Applications for Duty-Free Entry of Scientific Instruments, 42630-42633 [E6-11968]
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42630
Federal Register / Vol. 71, No. 144 / Thursday, July 27, 2006 / Notices
Dated: July 18, 2006.
Stephen J. Claeys,
Deputy Assistant Secretary for Import
Administration.
[FR Doc.E6–11969 Filed 7–26–06; 8:45 am]
BILLING CODE 3510–DS–S
DEPARTMENT OF COMMERCE
International Trade Administration
[A–485–806]
Notice of Extension of Time Limit for
the Preliminary Results of
Antidumping Duty Administrative
Review: Certain Hot- Rolled Carbon
Steel Flat Products from Romania
Import Administration,
International Trade Administration,
Department of Commerce.
SUMMARY: The Department of Commerce
is extending the time limit for
completion of the preliminary results of
the administrative review of the
antidumping duty order on certain hot–
rolled carbon steel flat products from
Romania until October 16, 2006. The
period of review is November 1, 2004,
through October 31, 2005.
EFFECTIVE DATE: July 27, 2006.
FOR FURTHER INFORMATION CONTACT:
Dunyako Ahmadu, Import
Administration, International Trade
Administration, U.S. Department of
Commerce, 14th Street and Constitution
Avenue, NW., Washington, DC 20230;
telephone (202) 482–0198.
SUPPLEMENTARY INFORMATION:
AGENCY:
Background
On December 22, 2005, the
Department of Commerce (the
Department) published a notice of
initiation of the 2004–2005 antidumping
duty administrative review of this order
covering Mittal Steel Galati S.A.
(formerly Ispat Sidex S.A). See Initiation
of Antidumping and Countervailing
Duty Administrative Reviews and
Request for Revocation in Part, 70 FR
76024 (December 22, 2004).
rwilkins on PROD1PC63 with NOTICES
Extension of Time Limit for Preliminary
Results
The Tariff Act of 1930, as amended
(the Act), provides at section
751(a)(3)(A) that the Department will
issue the preliminary results of an
administrative review of an
antidumping duty order within 245
days after the last day of the anniversary
month of the date of publication of the
order. Section 751(a)(3)(A) of the Act
provides further that, if the Department
determines that it is not practicable to
complete the review within this time
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16:46 Jul 26, 2006
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period, the Department may extend the
245-day period to 365 days.
The Department has determined that
it is not practicable to complete the
preliminary results by the current
deadline of August 2, 2006, because it
received a request to conduct a sales–
below-cost investigation on July 11,
2006. Additional time is necessary to
consider whether to initiate a sales–
below-cost investigation, give MS Galati
an opportunity to provide relevant
information, review MS Galati’s
response, and, if appropriate, conduct
the cost analysis as part of the
calculation of the weighted–average
margin for MS Galati.
Therefore, in accordance with section
751(a)(3)(A) of the Act and 19 CFR
351.213(h)(2), the Department is
extending the time limit for the
preliminary results by 75 days to
October 16, 2006.
We are issuing this notice in
accordance with section 751(a)(3)(A) of
the Act.
Dated: July 21, 2006.
Stephen J. Claeys,
Deputy Assistant Secretary for Import
Administration.
[FR Doc. E6–11972 Filed 7–26–06; 8:45 am]
BILLING CODE 3510–DS–S
DEPARTMENT OF COMMERCE
International Trade Administration
[A–549–821]
Notice of Extension of Deadline for the
Preliminary Results of Antidumping
Duty Administrative Review:
Polyethylene Retail Carrier Bags from
Thailand
Import Administration,
International Trade Administration,
Department of Commerce,
EFFECTIVE DATE: July 27, 2006.
FOR FURTHER INFORMATION CONTACT: Lyn
Johnson or Richard Rimlinger, AD/CVD
Operations, Office 5, Import
Administration, International Trade
Administration, U.S. Department of
Commerce, 14th Street and Constitution
Avenue, NW., Washington, DC 20230;
telephone: (202) 482–5287 and (202)
482–4477, respectively.
SUPPLEMENTARY INFORMATION:
AGENCY:
Extension of Deadline
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Dated: July 21, 2006.
Stephen J. Claeys,
Deputy Assistant Secretary for Import
Administration.
[FR Doc. E6–11971 Filed 7–26–06; 8:45 am]
BILLING CODE: 3510–DS–S
DEPARTMENT OF COMMERCE
At the request of various parties, the
Department of Commerce (the
Department) initiated an administrative
review of the antidumping duty order
on polyethylene retail carrier bags from
Thailand for the period January 26,
2004, through July 31, 2005. See
PO 00000
Initiation of Antidumping and
Countervailing Duty Administrative
Reviews and Request for Revocation in
Part, 70 FR 56631 (September 28, 2005).
Section 751(a)(3)(A) of the Tariff Act of
1930, as amended (the Act), requires the
Department to issue preliminary results
of review within 245 days after the last
day of the anniversary month of an
order for which a review is requested
and final results within 120 days after
the date on which the preliminary
results were published. If it is not
practicable to complete the review
within these time periods, section
751(a)(3)(A) of the Act allows the
Department to extend the time limit for
the preliminary results to a maximum of
365 days after the last day of the
anniversary month.
On April 26, 2006, the Department
published a notice extending the
preliminary results for this review by 90
days until August 1, 2006. See Notice of
Extension of Deadline for the
Preliminary Results of Antidumping
Duty Administrative Review:
Polyethylene Retail Carrier Bags from
Thailand, 71 FR 24641 (April 26, 2006).
Since the publication of the extension
notice, the Department conducted
home–market sales and cost
verifications of two of the seven
respondents involved in this review and
has a number of issues to address as a
result of these verifications. In addition,
the Department must also address
several complex issues raised in recent
filings by interested parties involving,
among others, costs of production,
affiliated–party inputs, direct material
expenses, and sales reporting.
Due to the complexity of the issues in
this review, the Department needs
additional time to conduct its analysis.
