Applications for Duty-Free Entry of Scientific Instruments, 67450-67451 [05-22151]

Download as PDF 67450 Federal Register / Vol. 70, No. 214 / Monday, November 7, 2005 / Notices base box coating, 70 pound/base box (0.0077 inch) thickness, and 32.9375 inch, 33.125 inch, or 35.1875 inch ordered width. – Electrolytically tin coated steel having differential coating with 1.00 pound/base box equivalent on the heavy side, with varied coating equivalents on the lighter side (detailed below), with a continuous cast steel chemistry of type MR, with a surface finish of type 7B or 7C, with a surface passivation of 0.5 mg/square foot of chromium applied as a cathodic dichromate treatment, with ultra flat scroll cut sheet form, with CAT 5 temper with 1.00/0.10 pound/base box coating, with a lithograph logo printed in a uniform pattern on the 0.10 pound coating side with a clear protective coat, with both sides waxed to a level of 15–20 mg/216 sq. in., with ordered dimension combinations of 1) 75 pound/base box (0.0082 inch) thickness and 34.9375 inch x 31.748 inch scroll cut dimensions; or 2) 75 pound/base box (0.0082 inch) thickness and 34.1875 inch x 29.076 inch scroll cut dimensions; or 3) 107 pound/base box (0.0118 inch) thickness and 30.5625 inch x 34.125 inch scroll cut dimension. – Tin–free steel coated with a metallic chromium layer between 100–200 mg/square meter and a chromium oxide layer between 5–30 mg/ square meter; chemical composition of 0.05% maximum carbon, 0.03% maximum silicon, 0.60% maximum manganese, 0.02% maximum phosphorous, and 0.02% maximum sulfur; magnetic flux density (‘‘Br’’) of 10 kg minimum and a coercive force (‘‘Hc’’) of 3.8 Oe minimum. – Tin–free steel laminated on one or both sides of the surface with a polyester film, consisting of two layers (an amorphous layer and an outer crystal layer), that contains no more than the indicated amounts of the following environmental hormones: 1 mg/kg BADGE (BisPhenol A Di–glycidyl Ether), 1 mg/kg BFDGE (BisPhenol F Di– glycidyl Ether), and 3 mg/kg BPA (BisPhenol A). The merchandise subject to this order is classified in the Harmonized Tariff Schedule of the United States (‘‘HTSUS’’), under HTSUS subheadings 7210.11.0000, 7210.12.0000, 7210.50.0000, 7212.10.0000, and 7212.50.0000 if of non–alloy steel and under HTSUS subheadings 7225.99.0090, and 7226.99.0000 if of alloy steel. Although the subheadings are provided for convenience and VerDate Aug<31>2005 16:38 Nov 04, 2005 Jkt 208001 customs purposes, our written description of the scope of this order is dispositive. Analysis of Comments Received All issues raised in this sunset review are addressed in the ‘‘Issues and Decision Memorandum’’ from Stephen J. Claeys, Deputy Assistant Secretary for Import Administration, to Joseph A. Spetrini, Acting Assistant Secretary for Import Administration, dated October 31, 2005, (‘‘Decision Memorandum’’), which is hereby adopted by this notice. The issues discussed in the Decision Memorandum include the likelihood of continuation or recurrence of dumping and the magnitude of the margin likely to prevail if the order were revoked. Parties can find a complete discussion of all issues raised in this sunset review and the corresponding recommendations in this public memorandum, which is on file in room B–099 of the main Department building. In addition, a complete version of the Decision Memorandum can be accessed directly on the Web at https:// ia.ita.doc.gov/frn, under the heading ‘‘November 2005.’’ The paper copy and electronic version of the Decision Memorandum are identical in content. sections 751(c), 752, and 777(i)(1) of the Act. Dated: October 31, 2005. Joseph A. Spetrini, Acting Assistant Secretary for Import Administration. [FR Doc. 05–22141 Filed 11–4–05; 8:45 am] BILLING CODE 3510–DS–S DEPARTMENT OF COMMERCE International Trade Administration Applications for Duty–Free Entry of Scientific Instruments Pursuant to Section 6(c) of the Educational, Scientific and Cultural Materials Importation Act of 1966 (Pub. L. 89–651; 80 Stat. 897; 15 CFR part 301), we invite comments on the question of whether an instrument of equivalent scientific value, for the purposes for which the instrument shown below is intended to be used, is being manufactured in the United States. Comments must comply with 15 CFR 301.5(a)(3) and (4) of the regulations and be filed within 20 days with the Statutory Import Programs Staff, U.S. Final Results of Review Department of Commerce, Washington, We determine that revocation of the D.C. 20230. Applications may be antidumping duty order on tin mill examined between 8:30 A.M. and 5:00 products from Japan would likely lead P.M. in Suite 4100W, U.S. Department to continuation or recurrence of of Commerce, Franklin Court Building, dumping at the following percentage 1099 14th Street, NW, Washington, D.C. weighted–average margins: Docket Number: 05–041. Applicant: Georgia Institute of Technology, 711 Manufacturers/ExportWeighted–Average Marietta St., Atlanta, GA 30332. ers/Producers Margin (Percent) Instrument: Dual Beam SEM/FIB Nippon Steel CorporaElectron Microscope System, Model tion ............................ 