Applications for Duty-Free Entry of Scientific Instruments, 42630-42633 [E6-11968]

Download as PDF 42630 Federal Register / Vol. 71, No. 144 / Thursday, July 27, 2006 / Notices Dated: July 18, 2006. Stephen J. Claeys, Deputy Assistant Secretary for Import Administration. [FR Doc.E6–11969 Filed 7–26–06; 8:45 am] BILLING CODE 3510–DS–S DEPARTMENT OF COMMERCE International Trade Administration [A–485–806] Notice of Extension of Time Limit for the Preliminary Results of Antidumping Duty Administrative Review: Certain Hot- Rolled Carbon Steel Flat Products from Romania Import Administration, International Trade Administration, Department of Commerce. SUMMARY: The Department of Commerce is extending the time limit for completion of the preliminary results of the administrative review of the antidumping duty order on certain hot– rolled carbon steel flat products from Romania until October 16, 2006. The period of review is November 1, 2004, through October 31, 2005. EFFECTIVE DATE: July 27, 2006. FOR FURTHER INFORMATION CONTACT: Dunyako Ahmadu, Import Administration, International Trade Administration, U.S. Department of Commerce, 14th Street and Constitution Avenue, NW., Washington, DC 20230; telephone (202) 482–0198. SUPPLEMENTARY INFORMATION: AGENCY: Background On December 22, 2005, the Department of Commerce (the Department) published a notice of initiation of the 2004–2005 antidumping duty administrative review of this order covering Mittal Steel Galati S.A. (formerly Ispat Sidex S.A). See Initiation of Antidumping and Countervailing Duty Administrative Reviews and Request for Revocation in Part, 70 FR 76024 (December 22, 2004). rwilkins on PROD1PC63 with NOTICES Extension of Time Limit for Preliminary Results The Tariff Act of 1930, as amended (the Act), provides at section 751(a)(3)(A) that the Department will issue the preliminary results of an administrative review of an antidumping duty order within 245 days after the last day of the anniversary month of the date of publication of the order. Section 751(a)(3)(A) of the Act provides further that, if the Department determines that it is not practicable to complete the review within this time VerDate Aug<31>2005 16:46 Jul 26, 2006 Jkt 208001 period, the Department may extend the 245-day period to 365 days. The Department has determined that it is not practicable to complete the preliminary results by the current deadline of August 2, 2006, because it received a request to conduct a sales– below-cost investigation on July 11, 2006. Additional time is necessary to consider whether to initiate a sales– below-cost investigation, give MS Galati an opportunity to provide relevant information, review MS Galati’s response, and, if appropriate, conduct the cost analysis as part of the calculation of the weighted–average margin for MS Galati. Therefore, in accordance with section 751(a)(3)(A) of the Act and 19 CFR 351.213(h)(2), the Department is extending the time limit for the preliminary results by 75 days to October 16, 2006. We are issuing this notice in accordance with section 751(a)(3)(A) of the Act. Dated: July 21, 2006. Stephen J. Claeys, Deputy Assistant Secretary for Import Administration. [FR Doc. E6–11972 Filed 7–26–06; 8:45 am] BILLING CODE 3510–DS–S DEPARTMENT OF COMMERCE International Trade Administration [A–549–821] Notice of Extension of Deadline for the Preliminary Results of Antidumping Duty Administrative Review: Polyethylene Retail Carrier Bags from Thailand Import Administration, International Trade Administration, Department of Commerce, EFFECTIVE DATE: July 27, 2006. FOR FURTHER INFORMATION CONTACT: Lyn Johnson or Richard Rimlinger, AD/CVD Operations, Office 5, Import Administration, International Trade Administration, U.S. Department of Commerce, 14th Street and Constitution Avenue, NW., Washington, DC 20230; telephone: (202) 482–5287 and (202) 482–4477, respectively. SUPPLEMENTARY INFORMATION: AGENCY: Extension of Deadline Frm 00006 Fmt 4703 Sfmt 4703 Dated: July 21, 2006. Stephen J. Claeys, Deputy Assistant Secretary for Import Administration. [FR Doc. E6–11971 Filed 7–26–06; 8:45 am] BILLING CODE: 3510–DS–S DEPARTMENT OF COMMERCE At the request of various parties, the Department of Commerce (the Department) initiated an administrative review of the antidumping duty order on polyethylene retail carrier bags from Thailand for the period January 26, 2004, through July 31, 2005. See PO 00000 Initiation of Antidumping and Countervailing Duty Administrative Reviews and Request for Revocation in Part, 70 FR 56631 (September 28, 2005). Section 751(a)(3)(A) of the Tariff Act of 1930, as amended (the Act), requires the Department to issue preliminary results of review within 245 days after the last day of the anniversary month of an order for which a review is requested and final results within 120 days after the date on which the preliminary results were published. If it is not practicable to complete the review within these time periods, section 751(a)(3)(A) of the Act allows the Department to extend the time limit for the preliminary results to a maximum of 365 days after the last day of the anniversary month. On April 26, 2006, the Department published a notice extending the preliminary results for this review by 90 days until August 1, 2006. See Notice of Extension of Deadline for the Preliminary Results of Antidumping Duty Administrative Review: Polyethylene Retail Carrier Bags from Thailand, 71 FR 24641 (April 26, 2006). Since the publication of the extension notice, the Department conducted home–market sales and cost verifications of two of the seven respondents involved in this review and has a number of issues to address as a result of these verifications. In addition, the Department must also address several complex issues raised in recent filings by interested parties involving, among others, costs of production, affiliated–party inputs, direct material expenses, and sales reporting. Due to the complexity of the issues in this review, the Department needs additional time to conduct its analysis. Therefore, we are extending the deadline for issuing the preliminary results of this review by an additional 30 days until August 31, 2006. This notice is published in accordance with sections 751(a)(3)(A) and 777(i) of the Act. International Trade Administration Applications for Duty–Free Entry of Scientific