Therefore, we are extending the
deadline for issuing the preliminary
results of this review by an additional
30 days until August 31, 2006.
This notice is published in
accordance with sections 751(a)(3)(A)
and 777(i) of the Act.
International Trade Administration
Applications for Duty–Free Entry of
Scientific Instruments
Pursuant to Section 6(c) of the
Educational, Scientific and Cultural
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Federal Register / Vol. 71, No. 144 / Thursday, July 27, 2006 / Notices
Materials Importation Act of 1966 (Pub.
L. 89–651; 80 Stat. 897; 15 CFR part
301), we invite comments on the
question of whether instruments of
equivalent scientific value, for the
purposes for which the instruments
shown below are intended to be used,
are being manufactured in the United
States.
Comments must comply with 15 CFR
301.5(a)(3) and (4) of the regulations and
be filed within 20 days with the
Statutory Import Programs Staff, U.S.
Department of Commerce, Washington,
DC 20230. Applications may be
examined between 8:30 a.m. and 5 p.m.
in Room 2104, U.S. Department of
Commerce, Statutory Import Programs
Staff, Room 2104, 14th and Constitution
Avenue, NW, Washington, DC.
Docket Number: 06–018. Applicant:
University of Alabama, 201 7th Ave.,
A129 Bevill Building, Tuscaloosa, AL
35487. Instrument: Electron Microscope,
Model Technai G2 F20 S–TWIN.
Manufacturer: FEI Company, The
Netherlands. Intended Use: The
instrument is intended to be used for
research programs involving fuel cells,
magnetic information storage, catalysis,
joining, and thin films. Materials
studied include Pt–alloy nanoparticles,
TiAl thin film coating and Cu–Sn alloys
for welding. It will also be used for
graduate student instruction and
training. Application accepted by
Commissioner of Customs: April 24
2006.
Docket Number: 06–019. Applicant:
University of Pittsburgh, Dept. Of ECE,
348 Benedum Hall, 3700 O’Hara Street,
Pittsburgh, PA 15261. Instrument:
Electron Microscope, Model JEM–
2100F. Manufacturer: JEOL Ltd., Japan.
Intended Use: The instrument is
intended to be used for probing of how
elemental composition, chemistry
(bonding) and internal structure at the
sub–nanometer scale are affected by
processing and influence properties of
materials, and to study phenomena
associated with processing of high–
performance metals, intermetallics,
multi–functional oxide ceramics,
various types of thin films,
nanoparticles in catalysis, oxidation and
corrosion behavior, phase
transformations and crystal defects.
Application accepted by Commissioner
of Customs: April 24, 2006.
Docket Number: 06–020. Applicant:
Middle Tennessee State University,
1114 Cope Building, 1301 East Main
Street, Murfreesboro, TN 37132.
Instrument: Electron Microscope, Model
H–7650 TEM. Manufacturer: Hitachi
High Technologies, Japan. Intended Use:
The instrument is intended to be used
to image samples with thicknesses
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(diameters) less than 1000 nm. Studies
include: (1) Characterization of
chemically prepared biological
structures at high resolution to
demonstrate the structure and function
of components, (2) heavy–metal-stained
biological samples (e.g., bacterial cells
within an amoeba) and (3) metrology of
discrete particles (e.g., colloidal silica).
It will also be used for a training course
in electron microscopy. Application
accepted by Commissioner of Customs:
April 24, 2006.
Docket Number: 06–021. Applicant: The
University of Texas, Southwestern
Medical Center at Dallas, 5323 Harry
Hines Boulevard, Dallas, TX 75390–
9056. Instrument: Electron Microscope,
Model Technai G2 Spirit BioTwin.
Manufacturer: FEI Company, Czech
Republic. Intended Use: The instrument
is intended to be used to study
biological molecules, cells, tissues,
organs and microorganisms to
determine both normal biological
structure and changes which may have
occurred during either disease or by
experimental manipulation in order to
improve patient care and treatment.
Application accepted by Commissioner
of Customs: April 25, 2006.
Docket Number: 06–022. Applicant:
Battelle Memorial Institute, Pacific
Northwest Division, 902 Battelle Blvd.,
Richland, WA 99352. Instrument:
Electron Microscope, Model Technai G2
Sprint TWIN. Manufacturer: FEI
Company, Czech Republic. Intended
Use: The instrument is intended to be
used for the development of 3–
dimensional reconstruction by TEM
tomography based on acquirement of tilt
series of a biological specimen, and its
software reconstruction and rendering.
This will provide a vital tool for
morphological and functional studies in
the area of cell biology and proteomics.
Application accepted by Commissioner
of Customs: May 2, 2006.
Docket Number: 06–023. Applicant:
University of California, Lawrence
Berkeley Lab for the US Department of
Energy, One Cyclotron Road, BLDG 69,
Berkeley, CA 94720, P.O. Box 528,
Berkeley, CA 94701. Instrument:
Electron Microscope, Model JEM–2100.
Manufacturer: JEOL, Ltd., Japan.
Intended Use: The instrument is
intended to be used for high–resolution
electron microscopy for characterization
of nanostructures combined with Z
contrast and element identification,
description of interfaces grown on top of
each other and growth polarity
identification of particular crystals and
description of their point groups.
Application accepted by Commissioner
of Customs: May 4, 2006.
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Docket Number: 06–024. Applicant: The
University of Alabama, 411 Hackberry
Lane, Tuscaloosa, AL 35487–0344.
Instrument: Electron Microscope, Model
H–7650–II TEM. Manufacturer: Hitachi
High–Technologies Corp, Japan Use:
The instrument is intended to be used
to examine and study the structure and
functions of cells and organisms
including basic description of cells,
comparative studies of structure as a
result of various treatments, and
localization of proteins within cells. It
will also be used for diverse educational
purposes. Application accepted by
Commissioner of Customs: May 5, 2006.