95.29 Quanta 200 3D Nanolab. Manufacturer: Kawasaki Steel CorFEI Company, Czech Republic. Intended poration ..................... 95.29 Use: The instrument is intended to be NKK Corporation .......... 95.29 used to improve understanding of Toyo Kohan Co., Ltd. ... 95.29 molecular mechanisms and functional All Other Japanese assemblies, initiate development of new Manufacturers and Exporters ................... 32.52 materials, and facilitate advances in environmental analysis and detection. New research and creative concepts will This notice also serves as the only include: (1) multifunctional scanning reminder to parties subject to nanoprobes and quantum cascade laser– administrative protective orders (APO) based sensing systems,(2) stimulated of their responsibility concerning the surface chemistry using metal– return or destruction of proprietary insulator-metal (MIM) devices information disclosed under APO in containing nano–scale field emission accordance with section 351.305 of the arrays,(3) optically gated single Department’s regulations. Timely molecule transistors,(4) shape– notification of the return or destruction preserving chemical conversion of 3–D of APO materials or conversion to judicial protective order is hereby bioclastic structures,(5) impedance requested. Failure to comply with the mapping AFM cantilever arrays and (6) regulations and terms of an APO is a nanobelts as nanobiosensors and violation which is subject to sanction. nanocantilevers. Application accepted We are issuing and publishing the by Commissioner of Customs: results and notice in accordance with September 15, 2005. PO 00000 Frm 00041 Fmt 4703 Sfmt 4703 E:\FR\FM\07NON1.SGM 07NON1 Federal Register / Vol. 70, No. 214 / Monday, November 7, 2005 / Notices Docket Number: 05–042. Applicant: Georgia Institute of Technology, 711 Marietta St., Atlanta, GA 30332. Instrument: Dual Beam SEM/FIB Electron Microscope System, Model Nova 200 Nanolab. Manufacturer: FEI Company, The Netherlands. Intended Use: The instrument is intended to be used to improve understanding of molecular mechanisms and functional assemblies, initiate development of new materials, and facilitate advances in environmental analysis and detection. New research and creative concepts will include: (1) multifunctional scanning nanoprobes and quantum cascade laser– based sensing systems,(2) stimulated surface chemistry using metal– insulator-metal (MIM) devices containing nano–scale field emission arrays,(3) optically gated single molecule transistors,(4) shape– preserving chemical conversion of 3–D bioclastic structures,(5) impedance mapping AFM cantilever arrays and (6) nanobelts as nanobiosensors, and nanocantilevers. Application accepted by Commissioner of Customs: September 15, 2005. Docket Number: 05–043. Applicant: Massachusetts General Hospital, 55 Fruit Street, Boston, MA 02114. Instrument: Electron Microscope, Model JEM–1011. Manufacturer: JEOL Ltd., Japan. Intended Use: The instrument is intended to be used by the professional laboratory staff at Massachusetts General Hospital for the advancement of scientific knowledge relating to U.S. government funded medical research projects using electron microscopy, electron microtomy and ultracryomicrotomy techniques. Application accepted by Commissioner of Customs: September 12, 2005. Gerald A. Zerdy, Program Manager, Statutory Import Programs Staff. [FR Doc. 05–22151 Filed 11–4–05; 8:45 am] Billing Code: 3510–DS–S DEPARTMENT OF COMMERCE International Trade Administration University of California, San Diego, et al., Notice of Consolidated Decision on Applications for Duty–Free Entry of Scientific Instruments This is a decision consolidated pursuant to Section 6(c) of the Educational, Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89–651, 80 Stat. 897; 15 CFR part 301). Related records can be viewed between 8:30 A.M. and 5:00 P.M. in Suite 4100W, Franklin Court Building, VerDate Aug<31>2005 16:38 Nov 04, 2005 Jkt 208001 U.S. Department