Applications for Duty-Free Entry of Scientific Instruments, 72609 [E5-6909]
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Federal Register / Vol. 70, No. 233 / Tuesday, December 6, 2005 / Notices
Department is also extending the time
limits for the preliminary results of
Dongbao by 35 days and for Anqiu
Friend by 8 days, until no later than
April 26, 2006. Thus, the Department
will issue the preliminary results for
Dongbao and Anqiu Friend concurrently
with the preliminary results for
Chengshun and Fanhui on April 26,
2006.
We are issuing this notice in
accordance with sections 751(a)(3)(A)
and 777(i) of the Act.
Dated: November 30, 2005.
Stephen J. Claeys,
Deputy Assistant Secretary for Import
Administration.
[FR Doc. E5–6901 Filed 12–5–05; 8:45 am]
(1) Microstructural Characterization
Techniques
(2) Introduction to Scanning Electron
Microscopy
BILLING CODE 3510–DS–S
DEPARTMENT OF COMMERCE
International Trade Administration
Applications for Duty–Free Entry of
Scientific Instruments
Pursuant to Section 6(c) of the
Educational, Scientific and Cultural
Materials Importation Act of 1966 (Pub.
L. 89–651; 80 Stat. 897; 15 CFR part
301), we invite comments on the
question of whether instruments of
equivalent scientific value, for the
purposes for which the instruments
shown below are intended to be used,
are being manufactured in the United
States.
Comments must comply with 15 CFR
301.5(a)(3) and (4) of the regulations and
be filed within 20 days with the
Statutory Import Programs Staff, U.S.
Department of Commerce, Washington,
D.C. 20230. Applications may be
examined between 8:30 A.M. and 5:00
P.M. in Suite 4100W, U.S. Department
of Commerce, Franklin Court Building,
1099 14th Street, NW, Washington, DC.
Docket Number: 05–047. Applicant:
Dartmouth College, Thayer School of
Engineering, HB 8000 Dartmouth
College, Hanover, NH 03755–8000.
Instrument: Nano Magneto–optic Kerr
Effect Microscope. Manufacturer:
Durham Magneto Optics, Ltd., UK.
Intended Use: The instrument is
intended to be used to study the Kerr
effect which is the rotation of the
polarization of light under the influence
of time–varying magnetic fields in three
axes. Transverse, longitudinal, and
polar Kerr effects will be measured as
well as time–varying combinations of
these. Thin layers of several magnetic
alloys inside of dielectric structures will
be deposited to enhance the effect of the
magnetic field to measure magnetic
VerDate Aug<31>2005
17:44 Dec 05, 2005
Jkt 205001
properties of weakly magnetic materials,
and to maximize the polarization
rotation of Kerr–effect materials.
Application accepted by Commissioner
of Customs: October 28, 2005.
Docket Number: 05–048. Applicant:
Purdue University, 401 South Grant
Street, West Lafayette, IN 47907.
Instrument: Electron Microscope, Model
Nova 200 NanoLab. Manufacturer: FEI
Company, The Netherlands. Intended
Use: The instrument is intended to be
used for instruction in the following
courses:
(3) Introduction to Transmission
Electron Microscopy
(4) Transmission Electron Microscopy
and Crystal Imperfections.
It will also be used in individualized
instruction for MS and PhD Theses.
Application accepted by Commissioner
of Customs: November 10, 2005.
Docket Number: 05–049. Applicant:
Purdue University, 401 South Grant
Street, West Lafayette, IN 47907.
Instrument: Electron Microscope, Model
Technai G2 F30 S–TWIN. Manufacturer:
FEI Company, The Netherlands.
Intended Use: The instrument is
intended to be used for instruction in
the following courses:
(1) Microstructural Characterization
Techniques
(2) Introduction to Scanning Electron
Microscopy
(3) Introduction to Transmission
Electron Microscopy
(4) Transmission Electron Microscopy
and Crystal Imperfections.
It will also be used in individualized
instruction for MS and PhD Theses.
