University of Texas, Medical Branch et al., Notice of Consolidated Decision on Applications, for Duty-Free Entry of Electron Microscopes, 4896 [E6-1115]

Download as PDF cprice-sewell on PROD1PC66 with NOTICES 4896 Federal Register / Vol. 71, No. 19 / Monday, January 30, 2006 / Notices Docket Number: 05–046. Applicant: Massachusetts Institute of technology, Boston, MA. Instrument: High– resolution Superconducting Magnet. Manufacturer: Jastec, Japan.Intended Use: See notice at 70 FR 73991, December 14, 2005. Reasons: The foreign article is a compatible ancillary device for a 500 MHz 200 mm room– temperature bore magnetic resonance spectrometer under development at MIT. It provides a persistent–mode cryocooled MRI magnet that is nominally operated at 4.2 K, but when not cryocooled, can still operate in persistent mode for up to 12 hours as the winding temperature rises from 4.2K to 6.0K. A cold body consisting of 65 liters of solidified neon permits the magnet to maintain a central field of 11.74 T (500 MHz) for the 12–hour period with its cryocooler shut off and thermally disconnected from the cold body. When the temperature reaches 6.0K, the system is recyled as the cryocooler is turned on and thermally recoupled to the cold body until the magnet returns to 4.2K. This magnet was specially designed to conform to the applicant’s specifications. Two domestic manufacturers possibly capable of building the magnet declined to bid. Docket Number: 05–054. Applicant: University of Illinois, Champaign IL. Instrument: Curved Image Plate Detector. Manufacturer: Technische Universitat Darmstadt, Germany. Intended Use: See notice at 70 FR 77145, December, 29 2005. Reasons: The foreign instrument is a compatible ancillary device which is intended to be used to develop a fast, high–resolution, x–ray powder diffraction apparatus using a beamline facility (Beamline 33– BM) at the Advanced Photon Source of Argonne National Laboratory. The detector is capable of detecting and storing x–ray intensity information proportionally over a wide dynamical range of at least five orders of magnitude with high resolution, high sensitivity and low noise (high S/N ratio). Complex algorithms are not required to extract data from the x–ray detector. Since it is curved, diffracted x–rays are incident normal to it and thus do not induce any distortion errors, while retaining the fidelity of the diffraction pattern. Intrinsic resolution down to 0.006» can translate into accuracy in peak position of ≤0.001». Position of the scanner head is provided by an optical tracking system with a grid resolution of 20 µm. The detector has an on site reader. The capabilities of each of the foreign articles described above are pertinent to each applicant’s intended purpose and we know of no domestic instrument or VerDate Aug<31>2005 17:14 Jan 27, 2006 Jkt 208001 apparatus of equivalent scientific value for the intended use of each article. application by U.S. Customs and Border Protection. Gerald A. Zerdy, Program Manager, Statutory Import Programs Staff. [FR Doc. E6–1114 Filed 1–27–06; 8:45 am] Gerald A. Zerdy, Program Manager, Statutory Import Programs Staff. [FR Doc. E6–1115 Filed 1–27–06; 8:45 am] BILLING CODE 3510–DS–S BILLING CODE 3510–DS–S DEPARTMENT OF COMMERCE DEPARTMENT OF COMMERCE International Trade Administration International Trade Administration University of Texas, Medical Branch et al., Notice of Consolidated Decision on Applications, for Duty–Free Entry of Electron Microscopes North American Free-Trade Agreement, Article 1904 NAFTA Panel Reviews; Completion of Panel Review NAFTA Secretariat, United States Section, International Trade Administration, Department of Commerce. AGENCY: This is a decision consolidated pursuant to Section 6(c) of the Educational, Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89–651, 80 Stat. 897; 15 CFR part 301). Related records can be viewed between 8:30 A.M. and 5:00 P.M. in Suite 4100W, Franklin Court Building, U.S. Department of Commerce, 1099 14th Street, NW., Washington, DC. Docket Number: 05–052. Applicant: University of Texas, Medical Branch, Galveston, TX. Instrument: Electron Microscope, Model JEM–2100 Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 70 FR 77145, December 29, 2005. Order Date: June 3, 2002. Docket Number: 05–053. Applicant: Howard Hughes MedicalInstitute, Chevy Chase, MD. Instrument: Electron Microscope, Model Technai G2 F20 TWIN. Manufacturer: FEI Company, The Netherlands. Intended Use: See notice at 70 FR 77145, December 29, 2005. Order Date: July 19,2005. Comments: None received. Decision: Approved. No instrument of equivalent scientific value to the foreign instrument, for such purposes as these instruments are intended to be used, was being manufactured in the United States at the time the instruments were ordered. Reasons: Each foreign instrument is a conventional transmission electron microscope (CTEM) and is intended for research or scientific educational uses requiring a CTEM. We know of no CTEM, or any other instrument suited to these purposes, which was being manufactured in the United States either at the time of order of each instrument OR at the time of receipt of PO 00000 Notice of Completion of Panel Review of the final remand determination made by the U.S. International Trade Commission, in the matter of Hard Red Spring Wheat from Canada, Secretariat File No. USA–CDA– 2003–1904–06. ACTION: SUMMARY: Pursuant to the Order of the Binational Panel dated December 12, 2005, affirming the final remand determination described above was completed on January 24, 2006. FOR FURTHER INFORMATION CONTACT: Caratina L. Alston, United States Secretary, NAFTA Secretariat, Suite 2061, 14th and Constitution Avenue, Washington, DC 20230, (202) 482–5438. On December 12, 2005, the Binational Panel issued an order, which affirmed the final remand determination of the United States International Trade Commission (ITC) concerning Hard Red Spring Wheat from Canada. The Secretariat was instructed to issue a Notice of Completion of Panel Review on the 31st day following the issuance of the Notice of Final Panel Action, if no request for an Extraordinary Challenge was filed. No such request was filed. Therefore, on the basis of the Panel Order and Rule 80 of the Article 1904 Panel Rules, the Panel Review was completed and the panelists discharged from their duties effective January 24, 2005. SUPPLEMENTARY INFORMATION: Dated: January 24, 2006. Caratina L. Alston, United States Secretary, NAFTA Secretariat. [FR Doc. E6–1067 Filed 1–27–06; 8:45 am] BILLING CODE 3510–GT–P Frm 00007 Fmt 4703 Sfmt 4703 E:\FR\FM\30JAN1.SGM 30JAN1