Instruments Pursuant to Section 6(c) of the Educational, Scientific and Cultural E:\FR\FM\27JYN1.SGM 27JYN1 rwilkins on PROD1PC63 with NOTICES Federal Register / Vol. 71, No. 144 / Thursday, July 27, 2006 / Notices Materials Importation Act of 1966 (Pub. L. 89–651; 80 Stat. 897; 15 CFR part 301), we invite comments on the question of whether instruments of equivalent scientific value, for the purposes for which the instruments shown below are intended to be used, are being manufactured in the United States. Comments must comply with 15 CFR 301.5(a)(3) and (4) of the regulations and be filed within 20 days with the Statutory Import Programs Staff, U.S. Department of Commerce, Washington, DC 20230. Applications may be examined between 8:30 a.m. and 5 p.m. in Room 2104, U.S. Department of Commerce, Statutory Import Programs Staff, Room 2104, 14th and Constitution Avenue, NW, Washington, DC. Docket Number: 06–018. Applicant: University of Alabama, 201 7th Ave., A129 Bevill Building, Tuscaloosa, AL 35487. Instrument: Electron Microscope, Model Technai G2 F20 S–TWIN. Manufacturer: FEI Company, The Netherlands. Intended Use: The instrument is intended to be used for research programs involving fuel cells, magnetic information storage, catalysis, joining, and thin films. Materials studied include Pt–alloy nanoparticles, TiAl thin film coating and Cu–Sn alloys for welding. It will also be used for graduate student instruction and training. Application accepted by Commissioner of Customs: April 24 2006. Docket Number: 06–019. Applicant: University of Pittsburgh, Dept. Of ECE, 348 Benedum Hall, 3700 O’Hara Street, Pittsburgh, PA 15261. Instrument: Electron Microscope, Model JEM– 2100F. Manufacturer: JEOL Ltd., Japan. Intended Use: The instrument is intended to be used for probing of how elemental composition, chemistry (bonding) and internal structure at the sub–nanometer scale are affected by processing and influence properties of materials, and to study phenomena associated with processing of high– performance metals, intermetallics, multi–functional oxide ceramics, various types of thin films, nanoparticles in catalysis, oxidation and corrosion behavior, phase transformations and crystal defects. Application accepted by Commissioner of Customs: April 24, 2006. Docket Number: 06–020. Applicant: Middle Tennessee State University, 1114 Cope Building, 1301 East Main Street, Murfreesboro, TN 37132. Instrument: Electron Microscope, Model H–7650 TEM. Manufacturer: Hitachi High Technologies, Japan. Intended Use: The instrument is intended to be used to image samples with thicknesses VerDate Aug<31>2005 16:46 Jul 26, 2006 Jkt 208001 (diameters) less than 1000 nm. Studies include: (1) Characterization of chemically prepared biological structures at high resolution to demonstrate the structure and function of components, (2) heavy–metal-stained biological samples (e.g., bacterial cells within an amoeba) and (3) metrology of discrete particles (e.g., colloidal silica). It will also be used for a training course in electron microscopy. Application accepted by Commissioner of Customs: April 24, 2006. Docket Number: 06–021. Applicant: The University of Texas, Southwestern Medical Center at Dallas, 5323 Harry Hines Boulevard, Dallas, TX 75390– 9056. Instrument: Electron Microscope, Model Technai G2 Spirit BioTwin. Manufacturer: FEI Company, Czech Republic. Intended Use: The instrument is intended to be used to study biological molecules, cells, tissues, organs and microorganisms to determine both normal biological structure and changes which may have occurred during either disease or by experimental manipulation in order to improve patient care and treatment. Application accepted by Commissioner of Customs: April 25, 2006. Docket Number: 06–022. Applicant: Battelle Memorial Institute, Pacific Northwest Division, 902 Battelle Blvd., Richland, WA 99352. Instrument: Electron Microscope, Model Technai G2 Sprint TWIN. Manufacturer: FEI Company, Czech Republic. Intended Use: The instrument is intended to be used for the development of 3– dimensional reconstruction by TEM tomography based on acquirement of tilt series of a biological specimen, and its software reconstruction and rendering. This will provide a vital tool for morphological and functional studies in the area of cell biology and proteomics. Application accepted by Commissioner of Customs: May 2, 2006. Docket Number: 06–023. Applicant: University of California, Lawrence Berkeley Lab for the US Department of Energy, One Cyclotron Road, BLDG 69, Berkeley, CA 94720, P.O. Box 528, Berkeley, CA 94701. Instrument: Electron Microscope, Model JEM–2100. Manufacturer: JEOL, Ltd., Japan. Intended Use: The instrument is intended to be used for high–resolution electron microscopy for characterization of nanostructures combined with Z contrast and element identification, description of interfaces grown on top of each other and growth polarity identification of particular crystals and description of their point groups. Application accepted by Commissioner of Customs: May 4, 2006. PO 00000 Frm 00007 Fmt 4703 Sfmt 4703 42631 Docket Number: 06–024. Applicant: The University of Alabama, 411 Hackberry Lane, Tuscaloosa, AL 35487–0344. Instrument: Electron Microscope, Model H–7650–II TEM. Manufacturer: Hitachi High–Technologies Corp, Japan Use: The instrument is intended to be used to examine and study the structure and functions of cells and organisms including basic description of cells, comparative studies of structure as a result of various treatments, and localization of proteins within cells. It will also be used for diverse educational purposes. Application accepted by Commissioner of Customs: May 5, 2006. Docket Number: 06–025. Applicant: The Ohio State University, Campus Microscopy and Imaging Facility, 4029 Graves Hall, 333 West 10th Ave., Columbus, OH 43210. Instrument: Electron Microscope, Model Technai G2 Spirit BioTwin. Manufacturer: FEI Company, Czech Republic. Intended Use: The instrument is intended to be used by a multi–disciplinary central instrumentation facility to provide nano–technology capability to its SEM laboratory. It will be used for a number of different electron microscopic techniques, including ultra–high resolution imaging, both with and without surface coating at a wide range of voltages for both biological and material applications. It