Applications for Duty-Free Entry of Scientific Instruments, 26048 [E6-6677]

Download as PDF 26048 Federal Register / Vol. 71, No. 85 / Wednesday, May 3, 2006 / Notices Model Morgagni 268. Manufacturer: FEI Company, The Netherlands. Intended Use: See notice at 71 FR 18082, April 10, 2006. Order Date: September 1 2005. Docket Number: 06–011 Applicant: President and Fellows of Harvard College, Cambridge, MA 02138. Instrument: Electron Microscope, Model JEM–2100. Manufacturer: JEOL, Ltd., Japan. Intended Use: See notice at 71 FR 18082, April 10, 2006. Order Date: June 17, 2005. Docket Number: 06–013. Applicant: Ames Laboratory - U.S. Department of Energy, Ames, Iowa 50011–3020. Instrument: Electron Microscope, Model Technai G2 F20 X–TWIN. Manufacturer: FEI Company, The Netherlands. Intended Use: See notice at 71 FR 18082, April 10, 2006. Order Date: September 7, 2005. Comments: None received. Decision: Approved. No instrument of equivalent scientific value to the foreign instrument, for such purposes as these instruments are intended to be used, was being manufactured in the United States at the time the instruments were ordered. Reasons: Each foreign instrument is a conventional transmission electron microscope (CTEM) and is intended for research or scientific educational uses requiring a CTEM. We know of no CTEM, or any other instrument suited to these purposes, which was being manufactured in the United States either at the time of order of each instrument OR at the time of receipt of application by U.S. Customs and Border Protection. Gerald A. Zerdy, Program Manager, Statutory Import Programs Staff. [FR Doc. E6–6675 Filed 5–2–06; 8:45 am] BILLING CODE 3510–DS–S DEPARTMENT OF COMMERCE International Trade Administration jlentini on PROD1PC65 with NOTICES Applications for Duty–Free Entry of Scientific Instruments Pursuant to Section 6(c) of the Educational, Scientific and Cultural Materials Importation Act of 1966 (Pub. L. 89–651; 80 Stat. 897; 15 CFR part 301), we invite comments on the question of whether instruments of equivalent scientific value, for the purposes for which the instruments shown below are intended to be used, are being manufactured in the United States. Comments must comply with 15 CFR 301.5(a)(3) and (4) of the regulations and be filed within 20 days with the VerDate Aug<31>2005 17:23 May 02, 2006 Jkt 208001 Statutory Import Programs Staff, U.S. Department of Commerce, Washington, DC 20230. Applications may be examined between 8:30 a.m. and 5 p.m. in Suite 4100W, U.S. Department of Commerce, Franklin Court Building, 1099 14th Street, NW, Washington, DC Docket Number: 06–015. Applicant: University of Kentucky, Department of Chemistry, 235 Chem–Phys. Bldg., Lexington, KY 40506–0055. Instrument: Optical Parametric Oscillator System. Manufacturer: GWU Lasertechnik, Germany. Intended Use: The instrument is intended to be used to study small silicon, germanium, phosphorus and boron containing molecules in the gas phase using the technique of laser– induced fluorescence to develop methods for identifying and characterizing these molecules and to determine their molecular energy levels and geometries and to quantify these reactive molecules in laboratory and industrial environments. Application accepted by Commissioner of Customs: March 27, 2006. Docket Number: 06–016. Applicant: University of Maryland, Materials Science and Engineering Department, Building 225, Lab 1246, College Park, MD 20742. Instrument: Electron Microscope, Model JEM–2100. Manufacturer: JEOL Ltd., Japan. Intended Use: The instrument is intended to be used to characterize nanomaterials and nanocomposites at the atomic level. These include semiconductor nanostructures, polymeric materials, metal nanoparticles, ferroelectric/ ferromagnetic oxide nanocomposites and semiconductor nanowires. Properties of materials examined include crystal structure and quality of material, structural defects, and morphology using techniques of electron diffraction, high resolution lattice imaging, bright/dark field imaging and obtaining electron diffraction patterns and images of areas as small as a few nanometers in diameter. The instrument will also be used in courses and for conducting individual graduate research projects. Application accepted by Commissioner of Customs: April 4, 2006. Docket Number: 06–017. Applicant: University of Michigan, Materials Science and Engineering Dept., 3062 H.H. Dow Bldg., 2300 Hayward Street, Ann Arbor, MI 48109–2136. Instrument: Ultrasonic Fatigue Testing Equipment. Manufacturer: BOKU Institute of Physics, Austria. Intended Use: The instrument is intended to be used to study ultra–high cyclic fatigue behavior of materials in the gigacycle regime where little data is currently available. PO 00000 Frm 00031 Fmt 4703 Sfmt 4703 Measurements for understanding crack growth behavior in various materials will be obtained for aiding in the prediction of lifetime behavior with cyclic loading frequencies to 20KHz. It will also be used to characterize new materials being developed to perform under high cyclic loading conditions, such as next generation superalloys used in aircraft and power generating turbines. Application accepted by Commissioner of Customs: April 10, 2006. Gerald A. Zerdy, Program Manager, Statutory Import Programs Staff. [FR Doc. E6–6677 Filed 5–2–06; 8:45 am] BILLING CODE 3510–DS–S DEPARTMENT OF COMMERCE International Trade Administration Export Trade Certificate Of Review Notice of revocation of Export Trade Certificate of Review Application No. 03–00004. ACTION: SUMMARY: The Secretary of Commerce issued an Export Trade Certificate of Review to NYVZ Import & Export Inc. on November 10, 2003. Because this Certificate Holder has failed to file an annual report as required by law, the Secretary is revoking the certificate. This notice summarizes the notification letter sent to NYVZ Import & Export Inc. FOR FURTHER INFORMATION CONTACT: Jeffrey Anspacher, Director, Export Trading Company Affairs, International Trade Administration, 202/482–5131. This is not a toll-free number. SUPPLEMENTARY INFORMATION: Title III of the Export Trading Company Act of 1982 (‘‘The Act’’) (Pub. L. 97–290, 15 U.S.C. 4011–21) Authorizes the Secretary of Commerce to Issue Export Trade Certificates of Review. The Regulations Implementing Title III (‘‘the Regulations’’) are found at 15 CFR part 325 (1999). Pursuant to this Authority, a Certificate of Review was issued on November 10, 2003 to NYVZ Import & Export Inc. A Certificate Holder is required by law to submit to the Secretary of Commerce Annual Reports that update financial and other information relating to business activities covered by its Certificate (Section 308 of the Act, 15 U.S.C. 4018, section 325.14(a) of the Regulations, 15 CFR 325.14(a)). The Annual Report is due within 45 days after the Anniversary Date of the Issuance of the Certificate of Review (Sections 325.14(b) of the Regulations, 15 CFR 325.14(b)). Failure to submit a E:\FR\FM\03MYN1.SGM 03MYN1

