Dartmouth College, et al., Notice of Consolidated Decision on Applications, for Duty-Free Entry of Scientific Instruments, 10649 [E6-2986]

Download as PDF Federal Register / Vol. 71, No. 41 / Thursday, March 2, 2006 / Notices to govern business proprietary information in this segment of the proceeding. Timely written notification of the return/destruction of APO materials or conversion to judicial protective order is hereby requested. Failure to comply with the regulations and terms of an APO is a violation which is subject to sanction. These results of administrative review and notice are published in accordance with sections 751(a)(1) and 777(i)(1) of the Act. Dated: February 23, 2006. Joseph A. Spetrini, Acting Assistant Secretary for Import Administration. [FR Doc. 06–1932 Filed 3–1–06; 8:45 am] BILLING CODE 3510–DS–M DEPARTMENT OF COMMERCE International Trade Administration Dartmouth College, et al., Notice of Consolidated Decision on Applications, for Duty–Free Entry of Scientific Instruments This is a decision consolidated pursuant to Section 6(c) of the Educational, Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89– 651, 80 Stat. 897; 15 CFR part 301). Related records can be viewed between 8:30 a.m. and 5 p.m. in Suite 4100W, Franklin Court Building, U.S. Department of Commerce, 1099 14th Street, NW., Washington, DC. Comments: None received. Decision: Approved. No instrument of equivalent scientific value to the foreign instruments described below, for such purposes as each is intended to be used, is being manufactured in the United States. wwhite on PROD1PC61 with NOTICES Docket Number: 05–047. Applicant: Dartmouth College, Thayer School of Engineering, Hanover, NH. Instrument: Magneto–opticKerr Effect Microscope. Manufacturer: Durham Magneto Optics,Ltd., UK. Intended Use: See notice at 70 FR 72609, December 6, 2005. Reasons: The foreign instrument provides: 1. Variation of the magnetic field configuration both in time and according to the relative strength of the three directional components. 2. Laser spot size to the order of 1.5 to 2.0 m. 3. Ability to rotate the time–varying applied magnetic field relative to the incoming light. 4. Modification of the sensor optics to maximize the signal in order to handle VerDate Aug<31>2005 17:54 Mar 01, 2006 Jkt 208001 a variety of sample shapes and thickness. 5. Amenity to instruction of students. Advice received from: The National Institute of Standards and Technology. Docket Number: 05–055. Applicant: Rutgers, The State University of New Jersey, New Brunswick, NJ. Instrument: Near–Field Optical Microscope integrated to Micro–Raman. Manufacturer: Nanonics Imaging Ltd., Israel. Intended Use: See notice at 70 FR 77145, December 29, 2005. Reasons: The foreign instrument is a compatible accessory which is designed to be directly integrated with the applicant’s existing Renishaw micro–Raman system. This microscope comes equipped with the Raman software module for the Renishaw Raman and CCD camera spectroscopy control and the Raman low–noise vibration isolation platform. The complete system will meet the applicant’s requirements to characterize the chemical bonding and elastic strains in nanostructured materials. Advice received from: The National Institutes of Health. Docket Number: 05–061. Applicant: University of Michigan, Ann Arbor, MI. Instrument: Application Specific Integrated Circuit. Manufacturer: Ideas ASA, Norway. Intended Use: See notice at 71 FR 2024, January 12, 2006. Reasons: The foreign instrument is a compatible accessory for a unique 3– dimensional position sensitive CdZnTe semiconductor gamma–ray spectrometer. The article provides a multi–channel, charge–sensing amplifier with very low noise of about 300 electrons rms, for which three iterations have been developed in collaboration with Ideas ASA. The systems can get energy and 3–D position information for not only single– interaction events, but for multiple– interaction events by using electron drift times. Excellent energy resolution for both single–interaction events (0.8% FWHM at 662 keV) and multiple– interaction events (1.3% FWHM at 662 keV)has been achieved. A new scalable detector array system, with plug–in electronics, is required for further development of the spectrometer. Development of an equivalent device from a different source would cause a significant delay in this project. Docket Number: 06–001. Applicant: Medical college of Georgia, Augusta, GA. Instrument: Micromanipulator System. Manufacturer: Luigs & Neuman, Germany. Intended Use: See notice at 71 FR 4895, January 30, 2006. Reasons: The foreign instrument is an ancillary device which provides micromanipulator staging and control that will be used to PO 00000 Frm 00016 Fmt 4703 Sfmt 4703 10649 maneuver electrophysiology equipment, that requires precision in its location, which will be centered around a multi– photon confocal microscope. No known domestic manufacturers produce a micromanipulator system which is compatible with this equipment. Advice received from: The National Institutes of Health. The capabilities of each of the foreign instruments described above are pertinent to each applicant’s intended use of it and we know of no other instrument or apparatus being manufactured in the United States which is of equivalent scientific value to any of the foreign instruments. Gerald A. Zerdy, Program Manager, Statutory Import Programs Staff. [FR Doc. E6–2986 Filed 3–1–06; 8:45 am] BILLING CODE 3510–DS–S DEPARTMENT OF COMMERCE International Trade Administration Applications for Duty–Free Entry of Scientific Instruments Pursuant to section 6(c) of the Educational, Scientific and Cultural Materials Importation Act of 1966 (Pub. L. 89–651; 80 Stat. 897; 15 CFR part 301), we invite comments on the question of whether instruments of equivalent scientific value, for the purposes for which the instruments shown below are intended to be used, are being manufactured in the United States. Comments must comply with 15 CFR 301.5(a)(3) and (4) of the regulations and be filed within 20 days with the Statutory Import Programs Staff, U.S. Department of Commerce, Washington, DC 20230. Applications may be examined between 8:30 a.m. and 5 p.m. in Suite 4100W, U.S. Department of Commerce, Franklin Court Building, 1099 14th Street, NW., Washington, DC. Docket Number: 05–059. Applicant: College of Staten Island, 2800 Victory Blvd., Staten Island, NY 10314. Instrument: Plasma System. Manufacturer: Diener Electronic GmBh & Co., KG, Germany. Intended Use: The instrument is intended to be used to study and develop: 1. Nanotechnolgy with focused ion beams, including electronic properties of carbon nanowires direct written with nano–scaled ion beams on carbonaceous substrates 2. Micro- and nano–scale light emitting diodes on diamond, with the aim to develop single molecule and single E:\FR\FM\02MRN1.SGM 02MRN1