will also be used for diverse educational purposes. Application accepted by Commissioner of Customs: May 5, 2006. Docket Number: 06–026. Applicant: The New York Structural Biology Center, 89 Covenant Avenue at 133rd St., New York, NY 10027. Instrument: Electron Microscope, Model JEM–3200FSC. Manufacturer: JEOL Ltd., Japan. Intended Use: The instrument is intended to be used by ten educational and research institutions in New York to investigate, among other things, biological assemblies ranging from isolated protein molecules, complexes of protein molecules potentially bound to nucleic acids or membranes, crystalline arrays composed of these protein complexes, cells, viruses, or intact tissues to pursue a wide variety of biological problems. In addition to standard methods of electron microscopy, work will be done using the procedure of electron tomography which is like a CAT scan at molecular proportions, involving the imaging of a given cellular assembly which is systematically tilted to different angles. It will also be used in student courses. Application accepted by Commissioner of Customs: May 5, 2006. Docket Number: 06–027. Applicant: The University of Akron, 302 Buchtel Common, Akron, OH 44325. Instrument: E:\FR\FM\27JYN1.SGM 27JYN1 rwilkins on PROD1PC63 with NOTICES 42632 Federal Register / Vol. 71, No. 144 / Thursday, July 27, 2006 / Notices Electron Microscope, Model JEM–1230. Manufacturer: Joel Ltd., Japan. Intended Use: The instrument is intended to be used for graduate research education purposes and in class–oriented educational purposes. Major use will be in polymer microscopy in applications including, but not limited to: polymer fibers, films and membranes; polycrystalline materials; engineering resins, rubber and plastics; emulsions and adhesives and inorganic and organic nano particles. Application accepted by Commissioner of Customs: May 5, 2006. Docket Number: 06–028. Applicant: Clarion Health Partners, 1701 N. Senate Blvd., Indianapolis, IN 46204. Instrument: Electron Microscope, Model Technai G2 Spirit BioTwin. Manufacturer: FEI Company, Czech Republic. Intended Use: The instrument is intended to be used to study various ultrastructural morphologic aspects of normal and pathological cells and tissues. Examples of recent research include 3–D glomerular imaging of renal biopsies, nephropathology in patients with Brushite nephrolithiasis and ischemic disruption of myosin I beta in renal tubules. Application accepted by Commissioner of Customs: May 5, 2006. Docket Number: 06–029. Applicant: U.S. Department of Commerce, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, MD 20899. Instrument: Aberration– Corrected Monochromated Electron Microscope, Model ACEM: Technai G3 TF30CSP. Manufacturer: FEI Company, The Netherlands . Intended Use: The instrument is intended to be used to measure and characterize nanoscale devices and nanoscale materials for nanotechnology research including: electron and x–ray nanotomography; 3– D chemical imaging; critical dimension metrology for semiconductor devices; nanoparticle characterization and will use various other techniques for studying a very broad range of materials. Application accepted by Commissioner of Customs: May 9, 2006. Docket Number: 06–030. Applicant: Florida State University, Department of Biological Science, 119 Biology Unit I, 4370, Tallahassee, FL 32306 Instrument: Electron Microscope, Model Nova 400 NanoSEM. Manufacturer: FEI Company, Czech Republic. Intended Use: The instrument is intended to be used for studies on: comparative morphology of insects; cellular and tissue engineering; cell morphology on different surfaces; formation of semi–crystalline polymers; use of diatoms and other materials as templates for nanostructures; use of photocatalysts active in the synthesis of marine natural products used as anti– VerDate Aug<31>2005 18:18 Jul 26, 2006 Jkt 208001 cancer drugs and a wide range of other structural studies. Application accepted by Commissioner of Customs: May 9, 2006. Docket Number: 06–031. Applicant: Jackson State University, 1400 J.R. Lynch Street, Box 18540. Instrument: Electron Microscope, Model JEM–1011 Manufacturer: JEOL Ltd., Japan. Intended Use: The instrument is intended to be used to study: (1) The molecular structures of various mammalian cells, and compare the morphology of various cell lines; (2) assess the cytotoxicity of various therapeutic and environmental compounds; (3) perform apoptosis studies with these compounds; and (4) study their potential effects at the cellular and molecular levels. It will also be used in courses and training in its operation by students. Application accepted by Commissioner of Customs:May 11, 2005. Docket Number: 06–032. Applicant: Smithsonian Institution. Instrument: Electron Microscope, Model Nova 600 NanoSEM. Manufacturer: FEI Company, Czech Republic. Intended Use: The instrument is intended to be used for research regarding geological, mineralogical and planetary science by imaging and analyzing natural materials for their chemical composition (minerals, meteorites and rock specimens) at the microscopic scale. Application accepted by Commissioner of Customs: May 15, 2006. Docket Number: 06–033. Applicant: University of North Florida, 4567 St. Johns Bluff Rd. South, Jacksonville FL 32224. Instrument: Electron Microscope, Model Quantum 200 ESEM. Manufacturer: FEI Company, Czech Republic. Intended Use: The instrument is intended to be used to: (1) Optimize growth conditions for nanocrystalline ITO thin films and to fabricate gas sensor arrays, (2) study surface morphology, electrical response and chemical analysis of nanocrystalline thin films and gas sensor arrays in the presence of different gases and (3) investigate the surface conditions as well as structural properties of PICM sensors. Application accepted by Commissioner of Customs: May 19, 2006. Docket Number: 06–034. Applicant: NYS Institute for Basic Research, 1050 Forest Hill Road, Staten Island, NY 10314. Instrument: Electron Microscope, Model H–7500. Manufacturer: Hitachi High–Technologies Corporation, Japan. Intended Use: The instrument is intended to be used to study brain, spinal chord, tissue–cultured cells and chromosomes from humans and animals. Priority areas of research PO 00000 Frm 00008 Fmt 4703 Sfmt 4703 include autism, infant development, fragile X syndrome, Down