Docket Number: 06–025. Applicant: The
Ohio State University, Campus
Microscopy and Imaging Facility, 4029
Graves Hall, 333 West 10th Ave.,
Columbus, OH 43210. Instrument:
Electron Microscope, Model Technai G2
Spirit BioTwin. Manufacturer: FEI
Company, Czech Republic. Intended
Use: The instrument is intended to be
used by a multi–disciplinary central
instrumentation facility to provide
nano–technology capability to its SEM
laboratory. It will be used for a number
of different electron microscopic
techniques, including ultra–high
resolution imaging, both with and
without surface coating at a wide range
of voltages for both biological and
material applications. It will also be
used for diverse educational purposes.
Application accepted by Commissioner
of Customs: May 5, 2006.
Docket Number: 06–026. Applicant: The
New York Structural Biology Center, 89
Covenant Avenue at 133rd St., New
York, NY 10027. Instrument: Electron
Microscope, Model JEM–3200FSC.
Manufacturer: JEOL Ltd., Japan.
Intended Use: The instrument is
intended to be used by ten educational
and research institutions in New York to
investigate, among other things,
biological assemblies ranging from
isolated protein molecules, complexes
of protein molecules potentially bound
to nucleic acids or membranes,
crystalline arrays composed of these
protein complexes, cells, viruses, or
intact tissues to pursue a wide variety
of biological problems. In addition to
standard methods of electron
microscopy, work will be done using
the procedure of electron tomography
which is like a CAT scan at molecular
proportions, involving the imaging of a
given cellular assembly which is
systematically tilted to different angles.
It will also be used in student courses.
Application accepted by Commissioner
of Customs: May 5, 2006.
Docket Number: 06–027. Applicant: The
University of Akron, 302 Buchtel
Common, Akron, OH 44325. Instrument:
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42632
Federal Register / Vol. 71, No. 144 / Thursday, July 27, 2006 / Notices
Electron Microscope, Model JEM–1230.
Manufacturer: Joel Ltd., Japan. Intended
Use: The instrument is intended to be
used for graduate research education
purposes and in class–oriented
educational purposes. Major use will be
in polymer microscopy in applications
including, but not limited to: polymer
fibers, films and membranes;
polycrystalline materials; engineering
resins, rubber and plastics; emulsions
and adhesives and inorganic and
organic nano particles. Application
accepted by Commissioner of Customs:
May 5, 2006.
Docket Number: 06–028. Applicant:
Clarion Health Partners, 1701 N. Senate
Blvd., Indianapolis, IN 46204.
Instrument: Electron Microscope, Model
Technai G2 Spirit BioTwin.
Manufacturer: FEI Company, Czech
Republic. Intended Use: The instrument
is intended to be used to study various
ultrastructural morphologic aspects of
normal and pathological cells and
tissues. Examples of recent research
include 3–D glomerular imaging of renal
biopsies, nephropathology in patients
with Brushite nephrolithiasis and
ischemic disruption of myosin I beta in
renal tubules. Application accepted by
Commissioner of Customs: May 5, 2006.
Docket Number: 06–029. Applicant:
U.S. Department of Commerce, National
Institute of Standards and Technology,
100 Bureau Drive, Gaithersburg, MD
20899. Instrument: Aberration–
Corrected Monochromated Electron
Microscope, Model ACEM: Technai G3
TF30CSP. Manufacturer: FEI Company,
The Netherlands . Intended Use: The
instrument is intended to be used to
measure and characterize nanoscale
devices and nanoscale materials for
nanotechnology research including:
electron and x–ray nanotomography; 3–
D chemical imaging; critical dimension
metrology for semiconductor devices;
nanoparticle characterization and will
use various other techniques for
studying a very broad range of materials.
Application accepted by Commissioner
of Customs: May 9, 2006.
Docket Number: 06–030. Applicant:
Florida State University, Department of
Biological Science, 119 Biology Unit I,
4370, Tallahassee, FL 32306 Instrument:
Electron Microscope, Model Nova 400
NanoSEM. Manufacturer: FEI Company,
Czech Republic. Intended Use: The
instrument is intended to be used for
studies on: comparative morphology of
insects; cellular and tissue engineering;
cell morphology on different surfaces;
formation of semi–crystalline polymers;
use of diatoms and other materials as
templates for nanostructures; use of
photocatalysts active in the synthesis of
marine natural products used as anti–
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cancer drugs and a wide range of other
structural studies. Application accepted
by Commissioner of Customs: May 9,
2006.
Docket Number: 06–031. Applicant:
Jackson State University, 1400 J.R.
Lynch Street, Box 18540. Instrument:
Electron Microscope, Model JEM–1011
Manufacturer: JEOL Ltd., Japan.
Intended Use: The instrument is
intended to be used to study: (1) The
molecular structures of various
mammalian cells, and compare the
morphology of various cell lines; (2)
assess the cytotoxicity of various
therapeutic and environmental
compounds; (3) perform apoptosis
studies with these compounds; and (4)
study their potential effects at the
cellular and molecular levels. It will
also be used in courses and training in
its operation by students. Application
accepted by Commissioner of
Customs:May 11, 2005.
Docket Number: 06–032. Applicant:
Smithsonian Institution. Instrument:
Electron Microscope, Model Nova 600
NanoSEM. Manufacturer: FEI Company,
Czech Republic. Intended Use: The
instrument is intended to be used for
research regarding geological,
mineralogical and planetary science by
imaging and analyzing natural materials
for their chemical composition
(minerals, meteorites and rock
specimens) at the microscopic scale.
Application accepted by Commissioner
of Customs: May 15, 2006.
Docket Number: 06–033. Applicant:
University of North Florida, 4567 St.
Johns Bluff Rd. South, Jacksonville FL
32224. Instrument: Electron Microscope,
Model Quantum 200 ESEM.
Manufacturer: FEI Company, Czech
Republic. Intended Use: The instrument
is intended to be used to: (1) Optimize
growth conditions for nanocrystalline
ITO thin films and to fabricate gas
sensor arrays, (2) study surface
morphology, electrical response and
chemical analysis of nanocrystalline
thin films and gas sensor arrays in the
presence of different gases and (3)
investigate the surface conditions as
well as structural properties of PICM
sensors. Application accepted by
Commissioner of Customs: May 19,
2006.
