Applications for Duty-Free Entry of Scientific Instruments, 72609 [E5-6909]

Download as PDF Federal Register / Vol. 70, No. 233 / Tuesday, December 6, 2005 / Notices Department is also extending the time limits for the preliminary results of Dongbao by 35 days and for Anqiu Friend by 8 days, until no later than April 26, 2006. Thus, the Department will issue the preliminary results for Dongbao and Anqiu Friend concurrently with the preliminary results for Chengshun and Fanhui on April 26, 2006. We are issuing this notice in accordance with sections 751(a)(3)(A) and 777(i) of the Act. Dated: November 30, 2005. Stephen J. Claeys, Deputy Assistant Secretary for Import Administration. [FR Doc. E5–6901 Filed 12–5–05; 8:45 am] (1) Microstructural Characterization Techniques (2) Introduction to Scanning Electron Microscopy BILLING CODE 3510–DS–S DEPARTMENT OF COMMERCE International Trade Administration Applications for Duty–Free Entry of Scientific Instruments Pursuant to Section 6(c) of the Educational, Scientific and Cultural Materials Importation Act of 1966 (Pub. L. 89–651; 80 Stat. 897; 15 CFR part 301), we invite comments on the question of whether instruments of equivalent scientific value, for the purposes for which the instruments shown below are intended to be used, are being manufactured in the United States. Comments must comply with 15 CFR 301.5(a)(3) and (4) of the regulations and be filed within 20 days with the Statutory Import Programs Staff, U.S. Department of Commerce, Washington, D.C. 20230. Applications may be examined between 8:30 A.M. and 5:00 P.M. in Suite 4100W, U.S. Department of Commerce, Franklin Court Building, 1099 14th Street, NW, Washington, DC. Docket Number: 05–047. Applicant: Dartmouth College, Thayer School of Engineering, HB 8000 Dartmouth College, Hanover, NH 03755–8000. Instrument: Nano Magneto–optic Kerr Effect Microscope. Manufacturer: Durham Magneto Optics, Ltd., UK. Intended Use: The instrument is intended to be used to study the Kerr effect which is the rotation of the polarization of light under the influence of time–varying magnetic fields in three axes. Transverse, longitudinal, and polar Kerr effects will be measured as well as time–varying combinations of these. Thin layers of several magnetic alloys inside of dielectric structures will be deposited to enhance the effect of the magnetic field to measure magnetic VerDate Aug<31>2005 17:44 Dec 05, 2005 Jkt 205001 properties of weakly magnetic materials, and to maximize the polarization rotation of Kerr–effect materials. Application accepted by Commissioner of Customs: October 28, 2005. Docket Number: 05–048. Applicant: Purdue University, 401 South Grant Street, West Lafayette, IN 47907. Instrument: Electron Microscope, Model Nova 200 NanoLab. Manufacturer: FEI Company, The Netherlands. Intended Use: The instrument is intended to be used for instruction in the following courses: (3) Introduction to Transmission Electron Microscopy (4) Transmission Electron Microscopy and Crystal Imperfections. It will also be used in individualized instruction for MS and PhD Theses. Application accepted by Commissioner of Customs: November 10, 2005. Docket Number: 05–049. Applicant: Purdue University, 401 South Grant Street, West Lafayette, IN 47907. Instrument: Electron Microscope, Model Technai G2 F30 S–TWIN. Manufacturer: FEI Company, The Netherlands. Intended Use: The instrument is intended to be used for instruction in the following courses: (1) Microstructural Characterization Techniques (2) Introduction to Scanning Electron Microscopy (3) Introduction to Transmission Electron Microscopy (4) Transmission Electron Microscopy and Crystal Imperfections. It will also be used in individualized instruction for MS and PhD Theses. Application accepted by Commissioner of Customs: November 10, 2005. Docket Number: 05–050. Applicant: The Ohio State University, Materials Science and Engineering, 2041 College Road, Columbus, OH 43210. Instrument: Electron Microscope, Model Titan F30 S–TWIN. Manufacturer: FEI Company, The Netherlands. Intended Use: The instrument is intended to be used in a multi–disciplinary central instrumentation facility and will be used to study many different types of solid state materials. It will be used for general morphological and structural studies of ceramics and metals, including high–temperature superconductors, high–temperature metal alloys, evaporated metal films, PO 00000 Frm 00005 Fmt 4703 Sfmt 4703 72609 silicon–germanium quantum dots, soils and geological materials, polymers and possibly some biological samples. It will be used measure the morphology and orientation of grains and particles, as well as the structure, long and short range ordering, number and type of defects and the elemental composition of various phases in the materials. Application accepted by Commissioner of Customs: November 16, 2005. Docket Number: 05–051. Applicant: The Rockefeller University, 1230 York Avenue, New York, NY 10021. Instrument: Electron Microscope, Model Technai G2 12 Bio Twin. Manufacturer: FEI Company, The Netherlands. Intended Use: The instrument is intended to be used in a central facility that is available for use by all researchers at the University. The center provides highly specialized state–ofthe–art equipment for both optical and electron microscopy, as well as training in its use. The staff are available to provide experimental assistance and advice. About 65 of 75 of the laboratories will be used by a wide variety of researchers working on a broad range of experimental systems, from viruses and bacteria to sections of brain tissue. The new very high resolution microscope for cell biology will allow visualization of a single cell or bacterium filling an 8 x 11 page. Application accepted by Commissioner of Customs: November 18, 2005. Gerald A. Zerdy, Program Manager, Statutory Import Programs Staff. [FR Doc. E5–6909 Filed 12–5–05; 8:45 am] BILLING CODE 3510–DS–S DEPARTMENT OF COMMERCE International Trade Administration Export Trade Certificate of Review ACTION: Notice of application. SUMMARY: Export Trading Company Affairs (‘‘ETCA’’), International Trade Administration, Department of Commerce, has received an application for an Export Trade Certificate of Review. This notice summarizes the conduct for which certification is sought and requests comments relevant to whether the Certificate should be issued. FOR FURTHER INFORMATION CONTACT: Jeffrey Anspacher, Director, Export Trading Company Affairs, International Trade Administration, by telephone at (202) 482–5131 (this is not a toll free number) or E-mail at oetca@ita.doc.gov. E:\FR\FM\06DEN1.SGM 06DEN1