syndrome, neurodegenerative diseases, pediatric AIDS and other neuroinfectious diseases, environmental neurotoxicology, pharmaceutical therapy and brain development and pathology. It will also be used for student training in research methods in electron microscopy. Application accepted by Commissioner of Customs: May 17, 2006. Docket Number: 06–035. Applicant: Carnegie Mellon University, 5000 Forbes Avenue, Pittsburgh, Pa 15213. Instrument: Electron Microscope, Model Nova 600 NanoLab Dual Beam. Manufacturer: FEI Company, The Netherlands. Intended Use: The instrument is intended to be used to study: (1) Grain boundary energy on a wide range of metal, ceramic and semiconductor materials, (2) in–situ serial section for multi–image plans for 3–D analysis of grain boundary energy, (2) thin films of multi–layer materials in semiconductor devices and magnetic recording media and (3) the role of defects in the growth mechanisms of semiconductor substrates. Application accepted by Commissioner of Customs: May 19, 2006. Docket Number: 06–036. Applicant: Texas Tech University, Health Sciences Center, 3601 4th Street, Stop 9042, Lubbock, TX 79430. Instrument: Electron Microscope, Model H–7650–II TEM. Manufacturer: Hitachi High– Technologies Corporation, Japan . Intended Use: The instrument is intended to be used to study, among other things, (1) The diagnosis of disease processes (e.g., examining the basement membrane of the kidney), (2) a blood substitute project will analyze human coronary endothelial cells, brain capillary endothelial cells, astrocytes, and neurons; cells in culture will be fixed, embedded in epon and thin sections will be examined for changes in cell structure and (3) vein leaflets will be fixed in glutaraldehyde, embedded in epon, and thin sections will be examined. Application accepted by Commissioner of Customs: May 24, 2006. Docket Number: 06–037. Applicant: Wesleylan University, Biology Dept., Hall–Atwater Labs, Lawn Ave., Middletown, CT 06459–0170 Instrument: Micromanipulators and control system, temperature control and movable top plate. Manufactuurer: Scientifica, United Kingdom. Intended Use: The instrument is intended to be used to correlate the data taken from ‘‘movies’’ of cortical activity in the mouse with the activity recorded from a single neuron recorded intracellularly. E:\FR\FM\27JYN1.SGM 27JYN1 rwilkins on PROD1PC63 with NOTICES Federal Register / Vol. 71, No. 144 / Thursday, July 27, 2006 / Notices The movie is then used to simultaneously monitor the action potential activity of hundreds of neurons to infer subthreshold activity in other non–proximal neurons. Application accepted by Commissioner of Customs: June 6, 2006. Docket Number: 06–038. Applicant: The Ohio State University,Campus Microscopy and Imaging Facility, 4029 Graves Hall, 333 West 10th Ave., Columbus, OH 43210. Instrument: Electron Microscope, Model Technai G2 Spirit BioTwin. Manufacturer: FEI Company, Czech Republic. Intended Use: The instrument is intended to be used in the campus microscopy and imaging facility, a multi–disciplinary central instrumentation facility at the university and will be used to study many different types of biological and non–biological materials, including many different types of solid–state materials including materials used for nano–fabrication studies. It will be used for both research and educational purposes including microscopy classes as well as individual training of faculty, staff and students. Application accepted by Commissioner of Customs: June 29, 2006. Docket Number: 06–039. Applicant: University of Louisville, Speed School Of Engineering, Ernst Hall Room 106, Louisville, KY, 40292. Instrument: Electron Microscope, Model Technai G2 F–20 X–TWIN. Manufacturer: FEI Company, The Netherlands. Intended Use: The instrument is intended to be used in materials science leading to the development of new materials focusing on carbon–free energy, the development of alternate fuels such as hydrogen and biomass–derived ethanol products and structural biology including biochemistry, molecular biology, genetics and molecular medicine. It will also be used to offer in–depth courses and hands–on seminars on high resolution transmission electron microscopy. Application accepted by Commissioner of Customs: July 10, 2006. Docket Number: 06–040. Applicant: UC Irvine Medical Center, 101 The City Drive, Orange, CA, 92868. Instrument: Electron Microscope, Model Technai G2 Spirit. Manufacturer: FEI Company, Czech Republic. Intended Use: The instrument is intended to be used as a requirement for accreditation of the Pathology residency program. It will be used in the study of renal pathology, muscle and tumor pathology, study of ciliary structure, parasitic protozoan infections in Aids and in viral infection. Application accepted by the Commissioner of Customs: July 10, 2006. VerDate Aug<31>2005 16:46 Jul 26, 2006 Jkt 208001 Docket Number: 06–041. Applicant: University of Illinois at Chicago, Department of Physics (m/c 273), 845 West Taylor Street, Chicago, IL 6067– 7059. Instrument: Beam Stabilizing System Manufacturer: Laser Laboratorium Gottingen, Germany. Intended Use: The instrument is intended to be used as a compatible accessory for an existing KrF Laser which will be developed to improve the beam quality of the laser maximizing the possibility of a uniform beam with an even wavefront for ultraviolet operation at 248 nm with extension of operation into the x–ray range of. 29 nm for general studies of the interaction of intense radiation with matter. Application accepted by the Commissioner of Customs: July 7, 2006. Docket Number: 06–042. Applicant: The University of Illinois at Urbana– Champaign, 616 Green Street, Suite 212, Champaign, IL 61820. Instrument: Electron Microscope, Model JEM–220FS with STEM & Monochrometer. Manufacturer: JEOL Ltd., Japan. Intended Use: The instrument is intended to be used as a major part of the Center for Microanalysis of Materials, a shared research facility at the University of Illinois at Urbana– Champaign. The range of materials to be studied is very broad and under the direction of the current facility Principal Investigators and their graduate students from approximately ten university departments. One of the main goals of this instrument is to develop new imaging techniques to resolve the structure of materials with atomic resolution