Docket Number: 06–034. Applicant:
NYS Institute for Basic Research, 1050
Forest Hill Road, Staten Island, NY
10314. Instrument: Electron Microscope,
Model H–7500. Manufacturer: Hitachi
High–Technologies Corporation, Japan.
Intended Use: The instrument is
intended to be used to study brain,
spinal chord, tissue–cultured cells and
chromosomes from humans and
animals. Priority areas of research
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include autism, infant development,
fragile X syndrome, Down syndrome,
neurodegenerative diseases, pediatric
AIDS and other neuroinfectious
diseases, environmental
neurotoxicology, pharmaceutical
therapy and brain development and
pathology. It will also be used for
student training in research methods in
electron microscopy. Application
accepted by Commissioner of Customs:
May 17, 2006.
Docket Number: 06–035. Applicant:
Carnegie Mellon University, 5000
Forbes Avenue, Pittsburgh, Pa 15213.
Instrument: Electron Microscope, Model
Nova 600 NanoLab Dual Beam.
Manufacturer: FEI Company, The
Netherlands. Intended Use: The
instrument is intended to be used to
study: (1) Grain boundary energy on a
wide range of metal, ceramic and
semiconductor materials, (2) in–situ
serial section for multi–image plans for
3–D analysis of grain boundary energy,
(2) thin films of multi–layer materials in
semiconductor devices and magnetic
recording media and (3) the role of
defects in the growth mechanisms of
semiconductor substrates. Application
accepted by Commissioner of Customs:
May 19, 2006.
Docket Number: 06–036. Applicant:
Texas Tech University, Health Sciences
Center, 3601 4th Street, Stop 9042,
Lubbock, TX 79430. Instrument:
Electron Microscope, Model H–7650–II
TEM. Manufacturer: Hitachi High–
Technologies Corporation, Japan .
Intended Use: The instrument is
intended to be used to study, among
other things, (1) The diagnosis of
disease processes (e.g., examining the
basement membrane of the kidney), (2)
a blood substitute project will analyze
human coronary endothelial cells, brain
capillary endothelial cells, astrocytes,
and neurons; cells in culture will be
fixed, embedded in epon and thin
sections will be examined for changes in
cell structure and (3) vein leaflets will
be fixed in glutaraldehyde, embedded in
epon, and thin sections will be
examined. Application accepted by
Commissioner of Customs: May 24,
2006.
Docket Number: 06–037. Applicant:
Wesleylan University, Biology Dept.,
Hall–Atwater Labs, Lawn Ave.,
Middletown, CT 06459–0170
Instrument: Micromanipulators and
control system, temperature control and
movable top plate. Manufactuurer:
Scientifica, United Kingdom. Intended
Use: The instrument is intended to be
used to correlate the data taken from
‘‘movies’’ of cortical activity in the
mouse with the activity recorded from
a single neuron recorded intracellularly.
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The movie is then used to
simultaneously monitor the action
potential activity of hundreds of
neurons to infer subthreshold activity in
other non–proximal neurons.
Application accepted by Commissioner
of Customs: June 6, 2006.
Docket Number: 06–038. Applicant: The
Ohio State University,Campus
Microscopy and Imaging Facility, 4029
Graves Hall, 333 West 10th Ave.,
Columbus, OH 43210. Instrument:
Electron Microscope, Model Technai G2
Spirit BioTwin. Manufacturer: FEI
Company, Czech Republic. Intended
Use: The instrument is intended to be
used in the campus microscopy and
imaging facility, a multi–disciplinary
central instrumentation facility at the
university and will be used to study
many different types of biological and
non–biological materials, including
many different types of solid–state
materials including materials used for
nano–fabrication studies. It will be used
for both research and educational
purposes including microscopy classes
as well as individual training of faculty,
staff and students. Application accepted
by Commissioner of Customs: June 29,
2006.
Docket Number: 06–039. Applicant:
University of Louisville, Speed School
Of Engineering, Ernst Hall Room 106,
Louisville, KY, 40292. Instrument:
Electron Microscope, Model Technai G2
F–20 X–TWIN. Manufacturer: FEI
Company, The Netherlands. Intended
Use: The instrument is intended to be
used in materials science leading to the
development of new materials focusing
on carbon–free energy, the development
of alternate fuels such as hydrogen and
biomass–derived ethanol products and
structural biology including
biochemistry, molecular biology,
genetics and molecular medicine. It will
also be used to offer in–depth courses
and hands–on seminars on high
resolution transmission electron
microscopy. Application accepted by
Commissioner of Customs: July 10,
2006.
Docket Number: 06–040. Applicant: UC
Irvine Medical Center, 101 The City
Drive, Orange, CA, 92868. Instrument:
Electron Microscope, Model Technai G2
Spirit. Manufacturer: FEI Company,
Czech Republic. Intended Use: The
instrument is intended to be used as a
requirement for accreditation of the
Pathology residency program. It will be
used in the study of renal pathology,
muscle and tumor pathology, study of
ciliary structure, parasitic protozoan
infections in Aids and in viral infection.
Application accepted by the
Commissioner of Customs: July 10,
2006.
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Docket Number: 06–041. Applicant:
University of Illinois at Chicago,
Department of Physics (m/c 273), 845
West Taylor Street, Chicago, IL 6067–
7059. Instrument: Beam Stabilizing
System Manufacturer: Laser
Laboratorium Gottingen, Germany.
Intended Use: The instrument is
intended to be used as a compatible
accessory for an existing KrF Laser
which will be developed to improve the
beam quality of the laser maximizing
the possibility of a uniform beam with
an even wavefront for ultraviolet
operation at 248 nm with extension of
operation into the x–ray range of. 29 nm
for general studies of the interaction of
intense radiation with matter.
Application accepted by the
Commissioner of Customs: July 7, 2006.
