Applications for Duty-Free Entry of Scientific Instruments, 2024 [E6-236]

Download as PDF 2024 Federal Register / Vol. 71, No. 8 / Thursday, January 12, 2006 / Notices May 31, 2006. We intend to issue the final results no later than 120 days after publication of the preliminary results notice. This notice of extension of the time limit is published in accordance with 751(a)(3)(A) of the Act. Dated: January 5, 2006. Stephen J. Claeys, Deputy Assistant Secretary for Import Administration. [FR Doc. E6–239 Filed 1–11–06; 8:45 am] to the foreign instrument which is being manufactured in the United States. Gerald A. Zerdy, Program Manager, Statutory Import Programs Staff. [FR Doc. E6–235 Filed 1–11–06; 8:45 am] BILLING CODE 3510–DS–S DEPARTMENT OF COMMERCE International Trade Administration BILLING CODE 3510–DS–S Applications for Duty–Free Entry of Scientific Instruments DEPARTMENT OF COMMERCE Pursuant to section 6(c) of the Educational, Scientific and Cultural Materials Importation Act of 1966 (Pub. L. 89–651; 80 Stat. 897; 15 CFR part 301), we invite comments on the question of whether instruments of equivalent scientific value, for the purposes for which the instruments shown below are intended to be used, are being manufactured in the United States. Comments must comply with 15 CFR 301.5(a)(3) and (4) of the regulations and be filed within 20 days with the Statutory Import Programs Staff, U.S. Department of Commerce, Washington, DC 20230. Applications may be examined between 8:30 a.m. and 5 p.m. in Suite 4100W, U.S. Department of Commerce, Franklin Court Building, 1099 14th Street, NW., Washington, DC. Docket Number: 05–061. Applicant: University of Michigan, 2355 Bonisteel Boulevard, Ann Arbor, MI 48109–2104. Instrument: Application Specific Integrated Circuit. Manufacturer: Ideas ASA, Norway. Intended Use: The instrument is intended to be used as a compatible accessory for a unique 3dimensional position sensitive CdZnTe semiconductor gamma–ray spectrometer. The article consists of a multi-channel charge sensing amplifier with very low noise of about 300 electrons rms for which three iterations have been developed in collaboration with Ideas ASA. The systems can get energy and 3D position information for not only single-interaction events, but for multiple-interaction events by using electron drift times. Excellent energy resolution for both single-interaction events (0.8% FWHM at 662 keV) and multiple-interaction events (1.3% FWHM at 662 keV) has been achieved. A new scalable detector array system with plug–in electronics is required for further development of the spectrometer. Application accepted by Commissioner of Customs: December 27, 20005. Docket Number: 05–062. Applicant: University of Texas Medical Branch at International Trade Administration erjones on PROD1PC68 with NOTICES Tufts University, Notice of Decision on Application, for Duty–Free Entry of Scientific Instrument This decision is made pursuant to section 6(c) of the Educational, Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89– 651, 80 Stat. 897; 15 CFR part 301). Related records can be viewed between 8:30 a.m. and 5 p.m. in Suite 4100W, U.S. Department of Commerce, Franklin Court Building, 1099 14th Street, NW., Washington, DC. Docket Number: 05–044. Applicant: Tufts University, Somerville, MA. Instrument: Low Temperature Scanning Tunneling Microscope. Manufacturer: Omicron Nanotechnology, Germany. Intended Use: See notice at 70 FR 61603, October 25, 2005. Comments: None received. Decision: Approved. No instrument of equivalent scientific value to the foreign instrument, for such purposes as it is intended to be used, is being manufactured in the United States. Reasons: The foreign instrument provides: stable imaging at temperatures down to 4 Kelvin with low thermal drift rates (<1 angstrom per hour) and low rms vibration amplitudes (< 0.005 angstrom in a 300 Hz bandwidth). It also has the capability of depositing molecules on the sample in the microscope stage at temperatures down to 4 Kelvin and tip retraction and return to the same area after deposition of molecules. Advice received from: A university research laboratory for advanced microstructures and devices (comparable case). It knows of no domestic instrument or apparatus of equivalent scientific value to the foreign instrument for the applicant’s intended use. We know of no other instrument or apparatus of equivalent scientific value VerDate Aug<31>2005 15:02 Jan 11, 2006 Jkt 208001 PO 00000 Frm 00012 Fmt 4703 Sfmt 4703 Galveston, 301 University Boulevard, Galveston, TX 77555. Instrument: Electron Microscope, Model JEM– 2200FS. Manufacturer: JEOL, Ltd., Japan. Intended Use: The instrument is intended to be used to examine and study: (1) Biological macromolecules, cellular organelles and viruses (2) Three dimensional structure (3) Electron Microscope imaging at cryogenic temperatures (4) Structure–functional relationship to pathologic potential (5) Low electron radiation dose imaging of frozen–hydrated viruses to preserve structure. Application accepted by Commissioner of Customs: December 27, 2005. Gerald A. Zerdy, Program Manager, Statutory Import Programs Staff. [FR Doc. E6–236 Filed 1–11–06; 8:45 am] BILLING CODE 3510–DS–S DEPARTMENT OF COMMERCE International Trade Administration Notice Requesting Comments on Intellectual Property Protection at Trade Events Authority: 15 U.S.C. 4721, 4724; 22 U.S.C. 2452(a)(3); Pub. L. 86–14 (73 Stat. 18); Pub. L. 91–269 (84 Stat. 272). International Trade Administration, Department of Commerce. ACTION: Notice requesting comments on intellectual property protection at trade events. AGENCY: SUMMARY: The U.S. Department of Commerce requests comments from interested parties regarding issues related to Intellectual Property Rights (IPR) protection at trade events, including policies and current practices, and problems of infringement. DATES: Comments should be received within 30 days from the date this notice appears in the Federal Register. Comments received after 30 days will be considered to the extent practicable. ADDRESSES: The U.S. Department of Commerce, Room 2118, HCHB, 14th Street and Constitution Avenue, NW., Washington, DC 20230, Attn: Donald Huber; or e-mail to: dhuber@mail.doc.gov. FOR FURTHER INFORMATION CONTACT: Donald Huber at Tel: 202–482–2525; email: dhuber@mail.doc.gov. SUPPLEMENTARY INFORMATION: Secretary of Commerce Carlos M. Gutierrez E:\FR\FM\12JAN1.SGM 12JAN1