in three dimensions. Application accepted by the Commissioner of Customs: July 10, 2006. Docket Number: 06–043. Applicant: SUNY Upstate Medical University, 750 East Adams Street, Syracuse, NY 13210. Instrument: Electron Microscope, Model JEM–2100. Manufacturer: JEOL Ltd., Japan. Intended Use: The Instrument is intended to be used to study, among other things, the structure of Pgp to visualize the structural changes Pgp is undergoing during the catalytic cycle, to calculate a three dimensional model of Pgp trapped at the different steps during ATP hydolysis and drug transport and to optimize the conditions under which we currently generate two dimensional crystals of Pgp in its native environment, the lipid layer. Application accepted for transmittal to the Commissioner of Customs: July 10, 2000. Docket Number: 06–044. Applicant: Columbia University, 530 West 120th Street - Room 1001, New York, NY 10027. Instrument: Ultra–High Vacuum PO 00000 Frm 00009 Fmt 4703 Sfmt 4703 42633 Low Temperature Scanning Tunneling Microscope. Manufacturer: Omicron Nano Technology, Germany. Intended Use: The instrument is intended to be used for studying the atomic structure of surfaces; the structure and order of adsorbed monolayers; the electronic properties of the surfaces and adsorbate–covered surfaces. Additionally, the dynamics of change of these properties following heating, cooling, adsorption desorption and laser excitation will be examined. Scanning tunneling microscopy will be conducted at cryogenic temperatures of 4K. Application accepted by the Commissioner of Customs: July 10, 2006. Docket Number: 06–045. Applicant: Purdue University, WTHR Laboratory of Chemistry, 560 Oval Drive, West Lafayette, IN 47907–2084. Instrument: Nd:YAG Laser/dye laser. Manufacturer: InnoLas, Germany. Intended Use: The instrument is intended to be used for fundamental research studies of the properties of molecules, the way in which they isomerize and how they use energy from a laser to isomerize or react. The laser will excite the molecules of interest to excited electronic states, from which they will either fluoresce or are excited further to ionize before detection. It will be used for training and courses in modern, experimental physical chemistry research. Application accepted by the Commissioner of Customs: July 10,2006. Gerald A. Zerdy, Program Manager, Florence Agreement Program. [FR Doc. E6–11968 Filed 7–26–06; 8:45 am] BILLING CODE: 3510–DS–S DEPARTMENT OF COMMERCE National Oceanic and Atmospheric Administration [I.D. 071906B] Advisory Committee to the U.S. Section of the International Commission for the Conservation of Atlantic Tunas (ICCAT); Summer Meeting National Marine Fisheries Service (NMFS), National Oceanic and Atmospheric Administration (NOAA), Commerce. ACTION: Notice of meeting. AGENCY: SUMMARY: In preparation for the 2006 International Commission for the Conservation of Atlantic Tunas (ICCAT) meeting, the Advisory Committee to the U.S. Section to the ICCAT will have a summer meeting. E:\FR\FM\27JYN1.SGM 27JYN1

Agencies

[Federal Register Volume 71, Number 144 (Thursday, July 27, 2006)]
[Notices]
[Pages 42630-42633]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: E6-11968]


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DEPARTMENT OF COMMERCE

International Trade Administration


Applications for Duty-Free Entry of Scientific Instruments

Pursuant to Section 6(c) of the Educational, Scientific and Cultural

[[Page 42631]]

Materials Importation Act of 1966 (Pub. L. 89-651; 80 Stat. 897; 15 CFR 
part 301), we invite comments on the question of whether instruments of 
equivalent scientific value, for the purposes for which the instruments 
shown below are intended to be used, are being manufactured in the 
United States.
Comments must comply with 15 CFR 301.5(a)(3) and (4) of the regulations 
and be filed within 20 days with the Statutory Import Programs Staff, 
U.S. Department of Commerce, Washington, DC 20230. Applications may be 
examined between 8:30 a.m. and 5 p.m. in Room 2104, U.S. Department of 
Commerce, Statutory Import Programs Staff, Room 2104, 14th and 
Constitution Avenue, NW, Washington, DC.
Docket Number: 06-018. Applicant: University of Alabama, 201 7th Ave., 
A129 Bevill Building, Tuscaloosa, AL 35487. Instrument: Electron 
Microscope, Model Technai G2 F20 S-TWIN. Manufacturer: FEI Company, The 
Netherlands. Intended Use: The instrument is intended to be used for 
research programs involving fuel cells, magnetic information storage, 
catalysis, joining, and thin films. Materials studied include Pt-alloy 
nanoparticles, TiAl thin film coating and Cu-Sn alloys for welding. It 
will also be used for graduate student instruction and training. 
Application accepted by Commissioner of Customs: April 24 2006.
Docket Number: 06-019. Applicant: University of Pittsburgh, Dept. Of 
ECE, 348 Benedum Hall, 3700 O'Hara Street, Pittsburgh, PA 15261. 
Instrument: Electron Microscope, Model JEM-2100F. Manufacturer: JEOL 
Ltd., Japan. Intended Use: The instrument is intended to be used for 
probing of how elemental composition, chemistry (bonding) and internal 
structure at the sub-nanometer scale are affected by processing and 
influence properties of materials, and to study phenomena associated 
with processing of high-performance metals, intermetallics, multi-
functional oxide ceramics, various types of thin films, nanoparticles 
in catalysis, oxidation and corrosion behavior, phase transformations 
and crystal defects. Application accepted by Commissioner of Customs: 
April 24, 2006.
Docket Number: 06-020. Applicant: Middle Tennessee State University, 
1114 Cope Building, 1301 East Main Street, Murfreesboro, TN 37132. 
Instrument: Electron Microscope, Model H-7650 TEM. Manufacturer: 
Hitachi High Technologies, Japan. Intended Use: The instrument is 
intended to be used to image samples with thicknesses (diameters) less 
than 1000 nm. Studies include: (1) Characterization of chemically 
prepared biological structures at high resolution to demonstrate the 
structure and function of components, (2) heavy-metal-stained 
biological samples (e.g., bacterial cells within an amoeba) and (3) 
metrology of discrete particles (e.g., colloidal silica). It will also 
be used for a training course in electron microscopy. Application 
accepted by Commissioner of Customs: April 24, 2006.