Docket Number: 06–042. Applicant: The
University of Illinois at Urbana–
Champaign, 616 Green Street, Suite 212,
Champaign, IL 61820. Instrument:
Electron Microscope, Model JEM–220FS
with STEM & Monochrometer.
Manufacturer: JEOL Ltd., Japan.
Intended Use: The instrument is
intended to be used as a major part of
the Center for Microanalysis of
Materials, a shared research facility at
the University of Illinois at Urbana–
Champaign. The range of materials to be
studied is very broad and under the
direction of the current facility Principal
Investigators and their graduate students
from approximately ten university
departments. One of the main goals of
this instrument is to develop new
imaging techniques to resolve the
structure of materials with atomic
resolution in three dimensions.
Application accepted by the
Commissioner of Customs: July 10,
2006.
Docket Number: 06–043. Applicant:
SUNY Upstate Medical University, 750
East Adams Street, Syracuse, NY 13210.
Instrument: Electron Microscope, Model
JEM–2100. Manufacturer: JEOL Ltd.,
Japan. Intended Use: The Instrument is
intended to be used to study, among
other things, the structure of Pgp to
visualize the structural changes Pgp is
undergoing during the catalytic cycle, to
calculate a three dimensional model of
Pgp trapped at the different steps during
ATP hydolysis and drug transport and
to optimize the conditions under which
we currently generate two dimensional
crystals of Pgp in its native
environment, the lipid layer.
Application accepted for transmittal to
the Commissioner of Customs: July 10,
2000.
Docket Number: 06–044. Applicant:
Columbia University, 530 West 120th
Street - Room 1001, New York, NY
10027. Instrument: Ultra–High Vacuum
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42633
Low Temperature Scanning Tunneling
Microscope. Manufacturer: Omicron
Nano Technology, Germany. Intended
Use: The instrument is intended to be
used for studying the atomic structure of
surfaces; the structure and order of
adsorbed monolayers; the electronic
properties of the surfaces and
adsorbate–covered surfaces.
Additionally, the dynamics of change of
these properties following heating,
cooling, adsorption desorption and laser
excitation will be examined. Scanning
tunneling microscopy will be conducted
at cryogenic temperatures of 4K.
Application accepted by the
Commissioner of Customs: July 10,
2006.
Docket Number: 06–045. Applicant:
Purdue University, WTHR Laboratory of
Chemistry, 560 Oval Drive, West
Lafayette, IN 47907–2084. Instrument:
Nd:YAG Laser/dye laser. Manufacturer:
InnoLas, Germany. Intended Use: The
instrument is intended to be used for
fundamental research studies of the
properties of molecules, the way in
which they isomerize and how they use
energy from a laser to isomerize or react.
The laser will excite the molecules of
interest to excited electronic states, from
which they will either fluoresce or are
excited further to ionize before
detection. It will be used for training
and courses in modern, experimental
physical chemistry research.
Application accepted by the
Commissioner of Customs: July 10,2006.
Gerald A. Zerdy,
Program Manager, Florence Agreement
Program.
[FR Doc. E6–11968 Filed 7–26–06; 8:45 am]
BILLING CODE: 3510–DS–S
DEPARTMENT OF COMMERCE
National Oceanic and Atmospheric
Administration
[I.D. 071906B]
Advisory Committee to the U.S.
Section of the International
Commission for the Conservation of
Atlantic Tunas (ICCAT); Summer
Meeting
National Marine Fisheries
Service (NMFS), National Oceanic and
Atmospheric Administration (NOAA),
Commerce.
ACTION: Notice of meeting.
AGENCY:
SUMMARY: In preparation for the 2006
International Commission for the
Conservation of Atlantic Tunas (ICCAT)
meeting, the Advisory Committee to the
U.S. Section to the ICCAT will have a
summer meeting.
E:\FR\FM\27JYN1.SGM
27JYN1
]]>Agencies
[Federal Register Volume 71, Number 144 (Thursday, July 27, 2006)]
[Notices]
[Pages 42630-42633]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: E6-11968]
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DEPARTMENT OF COMMERCE
International Trade Administration
Applications for Duty-Free Entry of Scientific Instruments
Pursuant to Section 6(c) of the Educational, Scientific and Cultural
[[Page 42631]]
Materials Importation Act of 1966 (Pub. L. 89-651; 80 Stat. 897; 15 CFR
part 301), we invite comments on the question of whether instruments of
equivalent scientific value, for the purposes for which the instruments
shown below are intended to be used, are being manufactured in the
United States.
Comments must comply with 15 CFR 301.5(a)(3) and (4) of the regulations
and be filed within 20 days with the Statutory Import Programs Staff,
U.S. Department of Commerce, Washington, DC 20230. Applications may be
examined between 8:30 a.m. and 5 p.m. in Room 2104, U.S. Department of
Commerce, Statutory Import Programs Staff, Room 2104, 14th and
Constitution Avenue, NW, Washington, DC.
Docket Number: 06-018. Applicant: University of Alabama, 201 7th Ave.,
A129 Bevill Building, Tuscaloosa, AL 35487. Instrument: Electron
Microscope, Model Technai G2 F20 S-TWIN. Manufacturer: FEI Company, The
Netherlands. Intended Use: The instrument is intended to be used for
research programs involving fuel cells, magnetic information storage,
catalysis, joining, and thin films. Materials studied include Pt-alloy
nanoparticles, TiAl thin film coating and Cu-Sn alloys for welding. It
will also be used for graduate student instruction and training.
Application accepted by Commissioner of Customs: April 24 2006.
Docket Number: 06-019. Applicant: University of Pittsburgh, Dept. Of
ECE, 348 Benedum Hall, 3700 O'Hara Street, Pittsburgh, PA 15261.
Instrument: Electron Microscope, Model JEM-2100F. Manufacturer: JEOL
Ltd., Japan. Intended Use: The instrument is intended to be used for
probing of how elemental composition, chemistry (bonding) and internal
structure at the sub-nanometer scale are affected by processing and
influence properties of materials, and to study phenomena associated
with processing of high-performance metals, intermetallics, multi-
functional oxide ceramics, various types of thin films, nanoparticles
in catalysis, oxidation and corrosion behavior, phase transformations
and crystal defects. Application accepted by Commissioner of Customs:
April 24, 2006.