of Commerce, 1099 14th Street, NW, Washington, D.C. Comments: None received. Decision: Approved. No instrument of equivalent scientific value to the foreign instruments described below, for such purposes as each is intended to be used, is being manufactured in the United States. Docket Number: 05–038. Applicant: University of California, San Diego. Instrument: Low–Temperature Ultra– High Vacuum Scanning Tunneling Microscope. Manufacturer: Omicron NanoTechnology, GmbH, Germany. Intended Use: See notice at 70 FR 54366, September 14, 2005. Reasons: The foreign instrument provides: (1) a scanning tunneling microscope (STM) mounted inside a 4K liquid helium reservoir (8-hour time between liquid He refills), (2) operation at an equilibrium temperature of 4 K (including both tip and sample), (3) in– situ sample manipulation and tip transfer capabilities, (4) low drift rates of 1.0 angstrom/hour (5) RMS vibration amplitudes of <0.005 angstrom in a 300 Hz bandwidth and (6) sample surface facing downwards during STM imaging for easy dosing. Advice received from: A university research laboratory for advanced microstructures and devices. Docket Number: 05–039. Applicant: University of Wisconsin, Eau Claire. Instrument: Automatic Fusion Machine, Model Autofluxer 4. Manufacturer: Breitlander, GmbH, Germany. Intended Use: See notice at 70 FR . Reasons: The foreign instrument provides dissolution of whole rock powder by a combination fusion/acid digestion for trace element analysis by ICP mass spectrometry. No apparatus of equivalent scientific value to the foreign apparatus, for such purposes as it is intended to be used, is being manufactured in the United States. This is a compatible accessory for an existing instrument purchased for the use of the applicant. The accessory is pertinent to the intended uses and we know of no domestic accessory which can be readily adapted for use with the existing instrument. Docket Number: 05–040. Applicant: National Renewable Energy Laboratory, Golden, CO, 80401. Instrument: Dual Beam Focused Ion Beam Electron Microscope, Model Nova 200 NanoLab. Manufacturer: FEI Company, The Netherlands. Intended Use: See notice at 70 FR 54366, September 14, 2005. Reasons: The foreign instrument is an electron microscope and is intended for research or scientific educational uses requiring it. We know of no instrument suited to these purposes, which was being manufactured in the United States at the time of order of the instrument. PO 00000 Frm 00042 Fmt 4703 Sfmt 4703 67451 We know of no other instrument or apparatus being manufactured in the United States which is of equivalent scientific value to any of the foreign instruments. Gerald A. Zerdy, Program Manager, Statutory Import Programs Staff. [FR Doc. 05–22150 Filed 11–4–05; 8:45 am] BILLING CODE 3510–DS–S DEPARTMENT OF COMMERCE International Trade Administration (A–570–803) Heavy Forged Hand Tools (i.e., Axes & Adzes, Bars & Wedges, Hammers & Sledges, and Picks & Mattocks) from the People’s Republic of China: Final Results of the Expedited Sunset Review of the Antidumping Duty Orders Import Administration, International Trade Administration, Department of Commerce. SUMMARY: On July 1, 2005, the Department of Commerce (‘‘the Department’’) initiated a sunset review of the antidumping duty (‘‘AD’’) orders on Heavy Forged Hand Tools (i.e., Axes & Adzes, Bars & Wedges, Hammers & Sledges, and Picks & Mattocks) (‘‘HFHTs’’) from the People’s Republic of China pursuant to section 751(c) of the Tariff Act of 1930, as amended (‘‘the Act’’). On the basis of notices of intent to participate and adequate substantive responses filed on behalf of the domestic interested parties and lack of response from respondent interested parties, the Department conducted an expedited sunset review of the AD orders pursuant to section 751(c)(3)(B) of the Act and section 351.218(e)(1)(ii)(C)(2) of the Department’s regulations. As a result of this sunset review, the Department finds that revocation of the AD orders would likely lead to continuation or recurrence of dumping at the levels indicated in the ‘‘Final Results of Review’’ section of this notice. EFFECTIVE DATE: November 7, 2005. FOR FURTHER INFORMATION CONTACT: Maureen Flannery, AD/CVD Operations, Import Administration, International Trade Administration, U.S. Department of Commerce, 14th Street and Constitution Avenue, NW, Washington, DC 20230; telephone: (202) 482–3020. SUPPLEMENTARY INFORMATION: AGENCY: Background On July 1, 2005, the Department initiated a sunset review of the AD E:\FR\FM\07NON1.SGM 07NON1

