Consortium for Astro-Particle Research in Utah et al., Notice of Consolidated Decision on Applications for Duty-Free Entry of Scientific Instruments, 18081 [E6-5193]
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Federal Register / Vol. 71, No. 68 / Monday, April 10, 2006 / Notices
regarding the reimbursement of
antidumping duties prior to liquidation
of the relevant entries during this
review period. Failure to comply with
this requirement could result in the
Secretary’s presumption that
reimbursement of antidumping duties
occurred and the subsequent assessment
of double antidumping duties.
We are issuing and publishing these
preliminary results of review in
accordance with sections 751(a)(1) and
777(i)(1) of the Act.
Dated: April 3, 2006.
David M. Spooner,
Assistant Secretary for Import
Administration.
[FR Doc. E6–5202 Filed 4–7–06; 8:45 am]
Billing Code: 3510–DS–P
DEPARTMENT OF COMMERCE
International Trade Administration
wwhite on PROD1PC65 with NOTICES
Consortium for Astro–Particle
Research in Utah et al., Notice of
Consolidated Decision on Applications
for Duty–Free Entry of Scientific
Instruments
This is a decision consolidated pursuant
to Section 6(c) of the Educational,
Scientific, and Cultural Materials
Importation Act of 1966 (Pub. L. 89–
651, 80 Stat. 897; 15 CFR part 301).
Related records can be viewed between
8:30 a.m. and 5 p.m. in Suite 4100W,
Franklin Court Building, U.S.
Department of Commerce, 1099 14th
Street, NW., Washington, DC.
Comments: None received. Decision:
Approved. No instrument of equivalent
scientific value to the foreign
instruments described below, for such
purposes as each is intended to be used,
is being manufactured in the United
States.
Docket Number: 05–057. Applicant:
Consortium for Astro-particle Research
in Utah/University of Utah, Salt Lake
City, Utah. Instrument: Fluorescent
Telescope Array; with
GroundScintillator, Laser Atmosphere
Monitor and LAN Network.
Manufacturer: Various; Japan, UK.
Intended use: See Notice at71 FR 4895,
January 30, 2006. Reasons: These
instrument systems when deployed in
Utah are capable of conducting a joint
US–Japan led scientific project to
measure the energy, pointing direction
and chemical composition of ultra high
energy cosmic rays using both the
fluorescence technique, which uses
large telescopes to observe fluorescent
tracks from cosmic ray showers in the
atmosphere and the secondary shower
charged particle technique, which uses
VerDate Aug<31>2005
18:48 Apr 07, 2006
Jkt 208001
ground–based light sensing photo–tubes
and counters to measure the number
and timing of particle arrivals. Results
obtained by these techniques can be
cross correlated, compared and
evaluated for developing more precise
measurements and to provide
information about likely celestial
sources of the cosmic rays observed.
Docket Number: 05–059. Applicant:
College of Staten Island, Staten Island,
NY. Instrument: Plasma System.
Manufacturer: Diener Electronic GmBh
& Co., KG, Germany. Intended Use: See
Notice at 71 FR 10649, March 2, 2006.
Reasons: The foreign article is a
compatible, (sole source) accessory for
existing instrumentation for materials
research. It consists of a plasma type
microwave generator with a glass
chamber for conducting semiconductor
processing procedures. It can be used to
develop and study:
1. Nanotechnolgy with focused ion
beams, including electronic properties
of carbon nanowires direct written
with nano–scaled ion beams on
carbonaceous substrates
2. Micro- and nano–scale light emitting
diodes on diamond, with the aim to
develop single molecule and single
photon electrically driven light
sources operating at room temperature
3. High–pressure, high–temperature
diamond anvil cells with internally
heated anvils for hydrothermal and
shear stress experiments.
The instrument will also be used in
courses on materials science.
These instruments are pertinent to each
applicant’s needs and we know of no
other instrument or apparatus being
manufactured in the United States
which is of equivalent scientific value to
either of the foreign instruments.
Gerald A. Zerdy,
Program Manager, Statutory Import Programs
Staff.
[FR Doc. E6–5193 Filed 4–7–06; 8:45 am]
18081
Department of Commerce, 1099 14th
Street, NW., Washington, DC.
Docket Number: 06-002. Applicant:
University of Puerto Rico at Mayaguez.
Instrument: Electron Microscope, Model
JEM-2010. Manufacturer: JEOL, Ltd.,
Japan. Intended Use: See notice at71 FR
10650, March 2, 2006. Order Date: 2/11/
05.
Docket Number: 06-003. Applicant:
Oklahoma State University, Stillwater,
OK. Instrument: Electron Microscope,
ModelJEM-2100F. Manufacturer: JEOL,
Ltd., Japan. Intended Use: See notice at
71 FR 10650, March 2, 2006. Order Date:
12/13/05.
Docket Number: 06-004. Applicant:
University of North Texas . Instrument:
Electron Microscope, Model Technai G2
F20 S-TWIN. Manufacturer: FEI
Company, The Netherlands. Intended
Use: See notice at 71 FR 10650, March
2, 2006. Order Date: 8/4/04.