Docket Number: 06-020. Applicant: Middle Tennessee State University,
1114 Cope Building, 1301 East Main Street, Murfreesboro, TN 37132.
Instrument: Electron Microscope, Model H-7650 TEM. Manufacturer:
Hitachi High Technologies, Japan. Intended Use: The instrument is
intended to be used to image samples with thicknesses (diameters) less
than 1000 nm. Studies include: (1) Characterization of chemically
prepared biological structures at high resolution to demonstrate the
structure and function of components, (2) heavy-metal-stained
biological samples (e.g., bacterial cells within an amoeba) and (3)
metrology of discrete particles (e.g., colloidal silica). It will also
be used for a training course in electron microscopy. Application
accepted by Commissioner of Customs: April 24, 2006.
Docket Number: 06-021. Applicant: The University of Texas, Southwestern
Medical Center at Dallas, 5323 Harry Hines Boulevard, Dallas, TX 75390-
9056. Instrument: Electron Microscope, Model Technai G2 Spirit BioTwin.
Manufacturer: FEI Company, Czech Republic. Intended Use: The instrument
is intended to be used to study biological molecules, cells, tissues,
organs and microorganisms to determine both normal biological structure
and changes which may have occurred during either disease or by
experimental manipulation in order to improve patient care and
treatment. Application accepted by Commissioner of Customs: April 25,
2006.
Docket Number: 06-022. Applicant: Battelle Memorial Institute, Pacific
Northwest Division, 902 Battelle Blvd., Richland, WA 99352. Instrument:
Electron Microscope, Model Technai G2 Sprint TWIN. Manufacturer: FEI
Company, Czech Republic. Intended Use: The instrument is intended to be
used for the development of 3-dimensional reconstruction by TEM
tomography based on acquirement of tilt series of a biological
specimen, and its software reconstruction and rendering. This will
provide a vital tool for morphological and functional studies in the
area of cell biology and proteomics. Application accepted by
Commissioner of Customs: May 2, 2006.
Docket Number: 06-023. Applicant: University of California, Lawrence
Berkeley Lab for the US Department of Energy, One Cyclotron Road, BLDG
69, Berkeley, CA 94720, P.O. Box 528, Berkeley, CA 94701. Instrument:
Electron Microscope, Model JEM-2100. Manufacturer: JEOL, Ltd., Japan.
Intended Use: The instrument is intended to be used for high-resolution
electron microscopy for characterization of nanostructures combined
with Z contrast and element identification, description of interfaces
grown on top of each other and growth polarity identification of
particular crystals and description of their point groups. Application
accepted by Commissioner of Customs: May 4, 2006.
Docket Number: 06-024. Applicant: The University of Alabama, 411
Hackberry Lane, Tuscaloosa, AL 35487-0344. Instrument: Electron
Microscope, Model H-7650-II TEM. Manufacturer: Hitachi High-
Technologies Corp, Japan Use: The instrument is intended to be used to
examine and study the structure and functions of cells and organisms
including basic description of cells, comparative studies of structure
as a result of various treatments, and localization of proteins within
cells. It will also be used for diverse educational purposes.
Application accepted by Commissioner of Customs: May 5, 2006.
Docket Number: 06-025. Applicant: The Ohio State University, Campus
Microscopy and Imaging Facility, 4029 Graves Hall, 333 West 10th Ave.,
Columbus, OH 43210. Instrument: Electron Microscope, Model Technai G2
Spirit BioTwin. Manufacturer: FEI Company, Czech Republic. Intended
Use: The instrument is intended to be used by a multi-disciplinary
central instrumentation facility to provide nano-technology capability
to its SEM laboratory. It will be used for a number of different
electron microscopic techniques, including ultra-high resolution
imaging, both with and without surface coating at a wide range of
voltages for both biological and material applications. It will also be
used for diverse educational purposes. Application accepted by
Commissioner of Customs: May 5, 2006.
Docket Number: 06-026. Applicant: The New York Structural Biology
Center, 89 Covenant Avenue at 133rd St., New York, NY 10027.
Instrument: Electron Microscope, Model JEM-3200FSC. Manufacturer: JEOL
Ltd., Japan. Intended Use: The instrument is intended to be used by ten
educational and research institutions in New York to investigate, among
other things, biological assemblies ranging from isolated protein
molecules, complexes of protein molecules potentially bound to nucleic
acids or membranes, crystalline arrays composed of these protein
complexes, cells, viruses, or intact tissues to pursue a wide variety
of biological problems. In addition to standard methods of electron
microscopy, work will be done using the procedure of electron
tomography which is like a CAT scan at molecular proportions, involving
the imaging of a given cellular assembly which is systematically tilted
to different angles. It will also be used in student courses.
Application accepted by Commissioner of Customs: May 5, 2006.
Docket Number: 06-027. Applicant: The University of Akron, 302 Buchtel
Common, Akron, OH 44325. Instrument:
[[Page 42632]]
Electron Microscope, Model JEM-1230. Manufacturer: Joel Ltd., Japan.
Intended Use: The instrument is intended to be used for graduate
research education purposes and in class-oriented educational purposes.
Major use will be in polymer microscopy in applications including, but
not limited to: polymer fibers, films and membranes; polycrystalline
materials; engineering resins, rubber and plastics; emulsions and
adhesives and inorganic and organic nano particles. Application
accepted by Commissioner of Customs: May 5, 2006.
Docket Number: 06-028. Applicant: Clarion Health Partners, 1701 N.
Senate Blvd., Indianapolis, IN 46204. Instrument: Electron Microscope,
Model Technai G2 Spirit BioTwin. Manufacturer: FEI Company, Czech
Republic. Intended Use: The instrument is intended to be used to study
various ultrastructural morphologic aspects of normal and pathological
cells and tissues. Examples of recent research include 3-D glomerular
imaging of renal biopsies, nephropathology in patients with Brushite
nephrolithiasis and ischemic disruption of myosin I beta in renal
tubules. Application accepted by Commissioner of Customs: May 5, 2006.
