University of Puerto Rico at Mayaguez, et al., Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscopes, 18081 [E6-5194]

Download as PDF Federal Register / Vol. 71, No. 68 / Monday, April 10, 2006 / Notices regarding the reimbursement of antidumping duties prior to liquidation of the relevant entries during this review period. Failure to comply with this requirement could result in the Secretary’s presumption that reimbursement of antidumping duties occurred and the subsequent assessment of double antidumping duties. We are issuing and publishing these preliminary results of review in accordance with sections 751(a)(1) and 777(i)(1) of the Act. Dated: April 3, 2006. David M. Spooner, Assistant Secretary for Import Administration. [FR Doc. E6–5202 Filed 4–7–06; 8:45 am] Billing Code: 3510–DS–P DEPARTMENT OF COMMERCE International Trade Administration wwhite on PROD1PC65 with NOTICES Consortium for Astro–Particle Research in Utah et al., Notice of Consolidated Decision on Applications for Duty–Free Entry of Scientific Instruments This is a decision consolidated pursuant to Section 6(c) of the Educational, Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89– 651, 80 Stat. 897; 15 CFR part 301). Related records can be viewed between 8:30 a.m. and 5 p.m. in Suite 4100W, Franklin Court Building, U.S. Department of Commerce, 1099 14th Street, NW., Washington, DC. Comments: None received. Decision: Approved. No instrument of equivalent scientific value to the foreign instruments described below, for such purposes as each is intended to be used, is being manufactured in the United States. Docket Number: 05–057. Applicant: Consortium for Astro-particle Research in Utah/University of Utah, Salt Lake City, Utah. Instrument: Fluorescent Telescope Array; with GroundScintillator, Laser Atmosphere Monitor and LAN Network. Manufacturer: Various; Japan, UK. Intended use: See Notice at71 FR 4895, January 30, 2006. Reasons: These instrument systems when deployed in Utah are capable of conducting a joint US–Japan led scientific project to measure the energy, pointing direction and chemical composition of ultra high energy cosmic rays using both the fluorescence technique, which uses large telescopes to observe fluorescent tracks from cosmic ray showers in the atmosphere and the secondary shower charged particle technique, which uses VerDate Aug<31>2005 18:48 Apr 07, 2006 Jkt 208001 ground–based light sensing photo–tubes and counters to measure the number and timing of particle arrivals. Results obtained by these techniques can be cross correlated, compared and evaluated for developing more precise measurements and to provide information about likely celestial sources of the cosmic rays observed. Docket Number: 05–059. Applicant: College of Staten Island, Staten Island, NY. Instrument: Plasma System. Manufacturer: Diener Electronic GmBh & Co., KG, Germany. Intended Use: See Notice at 71 FR 10649, March 2, 2006. Reasons: The foreign article is a compatible, (sole source) accessory for existing instrumentation for materials research. It consists of a plasma type microwave generator with a glass chamber for conducting semiconductor processing procedures. It can be used to develop and study: 1. Nanotechnolgy with focused ion beams, including electronic properties of carbon nanowires direct written with nano–scaled ion beams on carbonaceous substrates 2. Micro- and nano–scale light emitting diodes on diamond, with the aim to develop single molecule and single photon electrically driven light sources operating at room temperature 3. High–pressure, high–temperature diamond anvil cells with internally heated anvils for hydrothermal and shear stress experiments. The instrument will also be used in courses on materials science. These instruments are pertinent to each applicant’s needs and we know of no other instrument or apparatus being manufactured in the United States which is of equivalent scientific value to either of the foreign instruments. Gerald A. Zerdy, Program Manager, Statutory Import Programs Staff. [FR Doc. E6–5193 Filed 4–7–06; 8:45 am] 18081 Department of Commerce, 1099 14th Street, NW., Washington, DC. Docket Number: 06-002. Applicant: University of Puerto Rico at Mayaguez. Instrument: Electron Microscope, Model JEM-2010. Manufacturer: JEOL, Ltd., Japan. Intended Use: See notice at71 FR 10650, March 2, 2006. Order Date: 2/11/ 05. Docket Number: 06-003. Applicant: Oklahoma State University, Stillwater, OK. Instrument: Electron Microscope, ModelJEM-2100F. Manufacturer: JEOL, Ltd., Japan. Intended Use: See notice at 71 FR 10650, March 2, 2006. Order Date: 12/13/05. Docket Number: 06-004. Applicant: University of North Texas . Instrument: Electron Microscope, Model Technai G2 F20 S-TWIN. Manufacturer: FEI Company, The Netherlands. Intended Use: See notice at 71 FR 10650, March 2, 2006. Order Date: 8/4/04. Docket Number: O6-005. Applicant: University of Maryland, College Park, MD. Instrument: Electron Microscope, Model JEM-2100F. Manufacturer: JEOL, Ltd., Japan. Intended Use: See notice at 71 FR 10650, March 2, 2005. Order Date: 4/13/05. Comments: None received. Decision: Approved. No instrument of equivalent scientific value to the foreign instrument, for such purposes as these instruments are intended to be used, was being manufactured in the United States at the time the instruments were ordered. Reasons: Each foreign instrument is an electron microscope and is intended for research or scientific educational uses. We know of no electron microscope, or any other instrument suited to these purposes, which was being manufactured in the United States either at the time of order of each instrument OR at the time of receipt of application by U.S. Customs and Border Protection. Billing Code: 3510–DS–S Gerald A. Zerdy, Program Manager, Statutory Import Programs Staff. [FR Doc. E6–5194 Filed 4–7–06; 8:45 am] DEPARTMENT OF COMMERCE Billing Code: 3510–DS–S International Trade Administration University of Puerto Rico at Mayaguez, et al., Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscopes This is a decision consolidated pursuant to Section 6(c) of the Educational, Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89-651, 80 Stat. 897; 15 CFR part 301). Related records can be viewed between 8:30 a.m. and 5 p.m. in Suite 4100W, Franklin Court Building, U.S. PO 00000 Frm 00020 Fmt 4703 Sfmt 4703 DEPARTMENT OF COMMERCE International Trade Administration Applications for Duty-Free Entry of Scientific Instruments Pursuant to Section 6(c) of the Educational, Scientific and Cultural Materials Importation Act of 1966 (Pub. L. 89-651; 80 Stat. 897; 15 CFR part 301), we invite comments on the question of whether instruments of equivalent scientific value, for the E:\FR\FM\10APN1.SGM 10APN1