Application accepted by Commissioner
of Customs: November 10, 2005.
Docket Number: 05–050. Applicant: The
Ohio State University, Materials Science
and Engineering, 2041 College Road,
Columbus, OH 43210. Instrument:
Electron Microscope, Model Titan F30
S–TWIN. Manufacturer: FEI Company,
The Netherlands. Intended Use: The
instrument is intended to be used in a
multi–disciplinary central
instrumentation facility and will be
used to study many different types of
solid state materials. It will be used for
general morphological and structural
studies of ceramics and metals,
including high–temperature
superconductors, high–temperature
metal alloys, evaporated metal films,
PO 00000
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Fmt 4703
Sfmt 4703
72609
silicon–germanium quantum dots, soils
and geological materials, polymers and
possibly some biological samples. It will
be used measure the morphology and
orientation of grains and particles, as
well as the structure, long and short
range ordering, number and type of
defects and the elemental composition
of various phases in the materials.
Application accepted by Commissioner
of Customs: November 16, 2005.
Docket Number: 05–051. Applicant: The
Rockefeller University, 1230 York
Avenue, New York, NY 10021.
Instrument: Electron Microscope, Model
Technai G2 12 Bio Twin. Manufacturer:
FEI Company, The Netherlands.
Intended Use: The instrument is
intended to be used in a central facility
that is available for use by all
researchers at the University. The center
provides highly specialized state–ofthe–art equipment for both optical and
electron microscopy, as well as training
in its use. The staff are available to
provide experimental assistance and
advice. About 65 of 75 of the
laboratories will be used by a wide
variety of researchers working on a
broad range of experimental systems,
from viruses and bacteria to sections of
brain tissue. The new very high
resolution microscope for cell biology
will allow visualization of a single cell
or bacterium filling an 8 x 11 page.
Application accepted by Commissioner
of Customs: November 18, 2005.
Gerald A. Zerdy,
Program Manager, Statutory Import Programs
Staff.
[FR Doc. E5–6909 Filed 12–5–05; 8:45 am]
BILLING CODE 3510–DS–S
DEPARTMENT OF COMMERCE
International Trade Administration
Export Trade Certificate of Review
ACTION:
Notice of application.
SUMMARY: Export Trading Company
Affairs (‘‘ETCA’’), International Trade
Administration, Department of
Commerce, has received an application
for an Export Trade Certificate of
Review. This notice summarizes the
conduct for which certification is sought
and requests comments relevant to
whether the Certificate should be
issued.
FOR FURTHER INFORMATION CONTACT:
Jeffrey Anspacher, Director, Export
Trading Company Affairs, International
Trade Administration, by telephone at
(202) 482–5131 (this is not a toll free
number) or E-mail at oetca@ita.doc.gov.
E:\FR\FM\06DEN1.SGM
06DEN1
]]>Agencies
[Federal Register Volume 70, Number 233 (Tuesday, December 6, 2005)]
[Notices]
[Page 72609]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: E5-6909]
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DEPARTMENT OF COMMERCE
International Trade Administration
Applications for Duty-Free Entry of Scientific Instruments
Pursuant to Section 6(c) of the Educational, Scientific and Cultural
Materials Importation Act of 1966 (Pub. L. 89-651; 80 Stat. 897; 15 CFR
part 301), we invite comments on the question of whether instruments of
equivalent scientific value, for the purposes for which the instruments
shown below are intended to be used, are being manufactured in the
United States.
Comments must comply with 15 CFR 301.5(a)(3) and (4) of the regulations
and be filed within 20 days with the Statutory Import Programs Staff,
U.S. Department of Commerce, Washington, D.C. 20230. Applications may
be examined between 8:30 A.M. and 5:00 P.M. in Suite 4100W, U.S.
Department of Commerce, Franklin Court Building, 1099 14th Street, NW,
Washington, DC. Docket Number: 05-047. Applicant: Dartmouth College,
Thayer School of Engineering, HB 8000 Dartmouth College, Hanover, NH
03755-8000. Instrument: Nano Magneto-optic Kerr Effect Microscope.
