Applications for Duty-Free Entry of Scientific Instruments, 18081-18082 [E6-5195]
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Federal Register / Vol. 71, No. 68 / Monday, April 10, 2006 / Notices
regarding the reimbursement of
antidumping duties prior to liquidation
of the relevant entries during this
review period. Failure to comply with
this requirement could result in the
Secretary’s presumption that
reimbursement of antidumping duties
occurred and the subsequent assessment
of double antidumping duties.
We are issuing and publishing these
preliminary results of review in
accordance with sections 751(a)(1) and
777(i)(1) of the Act.
Dated: April 3, 2006.
David M. Spooner,
Assistant Secretary for Import
Administration.
[FR Doc. E6–5202 Filed 4–7–06; 8:45 am]
Billing Code: 3510–DS–P
DEPARTMENT OF COMMERCE
International Trade Administration
wwhite on PROD1PC65 with NOTICES
Consortium for Astro–Particle
Research in Utah et al., Notice of
Consolidated Decision on Applications
for Duty–Free Entry of Scientific
Instruments
This is a decision consolidated pursuant
to Section 6(c) of the Educational,
Scientific, and Cultural Materials
Importation Act of 1966 (Pub. L. 89–
651, 80 Stat. 897; 15 CFR part 301).
Related records can be viewed between
8:30 a.m. and 5 p.m. in Suite 4100W,
Franklin Court Building, U.S.
Department of Commerce, 1099 14th
Street, NW., Washington, DC.
Comments: None received. Decision:
Approved. No instrument of equivalent
scientific value to the foreign
instruments described below, for such
purposes as each is intended to be used,
is being manufactured in the United
States.
Docket Number: 05–057. Applicant:
Consortium for Astro-particle Research
in Utah/University of Utah, Salt Lake
City, Utah. Instrument: Fluorescent
Telescope Array; with
GroundScintillator, Laser Atmosphere
Monitor and LAN Network.
Manufacturer: Various; Japan, UK.
Intended use: See Notice at71 FR 4895,
January 30, 2006. Reasons: These
instrument systems when deployed in
Utah are capable of conducting a joint
US–Japan led scientific project to
measure the energy, pointing direction
and chemical composition of ultra high
energy cosmic rays using both the
fluorescence technique, which uses
large telescopes to observe fluorescent
tracks from cosmic ray showers in the
atmosphere and the secondary shower
charged particle technique, which uses
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18:48 Apr 07, 2006
Jkt 208001
ground–based light sensing photo–tubes
and counters to measure the number
and timing of particle arrivals. Results
obtained by these techniques can be
cross correlated, compared and
evaluated for developing more precise
measurements and to provide
information about likely celestial
sources of the cosmic rays observed.
Docket Number: 05–059. Applicant:
College of Staten Island, Staten Island,
NY. Instrument: Plasma System.
Manufacturer: Diener Electronic GmBh
& Co., KG, Germany. Intended Use: See
Notice at 71 FR 10649, March 2, 2006.
Reasons: The foreign article is a
compatible, (sole source) accessory for
existing instrumentation for materials
research. It consists of a plasma type
microwave generator with a glass
chamber for conducting semiconductor
processing procedures. It can be used to
develop and study:
1. Nanotechnolgy with focused ion
beams, including electronic properties
of carbon nanowires direct written
with nano–scaled ion beams on
carbonaceous substrates
2. Micro- and nano–scale light emitting
diodes on diamond, with the aim to
develop single molecule and single
photon electrically driven light
sources operating at room temperature
3. High–pressure, high–temperature
diamond anvil cells with internally
heated anvils for hydrothermal and
shear stress experiments.
The instrument will also be used in
courses on materials science.
These instruments are pertinent to each
applicant’s needs and we know of no
other instrument or apparatus being
manufactured in the United States
which is of equivalent scientific value to
either of the foreign instruments.
Gerald A. Zerdy,
Program Manager, Statutory Import Programs
Staff.
[FR Doc. E6–5193 Filed 4–7–06; 8:45 am]
18081
Department of Commerce, 1099 14th
Street, NW., Washington, DC.
Docket Number: 06-002. Applicant:
University of Puerto Rico at Mayaguez.