Agencies

[Federal Register Volume 70, Number 233 (Tuesday, December 6, 2005)]
[Notices]
[Page 72609]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: E5-6909]


-----------------------------------------------------------------------

DEPARTMENT OF COMMERCE

International Trade Administration


Applications for Duty-Free Entry of Scientific Instruments

Pursuant to Section 6(c) of the Educational, Scientific and Cultural 
Materials Importation Act of 1966 (Pub. L. 89-651; 80 Stat. 897; 15 CFR 
part 301), we invite comments on the question of whether instruments of 
equivalent scientific value, for the purposes for which the instruments 
shown below are intended to be used, are being manufactured in the 
United States.
Comments must comply with 15 CFR 301.5(a)(3) and (4) of the regulations 
and be filed within 20 days with the Statutory Import Programs Staff, 
U.S. Department of Commerce, Washington, D.C. 20230. Applications may 
be examined between 8:30 A.M. and 5:00 P.M. in Suite 4100W, U.S. 
Department of Commerce, Franklin Court Building, 1099 14th Street, NW, 
Washington, DC. Docket Number: 05-047. Applicant: Dartmouth College, 
Thayer School of Engineering, HB 8000 Dartmouth College, Hanover, NH 
03755-8000. Instrument: Nano Magneto-optic Kerr Effect Microscope. 
Manufacturer: Durham Magneto Optics, Ltd., UK. Intended Use: The 
instrument is intended to be used to study the Kerr effect which is the 
rotation of the polarization of light under the influence of time-
varying magnetic fields in three axes. Transverse, longitudinal, and 
polar Kerr effects will be measured as well as time-varying 
combinations of these. Thin layers of several magnetic alloys inside of 
dielectric structures will be deposited to enhance the effect of the 
magnetic field to measure magnetic properties of weakly magnetic 
materials, and to maximize the polarization rotation of Kerr-effect 
materials. Application accepted by Commissioner of Customs: October 28, 
2005.
Docket Number: 05-048. Applicant: Purdue University, 401 South Grant 
Street, West Lafayette, IN 47907. Instrument: Electron Microscope, 
Model Nova 200 NanoLab. Manufacturer: FEI Company, The Netherlands. 
Intended Use: The instrument is intended to be used for instruction in 
the following courses:
(1) Microstructural Characterization Techniques
(2) Introduction to Scanning Electron Microscopy
(3) Introduction to Transmission Electron Microscopy
(4) Transmission Electron Microscopy and Crystal Imperfections.
It will also be used in individualized instruction for MS and PhD 
Theses. Application accepted by Commissioner of Customs: November 10, 
2005.
Docket Number: 05-049. Applicant: Purdue University, 401 South Grant 
Street, West Lafayette, IN 47907. Instrument: Electron Microscope, 
Model Technai G[bds2] F30 S-TWIN. Manufacturer: FEI Company, The 
Netherlands. Intended Use: The instrument is intended to be used for 
instruction in the following courses:
(1) Microstructural Characterization Techniques
(2) Introduction to Scanning Electron Microscopy
(3) Introduction to Transmission Electron Microscopy
(4) Transmission Electron Microscopy and Crystal Imperfections.
It will also be used in individualized instruction for MS and PhD 
Theses. Application accepted by Commissioner of Customs: November 10, 
2005.
Docket Number: 05-050. Applicant: The Ohio State University, Materials 
Science and Engineering, 2041 College Road, Columbus, OH 43210. 
Instrument: Electron Microscope, Model Titan F30 S-TWIN. Manufacturer: 
FEI Company, The Netherlands. Intended Use: The instrument is intended 
to be used in a multi-disciplinary central instrumentation facility and 
will be used to study many different types of solid state materials. It 
will be used for general morphological and structural studies of 
ceramics and metals, including high-temperature superconductors, high-
temperature metal alloys, evaporated metal films, silicon-germanium 
quantum dots, soils and geological materials, polymers and possibly 
some biological samples. It will be used measure the morphology and 
orientation of grains and particles, as well as the structure, long and 
short range ordering, number and type of defects and the elemental 
composition of various phases in the materials. Application accepted by 
Commissioner of Customs: November 16, 2005.
Docket Number: 05-051. Applicant: The Rockefeller University, 1230 York 
Avenue, New York, NY 10021. Instrument: Electron Microscope, Model 
Technai G[bds2] 12 Bio Twin. Manufacturer: FEI Company, The 
Netherlands. Intended Use: The instrument is intended to be used in a 
central facility that is available for use by all researchers at the 
University. The center provides highly specialized state-of-the-art 
equipment for both optical and electron microscopy, as well as training 
in its use. The staff are available to provide experimental assistance 
and advice. About 65 of 75 of the laboratories will be used by a wide 
variety of researchers working on a broad range of experimental 
systems, from viruses and bacteria to sections of brain tissue. The new 
very high resolution microscope for cell biology will allow 
visualization of a single cell or bacterium filling an 8 x 11 page. 
Application accepted by Commissioner of Customs: November 18, 2005.

Gerald A. Zerdy,
Program Manager, Statutory Import Programs Staff.
[FR Doc. E5-6909 Filed 12-5-05; 8:45 am]
BILLING CODE 3510-DS-S