Docket Number: 06-029. Applicant: U.S. Department of Commerce, National
Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg,
MD 20899. Instrument: Aberration-Corrected Monochromated Electron
Microscope, Model ACEM: Technai G3 TF30CSP. Manufacturer: FEI Company,
The Netherlands . Intended Use: The instrument is intended to be used
to measure and characterize nanoscale devices and nanoscale materials
for nanotechnology research including: electron and x-ray
nanotomography; 3-D chemical imaging; critical dimension metrology for
semiconductor devices; nanoparticle characterization and will use
various other techniques for studying a very broad range of materials.
Application accepted by Commissioner of Customs: May 9, 2006.
Docket Number: 06-030. Applicant: Florida State University, Department
of Biological Science, 119 Biology Unit I, 4370, Tallahassee, FL 32306
Instrument: Electron Microscope, Model Nova 400 NanoSEM. Manufacturer:
FEI Company, Czech Republic. Intended Use: The instrument is intended
to be used for studies on: comparative morphology of insects; cellular
and tissue engineering; cell morphology on different surfaces;
formation of semi-crystalline polymers; use of diatoms and other
materials as templates for nanostructures; use of photocatalysts active
in the synthesis of marine natural products used as anti-cancer drugs
and a wide range of other structural studies. Application accepted by
Commissioner of Customs: May 9, 2006.
Docket Number: 06-031. Applicant: Jackson State University, 1400 J.R.
Lynch Street, Box 18540. Instrument: Electron Microscope, Model JEM-
1011 Manufacturer: JEOL Ltd., Japan. Intended Use: The instrument is
intended to be used to study: (1) The molecular structures of various
mammalian cells, and compare the morphology of various cell lines; (2)
assess the cytotoxicity of various therapeutic and environmental
compounds; (3) perform apoptosis studies with these compounds; and (4)
study their potential effects at the cellular and molecular levels. It
will also be used in courses and training in its operation by students.
Application accepted by Commissioner of Customs:May 11, 2005.
Docket Number: 06-032. Applicant: Smithsonian Institution. Instrument:
Electron Microscope, Model Nova 600 NanoSEM. Manufacturer: FEI Company,
Czech Republic. Intended Use: The instrument is intended to be used for
research regarding geological, mineralogical and planetary science by
imaging and analyzing natural materials for their chemical composition
(minerals, meteorites and rock specimens) at the microscopic scale.
Application accepted by Commissioner of Customs: May 15, 2006.
Docket Number: 06-033. Applicant: University of North Florida, 4567 St.
Johns Bluff Rd. South, Jacksonville FL 32224. Instrument: Electron
Microscope, Model Quantum 200 ESEM. Manufacturer: FEI Company, Czech
Republic. Intended Use: The instrument is intended to be used to: (1)
Optimize growth conditions for nanocrystalline ITO thin films and to
fabricate gas sensor arrays, (2) study surface morphology, electrical
response and chemical analysis of nanocrystalline thin films and gas
sensor arrays in the presence of different gases and (3) investigate
the surface conditions as well as structural properties of PICM
sensors. Application accepted by Commissioner of Customs: May 19, 2006.
Docket Number: 06-034. Applicant: NYS Institute for Basic Research,
1050 Forest Hill Road, Staten Island, NY 10314. Instrument: Electron
Microscope, Model H-7500. Manufacturer: Hitachi High-Technologies
Corporation, Japan. Intended Use: The instrument is intended to be used
to study brain, spinal chord, tissue-cultured cells and chromosomes
from humans and animals. Priority areas of research include autism,
infant development, fragile X syndrome, Down syndrome,
neurodegenerative diseases, pediatric AIDS and other neuroinfectious
diseases, environmental neurotoxicology, pharmaceutical therapy and
brain development and pathology. It will also be used for student
training in research methods in electron microscopy. Application
accepted by Commissioner of Customs: May 17, 2006.
Docket Number: 06-035. Applicant: Carnegie Mellon University, 5000
Forbes Avenue, Pittsburgh, Pa 15213. Instrument: Electron Microscope,
Model Nova 600 NanoLab Dual Beam. Manufacturer: FEI Company, The
Netherlands. Intended Use: The instrument is intended to be used to
study: (1) Grain boundary energy on a wide range of metal, ceramic and
semiconductor materials, (2) in-situ serial section for multi-image
plans for 3-D analysis of grain boundary energy, (2) thin films of
multi-layer materials in semiconductor devices and magnetic recording
media and (3) the role of defects in the growth mechanisms of
semiconductor substrates. Application accepted by Commissioner of
Customs: May 19, 2006.
Docket Number: 06-036. Applicant: Texas Tech University, Health
Sciences Center, 3601 4th Street, Stop 9042, Lubbock, TX 79430.
Instrument: Electron Microscope, Model H-7650-II TEM. Manufacturer:
Hitachi High-Technologies Corporation, Japan . Intended Use: The
instrument is intended to be used to study, among other things, (1) The
diagnosis of disease processes (e.g., examining the basement membrane
of the kidney), (2) a blood substitute project will analyze human
coronary endothelial cells, brain capillary endothelial cells,
astrocytes, and neurons; cells in culture will be fixed, embedded in
epon and thin sections will be examined for changes in cell structure
and (3) vein leaflets will be fixed in glutaraldehyde, embedded in
epon, and thin sections will be examined. Application accepted by
Commissioner of Customs: May 24, 2006.
Docket Number: 06-037. Applicant: Wesleylan University, Biology Dept.,
Hall-Atwater Labs, Lawn Ave., Middletown, CT 06459-0170 Instrument:
Micromanipulators and control system, temperature control and movable
top plate. Manufactuurer: Scientifica, United Kingdom. Intended Use:
The instrument is intended to be used to correlate the data taken from
``movies'' of cortical activity in the mouse with the activity recorded
from a single neuron recorded intracellularly.