Agencies

[Federal Register Volume 70, Number 214 (Monday, November 7, 2005)]
[Notices]
[Pages 67450-67451]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: 05-22151]


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DEPARTMENT OF COMMERCE

International Trade Administration


Applications for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651; 80 Stat. 
897; 15 CFR part 301), we invite comments on the question of whether an 
instrument of equivalent scientific value, for the purposes for which 
the instrument shown below is intended to be used, is being 
manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be filed within 20 days with the Statutory Import 
Programs Staff, U.S. Department of Commerce, Washington, D.C. 20230. 
Applications may be examined between 8:30 A.M. and 5:00 P.M. in Suite 
4100W, U.S. Department of Commerce, Franklin Court Building, 1099 14th 
Street, NW, Washington, D.C.
    Docket Number: 05-041. Applicant: Georgia Institute of Technology, 
711 Marietta St., Atlanta, GA 30332. Instrument: Dual Beam SEM/FIB 
Electron Microscope System, Model Quanta 200 3D Nanolab. Manufacturer: 
FEI Company, Czech Republic. Intended Use: The instrument is intended 
to be used to improve understanding of molecular mechanisms and 
functional assemblies, initiate development of new materials, and 
facilitate advances in environmental analysis and detection. New 
research and creative concepts will include: (1) multifunctional 
scanning nanoprobes and quantum cascade laser-based sensing systems,(2) 
stimulated surface chemistry using metal-insulator-metal (MIM) devices 
containing nano-scale field emission arrays,(3) optically gated single 
molecule transistors,(4) shape-preserving chemical conversion of 3-D 
bioclastic structures,(5) impedance mapping AFM cantilever arrays and 
(6) nanobelts as nanobiosensors and nanocantilevers. Application 
accepted by Commissioner of Customs: September 15, 2005.

[[Page 67451]]

    Docket Number: 05-042. Applicant: Georgia Institute of Technology, 
711 Marietta St., Atlanta, GA 30332. Instrument: Dual Beam SEM/FIB 
Electron Microscope System, Model Nova 200 Nanolab. Manufacturer: FEI 
Company, The Netherlands. Intended Use: The instrument is intended to 
be used to improve understanding of molecular mechanisms and functional 
assemblies, initiate development of new materials, and facilitate 
advances in environmental analysis and detection. New research and 
creative concepts will include: (1) multifunctional scanning nanoprobes 
and quantum cascade laser-based sensing systems,(2) stimulated surface 
chemistry using metal-insulator-metal (MIM) devices containing nano-
scale field emission arrays,(3) optically gated single molecule 
transistors,(4) shape-preserving chemical conversion of 3-D bioclastic 
structures,(5) impedance mapping AFM cantilever arrays and (6) 
nanobelts as nanobiosensors, and nanocantilevers. Application accepted 
by Commissioner of Customs: September 15, 2005.
    Docket Number: 05-043. Applicant: Massachusetts General Hospital, 
55 Fruit Street, Boston, MA 02114. Instrument: Electron Microscope, 
Model JEM-1011. Manufacturer: JEOL Ltd., Japan. Intended Use: The 
instrument is intended to be used by the professional laboratory staff 
at Massachusetts General Hospital for the advancement of scientific 
knowledge relating to U.S. government funded medical research projects 
using electron microscopy, electron microtomy and ultracryomicrotomy 
techniques. Application accepted by Commissioner of Customs: September 
12, 2005.

Gerald A. Zerdy,
Program Manager, Statutory Import Programs Staff.
[FR Doc. 05-22151 Filed 11-4-05; 8:45 am]
Billing Code: 3510-DS-S