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[Federal Register Volume 71, Number 85 (Wednesday, May 3, 2006)]
[Notices]
[Page 26048]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: E6-6677]


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DEPARTMENT OF COMMERCE

International Trade Administration


Applications for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651; 80 Stat. 
897; 15 CFR part 301), we invite comments on the question of whether 
instruments of equivalent scientific value, for the purposes for which 
the instruments shown below are intended to be used, are being 
manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be filed within 20 days with the Statutory Import 
Programs Staff, U.S. Department of Commerce, Washington, DC 20230. 
Applications may be examined between 8:30 a.m. and 5 p.m. in Suite 
4100W, U.S. Department of Commerce, Franklin Court Building, 1099 14th 
Street, NW, Washington, DC
    Docket Number: 06-015. Applicant: University of Kentucky, 
Department of Chemistry, 235 Chem-Phys. Bldg., Lexington, KY 40506-
0055. Instrument: Optical Parametric Oscillator System. Manufacturer: 
GWU Lasertechnik, Germany. Intended Use: The instrument is intended to 
be used to study small silicon, germanium, phosphorus and boron 
containing molecules in the gas phase using the technique of laser-
induced fluorescence to develop methods for identifying and 
characterizing these molecules and to determine their molecular energy 
levels and geometries and to quantify these reactive molecules in 
laboratory and industrial environments. Application accepted by 
Commissioner of Customs: March 27, 2006.
    Docket Number: 06-016. Applicant: University of Maryland, Materials 
Science and Engineering Department, Building 225, Lab 1246, College 
Park, MD 20742. Instrument: Electron Microscope, Model JEM-2100. 
Manufacturer: JEOL Ltd., Japan. Intended Use: The instrument is 
intended to be used to characterize nanomaterials and nanocomposites at 
the atomic level. These include semiconductor nanostructures, polymeric 
materials, metal nanoparticles, ferroelectric/ferromagnetic oxide 
nanocomposites and semiconductor nanowires. Properties of materials 
examined include crystal structure and quality of material, structural 
defects, and morphology using techniques of electron diffraction, high 
resolution lattice imaging, bright/dark field imaging and obtaining 
electron diffraction patterns and images of areas as small as a few 
nanometers in diameter. The instrument will also be used in courses and 
for conducting individual graduate research projects. Application 
accepted by Commissioner of Customs: April 4, 2006.
    Docket Number: 06-017. Applicant: University of Michigan, Materials 
Science and Engineering Dept., 3062 H.H. Dow Bldg., 2300 Hayward 
Street, Ann Arbor, MI 48109-2136. Instrument: Ultrasonic Fatigue 
Testing Equipment. Manufacturer: BOKU Institute of Physics, Austria. 
Intended Use: The instrument is intended to be used to study ultra-high 
cyclic fatigue behavior of materials in the gigacycle regime where 
little data is currently available. Measurements for understanding 
crack growth behavior in various materials will be obtained for aiding 
in the prediction of lifetime behavior with cyclic loading frequencies 
to 20KHz. It will also be used to characterize new materials being 
developed to perform under high cyclic loading conditions, such as next 
generation superalloys used in aircraft and power generating turbines. 
Application accepted by Commissioner of Customs: April 10, 2006.

Gerald A. Zerdy,
Program Manager, Statutory Import Programs Staff.
[FR Doc. E6-6677 Filed 5-2-06; 8:45 am]
BILLING CODE 3510-DS-S