[[Page 42633]]
The movie is then used to simultaneously monitor the action potential
activity of hundreds of neurons to infer subthreshold activity in other
non-proximal neurons. Application accepted by Commissioner of Customs:
June 6, 2006.
Docket Number: 06-038. Applicant: The Ohio State University,Campus
Microscopy and Imaging Facility, 4029 Graves Hall, 333 West 10th Ave.,
Columbus, OH 43210. Instrument: Electron Microscope, Model Technai G2
Spirit BioTwin. Manufacturer: FEI Company, Czech Republic. Intended
Use: The instrument is intended to be used in the campus microscopy and
imaging facility, a multi-disciplinary central instrumentation facility
at the university and will be used to study many different types of
biological and non-biological materials, including many different types
of solid-state materials including materials used for nano-fabrication
studies. It will be used for both research and educational purposes
including microscopy classes as well as individual training of faculty,
staff and students. Application accepted by Commissioner of Customs:
June 29, 2006.
Docket Number: 06-039. Applicant: University of Louisville, Speed
School Of Engineering, Ernst Hall Room 106, Louisville, KY, 40292.
Instrument: Electron Microscope, Model Technai G2 F-20 X-TWIN.
Manufacturer: FEI Company, The Netherlands. Intended Use: The
instrument is intended to be used in materials science leading to the
development of new materials focusing on carbon-free energy, the
development of alternate fuels such as hydrogen and biomass-derived
ethanol products and structural biology including biochemistry,
molecular biology, genetics and molecular medicine. It will also be
used to offer in-depth courses and hands-on seminars on high resolution
transmission electron microscopy. Application accepted by Commissioner
of Customs: July 10, 2006.
Docket Number: 06-040. Applicant: UC Irvine Medical Center, 101 The
City Drive, Orange, CA, 92868. Instrument: Electron Microscope, Model
Technai G2 Spirit. Manufacturer: FEI Company, Czech Republic. Intended
Use: The instrument is intended to be used as a requirement for
accreditation of the Pathology residency program. It will be used in
the study of renal pathology, muscle and tumor pathology, study of
ciliary structure, parasitic protozoan infections in Aids and in viral
infection. Application accepted by the Commissioner of Customs: July
10, 2006.
Docket Number: 06-041. Applicant: University of Illinois at Chicago,
Department of Physics (m/c 273), 845 West Taylor Street, Chicago, IL
6067-7059. Instrument: Beam Stabilizing System Manufacturer: Laser
Laboratorium Gottingen, Germany. Intended Use: The instrument is
intended to be used as a compatible accessory for an existing KrF Laser
which will be developed to improve the beam quality of the laser
maximizing the possibility of a uniform beam with an even wavefront for
ultraviolet operation at 248 nm with extension of operation into the x-
ray range of. 29 nm for general studies of the interaction of intense
radiation with matter. Application accepted by the Commissioner of
Customs: July 7, 2006.
Docket Number: 06-042. Applicant: The University of Illinois at Urbana-
Champaign, 616 Green Street, Suite 212, Champaign, IL 61820.
Instrument: Electron Microscope, Model JEM-220FS with STEM &
Monochrometer. Manufacturer: JEOL Ltd., Japan. Intended Use: The
instrument is intended to be used as a major part of the Center for
Microanalysis of Materials, a shared research facility at the
University of Illinois at Urbana-Champaign. The range of materials to
be studied is very broad and under the direction of the current
facility Principal Investigators and their graduate students from
approximately ten university departments. One of the main goals of this
instrument is to develop new imaging techniques to resolve the
structure of materials with atomic resolution in three dimensions.
Application accepted by the Commissioner of Customs: July 10, 2006.
Docket Number: 06-043. Applicant: SUNY Upstate Medical University, 750
East Adams Street, Syracuse, NY 13210. Instrument: Electron Microscope,
Model JEM-2100. Manufacturer: JEOL Ltd., Japan. Intended Use: The
Instrument is intended to be used to study, among other things, the
structure of Pgp to visualize the structural changes Pgp is undergoing
during the catalytic cycle, to calculate a three dimensional model of
Pgp trapped at the different steps during ATP hydolysis and drug
transport and to optimize the conditions under which we currently
generate two dimensional crystals of Pgp in its native environment, the
lipid layer. Application accepted for transmittal to the Commissioner
of Customs: July 10, 2000.
Docket Number: 06-044. Applicant: Columbia University, 530 West 120th
Street - Room 1001, New York, NY 10027. Instrument: Ultra-High Vacuum
Low Temperature Scanning Tunneling Microscope. Manufacturer: Omicron
Nano Technology, Germany. Intended Use: The instrument is intended to
be used for studying the atomic structure of surfaces; the structure
and order of adsorbed monolayers; the electronic properties of the
surfaces and adsorbate-covered surfaces. Additionally, the dynamics of
change of these properties following heating, cooling, adsorption
desorption and laser excitation will be examined. Scanning tunneling
microscopy will be conducted at cryogenic temperatures of 4K.
Application accepted by the Commissioner of Customs: July 10, 2006.
Docket Number: 06-045. Applicant: Purdue University, WTHR Laboratory of
Chemistry, 560 Oval Drive, West Lafayette, IN 47907-2084. Instrument:
Nd:YAG Laser/dye laser. Manufacturer: InnoLas, Germany. Intended Use:
The instrument is intended to be used for fundamental research studies
of the properties of molecules, the way in which they isomerize and how
they use energy from a laser to isomerize or react. The laser will
excite the molecules of interest to excited electronic states, from
which they will either fluoresce or are excited further to ionize
before detection. It will be used for training and courses in modern,
experimental physical chemistry research. Application accepted by the
Commissioner of Customs: July 10,2006.
Gerald A. Zerdy,
Program Manager, Florence Agreement Program.
[FR Doc. E6-11968 Filed 7-26-06; 8:45 am]
BILLING CODE: 3510-DS-S
