applicant: University of Louisville, Speed
School Of Engineering, Louisville, KY 40292. Instrument: Electron
Microscope, Model Technai G2 F-20 X-TWIN. Manufacturer: FEI Company,
The Netherlands. Intended Use: See notice at 71 FR 42633.
Docket Number: 06-040. Applicant: UC Irvine Medical Center, Orange, CA,
92868. Instrument: Electron Microscope, Model Technai G2 Spirit.
Manufacturer: FEI Company, Czech Republic. Intended Use: See notice at
71 FR 42633.
Docket Number: 06-042. Applicant: The University of Illinois at Urbana-
Champaign, Champaign, IL 61820. Instrument: Electron Microscope, Model
JEM-220FS with STEM & Monochrometer. Manufacturer: JEOL Ltd., Japan.
Intended Use: See notice at 71 FR 42633.
Docket Number: 06-043. Applicant: SUNY Upstate Medical University,
Syracuse, NY 13210. Instrument: Electron Microscope, Model JEM-2100.
Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 42633.
Comments: None received. Decision: Approved. No instrument of
equivalent scientific value to the foreign instrument, for such
purposes as these instruments are intended to be used, was being
manufactured in the United States at the time the instruments were
ordered. Reasons: Each foreign instrument is an electron microscope and
is intended for research or scientific educational uses requiring an
electron microscope. We know of no electron microscope, or any other
instrument suited to these purposes, which was being manufactured in
the United States at the time of order of each instrument.
Gerald A. Zerdy,
Program ManagerStatutory Import Programs Staff.
[FR Doc. 06-7935 Filed 9-20-06; 8:45 am]
BILLING CODE 3510-DS-S