Manufacturer: Durham Magneto Optics, Ltd., UK. Intended Use: The
instrument is intended to be used to study the Kerr effect which is the
rotation of the polarization of light under the influence of time-
varying magnetic fields in three axes. Transverse, longitudinal, and
polar Kerr effects will be measured as well as time-varying
combinations of these. Thin layers of several magnetic alloys inside of
dielectric structures will be deposited to enhance the effect of the
magnetic field to measure magnetic properties of weakly magnetic
materials, and to maximize the polarization rotation of Kerr-effect
materials. Application accepted by Commissioner of Customs: October 28,
2005.
Docket Number: 05-048. Applicant: Purdue University, 401 South Grant
Street, West Lafayette, IN 47907. Instrument: Electron Microscope,
Model Nova 200 NanoLab. Manufacturer: FEI Company, The Netherlands.
Intended Use: The instrument is intended to be used for instruction in
the following courses:
(1) Microstructural Characterization Techniques
(2) Introduction to Scanning Electron Microscopy
(3) Introduction to Transmission Electron Microscopy
(4) Transmission Electron Microscopy and Crystal Imperfections.
It will also be used in individualized instruction for MS and PhD
Theses. Application accepted by Commissioner of Customs: November 10,
2005.
Docket Number: 05-049. Applicant: Purdue University, 401 South Grant
Street, West Lafayette, IN 47907. Instrument: Electron Microscope,
Model Technai G[bds2] F30 S-TWIN. Manufacturer: FEI Company, The
Netherlands. Intended Use: The instrument is intended to be used for
instruction in the following courses:
(1) Microstructural Characterization Techniques
(2) Introduction to Scanning Electron Microscopy
(3) Introduction to Transmission Electron Microscopy
(4) Transmission Electron Microscopy and Crystal Imperfections.
It will also be used in individualized instruction for MS and PhD
Theses. Application accepted by Commissioner of Customs: November 10,
2005.
Docket Number: 05-050. Applicant: The Ohio State University, Materials
Science and Engineering, 2041 College Road, Columbus, OH 43210.
Instrument: Electron Microscope, Model Titan F30 S-TWIN. Manufacturer:
FEI Company, The Netherlands. Intended Use: The instrument is intended
to be used in a multi-disciplinary central instrumentation facility and
will be used to study many different types of solid state materials. It
will be used for general morphological and structural studies of
ceramics and metals, including high-temperature superconductors, high-
temperature metal alloys, evaporated metal films, silicon-germanium
quantum dots, soils and geological materials, polymers and possibly
some biological samples. It will be used measure the morphology and
orientation of grains and particles, as well as the structure, long and
short range ordering, number and type of defects and the elemental
composition of various phases in the materials. Application accepted by
Commissioner of Customs: November 16, 2005.
Docket Number: 05-051. Applicant: The Rockefeller University, 1230 York
Avenue, New York, NY 10021. Instrument: Electron Microscope, Model
Technai G[bds2] 12 Bio Twin. Manufacturer: FEI Company, The
Netherlands. Intended Use: The instrument is intended to be used in a
central facility that is available for use by all researchers at the
University. The center provides highly specialized state-of-the-art
equipment for both optical and electron microscopy, as well as training
in its use. The staff are available to provide experimental assistance
and advice. About 65 of 75 of the laboratories will be used by a wide
variety of researchers working on a broad range of experimental
systems, from viruses and bacteria to sections of brain tissue. The new
very high resolution microscope for cell biology will allow
visualization of a single cell or bacterium filling an 8 x 11 page.
Application accepted by Commissioner of Customs: November 18, 2005.
Gerald A. Zerdy,
Program Manager, Statutory Import Programs Staff.
[FR Doc. E5-6909 Filed 12-5-05; 8:45 am]
BILLING CODE 3510-DS-S