Docket Number: 06-021. Applicant: The University of Texas, Southwestern 
Medical Center at Dallas, 5323 Harry Hines Boulevard, Dallas, TX 75390-
9056. Instrument: Electron Microscope, Model Technai G2 Spirit BioTwin. 
Manufacturer: FEI Company, Czech Republic. Intended Use: The instrument 
is intended to be used to study biological molecules, cells, tissues, 
organs and microorganisms to determine both normal biological structure 
and changes which may have occurred during either disease or by 
experimental manipulation in order to improve patient care and 
treatment. Application accepted by Commissioner of Customs: April 25, 
2006.
Docket Number: 06-022. Applicant: Battelle Memorial Institute, Pacific 
Northwest Division, 902 Battelle Blvd., Richland, WA 99352. Instrument: 
Electron Microscope, Model Technai G2 Sprint TWIN. Manufacturer: FEI 
Company, Czech Republic. Intended Use: The instrument is intended to be 
used for the development of 3-dimensional reconstruction by TEM 
tomography based on acquirement of tilt series of a biological 
specimen, and its software reconstruction and rendering. This will 
provide a vital tool for morphological and functional studies in the 
area of cell biology and proteomics. Application accepted by 
Commissioner of Customs: May 2, 2006.
Docket Number: 06-023. Applicant: University of California, Lawrence 
Berkeley Lab for the US Department of Energy, One Cyclotron Road, BLDG 
69, Berkeley, CA 94720, P.O. Box 528, Berkeley, CA 94701. Instrument: 
Electron Microscope, Model JEM-2100. Manufacturer: JEOL, Ltd., Japan. 
Intended Use: The instrument is intended to be used for high-resolution 
electron microscopy for characterization of nanostructures combined 
with Z contrast and element identification, description of interfaces 
grown on top of each other and growth polarity identification of 
particular crystals and description of their point groups. Application 
accepted by Commissioner of Customs: May 4, 2006.
Docket Number: 06-024. Applicant: The University of Alabama, 411 
Hackberry Lane, Tuscaloosa, AL 35487-0344. Instrument: Electron 
Microscope, Model H-7650-II TEM. Manufacturer: Hitachi High-
Technologies Corp, Japan Use: The instrument is intended to be used to 
examine and study the structure and functions of cells and organisms 
including basic description of cells, comparative studies of structure 
as a result of various treatments, and localization of proteins within 
cells. It will also be used for diverse educational purposes. 
Application accepted by Commissioner of Customs: May 5, 2006.
Docket Number: 06-025. Applicant: The Ohio State University, Campus 
Microscopy and Imaging Facility, 4029 Graves Hall, 333 West 10th Ave., 
Columbus, OH 43210. Instrument: Electron Microscope, Model Technai G2 
Spirit BioTwin. Manufacturer: FEI Company, Czech Republic. Intended 
Use: The instrument is intended to be used by a multi-disciplinary 
central instrumentation facility to provide nano-technology capability 
to its SEM laboratory. It will be used for a number of different 
electron microscopic techniques, including ultra-high resolution 
imaging, both with and without surface coating at a wide range of 
voltages for both biological and material applications. It will also be 
used for diverse educational purposes. Application accepted by 
Commissioner of Customs: May 5, 2006.
Docket Number: 06-026. Applicant: The New York Structural Biology 
Center, 89 Covenant Avenue at 133rd St., New York, NY 10027. 
Instrument: Electron Microscope, Model JEM-3200FSC. Manufacturer: JEOL 
Ltd., Japan. Intended Use: The instrument is intended to be used by ten 
educational and research institutions in New York to investigate, among 
other things, biological assemblies ranging from isolated protein 
molecules, complexes of protein molecules potentially bound to nucleic 
acids or membranes, crystalline arrays composed of these protein 
complexes, cells, viruses, or intact tissues to pursue a wide variety 
of biological problems. In addition to standard methods of electron 
microscopy, work will be done using the procedure of electron 
tomography which is like a CAT scan at molecular proportions, involving 
the imaging of a given cellular assembly which is systematically tilted 
to different angles. It will also be used in student courses. 
Application accepted by Commissioner of Customs: May 5, 2006.
Docket Number: 06-027. Applicant: The University of Akron, 302 Buchtel 
Common, Akron, OH 44325. Instrument:

[[Page 42632]]

Electron Microscope, Model JEM-1230. Manufacturer: Joel Ltd., Japan. 
Intended Use: The instrument is intended to be used for graduate 
research education purposes and in class-oriented educational purposes. 
Major use will be in polymer microscopy in applications including, but 
not limited to: polymer fibers, films and membranes; polycrystalline 
materials; engineering resins, rubber and plastics; emulsions and 
adhesives and inorganic and organic nano particles. Application 
accepted by Commissioner of Customs: May 5, 2006.
Docket Number: 06-028. Applicant: Clarion Health Partners, 1701 N. 
Senate Blvd., Indianapolis, IN 46204. Instrument: Electron Microscope, 
Model Technai G2 Spirit BioTwin. Manufacturer: FEI Company, Czech 
Republic. Intended Use: The instrument is intended to be used to study 
various ultrastructural morphologic aspects of normal and pathological 
cells and tissues. Examples of recent research include 3-D glomerular 
imaging of renal biopsies, nephropathology in patients with Brushite 
nephrolithiasis and ischemic disruption of myosin I beta in renal 
tubules. Application accepted by Commissioner of Customs: May 5, 2006.