Agencies

[Federal Register Volume 71, Number 19 (Monday, January 30, 2006)]
[Notices]
[Page 4896]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: E6-1115]


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DEPARTMENT OF COMMERCE

International Trade Administration


University of Texas, Medical Branch et al., Notice of 
Consolidated Decision on Applications, for Duty-Free Entry of Electron 
Microscopes

    This is a decision consolidated pursuant to Section 6(c) of the 
Educational, Scientific, and Cultural Materials Importation Act of 1966 
(Pub. L. 89-651, 80 Stat. 897; 15 CFR part 301). Related records can be 
viewed between 8:30 A.M. and 5:00 P.M. in Suite 4100W, Franklin Court 
Building, U.S. Department of Commerce, 1099 14th Street, NW., 
Washington, DC.
    Docket Number: 05-052. Applicant: University of Texas, Medical 
Branch, Galveston, TX. Instrument: Electron Microscope, Model JEM-2100 
Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 70 FR 
77145, December 29, 2005. Order Date: June 3, 2002.
    Docket Number: 05-053. Applicant: Howard Hughes MedicalInstitute, 
Chevy Chase, MD. Instrument: Electron Microscope, Model Technai G[bds2] 
F20 TWIN. Manufacturer: FEI Company, The Netherlands. Intended Use: See 
notice at 70 FR 77145, December 29, 2005. Order Date: July 19,2005.
    Comments: None received. Decision: Approved. No instrument of 
equivalent scientific value to the foreign instrument, for such 
purposes as these instruments are intended to be used, was being 
manufactured in the United States at the time the instruments were 
ordered. Reasons: Each foreign instrument is a conventional 
transmission electron microscope (CTEM) and is intended for research or 
scientific educational uses requiring a CTEM. We know of no CTEM, or 
any other instrument suited to these purposes, which was being 
manufactured in the United States either at the time of order of each 
instrument OR at the time of receipt of application by U.S. Customs and 
Border Protection.

Gerald A. Zerdy,
Program Manager, Statutory Import Programs Staff.
[FR Doc. E6-1115 Filed 1-27-06; 8:45 am]
BILLING CODE 3510-DS-S
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