Agencies

[Federal Register Volume 71, Number 68 (Monday, April 10, 2006)]
[Notices]
[Page 18081]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: E6-5194]


-----------------------------------------------------------------------

DEPARTMENT OF COMMERCE

International Trade Administration


University of Puerto Rico at Mayaguez, et al., Notice of 
Consolidated Decision on Applications for Duty-Free Entry of Electron 
Microscopes

This is a decision consolidated pursuant to Section 6(c) of the 
Educational, Scientific, and Cultural Materials Importation Act of 1966 
(Pub. L. 89-651, 80 Stat. 897; 15 CFR part 301). Related records can be 
viewed between 8:30 a.m. and 5 p.m. in Suite 4100W, Franklin Court 
Building, U.S. Department of Commerce, 1099 14th Street, NW., 
Washington, DC.
Docket Number: 06-002. Applicant: University of Puerto Rico at 
Mayaguez. Instrument: Electron Microscope, Model JEM-2010. 
Manufacturer: JEOL, Ltd., Japan. Intended Use: See notice at71 FR 
10650, March 2, 2006. Order Date: 2/11/05.
Docket Number: 06-003. Applicant: Oklahoma State University, 
Stillwater, OK. Instrument: Electron Microscope, ModelJEM-2100F. 
Manufacturer: JEOL, Ltd., Japan. Intended Use: See notice at 71 FR 
10650, March 2, 2006. Order Date: 12/13/05.
Docket Number: 06-004. Applicant: University of North Texas . 
Instrument: Electron Microscope, Model Technai G[bds2] F20 S-TWIN. 
Manufacturer: FEI Company, The Netherlands. Intended Use: See notice at 
71 FR 10650, March 2, 2006. Order Date: 8/4/04.
Docket Number: O6-005. Applicant: University of Maryland, College Park, 
MD. Instrument: Electron Microscope, Model JEM-2100F. Manufacturer: 
JEOL, Ltd., Japan. Intended Use: See notice at 71 FR 10650, March 2, 
2005. Order Date: 4/13/05.
Comments: None received. Decision: Approved. No instrument of 
equivalent scientific value to the foreign instrument, for such 
purposes as these instruments are intended to be used, was being 
manufactured in the United States at the time the instruments were 
ordered. Reasons: Each foreign instrument is an electron microscope and 
is intended for research or scientific educational uses. We know of no 
electron microscope, or any other instrument suited to these purposes, 
which was being manufactured in the United States either at the time of 
order of each instrument OR at the time of receipt of application by 
U.S. Customs and Border Protection.

Gerald A. Zerdy,
Program Manager, Statutory Import Programs Staff.
[FR Doc. E6-5194 Filed 4-7-06; 8:45 am]
Billing Code: 3510-DS-S

This site is protected by reCAPTCHA and the Google Privacy Policy and Terms of Service apply.