Instrument: Electron Microscope, Model
JEM-2010. Manufacturer: JEOL, Ltd.,
Japan. Intended Use: See notice at71 FR
10650, March 2, 2006. Order Date: 2/11/
05.
Docket Number: 06-003. Applicant:
Oklahoma State University, Stillwater,
OK. Instrument: Electron Microscope,
ModelJEM-2100F. Manufacturer: JEOL,
Ltd., Japan. Intended Use: See notice at
71 FR 10650, March 2, 2006. Order Date:
12/13/05.
Docket Number: 06-004. Applicant:
University of North Texas . Instrument:
Electron Microscope, Model Technai G2
F20 S-TWIN. Manufacturer: FEI
Company, The Netherlands. Intended
Use: See notice at 71 FR 10650, March
2, 2006. Order Date: 8/4/04.
Docket Number: O6-005. Applicant:
University of Maryland, College Park,
MD. Instrument: Electron Microscope,
Model JEM-2100F. Manufacturer: JEOL,
Ltd., Japan. Intended Use: See notice at
71 FR 10650, March 2, 2005. Order Date:
4/13/05.
Comments: None received. Decision:
Approved. No instrument of equivalent
scientific value to the foreign
instrument, for such purposes as these
instruments are intended to be used,
was being manufactured in the United
States at the time the instruments were
ordered. Reasons: Each foreign
instrument is an electron microscope
and is intended for research or scientific
educational uses. We know of no
electron microscope, or any other
instrument suited to these purposes,
which was being manufactured in the
United States either at the time of order
of each instrument OR at the time of
receipt of application by U.S. Customs
and Border Protection.
Billing Code: 3510–DS–S
Gerald A. Zerdy,
Program Manager, Statutory Import Programs
Staff.
[FR Doc. E6–5194 Filed 4–7–06; 8:45 am]
DEPARTMENT OF COMMERCE
Billing Code: 3510–DS–S
International Trade Administration
University of Puerto Rico at Mayaguez,
et al., Notice of Consolidated Decision
on Applications for Duty-Free Entry of
Electron Microscopes
This is a decision consolidated pursuant
to Section 6(c) of the Educational,
Scientific, and Cultural Materials
Importation Act of 1966 (Pub. L. 89-651,
80 Stat. 897; 15 CFR part 301). Related
records can be viewed between 8:30
a.m. and 5 p.m. in Suite 4100W,
Franklin Court Building, U.S.
PO 00000
Frm 00020
Fmt 4703
Sfmt 4703
DEPARTMENT OF COMMERCE
International Trade Administration
Applications for Duty-Free Entry of
Scientific Instruments
Pursuant to Section 6(c) of the
Educational, Scientific and Cultural
Materials Importation Act of 1966 (Pub.
L. 89-651; 80 Stat. 897; 15 CFR part
301), we invite comments on the
question of whether instruments of
equivalent scientific value, for the
E:\FR\FM\10APN1.SGM
10APN1
wwhite on PROD1PC65 with NOTICES
18082
Federal Register / Vol. 71, No. 68 / Monday, April 10, 2006 / Notices
purposes for which the instruments
shown below are intended to be used,
are being manufactured in the United
States.
Comments must comply with 15 CFR
301.5(a)(3) and (4) of the regulations and
be filed within 20 days with the
Statutory Import Programs Staff, U.S.
Department of Commerce, Washington,
D.C. 20230. Applications may be
examined between 8:30 A.M. and 5 p.m.
in Suite 4100W, U.S. Department of
Commerce, Franklin Court Building,
1099 14th Street, NW, Washington, DC.
Docket Number: 06-007. Applicant:
University of Connecticut, 91 N.
Eagleville Road, BSP Bldg., Unit 3242,
Storrs, CT 06269. Instrument: Electron
Microscope, Model Technai G2 Spirit
BioTWIN. Manufacturer: FEI Company,
The Netherlands. Intended Use: The
instrument is intended to be used in a
multi-user facility providing training
and service to faculty, staff and
students. A wide variety of cells and
tissues will be examined. The
ultrastructural arrangement of cells,
organelles and macromolecular
assemblies and the fine structure of
domains within polymers will be
investigated. Research projects ranging
from evolutionary biology to materials
science will use the instrument.