Docket Number: 06-029. Applicant: U.S. Department of Commerce, National 
Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, 
MD 20899. Instrument: Aberration-Corrected Monochromated Electron 
Microscope, Model ACEM: Technai G3 TF30CSP. Manufacturer: FEI Company, 
The Netherlands . Intended Use: The instrument is intended to be used 
to measure and characterize nanoscale devices and nanoscale materials 
for nanotechnology research including: electron and x-ray 
nanotomography; 3-D chemical imaging; critical dimension metrology for 
semiconductor devices; nanoparticle characterization and will use 
various other techniques for studying a very broad range of materials. 
Application accepted by Commissioner of Customs: May 9, 2006.
Docket Number: 06-030. Applicant: Florida State University, Department 
of Biological Science, 119 Biology Unit I, 4370, Tallahassee, FL 32306 
Instrument: Electron Microscope, Model Nova 400 NanoSEM. Manufacturer: 
FEI Company, Czech Republic. Intended Use: The instrument is intended 
to be used for studies on: comparative morphology of insects; cellular 
and tissue engineering; cell morphology on different surfaces; 
formation of semi-crystalline polymers; use of diatoms and other 
materials as templates for nanostructures; use of photocatalysts active 
in the synthesis of marine natural products used as anti-cancer drugs 
and a wide range of other structural studies. Application accepted by 
Commissioner of Customs: May 9, 2006.
Docket Number: 06-031. Applicant: Jackson State University, 1400 J.R. 
Lynch Street, Box 18540. Instrument: Electron Microscope, Model JEM-
1011 Manufacturer: JEOL Ltd., Japan. Intended Use: The instrument is 
intended to be used to study: (1) The molecular structures of various 
mammalian cells, and compare the morphology of various cell lines; (2) 
assess the cytotoxicity of various therapeutic and environmental 
compounds; (3) perform apoptosis studies with these compounds; and (4) 
study their potential effects at the cellular and molecular levels. It 
will also be used in courses and training in its operation by students. 
Application accepted by Commissioner of Customs:May 11, 2005.
Docket Number: 06-032. Applicant: Smithsonian Institution. Instrument: 
Electron Microscope, Model Nova 600 NanoSEM. Manufacturer: FEI Company, 
Czech Republic. Intended Use: The instrument is intended to be used for 
research regarding geological, mineralogical and planetary science by 
imaging and analyzing natural materials for their chemical composition 
(minerals, meteorites and rock specimens) at the microscopic scale. 
Application accepted by Commissioner of Customs: May 15, 2006.
Docket Number: 06-033. Applicant: University of North Florida, 4567 St. 
Johns Bluff Rd. South, Jacksonville FL 32224. Instrument: Electron 
Microscope, Model Quantum 200 ESEM. Manufacturer: FEI Company, Czech 
Republic. Intended Use: The instrument is intended to be used to: (1) 
Optimize growth conditions for nanocrystalline ITO thin films and to 
fabricate gas sensor arrays, (2) study surface morphology, electrical 
response and chemical analysis of nanocrystalline thin films and gas 
sensor arrays in the presence of different gases and (3) investigate 
the surface conditions as well as structural properties of PICM 
sensors. Application accepted by Commissioner of Customs: May 19, 2006.
Docket Number: 06-034. Applicant: NYS Institute for Basic Research, 
1050 Forest Hill Road, Staten Island, NY 10314. Instrument: Electron 
Microscope, Model H-7500. Manufacturer: Hitachi High-Technologies 
Corporation, Japan. Intended Use: The instrument is intended to be used 
to study brain, spinal chord, tissue-cultured cells and chromosomes 
from humans and animals. Priority areas of research include autism, 
infant development, fragile X syndrome, Down syndrome, 
neurodegenerative diseases, pediatric AIDS and other neuroinfectious 
diseases, environmental neurotoxicology, pharmaceutical therapy and 
brain development and pathology. It will also be used for student 
training in research methods in electron microscopy. Application 
accepted by Commissioner of Customs: May 17, 2006.
Docket Number: 06-035. Applicant: Carnegie Mellon University, 5000 
Forbes Avenue, Pittsburgh, Pa 15213. Instrument: Electron Microscope, 
Model Nova 600 NanoLab Dual Beam. Manufacturer: FEI Company, The 
Netherlands. Intended Use: The instrument is intended to be used to 
study: (1) Grain boundary energy on a wide range of metal, ceramic and 
semiconductor materials, (2) in-situ serial section for multi-image 
plans for 3-D analysis of grain boundary energy, (2) thin films of 
multi-layer materials in semiconductor devices and magnetic recording 
media and (3) the role of defects in the growth mechanisms of 
semiconductor substrates. Application accepted by Commissioner of 
Customs: May 19, 2006.
Docket Number: 06-036. Applicant: Texas Tech University, Health 
Sciences Center, 3601 4th Street, Stop 9042, Lubbock, TX 79430. 
Instrument: Electron Microscope, Model H-7650-II TEM. Manufacturer: 
Hitachi High-Technologies Corporation, Japan . Intended Use: The 
instrument is intended to be used to study, among other things, (1) The 
diagnosis of disease processes (e.g., examining the basement membrane 
of the kidney), (2) a blood substitute project will analyze human 
coronary endothelial cells, brain capillary endothelial cells, 
astrocytes, and neurons; cells in culture will be fixed, embedded in 
epon and thin sections will be examined for changes in cell structure 
and (3) vein leaflets will be fixed in glutaraldehyde, embedded in 
epon, and thin sections will be examined. Application accepted by 
Commissioner of Customs: May 24, 2006.
Docket Number: 06-037. Applicant: Wesleylan University, Biology Dept., 
Hall-Atwater Labs, Lawn Ave., Middletown, CT 06459-0170 Instrument: 
Micromanipulators and control system, temperature control and movable 
top plate. Manufactuurer: Scientifica, United Kingdom. Intended Use: 
The instrument is intended to be used to correlate the data taken from 
``movies'' of cortical activity in the mouse with the activity recorded 
from a single neuron recorded intracellularly.

[[Page 42633]]

The movie is then used to simultaneously monitor the action potential 
activity of hundreds of neurons to infer subthreshold activity in other 
non-proximal neurons. Application accepted by Commissioner of Customs: 
June 6, 2006.