Docket Number: O6-005. Applicant:
University of Maryland, College Park,
MD. Instrument: Electron Microscope,
Model JEM-2100F. Manufacturer: JEOL,
Ltd., Japan. Intended Use: See notice at
71 FR 10650, March 2, 2005. Order Date:
4/13/05.
Comments: None received. Decision:
Approved. No instrument of equivalent
scientific value to the foreign
instrument, for such purposes as these
instruments are intended to be used,
was being manufactured in the United
States at the time the instruments were
ordered. Reasons: Each foreign
instrument is an electron microscope
and is intended for research or scientific
educational uses. We know of no
electron microscope, or any other
instrument suited to these purposes,
which was being manufactured in the
United States either at the time of order
of each instrument OR at the time of
receipt of application by U.S. Customs
and Border Protection.
Billing Code: 3510–DS–S
Gerald A. Zerdy,
Program Manager, Statutory Import Programs
Staff.
[FR Doc. E6–5194 Filed 4–7–06; 8:45 am]
DEPARTMENT OF COMMERCE
Billing Code: 3510–DS–S
International Trade Administration
University of Puerto Rico at Mayaguez,
et al., Notice of Consolidated Decision
on Applications for Duty-Free Entry of
Electron Microscopes
This is a decision consolidated pursuant
to Section 6(c) of the Educational,
Scientific, and Cultural Materials
Importation Act of 1966 (Pub. L. 89-651,
80 Stat. 897; 15 CFR part 301). Related
records can be viewed between 8:30
a.m. and 5 p.m. in Suite 4100W,
Franklin Court Building, U.S.
PO 00000
Frm 00020
Fmt 4703
Sfmt 4703
DEPARTMENT OF COMMERCE
International Trade Administration
Applications for Duty-Free Entry of
Scientific Instruments
Pursuant to Section 6(c) of the
Educational, Scientific and Cultural
Materials Importation Act of 1966 (Pub.
L. 89-651; 80 Stat. 897; 15 CFR part
301), we invite comments on the
question of whether instruments of
equivalent scientific value, for the
E:\FR\FM\10APN1.SGM
10APN1
Agencies
[Federal Register Volume 71, Number 68 (Monday, April 10, 2006)]
[Notices]
[Page 18081]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: E6-5193]
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DEPARTMENT OF COMMERCE
International Trade Administration
Consortium for Astro-Particle Research in Utah et al., Notice of
Consolidated Decision on Applications for Duty-Free Entry of Scientific
Instruments
This is a decision consolidated pursuant to Section 6(c) of the
Educational, Scientific, and Cultural Materials Importation Act of 1966
(Pub. L. 89-651, 80 Stat. 897; 15 CFR part 301). Related records can be
viewed between 8:30 a.m. and 5 p.m. in Suite 4100W, Franklin Court
Building, U.S. Department of Commerce, 1099 14th Street, NW.,
Washington, DC.
Comments: None received. Decision: Approved. No instrument of
equivalent scientific value to the foreign instruments described below,
for such purposes as each is intended to be used, is being manufactured
in the United States.
Docket Number: 05-057. Applicant: Consortium for Astro-particle
Research in Utah/University of Utah, Salt Lake City, Utah. Instrument:
Fluorescent Telescope Array; with GroundScintillator, Laser Atmosphere
Monitor and LAN Network. Manufacturer: Various; Japan, UK. Intended
use: See Notice at71 FR 4895, January 30, 2006. Reasons: These
instrument systems when deployed in Utah are capable of conducting a
joint US-Japan led scientific project to measure the energy, pointing
direction and chemical composition of ultra high energy cosmic rays
using both the fluorescence technique, which uses large telescopes to
observe fluorescent tracks from cosmic ray showers in the atmosphere
and the secondary shower charged particle technique, which uses ground-
based light sensing photo-tubes and counters to measure the number and
timing of particle arrivals. Results obtained by these techniques can
be cross correlated, compared and evaluated for developing more precise
measurements and to provide information about likely celestial sources
of the cosmic rays observed.
Docket Number: 05-059. Applicant: College of Staten Island, Staten
Island, NY. Instrument: Plasma System. Manufacturer: Diener Electronic
GmBh & Co., KG, Germany. Intended Use: See Notice at 71 FR 10649, March
2, 2006. Reasons: The foreign article is a compatible, (sole source)
accessory for existing instrumentation for materials research. It
consists of a plasma type microwave generator with a glass chamber for
conducting semiconductor processing procedures. It can be used to
develop and study:
1. Nanotechnolgy with focused ion beams, including electronic
properties of carbon nanowires direct written with nano-scaled ion
beams on carbonaceous substrates
2. Micro- and nano-scale light emitting diodes on diamond, with the aim
to develop single molecule and single photon electrically driven light
sources operating at room temperature
3. High-pressure, high-temperature diamond anvil cells with internally
heated anvils for hydrothermal and shear stress experiments.
The instrument will also be used in courses on materials science.
These instruments are pertinent to each applicant's needs and we know
of no other instrument or apparatus being manufactured in the United
States which is of equivalent scientific value to either of the foreign
instruments.
Gerald A. Zerdy,
Program Manager, Statutory Import Programs Staff.
[FR Doc. E6-5193 Filed 4-7-06; 8:45 am]
Billing Code: 3510-DS-S