Application accepted by Commissioner
of Customs: March 20, 2006.
Docket Number: 06-008. Applicant:
California Institute of Technology, 1200
E. California Boulevard, Mail Code 1036, Pasadena, CA 91125. Instrument:
Neutron Guide. Manufacturer:
SwissNeutronics, Switzerland. Intended
Use: The instrument is a compatible key
accessory for the high-resolution, directgeometry, time-of-flight chopper
spectrometer (ARCS) at the Spallation
Neutron Source at Oak Ridge N.L. It will
be used to investigate the energy spectra
obtained when neutrons incident on a
sample are scattered by the motions of
atoms or of electron spins in the sample.
Studies will include the
thermodynamics of atom vibrations or
spin motions, or of their characteristic
energies and momenta, cooperative
motions of electrons in solids relevant
to electrical transport, magnetic
properties and superconductivity. The
neutron guide is especially useful for
studies that require low or mediumenergy neutron beams that are incident
on the sample. Application accepted by
the Commissioner of Customs: February
27, 2006.
Docket Number: 06-009. Applicant: The
New York Structural Biology
Laboratory, 89 Convent Avenue at 133rd
St, New York, NY 10027. Instrument:
Electron Microscope, Model JEM 2100F.
Manufacturer: JEOL, Ltd., Japan.
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18:48 Apr 07, 2006
Jkt 208001
Intended Use: The instrument is
intended to be used by ten educational
and research institutions in New York to
investigate, among other things,
biological assemblies ranging from
isolated protein molecules, complexes
of protein molecules potentially bound
to nucleic acids or membranes,
crystalline arrays composed of these
protein complexes, cells, viruses, or
intact tissues to pursue a wide variety
of biological problems. In addition to
standard methods of electron
microscopy, work will be done using
the procedure of electron tomography
which is like a CAT scan at molecular
proportions, involving the imaging of a
given cellular assembly which is
systematically tilted to different angles.
It will alsobe used in student courses.
Application accepted by Commissioner
of Customs: March 6, 2006.
Docket Number: 06-010. Applicant:
Emory University Hospital, 1364 Clifton
Road, NE, Atlanta, GA 30322.
Instrument: Electron Microscope, Model
Mogagni 268. Manufacturer: FEI
Company, The Netherlands. Intended
Use: The instrument is intended to be
used for examination of normal,
abnormal and pathological changes in
human cells and tissue samples.
Experiments will be conducted based on
ultrastructural examination of human
kidney biopsies for documentation of
pathologic change, if any, for diagnostic
evaluation. Ultrathin sections of epoxy
embedded specimens under high
magnification will be preserved for
pathological review. Application
accepted by Commissioner of Customs:
March 1, 2000.
Docket Number: 06-011. Applicant:
President and Fellows of Harvard
College, 9 Oxford Street, Cambridge,
MA 02138. Instrument: Electron
Microscope, Model JEM-2100.
Manufacturer: JEOL Ltd., Japan.
Intended Use: The instrument is
intended to be used to study and
characterize nanoscale structures and
chemical compositions of novel
materials such as semi-conducting
materials, nano metallic catalysts and
polymers, etc. Some examples include
chemical composition by energydispersive x-ray spectroscopy,
identification of phases and crystal
structures by electron diffraction,
interfacial arrangements of atomic
structures between polymer materials by
stain-inducted contrast imaging and
lattice-fringe imaging of metallic thin
films and alloys. Application accepted
by Commissioner of Customs: March 20,
2006.
Docket Number: 06-013. Applicant:
Ames Laboratory - U.S. Department of
Energy REF: A5–2764, 211, TASF, Iowa
PO 00000
Frm 00021
Fmt 4703
Sfmt 4703
State University, Ames, Iowa 500113020. Instrument: Electron Microscope,
Model Technai G2 F20 X-TWIN.
Manufacturer: FEI Company, the
Netherlands. Intended Use: The
instrument is intended to be used to
provide both the imaging and
spectrographic analysis necessary to
evaluate materials ranging from rapidly
solidified metals, nanoscale magnetic
alloys, directionally solidified metal
alloys, mesoporous catalysis and novel
polymer compounds. With reduced
length scale of materials, interaction
with their environment changes. The
instrument will allow probing the
chemistry and atomic arrangements
(nanostructure) down to the level of the
atoms and to assess the success of
processing procedures. Application
accepted by Commissioner of Customs:
March 23, 2006.