Agencies

[Federal Register Volume 71, Number 41 (Thursday, March 2, 2006)]
[Notices]
[Page 10649]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: E6-2986]


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DEPARTMENT OF COMMERCE

International Trade Administration


Dartmouth College, et al., Notice of Consolidated Decision on 
Applications, for Duty-Free Entry of Scientific Instruments

This is a decision consolidated pursuant to Section 6(c) of the 
Educational, Scientific, and Cultural Materials Importation Act of 1966 
(Pub. L. 89-651, 80 Stat. 897; 15 CFR part 301). Related records can be 
viewed between 8:30 a.m. and 5 p.m. in Suite 4100W, Franklin Court 
Building, U.S. Department of Commerce, 1099 14th Street, NW., 
Washington, DC.
Comments: None received. Decision: Approved. No instrument of 
equivalent scientific value to the foreign instruments described below, 
for such purposes as each is intended to be used, is being manufactured 
in the United States.
Docket Number: 05-047. Applicant: Dartmouth College, Thayer School of 
Engineering, Hanover, NH. Instrument: Magneto-opticKerr Effect 
Microscope. Manufacturer: Durham Magneto Optics,Ltd., UK. Intended Use: 
See notice at 70 FR 72609, December 6, 2005. Reasons: The foreign 
instrument provides:
1. Variation of the magnetic field configuration both in time and 
according to the relative strength of the three directional components.
2. Laser spot size to the order of 1.5 to 2.0 m.
3. Ability to rotate the time-varying applied magnetic field relative 
to the incoming light.
4. Modification of the sensor optics to maximize the signal in order to 
handle a variety of sample shapes and thickness.
5. Amenity to instruction of students.
Advice received from: The National Institute of Standards and 
Technology.
Docket Number: 05-055. Applicant: Rutgers, The State University of New 
Jersey, New Brunswick, NJ. Instrument: Near-Field Optical Microscope 
integrated to Micro-Raman. Manufacturer: Nanonics Imaging Ltd., Israel. 
Intended Use: See notice at 70 FR 77145, December 29, 2005. Reasons: 
The foreign instrument is a compatible accessory which is designed to 
be directly integrated with the applicant's existing Renishaw micro-
Raman system. This microscope comes equipped with the Raman software 
module for the Renishaw Raman and CCD camera spectroscopy control and 
the Raman low-noise vibration isolation platform. The complete system 
will meet the applicant's requirements to characterize the chemical 
bonding and elastic strains in nanostructured materials. Advice 
received from: The National Institutes of Health.
Docket Number: 05-061. Applicant: University of Michigan, Ann Arbor, 
MI. Instrument: Application Specific Integrated Circuit. Manufacturer: 
Ideas ASA, Norway. Intended Use: See notice at 71 FR 2024, January 12, 
2006. Reasons: The foreign instrument is a compatible accessory for a 
unique 3-dimensional position sensitive CdZnTe semiconductor gamma-ray 
spectrometer. The article provides a multi-channel, charge-sensing 
amplifier with very low noise of about 300 electrons rms, for which 
three iterations have been developed in collaboration with Ideas ASA. 
The systems can get energy and 3-D position information for not only 
single-interaction events, but for multiple-interaction events by using 
electron drift times. Excellent energy resolution for both single-
interaction events (0.8% FWHM at 662 keV) and multiple-interaction 
events (1.3% FWHM at 662 keV)has been achieved. A new scalable detector 
array system, with plug-in electronics, is required for further 
development of the spectrometer. Development of an equivalent device 
from a different source would cause a significant delay in this 
project.
Docket Number: 06-001. Applicant: Medical college of Georgia, Augusta, 
GA. Instrument: Micromanipulator System. Manufacturer: Luigs & Neuman, 
Germany. Intended Use: See notice at 71 FR 4895, January 30, 2006. 
Reasons: The foreign instrument is an ancillary device which provides 
micromanipulator staging and control that will be used to maneuver 
electrophysiology equipment, that requires precision in its location, 
which will be centered around a multi-photon confocal microscope. No 
known domestic manufacturers produce a micromanipulator system which is 
compatible with this equipment. Advice received from: The National 
Institutes of Health.
The capabilities of each of the foreign instruments described above are 
pertinent to each applicant's intended use of it and we know of no 
other instrument or apparatus being manufactured in the United States 
which is of equivalent scientific value to any of the foreign 
instruments.

Gerald A. Zerdy,
Program Manager, Statutory Import Programs Staff.
[FR Doc. E6-2986 Filed 3-1-06; 8:45 am]
BILLING CODE 3510-DS-S

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