Agencies

[Federal Register Volume 71, Number 8 (Thursday, January 12, 2006)]
[Notices]
[Page 2024]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: E6-236]


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DEPARTMENT OF COMMERCE

International Trade Administration


Applications for Duty-Free Entry of Scientific Instruments

    Pursuant to section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651; 80 Stat. 
897; 15 CFR part 301), we invite comments on the question of whether 
instruments of equivalent scientific value, for the purposes for which 
the instruments shown below are intended to be used, are being 
manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be filed within 20 days with the Statutory Import 
Programs Staff, U.S. Department of Commerce, Washington, DC 20230. 
Applications may be examined between 8:30 a.m. and 5 p.m. in Suite 
4100W, U.S. Department of Commerce, Franklin Court Building, 1099 14th 
Street, NW., Washington, DC.
    Docket Number: 05-061. Applicant: University of Michigan, 2355 
Bonisteel Boulevard, Ann Arbor, MI 48109-2104. Instrument: Application 
Specific Integrated Circuit. Manufacturer: Ideas ASA, Norway. Intended 
Use: The instrument is intended to be used as a compatible accessory 
for a unique 3-dimensional position sensitive CdZnTe semiconductor 
gamma-ray spectrometer. The article consists of a multi-channel charge 
sensing amplifier with very low noise of about 300 electrons rms for 
which three iterations have been developed in collaboration with Ideas 
ASA. The systems can get energy and 3D position information for not 
only single-interaction events, but for multiple-interaction events by 
using electron drift times. Excellent energy resolution for both 
single-interaction events (0.8% FWHM at 662 keV) and multiple-
interaction events (1.3% FWHM at 662 keV) has been achieved. A new 
scalable detector array system with plug-in electronics is required for 
further development of the spectrometer. Application accepted by 
Commissioner of Customs: December 27, 20005.
    Docket Number: 05-062. Applicant: University of Texas Medical 
Branch at Galveston, 301 University Boulevard, Galveston, TX 77555. 
Instrument: Electron Microscope, Model JEM-2200FS. Manufacturer: JEOL, 
Ltd., Japan. Intended Use: The instrument is intended to be used to 
examine and study:
(1) Biological macromolecules, cellular organelles and viruses
(2) Three dimensional structure
(3) Electron Microscope imaging at cryogenic temperatures
(4) Structure-functional relationship to pathologic potential
(5) Low electron radiation dose imaging of frozen-hydrated viruses to 
preserve structure.
    Application accepted by Commissioner of Customs: December 27, 2005.

Gerald A. Zerdy,
Program Manager, Statutory Import Programs Staff.
[FR Doc. E6-236 Filed 1-11-06; 8:45 am]
BILLING CODE 3510-DS-S

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