Docket Number: 06-038. Applicant: The Ohio State University,Campus 
Microscopy and Imaging Facility, 4029 Graves Hall, 333 West 10th Ave., 
Columbus, OH 43210. Instrument: Electron Microscope, Model Technai G2 
Spirit BioTwin. Manufacturer: FEI Company, Czech Republic. Intended 
Use: The instrument is intended to be used in the campus microscopy and 
imaging facility, a multi-disciplinary central instrumentation facility 
at the university and will be used to study many different types of 
biological and non-biological materials, including many different types 
of solid-state materials including materials used for nano-fabrication 
studies. It will be used for both research and educational purposes 
including microscopy classes as well as individual training of faculty, 
staff and students. Application accepted by Commissioner of Customs: 
June 29, 2006.
Docket Number: 06-039. Applicant: University of Louisville, Speed 
School Of Engineering, Ernst Hall Room 106, Louisville, KY, 40292. 
Instrument: Electron Microscope, Model Technai G2 F-20 X-TWIN. 
Manufacturer: FEI Company, The Netherlands. Intended Use: The 
instrument is intended to be used in materials science leading to the 
development of new materials focusing on carbon-free energy, the 
development of alternate fuels such as hydrogen and biomass-derived 
ethanol products and structural biology including biochemistry, 
molecular biology, genetics and molecular medicine. It will also be 
used to offer in-depth courses and hands-on seminars on high resolution 
transmission electron microscopy. Application accepted by Commissioner 
of Customs: July 10, 2006.
Docket Number: 06-040. Applicant: UC Irvine Medical Center, 101 The 
City Drive, Orange, CA, 92868. Instrument: Electron Microscope, Model 
Technai G2 Spirit. Manufacturer: FEI Company, Czech Republic. Intended 
Use: The instrument is intended to be used as a requirement for 
accreditation of the Pathology residency program. It will be used in 
the study of renal pathology, muscle and tumor pathology, study of 
ciliary structure, parasitic protozoan infections in Aids and in viral 
infection. Application accepted by the Commissioner of Customs: July 
10, 2006.
Docket Number: 06-041. Applicant: University of Illinois at Chicago, 
Department of Physics (m/c 273), 845 West Taylor Street, Chicago, IL 
6067-7059. Instrument: Beam Stabilizing System Manufacturer: Laser 
Laboratorium Gottingen, Germany. Intended Use: The instrument is 
intended to be used as a compatible accessory for an existing KrF Laser 
which will be developed to improve the beam quality of the laser 
maximizing the possibility of a uniform beam with an even wavefront for 
ultraviolet operation at 248 nm with extension of operation into the x-
ray range of. 29 nm for general studies of the interaction of intense 
radiation with matter. Application accepted by the Commissioner of 
Customs: July 7, 2006.
Docket Number: 06-042. Applicant: The University of Illinois at Urbana-
Champaign, 616 Green Street, Suite 212, Champaign, IL 61820. 
Instrument: Electron Microscope, Model JEM-220FS with STEM & 
Monochrometer. Manufacturer: JEOL Ltd., Japan. Intended Use: The 
instrument is intended to be used as a major part of the Center for 
Microanalysis of Materials, a shared research facility at the 
University of Illinois at Urbana-Champaign. The range of materials to 
be studied is very broad and under the direction of the current 
facility Principal Investigators and their graduate students from 
approximately ten university departments. One of the main goals of this 
instrument is to develop new imaging techniques to resolve the 
structure of materials with atomic resolution in three dimensions. 
Application accepted by the Commissioner of Customs: July 10, 2006.
Docket Number: 06-043. Applicant: SUNY Upstate Medical University, 750 
East Adams Street, Syracuse, NY 13210. Instrument: Electron Microscope, 
Model JEM-2100. Manufacturer: JEOL Ltd., Japan. Intended Use: The 
Instrument is intended to be used to study, among other things, the 
structure of Pgp to visualize the structural changes Pgp is undergoing 
during the catalytic cycle, to calculate a three dimensional model of 
Pgp trapped at the different steps during ATP hydolysis and drug 
transport and to optimize the conditions under which we currently 
generate two dimensional crystals of Pgp in its native environment, the 
lipid layer. Application accepted for transmittal to the Commissioner 
of Customs: July 10, 2000.
Docket Number: 06-044. Applicant: Columbia University, 530 West 120th 
Street - Room 1001, New York, NY 10027. Instrument: Ultra-High Vacuum 
Low Temperature Scanning Tunneling Microscope. Manufacturer: Omicron 
Nano Technology, Germany. Intended Use: The instrument is intended to 
be used for studying the atomic structure of surfaces; the structure 
and order of adsorbed monolayers; the electronic properties of the 
surfaces and adsorbate-covered surfaces. Additionally, the dynamics of 
change of these properties following heating, cooling, adsorption 
desorption and laser excitation will be examined. Scanning tunneling 
microscopy will be conducted at cryogenic temperatures of 4K. 
Application accepted by the Commissioner of Customs: July 10, 2006.
Docket Number: 06-045. Applicant: Purdue University, WTHR Laboratory of 
Chemistry, 560 Oval Drive, West Lafayette, IN 47907-2084. Instrument: 
Nd:YAG Laser/dye laser. Manufacturer: InnoLas, Germany. Intended Use: 
The instrument is intended to be used for fundamental research studies 
of the properties of molecules, the way in which they isomerize and how 
they use energy from a laser to isomerize or react. The laser will 
excite the molecules of interest to excited electronic states, from 
which they will either fluoresce or are excited further to ionize 
before detection. It will be used for training and courses in modern, 
experimental physical chemistry research. Application accepted by the 
Commissioner of Customs: July 10,2006.

Gerald A. Zerdy,
Program Manager, Florence Agreement Program.
[FR Doc. E6-11968 Filed 7-26-06; 8:45 am]
BILLING CODE: 3510-DS-S