Docket Number: 06-014. Applicant:
Howard Hughes Medical Institute,
Harvard Medical School, 77 Ave. Louis
Pasteur, Boston, MA 02115. Instrument:
Confocal Microscope. Manufacturer:
Evotec, Germany. Intended Use: The
instrument is intended to be used to
assign phenotopic signatures
(phenoprints) to every Drosophilia gene
using genome-wide RNAi screens.
These can be used to cluster genes that
are functionally related and important
in functional genomics. The instrument
combines the high resolution of
confocal laser scanning microscopy
with ultra high throughput (≤200,00
images per day) and an integrated fast
autofocus system provides maximal
resolution and lowest background.
Application accepted by Commissioner
of Customs: March 24, 2006.
Gerald A. Zerdy,
Program Manager, Statutory Import Programs
Staff.
[FR Doc. E6–5195 Filed 4–7–06; 8:45 am]
BILLING CODE 3510–DS–S
DEPARTMENT OF COMMERCE
National Oceanic and Atmospheric
Administration
[Docket No. 060404095–6095–01]
Northern Gulf of Mexico Cooperative
Institute
Office of Oceanic and
Atmospheric Research, National
Oceanic and Atmospheric
Administration (NOAA), Department of
Commerce.
ACTION: Notice of availability of funds.
AGENCY:
SUMMARY: The Office of Oceanic and
Atmospheric Research (OAR) invites
E:\FR\FM\10APN1.SGM
10APN1
Agencies
[Federal Register Volume 71, Number 68 (Monday, April 10, 2006)]
[Notices]
[Pages 18081-18082]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: E6-5195]
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DEPARTMENT OF COMMERCE
International Trade Administration
Applications for Duty-Free Entry of Scientific Instruments
Pursuant to Section 6(c) of the Educational, Scientific and Cultural
Materials Importation Act of 1966 (Pub. L. 89-651; 80 Stat. 897; 15 CFR
part 301), we invite comments on the question of whether instruments of
equivalent scientific value, for the
[[Page 18082]]
purposes for which the instruments shown below are intended to be used,
are being manufactured in the United States.
Comments must comply with 15 CFR 301.5(a)(3) and (4) of the regulations
and be filed within 20 days with the Statutory Import Programs Staff,
U.S. Department of Commerce, Washington, D.C. 20230. Applications may
be examined between 8:30 A.M. and 5 p.m. in Suite 4100W, U.S.
Department of Commerce, Franklin Court Building, 1099 14th Street, NW,
Washington, DC.
Docket Number: 06-007. Applicant: University of Connecticut, 91 N.
Eagleville Road, BSP Bldg., Unit 3242, Storrs, CT 06269. Instrument:
Electron Microscope, Model Technai G[bds2] Spirit BioTWIN.
Manufacturer: FEI Company, The Netherlands. Intended Use: The
instrument is intended to be used in a multi-user facility providing
training and service to faculty, staff and students. A wide variety of
cells and tissues will be examined. The ultrastructural arrangement of
cells, organelles and macromolecular assemblies and the fine structure
of domains within polymers will be investigated. Research projects
ranging from evolutionary biology to materials science will use the
instrument. Application accepted by Commissioner of Customs: March 20,
2006.
Docket Number: 06-008. Applicant: California Institute of Technology,
1200 E. California Boulevard, Mail Code 103-6, Pasadena, CA 91125.
Instrument: Neutron Guide. Manufacturer: SwissNeutronics, Switzerland.
Intended Use: The instrument is a compatible key accessory for the
high-resolution, direct-geometry, time-of-flight chopper spectrometer
(ARCS) at the Spallation Neutron Source at Oak Ridge N.L. It will be
used to investigate the energy spectra obtained when neutrons incident
on a sample are scattered by the motions of atoms or of electron spins
in the sample. Studies will include the thermodynamics of atom
vibrations or spin motions, or of their characteristic energies and
momenta, cooperative motions of electrons in solids relevant to
electrical transport, magnetic properties and superconductivity. The
neutron guide is especially useful for studies that require low or
medium-energy neutron beams that are incident on the sample.
Application accepted by the Commissioner of Customs: February 27, 2006.
Docket Number: 06-009. Applicant: The New York Structural Biology
Laboratory, 89 Convent Avenue at 133rd St, New York, NY 10027.
Instrument: Electron Microscope, Model JEM 2100F. Manufacturer: JEOL,
Ltd., Japan. Intended Use: The instrument is intended to be used by ten
educational and research institutions in New York to investigate, among
other things, biological assemblies ranging from isolated protein
molecules, complexes of protein molecules potentially bound to nucleic
acids or membranes, crystalline arrays composed of these protein
complexes, cells, viruses, or intact tissues to pursue a wide variety
of biological problems. In addition to standard methods of electron
microscopy, work will be done using the procedure of electron
tomography which is like a CAT scan at molecular proportions, involving
the imaging of a given cellular assembly which is systematically tilted
to different angles. It will alsobe used in student courses.
Application accepted by Commissioner of Customs: March 6, 2006.
Docket Number: 06-010. Applicant: Emory University Hospital, 1364
Clifton Road, NE, Atlanta, GA 30322. Instrument: Electron Microscope,
Model Mogagni 268. Manufacturer: FEI Company, The Netherlands. Intended
Use: The instrument is intended to be used for examination of normal,
abnormal and pathological changes in human cells and tissue samples.
Experiments will be conducted based on ultrastructural examination of
human kidney biopsies for documentation of pathologic change, if any,
for diagnostic evaluation. Ultrathin sections of epoxy embedded
specimens under high magnification will be preserved for pathological
review. Application accepted by Commissioner of Customs: March 1, 2000.
Docket Number: 06-011. Applicant: President and Fellows of Harvard
College, 9 Oxford Street, Cambridge, MA 02138. Instrument: Electron
Microscope, Model JEM-2100. Manufacturer: JEOL Ltd., Japan. Intended
Use: The instrument is intended to be used to study and characterize
nanoscale structures and chemical compositions of novel materials such
as semi-conducting materials, nano metallic catalysts and polymers,
etc. Some examples include chemical composition by energy-dispersive x-
ray spectroscopy, identification of phases and crystal structures by
electron diffraction, interfacial arrangements of atomic structures
between polymer materials by stain-inducted contrast imaging and
lattice-fringe imaging of metallic thin films and alloys. Application
accepted by Commissioner of Customs: March 20, 2006.
Docket Number: 06-013. Applicant: Ames Laboratory - U.S. Department of
Energy REF: A5-2764, 211, TASF, Iowa State University, Ames, Iowa
50011-3020. Instrument: Electron Microscope, Model Technai G[bds2] F20
X-TWIN. Manufacturer: FEI Company, the Netherlands. Intended Use: The
instrument is intended to be used to provide both the imaging and
spectrographic analysis necessary to evaluate materials ranging from
rapidly solidified metals, nanoscale magnetic alloys, directionally
solidified metal alloys, mesoporous catalysis and novel polymer
compounds. With reduced length scale of materials, interaction with
their environment changes. The instrument will allow probing the
chemistry and atomic arrangements (nanostructure) down to the level of
the atoms and to assess the success of processing procedures.
Application accepted by Commissioner of Customs: March 23, 2006.
Docket Number: 06-014. Applicant: Howard Hughes Medical Institute,
Harvard Medical School, 77 Ave. Louis Pasteur, Boston, MA 02115.
Instrument: Confocal Microscope. Manufacturer: Evotec, Germany.
Intended Use: The instrument is intended to be used to assign
phenotopic signatures (phenoprints) to every Drosophilia gene using
genome-wide RNAi screens. These can be used to cluster genes that are
functionally related and important in functional genomics. The
instrument combines the high resolution of confocal laser scanning
microscopy with ultra high throughput (>200,00 images per day) and an
integrated fast autofocus system provides maximal resolution and lowest
background. Application accepted by Commissioner of Customs: March 24,
2006.
Gerald A. Zerdy,
Program Manager, Statutory Import Programs Staff.
[FR Doc. E6-5195 Filed 4-7-06; 8:45 am]
BILLING CODE 3510-DS-S